As semiconductor technology advances into the nano-scale era and more functional blocks are added into systems on chip (SoC), the interface between circuit design and manufacturing is becoming blurred. An increasing number of features, traditionally ignored by designers are influencing both circuit performance and yield. As a result, design tools need to incorporate new factors. One important source of circuit performance degradation comes from deterministic within-die variation from lithography imperfections and Cu interconnect chemical mechanical polishing (CMP). To determine how these within-die variations impact circuit performance, a new analysis tool is required. Thus a methodology has been proposed to involve layout-dependent within-die variations in static timing analysis. The methodology combines a set of scripts and commercial tools to analyze a full chip. The tool has been applied to analyze delay of ISCAS85 benchmark circuits in the presence of imperfect lithography and CMP variation. Also, this thesis presents a methodology to generate test sets to diagnose the sources of within-die variation. Specifically, a delay fault diagnosis algorithm is developed to link failing signatures to physical mechanisms and to distinguish among different sources of within-die variation. The algorithm relies on layout-dependent timing analysis, path enumeration, test pattern generation, and correlation of pass/fail signatures to diagnose lithography-caused delay faults. The effectiveness in diagnosis is evaluated for ISCAS85 benchmark circuits.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.