Power dissipated during scan testing is becoming increasingly important for today’s very complex sequential circuits. It is shown that the power dissipated during test mode operation is in general higher than the power dissipated during functional mode operation, the test mode average power may sometimes go upto 3x and the peak power may sometimes go upto 30x of normal mode operation. The power dissipated during the scan operation is primarily due to the switching activity that arises in scan cells during the shift and capture operation. The switching in scan cells propagates to the combinational block of the circuit during scan operation, which in turn creates many transition in the circuit and hence it causes higher dynamic power dissipation. The excessive average power dissipated during scan operation causes circuit damage due to higher temperature and the excessive peak power causes yield loss due to IR-drop and cross talk. The higher peak power also causes the thermal related issue if it last for sufficiently large number of cycles. Hence, to avoid all these issues it is very important to reduce the peak power during scan testing. Further, in case of multi-module SoC testing the reduction in peak power facilitates in reducing the test application time by scheduling many test sessions parallelly. In this dissertation we have addressed all the above stated issues. We have proposed three different techniques to deal with the excessive peak power dissipation problem during test. The first solution proposes an efficient graph theoretic methodology for test vector reordering to achieve minimum peak power supported by the given test vector set. Three graph theoretic problems are formulated and corresponding algorithms to solve the problems are proposed. The proposed methodology also minimizes average power for the given minimum peak power. Further, a lower bound on minimum achievable peak power for a given test set is defined. The results on several benchmarks show that the proposed methodology is able to reduce peak power significantly. To address the peak power problem during scan test-cycle (the cycle between launch and capture pulse) we have proposed a scan chain reordering technique. A new formulation for scan chain reordering as TSP (Traveling Sales Person) problem and a solution is proposed. The experimental results show that the proposed methodology is able to minimize considerable amount of peak power compared to the earlier proposals. The capture power (power dissipated during capture cycle) problem in testing multi chip module (MCM) is also addressed. We have proposed a methodology to schedule the test set to reduce capture power. The scheduling algorithm consist of reordering of test vector and insertion of idle cycle to prevent capture cycle coincidence of scheduled cores. The experimental results show the significant reduction in capture power without increase in test application time.

Η διατριβή ασχολείται με το αντικείμενο του ελέγχου ορθής λειτουργίας κυκλωμάτων κατά τον οποίο λαμβάνεται υπόψη και η συμπεριφορά ως προς την κατανάλωση ισχύος. Οι τεχνικές που προτείνονται αφορούν α) τη συμπίεση ενός συνόλου δοκιμής σε περιβάλλον ενσωματωμένου ελέγχου με χρήση εξωτερικών ελεγκτών, β) την εμφώλευση διανυσμάτων δοκιμής σε περιβάλλον ενσωματωμένου ελέγχου και γ) τη μείωση της κατανάλωση ισχύς και ενέργειας σε περιβάλλον εξωτερικού ελέγχου. Η συμπίεση των δεδομένων βασίζεται στην παρατήρηση ότι ένα διάνυσμα δοκιμής μπορεί να παραχθεί από το προηγούμενό του με την αντικατάσταση κάποιων τμημάτων του. Μεγαλύτερη συμπίεση επιτυγχάνεται όταν γίνει αναδιαταξή διανυσμάτων και αναδιάταξη των φλιπ-φλοπ της αλυσίδας ανίχνευσης. Αν η αναδιάταξη των φλιπ-φλοπ γίνει με βάση τη συχνότητα αλλαγών κατάστασης γειτονικών φλιπ-φλοπ τότε επιτυγχάνεται και μείωση της κατανάλωσης ισχύος. Όσον αφορά τις τεχνικές ενσωματωμένου αυτοελέγχου, μελετήθηκε το πρόβλημα της εμφώλευσης διανυσμάτων δοκιμής. Προτάθηκαν αποδοτικά κυκλώματα παραγωγής διανυσμάτων δοκιμής βασισμένα σε ολισθητές γραμμικής ανάδρασης και δέντρα πυλών XOR και σε ολισθητές συνδυασμένους με δέντρα πυλών OR. Όταν τα κυκλώματα υπό έλεγχο είναι κανονικής μορφής όπως είναι οι αθροιστές του αριθμητικού συστήματος υπολοίπων, προτείνονται κυκλώματα που εκμεταλεύονται την κανονική μορφή του συνόλου δοκιμής. Τέλος, σε περιβάλλον εξωτερικού ελέγχου, προτείνονται μέθοδοι αναδιάταξης διανυσμάτων δοκιμής με επανάληψη διανυσμάτων που μειώνουν την κατανάλωση. Οι μέθοδοι αυτές βασίζονται στην επιλογή των κατάλληλων ελάχιστων γεννητικών δέντρων και στη μετατροπή των κατάλληλων επαναλαμβανόμενων διανυσμάτων επιτυγχάνοντας σημαντική μείωση στην κατανάλωση ενέργειας, στη μέση και στη μέγιστη κατανάλωση ισχύος. / The dissertation is focused on VLSI testing while power dissipation is also taken into account. The techniques proposed are: a) test data compression in an embedded test environment, b) test set embedding in a built-in self test environment and c) reduction in test power dissipation in an external testing environment. Test data compression is based on the observation that a test vector can be produced from the previous one by replacing some parts of the previous vector with new parts of the current vector. The compression is even higher when the test vectors are ordered and scan cell reordering is also performed. If the scan cell reordering is based on a transition frequency approach then reduction in power dissipation is also achieved. In the case of built-in self test the problem of test set embedding was studied and efficient circuits based on linear feedback shift registers combined with XOR trees or shift registers combined with OR trees were proposed. If the circuits have a regular structure, such as the structure of residue number system adders, then a circuit taking advantage of the regular form of the test set can be derived. Finally, when external testing is considered, we proposed test vector ordering with vector repetition methods, which reduce power consumption. The methods are based on the selection of the appropriate minimum spanning trees and through the modification of the repeated vectors they achieve considerable savings in energy, average and peak power dissipation.