This thesis provides a compendium for the use of microcontact printing in fabricating electrical devices. Work has been undertaken to examine the use of soft lithographic techniques for employment in electronic manufacture. This thesis focusses on the use of high electric field generators as a means to producing electroluminescent devices. These devices provide a quantifiable output in the form of light. Analysis of the electrical performance of electrode structures can be determined by their success at producing light. A prospective reduction in driving voltage would deem these devices more efficient, longer lasting and an improvement on current specification. The work focussed on the viability of using relatively crude print techniques to create high resolution structures. This was carried out successfully and demonstrated that lighting structures of 75 μm and 25 μm have been produced. Microcontact printing has been established as a method for patterning gold surfaces with a functionalising self-assembled monolayer using alkanethiol molecules. This layer is then utilised as an etch resist layer to expose gold tracks for use as electric field generator electrode arrays. Through careful analysis of each step of the printing process, techniques were developed and reported to create a robust and repeatable print mechanism for reliability and accuracy. These techniques were employed to optimise the print process culminating in the development of each stage and final electrode structures mounted on a rigid backplate for use as electroluminescent devices for characterisation. These devices were then modelled for their electrical characteristics and investigated for being used in low voltage application. In this case for the development of electroluminescent applications, a driving voltage of 65 V was achieved and represents a significant advance to the field of printed electronics and Electroluminescence.

Metal and oxide interactions are of broad scientific and technological interest in areas such as heterogeneous catalysis, microelectronics, composite materials, and corrosion. In the real world, such interactions are often complicated by the presence of interfacial impurities and/or high electric fields that may change the thermodynamic and kinetic behaviors of the metal/oxide interfaces. This research includes: (1) the surface hydroxylation effects on the aluminum oxide interactions with copper adlayers, and (2) effects of high electric fields on the interface of thin aluminum oxide films and Ni3Al substrate. X-ray photoelectron spectroscopy (XPS) studies and first principles calculations have been carried out to compare copper adsorption on heavily hydroxylated a- Al2O3(0001) with dehydroxylated surfaces produced by Argon ion sputtering followed by annealing in oxygen. For a heavily hydroxylated surface with OH coverage of 0.47 monolayer (ML), sputter deposition of copper at 300 K results in a maximum Cu(I) coverage of ~0.35 ML, in agreement with theoretical predictions. Maximum Cu(I) coverage at 300 K decreases with decreasing surface hydroxylation. Exposure of a partially dehydroxylated a-Al2O3(0001) surface to either air or 2 Torr water vapor results in recovery of surface hydroxylation, which in turn increases the maximum Cu(I) coverage. The ability of surface hydroxyl groups to enhance copper binding suggests a reason for contradictory experimental results reported in the literature for copper wetting of aluminum oxide. Scanning tunneling microscopy (STM) was used to study the high electric field effects on thermally grown ultrathin Al2O3 and the interface of Al2O3 and Ni3Al substrate. Under STM induced high electric fields, dielectric breakdown of thin Al2O3 occurs at 12.3 } 1.0 MV/cm. At lower electric fields, small voids that are 2-8 A deep are initiated at the oxide/metal interface and grow wider and deeper into the metal substrate, which eventually leads to either physical collapse or dielectric breakdown of the oxide film on top.

A slab-coupled optical fiber sensor (SCOS) falls into a narrow class of all-dielectric optical fiber electric field sensors, which makes it a perfect candidate for measurements of high electric fields in environments where presence of conductors is highly perturbing to the system under test. Its nonlinear response to high fields requires a new nonlinear calibration technique. A nonlinear calibration method is explained and demonstrated to successfully measure high electric fields, as well as high voltages with dynamic range up to 50 dB. Furthermore, a SCOS can be fitted into narrow spaces and make highly localized measurements due to its small size. This allows a SCOS to be integrated inside a standard high voltage coaxial cable, such as RG-218. Effects of partial discharge and arcing is minimized by development of a fabrication method to avoid introduction of impurities, especially air-bubbles, into the cable during SCOS insertion. Low perturbation of the measured voltage is shown by simulating the introduced voltage reflections to be on the order of –50 dB. It is also shown that a SCOS can be inserted into other cables without significant perturbation to the voltage. A complete high voltage and high electric field measurement system is built based on the high-voltage modifications of the SCOS technology. The coaxial SCOS is enhanced for robustness. Enhancements include packaging a SCOS into stronger ceramic trough, strengthening the fiber with kevlar reinforced furcation tubing and protecting the sensor with metal braces and protective shells. The interrogator is protected from electromagnetic interference with an RF-shielded box. Reduction in power losses introduced by the new PANDA-SCOS technology allows interrogator bandwidths to be increased up to 1.2 GHz. The whole measurement process is streamlined with dedicated software, developed specifically for high voltage and electric field measurements with support for the nonlinear calibration.

A slab-coupled optical fiber sensor (SCOS) falls into a narrow class of all-dielectric optical fiber electric field sensors, which makes it a perfect candidate for measurements of high electric fields in environments where presence of conductors is highly perturbing to the system under test. Its nonlinear response to high fields requires a new nonlinear calibration technique. A nonlinear calibration method is explained and demonstrated to successfully measure high electric fields, as well as high voltages with dynamic range up to 50 dB. Furthermore, a SCOS can be fitted into narrow spaces and make highly localized measurements due to its small size. This allows a SCOS to be integrated inside a standard high voltage coaxial cable, such as RG-218. Effects of partial discharge and arcing is minimized by development of a fabrication method to avoid introduction of impurities, especially air-bubbles, into the cable during SCOS insertion. Low perturbation of the measured voltage is shown by simulating the introduced voltage reflections to be on the order of −50 dB. It is also shown that a SCOS can be inserted into other cables without significant perturbation to the voltage.A complete high voltage and high electric field measurement system is built based on the high-voltage modifications of the SCOS technology. The coaxial SCOS is enhanced for robustness. Enhancements include packaging a SCOS into stronger ceramic trough, strengthening the fiber with kevlar reinforced furcation tubing and protecting the sensor with metal braces and protective shells. The interrogator is protected from electromagnetic interference with an RF-shielded box. Reduction in power losses introduced by the new PANDA-SCOS technology allows interrogator bandwidths to be increased up to 1.2 GHz. The whole measurement process is streamlined with dedicated software, developed specifically for high voltage and electric field measurements with support for the nonlinear calibration.

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