1 |
CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICESGuo, Wilson 13 May 2019 (has links)
No description available.
|
2 |
Méthodologie de prédiction des niveaux d'émission conduite dans les circuits intégrés, à l'aide de VHDL-AMS / A VHDL-AMS based prediction methodology of conducted emission in integrated circuitsPerdriau, Richard 25 March 2004 (has links)
Depuis de nombreuses années, la prise en compte des critères de compatibilité électromagnétique (CEM) constitue une étape capitale dans la
conception des systèmes électroniques. Or, l'augmentation de la complexité des circuits intégrés rend indispensable l'étude du comportement électromagnétique directement au niveau du silicium.
L'objectif de ces travaux est la définition d'une méthodologie de prédiction, avant fonderie, de l'émission conduite des circuits intégrés. Celle-ci s'appuie sur le langage VHDL-AMS et le modèle ICEM (Integrated Circuit Electromagnetic Model), et peut s'intégrer dans un flot de
conception industriel.
/
For many years, taking into account electromagnetic compatibility (EMC) constraints has been a fundamental requirement in electronic system design. However, the increase in complexity of integrated circuits now demands the study of their electromagnetic behavior at chip level.
The objective of this work is the definition of a methodology aimed at predicting conducted emission in integrated circuits. This methodology is based on the VHDL-AMS language and the ICEM (Integrated Circuit Electromagnetic Model) model, and can be integrated into an industrial design flow.
|
3 |
Skener elektromagnetických polí a jeho využití při měření elektromagnetické kompatibility / Electromagnetic field scanner and its utilization in EMC measurementChupáč, Michal January 2013 (has links)
Master’s thesis is focused on making the acquaintance of EMC issues and ways of electromagnetic field scanner RS321 utilization for pre-compliance measurements. First part contains analysis of available equipment’s influence on measurement results on the basis of gathered specification. Next part includes an example measurement used as operational manual for scanner and its controlling program. The most important part is correction evaluation for performed EMI measurement of signal generator using its EMC certification protocol and application of gained correction curve on independent EMI measurement of device tested by EMC testing laboratory. Other possibilities of scanner utilization are mentioned in the next chapters. Last part of the thesis contains suitability evaluation of EMC scanner on the basis of findings from performed measurements.
|
Page generated in 0.0974 seconds