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Intuitive freeform modeling using subdivision surfaces.January 2005 (has links)
Lai Yuen-hoo. / Thesis submitted in: November 2004. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2005. / Includes bibliographical references (leaves 100-102). / Abstracts in English and Chinese. / Abstract --- p.i / 摘要 --- p.ii / Acknowledgment --- p.iii / List of Figures --- p.iv / Table of Content --- p.vii / Chapter 1. --- Introduction --- p.1 / Chapter 1.1. --- Problem Definition --- p.1 / Chapter 1.2. --- Proposed Solution --- p.2 / Chapter 1.3. --- Thesis Contributions --- p.2 / Chapter 2. --- Modeling Approaches --- p.4 / Chapter 2.1. --- Polygon Modeling --- p.4 / Chapter 2.2. --- Patch Modeling --- p.6 / Chapter 2.3. --- Freehand Sketch-based Modeling --- p.7 / Chapter 2.4. --- Template Based Modeling --- p.8 / Chapter 2.5. --- Curve Interpolation Method --- p.9 / Chapter 3. --- Surface Operations --- p.11 / Chapter 3.1. --- Surface Blending --- p.11 / Chapter 3.2. --- Surface Trimming --- p.13 / Chapter 3.3. --- Boolean Operations --- p.14 / Chapter 4. --- Subdivision Surface --- p.16 / Chapter 4.1. --- Basic Principle --- p.16 / Chapter 4.2. --- Catmull-Clark Surface --- p.17 / Chapter 5. --- Modeling Algorithm Overview --- p.21 / Chapter 6. --- Subdivision Surface Generation --- p.23 / Chapter 6.1. --- Input Curves --- p.23 / Chapter 6.2. --- Surface Sweeping --- p.24 / Chapter 6.3. --- Subdivision Surface Fitting --- p.29 / Chapter 7. --- Surface Blending --- p.32 / Chapter 7.1. --- Introduction --- p.32 / Chapter 7.2. --- Problem Definition --- p.32 / Chapter 7.3. --- Algorithm Overview --- p.36 / Chapter 7.4. --- Blend Region Detection --- p.39 / Chapter 7.4.1. --- Collision Detection --- p.40 / Chapter 7.4.2. --- Result and Analysis --- p.42 / Chapter 7.5. --- "Mesh Refinement, Surface Fitting and Region Removal" --- p.46 / Chapter 7.5.1. --- Mesh Refinement --- p.46 / Chapter 7.5.1.1. --- Adaptive Subdivision --- p.46 / Chapter 7.5.1.2. --- Additional Subdivision Constraint --- p.47 / Chapter 7.5.2. --- Surface Fitting --- p.49 / Chapter 7.5.2.1. --- General Approach --- p.49 / Chapter 7.5.2.2. --- Surface Point Correspondence --- p.50 / Chapter 7.5.2.3. --- Numerical Fitting Method --- p.51 / Chapter 7.5.3. --- Unwanted Region Removal --- p.55 / Chapter 7.5.4. --- Result and Analysis --- p.56 / Chapter 7.6. --- Boundary Smoothing --- p.58 / Chapter 7.6.1. --- General Approach --- p.59 / Chapter 7.6.2. --- Constraint on Deformation Direction of Vertex --- p.61 / Chapter 7.6.3. --- Result and Analysis --- p.63 / Chapter 7.7. --- Blend Curves --- p.65 / Chapter 7.7.1. --- Problem Definition --- p.65 / Chapter 7.7.2. --- Proposed Solution Overview --- p.66 / Chapter 7.7.3. --- Maintenance of Regular Vertex Valence along Blend Curve --- p.67 / Chapter 7.7.3.1. --- Pairing Up Blend Boundary Vertices --- p.70 / Chapter 7.7.4. --- Minimization of Distortion Caused by Extraordinary Vertices --- p.72 / Chapter 7.7.5. --- Blend Vertex Position Optimization Function --- p.74 / Chapter 7.7.5.1. --- Face Normal Expression --- p.74 / Chapter 7.7.5.2. --- Face Normal Difference Energy Function --- p.77 / Chapter 7.7.5.3. --- Midpoint Distance Energy Function --- p.78 / Chapter 7.7.5.4. --- Weighted Least Square Energy Minimization --- p.78 / Chapter 8. --- Implementation --- p.81 / Chapter 8.1. --- Data Structure --- p.81 / Chapter 8.2. --- User Interface --- p.82 / Chapter 9. --- Results --- p.83 / Chapter 9.1. --- Surface Generation --- p.83 / Chapter 9.2. --- Surface Blending --- p.86 / Chapter 9.2.1. --- Ideal Case --- p.86 / Chapter 9.2.2. --- Angle of Insertion --- p.87 / Chapter 9.2.3. --- Surface Feature Near Intersection --- p.88 / Chapter 9.2.4. --- Comparison --- p.89 / Chapter 9.2.5. --- Other Examples --- p.92 / Chapter 9.3. --- Overall Performance --- p.94 / Chapter 9.4. --- Limitations --- p.97 / Chapter 9.4.1. --- Limitation on Generated Shape --- p.97 / Chapter 9.4.2. --- Limitation on Input Surfaces --- p.98 / Chapter 10. --- Conclusion and Future Work --- p.99 / References --- p.100
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Static space charge in evaporated ZnS:Mn alternating-current thin-film electroluminescent devicesHitt, John C. 15 August 1997 (has links)
Graduation date: 1998
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Electro-optic characterization of SrS-based alternating current thin-film electroluminescent devicesNevers, Corey A. 30 April 1999 (has links)
Two methods of electro-optically characterizing alternating-current thin-film electroluminescent
(ACTFEL) devices are investigated: photo-induced transferred charge
(PIQ) and luminescence (PIL), and subthreshold voltage-induced transferred charge (VIQ)
techniques. Both techniques provide information related to traps within the phosphor
layer. PIQ/PIL experiments monitor the transport of electrons and holes across the phosphor
layer which are photo-injected by a UV laser pulse. VIQ experiments monitor the
optical reset of traps ionized by bipolar subthreshold voltage pulses.
