Master’s thesis in the theoretical part analyses the heating factor (Q), which has significant share on quality of a solder joint. The practical part describes the design and production of test PCB and setting temperature profiles, SMD resistors soldering by using BiSn solder paste. Shear tests of SMD solder joints were realised and evaluated including isothermal ageing samples. At the end of master’s thesis solder joints visual aspects and defects were evaluated, measurement thickness of intermetallic compound by not only optical microscope but also SEM, discussion about results and Q was evaluated.

This thesis deals with the design and implementation of a device for measuring pull strength by surface mounted devices (SMD). It analyzes the theory of pull strength testing of solder joints with emphasis on standard IEC 62137-1-3 and describes the selection of components utilized to create mechanical construction and electrical parts. These electronic parts made or innovated in this work were control system based on microcontroler Atmega164P, power circuit for stepper motor and communication of measure equipment TEST 321 with PC. The whole design is complemented by simulation of mechanical stress to the critical components using ANSYS. The conclusion summarizes the most important parameters of this equipment.

This thesis focuses on soldering technology in microelectronics. It describes in detail the basic ways of soldering and repairs in electronics. This piece of work shows the principles of technological equipment for bulk soldering and used repairing devices. In the theoretical part of this work there are also briefly described the packages for integrated circuits that were used in the practical part of the thesis. The practical part of the thesis deals with setting of the heat profiles for hot air repair station Fritsch Mikroplacer for LQFP64, SOIC16, TSSOP14, QFN16 and DSBGA5 packages. The heat profiles for assembly and disassembly of the particular types of the packages on designed and manufactured test printed circuit board were set and tested. The resulting heat profiles are compared with the recommended heat profile of an ordinary solder paste SnAg3Cu0,5 which was used for the test. This thesis can serve as an aid for the further settings of heat profiles in other types of packages not only on Fritsch Mikroplacer devices, but also on other repairing devices of this type.

This thesis examines the inuence of nitrogen atmosphere on the quality of the solder joint lead-free solder paste. For the solder paste were measured and set temperature proles. Thesis includes the implementation and measurement of samples in a protective nitrogen atmosphere and without a protective atmosphere. These measurements are compared, and the conclusions were drawn for the inuence of nitrogen atmosphere. The reliability and the quality of the soldered joints were investigated.

This thesis deals with novel trends in solder paste technology. It focuses on nanoparticle applications used as a tool for improving a state of the art lead free solder alloys. The recently published results about the impact of different types of nanoparticles on properties of newly-emerged nanocomposite solders are discussed and summarized in the thesis. Preparation, practical application and testing of new solder paste based on low temperature SnBi alloy with an admixture of titanium dioxide are also discussed. Finally, properties of solder joints using these solder pastes are investigated and the results are evaluated.

Cette thèse vise à réaliser des développements théoriques et numériques portant sur le comportement en cyclage thermomécanique de nouveaux alliages de brasure. L’objectif est de proposer une méthodologie de simulation de la fatigue des assemblages électroniques intégrant ce type de brasures. De nombreux modèles semi-empiriques de fatigue existent déjà mais ont montré leurs limites pour une prédiction suffisamment précise de la fiabilité. Il existe donc un besoin d’enrichir les approches existantes par une description des mécanismes de défaillance à l’échelle mésoscopique, en prenant en compte la microstructure fine de l’alliage d’étain. Une formulation décrivant la plasticité cristalline de l’étain et l’endommagement aux joints de grains a donc été développée et intégrée dans un code de calcul pour simuler les mécanismes de déformation dans le joint de brasure. / This thesis aims to carry out theoretical and numerical developments on the thermo-mechanical cyclic behavior of new solder alloys. The objective is to propose a methodology for modeling the fatigue of electronic packages including this type of solders. Several semi-empirical fatigue models already exist, but have shown their limitations for an accurate sufficiently prediction of reliability. Therefore, it requires to enrich the existing approaches by a description of failure mechanisms in the mesoscopic scale, taking into account the fine microstructure of the alloy of tin. A formulation describing the crystal plasticity of tin and the damage of grain boundaries has therefore been developed and integrated in the finite element code for simulating the fracture mechanisms of solder joint.

