Not available

A reflection retarder is a device that induces a change in the phase between the parallel and perpendicular components, of the electric field, to the plane of incidence while maintaining the relative amplitudes. A film-substrate reflection retarder is a reflection retarder that only consists of a film-substrate system. Film-substrate reflection retarders have been previously studied in the negative, zero, and positive systems. The type of system is determined by the relationship between the refractive index of the ambient N0, film N1, and substrate N2: if N1<(N0*N2)^(1/2) , the system is negative; if N1=(N0*N2)^(1/2), the system is zero; if N1>(N0*N2)^(1/2), the system is positive. It has been determined that is the condition required to achieve reflection retarders, in general. Angle-of-incidence tunable (AIT) retarder designs have not been investigated for the zero system, but have been studied in the negative system. An exact retarder in the zero system only exists at a single angle of incidence and a corresponding single film thickness. By approximating the retarder condition to allow the relative amplitudes to be within 5% of the exact value of unity, it is possible to realize unique AIT retarders in the zero system: retarders that can be operated over a continuous range of angles of incidence resulting in a large range of phase shifts approaching 360°. It is possible to have multiple angles of incidence with a difference of between their respective phase shifts. By inducing a phase shift of, it is possible to modulate the polarization of light. By employing an approximation of the retarder condition, AIT retarder designs were developed. The design’s tolerance to changes in design parameters is analyzed and discussed.

Thesis (Ph. D.)--University of Texas at Austin, 2007. / Vita. Includes bibliographical references.

Thesis (Ph.D.) - Carleton University, 2007. / Includes bibliographical references (p. 194-201). Also available in electronic format on the Internet.

CAPES / Com o avanço da miniaturização de componentes e dispositivos eletrônicos ocorrida nos últimos anos, a utilização de materiais dielétricos e a necessidade de informações precisas sobre o comportamento dielétrico apresentado por estes materiais aumentou consideravelmente. Neste trabalho é apresentado inicialmente as motivações para o estudo do comportamento dielétrico e da modelagem da função resposta dielétrica. A partir da teoria proposta por Debye e identificando suas peculiaridades, são exploradas algumas extensões deste modelo e analisada a interpretação da função resposta proposta por estes. Muitos modelos assumiam a existência de múltiplas interações envolvendo os dipolos com o meio dielétrico, as quais contribuíam para a dinâmica do comportamento dielétrico, somente mais tarde é que estas múltiplas interações ganharam uma conexão entre a resposta dielétrica observada com as propriedades intrínsecas do material. Por meio do modelo proposto por Dissado e Hill e assumindo dados experimentais disponíveis na literatura para alguns materiais, foi testada a validade da função resposta resultante do modelo, na qual veri cou-se a capacidade da mesma em ajustar as curvas para as componentes real e imaginária da permissividade para uma grande variedade de materiais dielétricos. A partir das simulações e análises realizadas, ficou evidente a dependência do comportamento dielétrico com a temperatura, fato este que deverá ser abordado em trabalhos futuros. / With the improvement of miniaturization of electronic components and devices occurred in recent years, the use of dielectric materials and the need for accurate information about the dielectric behavior displayed by these materials has increased considerably. In this work is initially presented the motivations for the study of dielectric behavior and the modeling of the dielectric response function. From the theory proposed by Debye and identifying its peculiarities, are exploited some extensions of this model and analyzed the interpretation of response function proposed by these. Many models used to assume the existence of multiple interactions involving the dipoles with the dielectric medium, which contributed to the dynamics of the dielectric behavior, only later the multiple interactions won a connection between the dielectric response observed with the intrinsic properties of the materials. Through the model proposed by Dissado and Hill and assuming experimental data available in bibliography for some materials, was tested the validity of the response function resulting from the model, in which was veri ed the ability of the same to adjust the curves for the real and imaginary components of permittivity to a wide variety of dielectric materials. From the simulations and analyzes performed, was evident the dependence of dielectric behavior with temperature, a fact that should be discussed in future works.

