This work consists of two main parts: a) Design of a 3-10GHz UltraWideBand
(UWB) Receiver and b) Built-In Testing Techniques (BIT) for Analog and RF circuits.
The MultiBand OFDM (MB-OFDM) proposal for UWB communications has
received significant attention for the implementation of very high data rate (up to
480Mb/s) wireless devices. A wideband LNA with a tunable notch filter, a downconversion
quadrature mixer, and the overall radio system-level design are proposed for
an 11-band 3.4-10.3GHz direct conversion receiver for MB-OFDM UWB implemented
in a 0.25mm BiCMOS process. The packaged IC includes an RF front-end with
interference rejection at 5.25GHz, a frequency synthesizer generating 11 carrier tones in
quadrature with fast hopping, and a linear phase baseband section with 42dB of gain
programmability. The receiver IC mounted on a FR-4 substrate provides a maximum
gain of 67-78dB and NF of 5-10dB across all bands while consuming 114mA from a
2.5V supply.
Two BIT techniques for analog and RF circuits are developed. The goal is to reduce
the test cost by reducing the use of analog instrumentation. An integrated frequency response characterization system with a digital interface is proposed to test the
magnitude and phase responses at different nodes of an analog circuit. A complete
prototype in CMOS 0.35mm technology employs only 0.3mm2 of area. Its operation is
demonstrated by performing frequency response measurements in a range of 1 to
130MHz on 2 analog filters integrated on the same chip. A very compact CMOS RF
RMS Detector and a methodology for its use in the built-in measurement of the gain and
1dB compression point of RF circuits are proposed to address the problem of on-chip
testing at RF frequencies. The proposed device generates a DC voltage proportional to
the RMS voltage amplitude of an RF signal. A design in CMOS 0.35mm technology
presents and input capacitance <15fF and occupies and area of 0.03mm2. The application
of these two techniques in combination with a loop-back test architecture significantly
enhances the testability of a wireless transceiver system.
| Identifer | oai:union.ndltd.org:tamu.edu/oai:repository.tamu.edu:1969.1/5757 |
| Date | 17 September 2007 |
| Creators | Valdes Garcia, Alberto |
| Contributors | Sinencio, Sanchez, Edgar |
| Publisher | Texas A&M University |
| Source Sets | Texas A and M University |
| Language | en_US |
| Detected Language | English |
| Type | Book, Thesis, Electronic Dissertation, text |
| Format | 3756365 bytes, electronic, application/pdf, born digital |
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