L’analyse de la durée de vie des joints brasés est un challenge pour les industries du spatiale, de l’aéronautique et de la défense qui ont besoin d’équipements très fiables pour des environnements sévères et de longues durées de vie. L’évolution des technologies de boitier électronique, principalement conduite par les marchés civils, introduit de nouvelles architectures et de nouveaux matériaux dont la fiabilité doit être étudiée pour les exigences de ces marchés critiques. Un des éléments critiques d’une carte électronique est l’interconnexion effectué par le joint brasé. Dans ce contexte, les connaissances des propriétés de fatigue des matériaux utilisés pour le joint brasé sont nécessaires pour développer des cartes électroniques, définir les essais accélérés de qualification ou pour réaliser des simulations de durée de vie.Les lois utilisées communément dans l’industrie sont généralement des critères simplifiés comme les lois de Coffin-Manson, basée sur la déformation inélastique, ou Morrow, basée sur l’énergie dissipée. Les déformations plastique et visqueuse sont dans ces lois indissociées et appelées déformation inélastique, supposant que les contributions au dommage des déformations plastique et visqueuse sont similaires. Cependant, la pertinence de ces lois dans le cas du matériau joint brasé et les profils de mission des marchés critiques doit être étudiée. En effet, le joint brasé possède une température de fusion faible qui entraine un comportement visqueux même à température ambiante. Celle-ci est nécessaire à l’étape d’assemblage des boitiers. Ainsi, d’importantes déformations visqueuses sont développées notamment pour les environnements sévères et les longues phases de maintien de ces marchés critiques. Dans ce contexte, il est important de prendre en compte l’interaction fatigue-fluage dans les matériaux joint brasé pour atteindre les exigences de ces applications.Les limitations de la littérature sont le manque de données expérimentales précises dissociant les déformations plastique et visqueuse en essai de fatigue. La représentativité des éprouvettes massiques par rapport à l’application finales est en effet discutable au vue de la microstructure très spécifique du joint brasé. De plus, il n’existe pas de consensus réel sur les modèles matériaux à utiliser. Dans ce contexte, un banc de mesure a été développé dans le but de réaliser des essais de fatigue en cisaillement sur des boitiers électroniques assemblés.Le temps de maintien, la température et la force appliquée ont un impact sur le nombre de cycles à défaillance. La combinaison d’une augmentation de la température avec l’ajout du temps de maintien réduit jusqu’à un facteur dix le nombre de cycles à rupture. Les courbes d’hystérésis du boitier ont été converties en contrainte et déformations plastique et visqueuse dans le joint brasé dans le but de calibrer un modèle matériau et une loi de fatigue. Les résultats montrent que l’intérêt des lois de fatigue utilisées communément est limité. Des résultats utilisant différents dispositifs expérimentaux de la littérature ont été ajoutés pour compléter ceux trouvés. Une loi de fatigue modifiée en fréquence a été testée et montre de meilleures prédictions dans le cas d’essais réalisés à différentes fréquences car elle permet de prendre des effets liés au temps comme la viscosité. Cependant, des limites avec cette loi ont été trouvées dans le cas de sollicitation avec temps de maintien. Une loi de fatigue prenant en compte l’interaction fatigue fluage a ensuite été proposée avec de bonnes prédictions notamment pour des températures plus élevées. L’évolution de la microstructure a montré que le dommage détruit la structure dendritique du joint et la remplace par des joints de tailles plus petites dans la zone proche de la fissure. La coalescence d’éléments a également été observée. Cependant, plus d’investigations sont nécessaires pour définir les marqueurs spécifiques des dommages plastique et visqueux. / Solder joints reliability analysis represents a challenge for the aerospace and defense industries, which are in need of trustworthy equipment with a long lifetime in harsh environments. The evolution of electronic packages, driven by consumer civil applications, introduces new architectures and materials for which reliability needs to be qualified for the constraints of the aerospace and defense applications. One of the most critical elements of an electronic assembly is the solder joint interconnection. In this context, the knowledge of fatigue properties of solder material is required to design the assemblies, to define accelerated tests or to perform lifetime simulations.Fatigue laws used commonly in the industry are generally simplified criteria such as Coffin-Manson relation, based on inelastic deformation, or Morrow relation, based on dissipated energy per cycle. Cyclic creep and plastic strains are mingled and formulated as a unique inelastic strain in these relationships. The underlying assumption is that damage contributions of creep and plasticity phenomena are equivalent. The relevance of these laws in the case of solder joint and the mission profiles of aerospace and defense industries can be discussed. In fact, solder joint materials have low melting temperatures which are required by the assembly manufacturing process, inducing viscous strains even at room temperature. In this context, important viscous strains are developed due to the harsh environment with high temperatures and the long maintain phases of space, defense and avionics industries. Creep-fatigue interaction must be taken into account for solder joint material in order to address these applications requirements.Limitations of the literature are the lack of clear experimental data separating plastic and creep strains during fatigue tests. Representativeness of experimental tests based on bulk samples can be discussed because of the complex microstructure of solder joints. No consensus exists on the mechanical model and the parameters. In this context, an innovative test bench has been developed to perform shear fatigue tests with assembled electronic packages in order to study creep-fatigue interaction in solder joints.Dwell time, temperature and force have an impact on the number of cycles to failure. Combined increase of temperature and dwell time reduces the number of cycles to failure until a factor of 10. The hysteresis response of the package is converted in stress and plastic and viscous strains in order to calibrate a viscoplastic model and a fatigue law. Results show limitations of classic Coffin-Manson fatigue law. Experimental results from the literature have been used to complete our test plan. A frequency modified fatigue model shows increased prediction accuracy for fatigue tests performed at different frequencies. In fact, time-dependent viscous damage is included in the law by the frequency factor. However, limitations of this law have been found in particular for long dwell time configuration. A creep-fatigue model is proposed to dissociate damages from plastic and viscous strains. This fatigue law increases prediction accuracy in the case of high temperature and long dwell time configuration. Microstructure evolutions indicate the destruction of the dendritic structure and replaced by small grains recrystallization in the area close to the fracture. Coalescence of different precipitates is also observed in the damaged area. More investigations on this topic are required in order to evaluate the specific markers of plastic and viscous damages.