A proposta deste estudo in vitro foi otimizar o método microbiológico para a produção de lesão de mancha branca em esmalte que possa ser validada por ensaio não destrutivo (tomografia por coerência óptica - OCT) para possibilitar a utilização posterior dos espécimes em outros experimentos. Foram obtidos 168 fragmentos retangulares de esmalte bovino com janelas centrais de desmineralização de 3,0 x 3,0 mm. Os grupos experimentais foram compostos a partir de 3 fatores de variação: microrganismo (S. mutans UA 159, S. sobrinus 3347 e S. mutans + S. sobrinus), fonte de carboidrato (sacarose 1% e sacarose 1% + amido 1%) e tempo (1, 2, 3, 4, 5, 6 e 7 dias). Assim, formaram-se seis grupos experimentais: G1 (S. mutans + sacarose), G2 (S. mutans + sacarose + amido), G3 (S. sobrinus + sacarose), G4 (S. sobrinus + sacarose + amido), G5 (S. mutans + S. sobrinus + sacarose), G6 (S. mutans + S. sobrinus + sacarose + amido), testados em 7 tempos de desafio cariogênico. Terminada esta etapa, foram obtidas imagens em escala de cada espécime pelo OCT, e em seguida os espécimes foram processados e submetidos à análise através de microscópio de luz polarizada. Em cada um dos métodos, foram realizadas 5 mensurações de profundidade da região desmineralizada. O teste estatístico de Análise de Variância (ANOVA) (p<0.05) detectou que os desafios cariogênicos testados foram capazes de desmineralizar o esmalte em profundidade, sendo influenciados pelo tipo de microrganismo, fonte de carboidrato e tempo (p=0,000). O Teste de Correlação de Pearson apresentou uma correlação significativa (p=0,000) entre as medidas de profundidade de desmineralização aferidas através dos métodos de luz polarizada e OCT. Logo, a tomografia por coerência óptica é um método não destrutivo válido para aferir a profundidade de desmineralização de lesões de mancha branca, que pode ser muito útil quando se objetiva obter substrato desmineralizado padronizado para estudos laboratoriais. Concluiu-se ainda que o desafio cariogênico realizado com microrganismo S. mutans UA 159, suplementado com sacarose como fonte de carboidrato por 6 dias, é capaz de produzir mancha branca de esmalte padronizada. Desta maneira, seria obtido um substrato modificado relevante para estudos laboratoriais. / The aim of this in vitro study was to optimize the microbiological method for the production of white spot lesions in enamel that can be validated by non-destructive test (optical coherence tomography - OCT) to enable the subsequent use of the specimens in other experiments. A hundred and sixty eight bovine enamel fragments with central windows of demineralization measuring 3,0 x 3,0 mm were obtained. The experimental groups were composed from three variation factors: the microorganism (S. mutans UA 159, S. sobrinus 3347 and S. mutans + S. sobrinus), carbohydrate source (1% sucrose and 1% sucrose + 1% starch) and time (1, 2, 3, 4, 5, 6 and 7 days). Thus, six experimental groups were formed: G1 (S. mutans + sucrose), G2 (S. mutans + starch + sucrose), G3 (S. sobrinus + sucrose), G4 (S. sobrinus + starch + sucrose), G5 (S. mutans + S. sobrinus + sucrose), G6 (S. mutans + S. sobrinus + sucrose + starch) tested in 7 periods of cariogenic challenge. After this step, images in scale were obtained from each specimen with OCT, and then the specimens were processed and analysed by polarized light microscopy. In each of the methods were performed 5 measurements of demineralization depth. The statistical test Analysis of Variance (ANOVA) (p<0.05) detected that the cariogenic challenges tested were able to demineralize enamel in depth, regardless of the type of microorganism, carbohydrate source and time (p=0,000). The Pearson\'s Correlation Test showed a significant correlation (p=0,000) between the measurements of depth demineralization measured with polarized light microscopy and OCT. Therefore, the optical coherence tomography is a non-destructive method valid to measure the depth of demineralization of white spot lesions, which can be very useful when the objective is to obtain standard demineralized substrate for laboratory studies. It was also concluded that the cariogenic challenge performed with the microorganism Streptococcus mutans UA159, supplemented with sucrose as carbohydrate source for 6 days, is capable to produce standard white spot lesions in enamel. In this way, a modified substract relevant for laboratory studies could be obtained.

