171 |
Detailed routing algorithms for VLSI circuits /Tseng, Hsiao-Ping. January 1997 (has links)
Thesis (Ph. D.)--University of Washington, 1997. / Vita. Includes bibliographical references (p. [159]-170).
|
172 |
Modeling leakage in sub-micron CMOS technologies /Mortazavi, Behnaz. January 1900 (has links)
Project (M.Eng.) - Simon Fraser University, 2004. / Theses (School of Engineering Science) / Simon Fraser University.
|
173 |
Determination of the existence or non-existence of low-intensity reciprocity law failure in Kodak micro positive resist 809 /Middel, Jutta C. January 1984 (has links)
Thesis (B.S.)--Rochester Institute of Technology, 1984. / Typescript. Includes bibliographical references (leaves 29-30).
|
174 |
A test chip approach to routine process control /Meisenzahl, Eric J. January 1988 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1988. / Typescript. Includes bibliographical references (leaves 100-103).
|
175 |
Design and characterisation of a ferroelectric liquid crystal over silicon spatial light modulator /Burns, Dwayne C. Unknown Date (has links)
Thesis (Ph.D.) --University of Edinburgh, 1995.
|
176 |
Atomic layer deposition and properties of refractory transition metal-based copper-diffusion barriers for ULSI interconnectLemonds, Andrew Michael, Ekerdt, John G., White, John M., January 2003 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2003. / Supervisors: J. G. Ekerdt and J. M. White. Vita. Includes bibliographical references. Available also from UMI Company.
|
177 |
Leakage power modeling and reduction techniques for nanometer scale VLSI circuits /Au, Yi-ching. January 2004 (has links)
Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2004. / Includes bibliographical references (leaves 59-61). Also available in electronic version. Access restricted to campus users.
|
178 |
Deposition and characterization of thin films for applications in ULSI fabricationWang, Qi, White, John M., January 2004 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: John Michael White. Vita. Includes bibliographical references.
|
179 |
Electromigration critical length effect and early failures in Cu/oxide and Cu/low k interconnectsLee, Ki-don. January 2003 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2003. / Vita. Includes bibliographical references. Available also from UMI Company.
|
180 |
Fundamental algorithms for physical design planning of VLSITang, Xiaoping. January 2002 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
|
Page generated in 0.4242 seconds