<p>A wide variety of phase evolution phenomena observed in solids such as intermetallic growth at the junction between two metals subjected to high temperature, growth of oxide on metal surfaces due to atmospheric exposure and void evolution induced by electromigration in microelectronic devices for example, can be classified as being driven by reaction-diffusion processes. These phase evolution phenomena have a significant impact on material reliability for critical applications, and therefore, there is a requirement for modeling such reaction-diffusion driven phase evolution phenomena. It is difficult to analyze these due to the complexity of modeling the evolving interface between solid phases. Additional complexity is  due to the multi-physics nature of the diffusive and reactive processes. Diffusion in solids is driven by a variety of stimuli such as current, temperature and stress, in addition to the chemical potential. Therefore, there is a need for a model that accounts for the influence of such factors on phase evolution. In this thesis,  a generalized continuum based reaction-diffusion theory for phase and void evolution in solid state is developed. The derivation starts off with generalized interface balance laws for mass, momentum and energy. The thermodynamic entropy inequality for irreversible phase growth is derived for arbitrary anisotropic and inhomogeneous surface stress. These interface relations are combined with governing relations in the material bulk for the temperature, stress, electrical and concentration fields, to develop a general model capable of analyzing and describing phase evolution in solids. This theory is then applied to a variety of intermetallic phase and void evolution phenomena observed in microelectronics.</p> <p><br></p> <p>Electromigration induced voiding in thin metal films is an example of phase evolution that is an important reliability concern in microelectronics. Studies have reported that the electromigration induced void growth rate is inversely related to the adhesion of metal thin films with the base and capping layers. Electromigration experiments are performed on fabricated test devices with Cu thin films with SiNx and TiN capping layers. The observations from electromigration experiments on thin Cu metal films at a range of temperatures indicate that the contribution of interface adhesion strength to electromigration resistance decreases with an increase in temperature. The generalized reaction-diffusion theory developed here is modified to develop an expression to account for the effect of base and passivation layer adhesion and temperature on electromigration resistance of metal thin films. The void growth rates measured in the experiments are analyzed with the expression for void growth rate to estimate the interface adhesion strength for the Cu-TiN and Cu-SiNx interfaces. </p> <p><br></p> <p>Demand for increased bandwidth, power efficiency and performance requirements have resulted in a trend of reduction in size and pitch of Cu pillar-Solder micro-bump interconnects used in heterogeneously integrated packages. As the size of micro-bumps reduce, reliability challenges due to voiding in the solder joint and the growth of Cu-Sn intermetallics are observed. The underlying reaction-diffusion mechanisms responsible for Cu-Sn intermetallic growth and voiding in solder joints are unclear at this stage and require further investigation. The current practice of material characterization in micro-bumps involve destructive cross-sectioning and polishing of the micro-bumps after testing. These processes result in loss of continuity in the samples used for the experiments, and material removal due to abrasive polishing might result in a loss of critical information. Therefore, a novel test device capable of non-destructive characterization of Cu-Sn intermetallic growth and voiding in sub-30 micron size micro-bumps is designed and fabricated in this work. The fabricated test devices are subjected to thermal aging for over 1000 h and the underlying reaction-diffusion mechanisms behind the intermetallic phase and void evolution are investigated. </p> <p><br></p> <p>A reaction-diffusion mechanism is proposed explaining the evolution of  various Cu-Sn intermetallic phases and solder joint void observed from experiments. Using the reaction-diffusion mechanism inferred from the thermal aging experiments and the generalized reaction-diffusion theory for phase evolution developed in this thesis, a sharp interface model is developed for the evolution of Cu-Sn intermetallic phases and solder joint void. The diffuse interface phase field equivalent equations for the sharp interface model governing equations are developed using matched formal asymptotic analysis. The evolution of Cu-Sn intermetallic phase and voids in the solder joint are simulated for different temperatures and current density to demonstrate the validity of the phase field and sharp interface models.  </p> <p><br></p>

