• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 571
  • 328
  • 112
  • 105
  • 78
  • 21
  • 20
  • 16
  • 14
  • 6
  • 6
  • 5
  • 5
  • 5
  • 5
  • Tagged with
  • 1649
  • 207
  • 151
  • 133
  • 131
  • 124
  • 123
  • 104
  • 98
  • 92
  • 88
  • 86
  • 85
  • 81
  • 78
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
441

Atomic Scale Characterization of Point Defects in the Ultra-Wide Band Gap Semiconductor β-Ga2O3

Johnson, Jared M. January 2020 (has links)
No description available.
442

Investigation of defects in n-type 4H-SiC and semi-insulating 6H-SiC using photoluminescence spectroscopy

Chanda, Sashi Kumar 06 August 2005 (has links)
Photoluminescence spectroscopy is one of the most efficient and sensitive non-contact techniques used to investigate defects in SiC. In this work, room temperature photoluminescence mapping is employed to identify different defects that influence material properties. The correlation of the distribution of these defects in n-type 4H-SiC substrates with electronic properties of SiC revealed connection between the deep levels acting as efficient recombination centers and doping in the substrate. Since deep levels are known to act as minority carrier lifetime killers, the obtained knowledge may contribute to our ability to control important characteristics such as minority carrier lifetime in SiC. In semi-insulating (SI) 6H-SiC, the correlation between room temperature infrared photoluminescence maps and the resistivity maps is used to identify deep defects responsible for semi-insulating behavior of the material. Different defects were found to be important in different families of SI SiC substrates, with often more than one type of defect playing a significant role. The obtained knowledge is expected to enhance the yield of SI SiC fabrication and the homogeneity of the resistivity distribution across the area of large SiC substrates.
443

The Role of Abnormal Placentation in Congenital Heart Defects

Courtney, Jennifer A. 28 June 2021 (has links)
No description available.
444

Defect Detection Microscopy

Rogers, Stuart Craig 02 September 2010 (has links) (PDF)
The automotive industry's search for stronger lighter materials has been hampered in its desire to make greater use of Magnesium alloys by their poor formability below 150°C. One current challenge is to identify the complex structure and deformation mechanisms at work and determine which of these are primary contributors to the nucleation of defects. Orientation Imaging Microscopy has been the most accessible tool for microstructural analysis over the past 15 years. However, using OIM to analyze defect nucleation sites requires prior knowledge of where the defects will occur because once the defects nucleate the majority of microstructural information is destroyed. This thesis seeks to contribute to the early detection of nucleation sites via three mechanisms: 1. Detection of cracks that have already nucleated, 2. Detection of surface topography changes that may indicate imminent nucleation and 3. Beam control strategies for efficiently finding areas of interest in a scan. Successive in-situ OIM scans of a consistent sample region while strain is increased, while using the three techniques developed in this thesis, will be employed in future work to provide a powerful defect analysis tool. By analyzing retrieved EBSD patterns we are able to locate defect / crack sites via shadowing on the EBSD patterns. Furthermore, topographical features (and potentially regions of surface roughening) can be detected via changes in intensity metrics and image quality. Topographical gradients are currently only detectable in line with the beam incidence. It is therefore suggested that the tensile specimens to be examined are orientated such that the resulting shear bands occur preferentially to this direction. The ability to refine the scan around these areas of interest has been demonstrated via an off-line adaptive scan routine that is implemented via the custom scan tool. A first attempt at a defect detection framework has been outlined and coded into MATLAB. These tools offer a first step to accessing the information about defect nucleation that researchers are currently seeking.
445

Meshless Dynamic Relaxation Techniques for Simulation Atomic Structures of Materials

Pan, Li 08 1900 (has links)
<p> Traditionally, Molecular Dynamics combined with pair potential functions or the Embedded Atom Method (EAM) is applied to simulate the motion of atoms. When a defect is generated in the crystalline lattice, the equilibrium of atoms around it is destroyed. The atoms move to find a new place where the potential energy in the system is minimum, which could result in a change of the local atomic structure. This thesis introduces a new Dynamic Relaxation algorithm, which is based on explicit Finite Element Analysis, and pair or EAM potential function, to find equilibrium positions of the block of atoms containing different structural defects.</p> <p> The internal force and stiffness at the atoms (nodes) are obtained by the first and second derivatives of the potential energy functions. The convergence criterion is based on the Euclidean norm of internal force being close to zero when the potential energy is minimum. The damping ratio affects the solution path so that different damping ratios could lead to different minimum potential energy and equilibrium shapes. The choice of scaled mass of atoms, proper time step, boundary conditions and damping appropriate for the efficient and stable simulation is studied.</p> <p> A small block of atoms is used to obtain the numerical responses from a hybrid algorithm of potential energy functions and Dynamic Relaxation techniques such as repulsion and attraction in pair potential, minimum configuration, damping effects and different boundary conditions.</p> <p> The simulation using modified Dynamic Relaxation techniques is performed to the real material model with dislocation defect. The results after relaxation are in agreement with the prediction and current Molecular Dynamics simulation. Therefore, Dynamic Relaxation could be an alternative tool for atomistic simulation.</p> / Thesis / Master of Applied Science (MASc)
446

Lattice defects in beta-silicon carbide grown on (001) silicon by CVD

Cheng, Tai-Tsui January 1990 (has links)
No description available.
447

Power And Sample Size Considerations In A Pre-Maturely Terminated Randomized, Double-Mask, Placebo-Controlled, Dose-Response, Phase 2 Study Of The Safety And Efficacy Of Thymosin Beta 4 For The Treatment Of Persistent Corneal Epithelial Defects Resulting

Jeng, Bennie Hau January 2011 (has links)
No description available.
448

COGNITIVE CORRELATES OF PSYCHOSOCIAL OUTCOME IN BIPOLAR DISORDER

WILDER-WILLIS, KELLY ELIZABETH 22 May 2002 (has links)
No description available.
449

FUNCTIONALIZATION OF SINGLE WALL CARBON NANOTUBES USING RF-PLASMA: THE ROLE OF DEFECTS IN SIDEWALL FUNCTIONALIZATION

JAYASINGHE, CHAMINDA 05 October 2007 (has links)
No description available.
450

Supporting Project Tasks, Resources, Documents, and Defects Analysis in Software Project Management

Jaber, Khaled M. 19 September 2016 (has links)
No description available.

Page generated in 0.04 seconds