International Telemetering Conference Proceedings / October 20-23, 2003 / Riviera Hotel and Convention Center, Las Vegas, Nevada / XML is a simple and powerful way to handle on data transfers between organizations, applications and/or computer systems. Currently, there is a significant effort within NASA to transition to XML vocabularies as the means of exchanging electronic data. XML can provide a useful way to transfer telemetry attributes data between customers and systems. The current standard for airborne telemetry data description is the Telemetry Attributes Transfer Standard (TMATS). TMATS is a well-defined, structured specification that will map into XML extremely well. This makes XML an excellent choice to supplement TMATS for the interchange of telemetry attribute information. The Western Aeronautical Test Range (WATR) at NASA Dryden Flight Research Center (DFRC) is defining an XML Schema that will be used in support of the WATR Integrated Next Generation System (WINGS). This paper describes this work in progress.

International Telemetering Conference Proceedings / October 23-26, 2000 / Town & Country Hotel and Conference Center, San Diego, California / XML is a simple, powerful way to agree on data transfers between organizations, applications and/or computer systems. XML was originally developed to separate data content definition from the display of data on a web page. XML is based on a subset of the Standardized General Markup Language (SGML), which means XML uses a tag-based syntax similar to Hyper Text Markup Language (HTML). Whereas HTML uses fixed tags to display data, XML uses custom designed tags to describe data. XML provides a simple, standard, portable, and flexible way to transfer data between applications. This could provide a useful way to transfer telemetry attributes data between customers and systems. Currently, there is not a significant amount of support for the use of the Telemetry Attributes Transfer Standard (TMATS). Telemetry vendors still use their own formats, customers maintain their own databases, and support facilities/ranges promote the use of their own implementations. TMATS was supposed to define a common ground to transfer data definitions, but the tools to TMATS have not come about. TMATS is a well defined, structured specification that maps into XML extremely well. Even though XML is a fairly new technology, there are already many tools available to support XML parsing with more becoming available. This makes XML an excellent choice to supplement TMATS for the interchange of telemetry attribute information. This paper provides an initial attempt at defining the language and structure for an XML vocabulary of TMATS.

International Telemetering Conference Proceedings / October 30-November 02, 1995 / Riviera Hotel, Las Vegas, Nevada / The Inter-Range Instrumentation Group (IRIG) introduced the Telemetry Attributes Transfer Standard (TMATS) in IRIG 106-93. This long needed standardization was designed to provide a common thread through which test programs could move from one test range to another without significant re-work in the setup environment. TMATS provides the definition of telemetry attributes and specifies the media and data format necessary to permit the ready transfer of the information required to setup telemetry receiving/processing functions at a test range. These attributes are defined as those parameters required by the receiving/processing system to acquire, process and display telemetry data received from a test item or source. As the telemetry vendor community develops more and more board level products designed to be integrated into various platforms such as Personal Computer (PC), VME, and VXI, the necessity of providing a setup environment, which is independent of a specific vendor product, becomes essential. An significant advantage of TMATS lies in its ability to provide a mechanism for setup of "multiple vendor systems" without the necessity of restructuring telemetry attribute information for each unique vendor's product. This paper describes the use of TMATS for the setup of a VXI based telemetry acquisition system containing board level products (including Antenna Control Units, RF Receivers, Combiners, Bit Synchronizers, PCM Decommutators, and PCM Simulators) from multiple vendors.

ITC/USA 2011 Conference Proceedings / The Forty-Seventh Annual International Telemetering Conference and Technical Exhibition / October 24-27, 2011 / Bally's Las Vegas, Las Vegas, Nevada / The Western Aeronautical Test Range (WATR) staff at the NASA Dryden Flight Research Center is developing a translation software called Chapter 10 Tools in response to challenges posed by post-flight processing data files originating from various on-board digital recorders that follow the Range Commanders Council Inter-Range Instrumentation Group (IRIG) 106 Chapter 10 Digital Recording Standard but use differing interpretations of the Standard. The software will read the date files regardless of the vendor implementation of the source recorder, displaying data, identifying and correcting errors, and producing a data file that can be successfully processed post-flight.