PIQ/PIL experiments are performed on three different SrS ACTFEL devices: ALE-deposited
SrS:Ce, sputter-deposited SrS:Cu, and undoped MOCVD-deposited SrS. From
the PIQ/PIL experiments, two distinct electron thresholds in the luminescent impurity
doped samples at ~0.8 (weak threshold) and ~1.2 MV/cm (strong threshold) are observed.
These thresholds are independent of the phosphor thickness, indicating that they
arise from a bulk property of the phosphor. The ~0.8 MV/cm weak threshold is attributed
to field emission of relatively shallow (~0.6 eV) electron-emitting bulk traps (e.g. cerium
or oxygen for SrS:Ce; a sulfur vacancy or oxygen for SrS:Cu). The ~1.2 MV/cm strong
threshold is ascribed to the onset of trap-to-band impact ionization. In contrast to electron
transport, PIQ/PIL studies reveal no hole transport in SrS doped with luminescent
impurities, although hole transport is observed for an undoped SrS ACTFEL device. The
lack of hole transport is attributed to the efficiency of hole capture in SrS doped with
luminescent impurities.
VIQ experiments are performed on the same SrS ACTFEL devices. VIQ trap energy
depths are estimated as ~0.1 eV for SrS:Ce; ~0.9 eV for SrS:Cu (with a capture cross-section
of ,~10�������cm��), and ~0.6 eV for undoped SrS. Tenative atomic identification of
traps responsible for these VIQ trends are: chlorine or a Ce shallow donor state for
SrS:Ce, a sulfur vacancy for SrS:Cu, and a sulfur vacancy or an oxygen isoelectronic trap
for undoped SrS. / Graduation date: 2000
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Sine burst waveform aging and electro-optic characterization of ALE ZnS:Mn ACTFEL devices for head-mounted active matrix displaysMendes, James Kevin 07 March 1997 (has links)
Graduation date: 1997
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Impact excitation efficiency in AC-driven thin-film electroluminescent devicesPeter, Manuela 08 February 1996 (has links)
Graduation date: 1996
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Characterization of alternating-current thin-film SrS:Ce electroluminescent devicesThuemler, Robert L. 28 May 1997 (has links)
Graduation date: 1998
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Development and characterization of AlInN as an alternating-current thin-film electroluminescent display phosphorMueller, Matthew R. 08 September 1994 (has links)
Graduation date: 1995
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Comparing 2D and 3D direct manipulation interfaces /Teather, Robert J. January 2008 (has links)
Thesis (M.Sc.)--York University, 2008. Graduate Programme in Computer Science. / Typescript. Includes bibliographical references (leaves 95-101). Also available on the Internet. MODE OF ACCESS via web browser by entering the following URL: http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&res_dat=xri:pqdiss&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&rft_dat=xri:pqdiss:MR38834
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Recursive parameter identification for estimating and displaying maneuvering vessel path /Pollard, Stephen J. January 2003 (has links) (PDF)
Thesis (M.S. in Electrical Engineering)--Naval Postgraduate School, December 2003. / Thesis advisor(s): Roberto Cristi, Fotis A. Papoulias. Includes bibliographical references (p. 155). Also available online.
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AN EVALUATION AND COMPARISON OF SEVERAL MEASURES OF IMAGE QUALITY FOR TELEVISION DISPLAYTask, Harry Lee January 1978 (has links)
No description available.
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