Le mémoire porte sur l’étude de la fiabilité des assemblages utilisant des alliages de brasure sans-plomb en environnement sévère pour des applications électroniques. Une méthode de préparation métallographique fiable et reproductible en vue de l’analyse microstructurale est présentée. L'effet du vieillissement thermique statique sur l’évolution microstructurale de billes de brasure en SAC, la tenue à la fatigue mécanique des assemblages brasés et l'étude de l'endommagement thermomécanique sont développés. Le seul effet notable constaté après vieillissement thermique est l'augmentation des épaisseurs des intermétalliques de contact. A la suite de sollicitations mécaniques, les ruptures sont plus souvent observées dans les pistes que dans les brasures, et ne permettent pas d'incriminer des éléments de la microstructure brasée comme facteurs déterminant de propagation des fissures. Les sollicitations thermomécaniques conduisent à une recristallisation, et les fissures se propagent alors le long des joints de grains recristallisés. / The thesis focuses on the study of the reliability of assemblies using Pb-free alloys under' harsh environment for electronic applications. A method for preparing metallographic reliable and reproducible for the microstructural analysis is presented. The effect of thermal aging on the static microstructural evolution of solder balls in SAC, the resistance to mechanical fatigue of solder joints and the study of thermomechanical damage are developed. The only significant effect observed after thermal aging is the increase in thickness of the intermetallic contact. Following mechanical, ruptures are most often seen in the copper tracks of the assembly, and do not blame the solder microstructure elements as determinants of crack propagation. The thermomechanical stresses lead to recrystallization, and then cracks propagate along the grain boundaries of recrystallized.

This thesis deals with the methodology of testing the wetting characteristics for different material and process effects in the double-plated base material. Testing is performed by wetting balance method. There is designed procedure to calculate the angles on each side of the non-homogeneous material. The Design of Experiments method is used to interpret the results, by using this method are also interpreted electrical and mechanical properties of solder joints. The correlation with wetting characteristics is discussed.