À l'heure où les nanotechnologies sont en plein essor, la précision des mesures réalisées à l'échelle nanométrique devient un défi essentiel pour améliorer les performances et la qualité des produits intégrant des nano. Pour répondre aux besoins sous-jacents en nanométrologie dimensionnelle, le Laboratoire National de métrologie et d'Essais (LNE) a conçu intégralement un Microscope à Force Atomique métrologique (mAFM). Son objectif principal est d'assurer la traçabilité au mètre défini par le Système International d'unités (SI) pour les mesures à l'échelle nanométrique. Pour cela, le mAFM utilise quatre interféromètres différentiels qui mesurent en temps réel le déplacement relatif de la pointe par rapport à l'échantillon. Cet instrument de référence est destiné à l'étalonnage d'étalons de transfert couramment utilisés en microscopie à champ proche (SPM) et en microscopie électronique à balayage (SEM). Lors de ce processus, une incertitude de mesure est évaluée. Elle détermine un niveau de confiance de l'étalonnage réalisé par le mAFM. Cette incertitude est généralement évaluée grâce à des mesures expérimentales permettant de déterminer l'impact de certaines sources d'erreur qui dégradent les mesures à l'échelle du nanomètre. Pour d'autres sources d'erreur, leur évaluation reste complexe ou expérimentalement impossible. Pour surmonter cette difficulté, le travail de thèse a consisté à mettre en place un modèle numérique de l'instrument nommé " AFM virtuel ". Il permet de prévoir l'incertitude de mesure du mAFM du LNE en ciblant les sources critiques d'erreur grâce à l'utilisation d'outils statistiques tels que la Méthode de Monte Carlo (MCM), les plans de Morris et les indices de Sobol. Le modèle utilise essentiellement la programmation orientée objet afin de prendre en compte un maximum d'interactions parmi les 140 paramètres d'entrée, en intégrant des sources jusqu'ici négligées ou surestimées par manque d'informations. / At present where nanotechnology applications are growing fast and nano products spreading worldwide, measurement accuracy at nanometer scale becomes an essential challenge to improve the performance and the quality of products integrating nano. To meet the specific needs in the field of dimensional nanometrology, LNE (French metrology institute) integrally designed a metrological Atomic Force Microscope (mAFM). Its main objective is to ensure the traceability of nanoscale measurements to the meter as defined by the International System of Units (SI). The mAFM uses four differential interferometers which measure the tip to sample relative position. This instrument will be devoted to the calibration of transfer standards commonly used in scanning probe microscopy (SPM) and scanning electron microscopy (SEM). During this process, a measurement uncertainty is evaluated to determine a confidence level of the calibration realized by the mAFM. This uncertainty is usually evaluated thanks to experimental measurements which determine the impact of some error sources which degrade measurements at the nanoscale. For other components, their evaluation can be more complex and sometimes impossible to estimate experimentally. To overcome this difficulty, the thesis work consisted in the development of a numerical model called "Virtual AFM". It allows producting the measurement uncertainty of the LNE's mAFM and to identify the critical components by using statistic tools such as Monte Carlo Method (MCM), Morris' design and Sobol' indices. The model uses essentially oriented-object programming to take into account a maximum of interactions from about 140 input quantities. It allowed integrating components previously neglected or overestimated due to a lack of information.

This master’s deals with the calibration routines of the alternating voltage measurement standard Datron 4920. The first part introduces the basic terminology of metrology, its history and organizations specializing in metrology. The thesis describes the alternating voltage at the highest metrological level through AC/DC difference. The theoretical part also describes the alternating voltage measurement standard Datron 4920 and its measurement functions together with the calibration routines. The main aim of thesis is to create the calibration procedures AVMS Datron 4920. Based on the created calibration procedures, a flowchart of application for calibration routines is designed. The practical part then continues with programming application for calibrating AVMS Datron 4920 based on the created flowchart. In conclusion, the application is tested at selected points of measurement and an analysis of measurement uncertainties is carried out.