The objective of this research is to optimize silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BiCMOS analog circuit building blocks for operation in extreme environments utilizing design techniques. First, negative feedback effects on single-event transient (SET) in SiGe HBT analog circuits were investigated. In order to study the role of internal and external negative feedback effects on SET in circuits, two different types of current mirrors (a basic common-emitter current mirror and a Wilson current mirror) were fabricated using a SiGe HBT BiCMOS technology and exposed to laser-induced single events. The SET measurements were performed at the U.S. Naval Research Laboratory using a two-photon absorption (TPA) pulsed laser. The measured data showed that negative feedback improved SET response in the analog circuits; the highest peak output transient current was reduced by more than 50%, and the settling time of the output current upon a TPA laser strike was shortened with negative feedback. This proven negative feedback radiation hardening technique was applied later in the high-speed 5-bit flash analog-to-digital converter (ADC) for receiver chains of radar systems to improve SET response of the system.
| Identifer | oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/54419 |
| Date | 07 January 2016 |
| Creators | Jung, Seungwoo |
| Contributors | Peterson, Andrew F. |
| Publisher | Georgia Institute of Technology |
| Source Sets | Georgia Tech Electronic Thesis and Dissertation Archive |
| Language | en_US |
| Detected Language | English |
| Type | Dissertation |
| Format | application/pdf |
Page generated in 0.0019 seconds