A proposta deste estudo in vitro foi otimizar o método microbiológico para a produção de lesão de mancha branca em esmalte que possa ser validada por ensaio não destrutivo (tomografia por coerência óptica - OCT) para possibilitar a utilização posterior dos espécimes em outros experimentos. Foram obtidos 168 fragmentos retangulares de esmalte bovino com janelas centrais de desmineralização de 3,0 x 3,0 mm. Os grupos experimentais foram compostos a partir de 3 fatores de variação: microrganismo (S. mutans UA 159, S. sobrinus 3347 e S. mutans + S. sobrinus), fonte de carboidrato (sacarose 1% e sacarose 1% + amido 1%) e tempo (1, 2, 3, 4, 5, 6 e 7 dias). Assim, formaram-se seis grupos experimentais: G1 (S. mutans + sacarose), G2 (S. mutans + sacarose + amido), G3 (S. sobrinus + sacarose), G4 (S. sobrinus + sacarose + amido), G5 (S. mutans + S. sobrinus + sacarose), G6 (S. mutans + S. sobrinus + sacarose + amido), testados em 7 tempos de desafio cariogênico. Terminada esta etapa, foram obtidas imagens em escala de cada espécime pelo OCT, e em seguida os espécimes foram processados e submetidos à análise através de microscópio de luz polarizada. Em cada um dos métodos, foram realizadas 5 mensurações de profundidade da região desmineralizada. O teste estatístico de Análise de Variância (ANOVA) (p<0.05) detectou que os desafios cariogênicos testados foram capazes de desmineralizar o esmalte em profundidade, sendo influenciados pelo tipo de microrganismo, fonte de carboidrato e tempo (p=0,000). O Teste de Correlação de Pearson apresentou uma correlação significativa (p=0,000) entre as medidas de profundidade de desmineralização aferidas através dos métodos de luz polarizada e OCT. Logo, a tomografia por coerência óptica é um método não destrutivo válido para aferir a profundidade de desmineralização de lesões de mancha branca, que pode ser muito útil quando se objetiva obter substrato desmineralizado padronizado para estudos laboratoriais. Concluiu-se ainda que o desafio cariogênico realizado com microrganismo S. mutans UA 159, suplementado com sacarose como fonte de carboidrato por 6 dias, é capaz de produzir mancha branca de esmalte padronizada. Desta maneira, seria obtido um substrato modificado relevante para estudos laboratoriais. / The aim of this in vitro study was to optimize the microbiological method for the production of white spot lesions in enamel that can be validated by non-destructive test (optical coherence tomography - OCT) to enable the subsequent use of the specimens in other experiments. A hundred and sixty eight bovine enamel fragments with central windows of demineralization measuring 3,0 x 3,0 mm were obtained. The experimental groups were composed from three variation factors: the microorganism (S. mutans UA 159, S. sobrinus 3347 and S. mutans + S. sobrinus), carbohydrate source (1% sucrose and 1% sucrose + 1% starch) and time (1, 2, 3, 4, 5, 6 and 7 days). Thus, six experimental groups were formed: G1 (S. mutans + sucrose), G2 (S. mutans + starch + sucrose), G3 (S. sobrinus + sucrose), G4 (S. sobrinus + starch + sucrose), G5 (S. mutans + S. sobrinus + sucrose), G6 (S. mutans + S. sobrinus + sucrose + starch) tested in 7 periods of cariogenic challenge. After this step, images in scale were obtained from each specimen with OCT, and then the specimens were processed and analysed by polarized light microscopy. In each of the methods were performed 5 measurements of demineralization depth. The statistical test Analysis of Variance (ANOVA) (p<0.05) detected that the cariogenic challenges tested were able to demineralize enamel in depth, regardless of the type of microorganism, carbohydrate source and time (p=0,000). The Pearson\'s Correlation Test showed a significant correlation (p=0,000) between the measurements of depth demineralization measured with polarized light microscopy and OCT. Therefore, the optical coherence tomography is a non-destructive method valid to measure the depth of demineralization of white spot lesions, which can be very useful when the objective is to obtain standard demineralized substrate for laboratory studies. It was also concluded that the cariogenic challenge performed with the microorganism Streptococcus mutans UA159, supplemented with sucrose as carbohydrate source for 6 days, is capable to produce standard white spot lesions in enamel. In this way, a modified substract relevant for laboratory studies could be obtained.

A complete all-optical-processing polarization-based binary-logic system, by which any logic gate or processor could be implemented, was proposed. Following the new polarization-based representation, a new Orthoparallel processing technique that allows for the creation of all-optical-processing gates that produce a unique output once in a truth table, was developed. This representation allows for the implementation of all basic 16 logic gates, including the NAND and NOR gates that can be used independently to represent any Boolean expression or function. In addition, the concept of a generalized gate is presented, which opens the door for reconfigurable optical processors and programmable optical logic gates. The gates can be cascaded, where the information is always on the laser beam. The polarization of the beam, and not its intensity, carries the information. The new methodology allows for the creation of multiple-input-multiple-output processors that implement, by itself, any Boolean function, such as specialized or non-specialized microprocessors. The Rail Road (RR) architecture for polarization optical processors (POP) is presented. All the control inputs are applied simultaneously, leading to a single time lag, which leads to a very-fast and glitch-immune POP. A simple and easy-to-follow step-by-step design algorithm is provided for the POP, and design reduction methodologies are discussed. The algorithm lends itself systematically to software programming and computer-assisted design. A completely passive optical switch was also proposed. The switch is used to design completely passive optical gates, including the NAND gate, with their operational speeds only bound by the input beams prorogation delay. The design is used to demonstrate various circuits including the RS latch. Experimental data is reported for the NAND and the Universal gate operating with different functionality. A minute error is recorded in different cases, which can be easily eliminated by a more dedicated manufacturing process. Finally, some field applications are discussed and a comparison between all proposed systems and the current semiconductor devices is conducted based on multiple factors, including, speed, lag, and heat generation.

The present work aims at enhancing the external quantum efficiencies of ultra-violet (UV) sensitive photodetectors (PDs) and light emitting diodes (LEDs)for any light polarization. Deep UV solid state devices are made out of AlGaN or MgZnO and their performances suffer from the high resistivity of their p-doped regions. They require transparent p-contacts; yet the most commonly used transparent contacts have low transmission in the UV: indium tin oxide (ITO) and nickel-gold (Ni/Au 5/5 nms) transmit less than 50% and 30% respectively at 300 nm. Here we investigate the use of surface plasmons (SPs) to design transparent p-contacts for AlGaN devices in the deep UV region of the spectrum. The appeal of using surface plasmon coupling arose from the local electromagnetic field enhancement near the metal surface as well as the increase in interaction time between the field and semiconductor if placed on top of a semiconductor. An in/out-coupling mechanism is achieved by using a grating consisting of two perpendicularly oriented sets of parallel aluminum lines with periods as low as 250 nm. The incident light is first coupled into SPs at the air/aluminum interface which then re-radiate at the aluminum/AlGaN interface and the photons energy is transferred to SP polaritons (SPPs) and back to photons. High transmission can be achieved not only at normal incidence but for a wider range of incident angles. iv A finite difference time domain (FDTD) package from R-Soft was used to simulate and design such aluminum gratings with transparency as high as 100% with tunable peak wavelength, bandwidth and angular acceptance. A rigorous coupled wave analysis (RCWA) was developed in Matlab to validate the FDTD results. The high UV transparency meshes were then fabricated using an e-beam assisted lithography lift-off process. Their electrical and optical properties were investigated. The electrical characterization was very encouraging; the sheet resistances of these meshes were lower than those of the conventionally used transparent contacts. The optical transmissions were lower than expected and the causes for the lower measurements have been investigated. The aluminum oxidation, the large metal grain size and the line edge roughness were identified as the main factors of inconsistency and solutions are proposed to improve these shortcomings. The effect of aluminum oxidation was calculated and the passivation of aluminum with SiO2 was evaluated as a solution. A cold deposition of aluminum reduced the aluminum grain size from 60 nm to 20 nm and the roughness from 5 nm to 0.5 nm. Furthermore, replacing the conventional lift-off process by a dry back-etch process led to much smoother metal line edges and much high optical transparency. The optical measurements were consistent with the simulations. Therefore, reduced roughness and smooth metal line edges were found to be especially critical considerations for deep UV application of the meshes.