<p>Ova disertacija predstavlja rezultate istraživanja uticaja dve vrste<br />intenzivnih promena Sunčevog zračenja na prostiranje radio talasa. Prvi deo<br />prikazanih rezultata odnosi se na efekte neperiodičnih zračenja u X-opsegu<br />talasnih dužina u toku trajanja Sunčevog X-flera. Izvršeno je modelovanje<br />karakteristika jonizovane sredine D-sloja jonosfere u toku celokupnog<br />trajanja efekata dodatne energije jonizacije i karakteristika prostiranja<br />radio talasa određenih frekvencijskih opsega u okviru navedene sredine.<br />Drugi deo rezultata prikazuje periodičnu promenu nivoa prijemnog signala<br />usmerene mikrotalasne radio komunikacije koja nastaje u toku jutarnjih<br />časova. Pokazano je da ova promena ima visok stepen korelisanosti sa<br />promenama vrednosti geomagnetskog polja i da je uzrokuje pojava Sunca na<br />horizontu. Na osnovu rezultata dobijenih merenjem je predložen model koji<br />opisuje trend navedene promene u jutarnjim časovima.</p> / <p>This thesis presents the research results of intensive solar radiation variation<br />influence on radio propagation. The first part of presented results is related to the<br />effects of non-periodic radiation within X-ray wavelength during Solar X-flare.<br />Modelling of ionosphere D-layer medium is performed during all time duration of<br />additional ionization energy, as well as radio propagation characteristics within this<br />medium. The second part of the measured results presents periodic variation of<br />receiving microwave radio signal level of experimental Line-of-site communication<br />during the morning hours. It is shown that this variation is highly correlated with<br />geomagnetic field component values variation and that is caused by the Sun<br />appearance on the horizon. Based on the experimentally collected results, the model<br />that describes this variation during morning hours is proposed.</p>

[pt] Espectroscopia de ressonância plasmônica de superfície (SPR) é uma técnica óptica amplamente utilizada para monitorizar as alterações físicas ou químicas que ocorrem em uma interface metal - dielétrico. A medição simultânea da espessura e do índice de refração de filmes finos orgânicos, adsorvidos ou depositados sobre a superfície plana de um metal, requer duas medições independentes seguindo uma metodologia designada na literatura como método de duas cores ou método de dois meios. Na primeira, as duas medições são realizadas utilizando diferentes comprimentos de onda da radiação eletromagnética interagindo com a amostra. Na segunda, o índice de refração do meio externo (gás, líquido) é alterado entre as duas medições. Enquanto o primeiro método implica no conhecimento da função de dispersão da fase orgânica, o segundo só produz resultados precisos quando as moléculas orgânicas não interagem quimicamente com o fluido externo. Ambos os métodos apresentam dificuldades quando são aplicados à caracterização de materiais luminescentes orgânicos, os quais são na maior parte do tempo altamente reativos à umidade e ao contato com solventes orgânicos. Neste trabalho foi montado um espectrômetro de SPR automatizado. Primeiramente, ele foi testado na caracterização de amostras feitas no laboratório em termos do valor absoluto, e da homogeneidade das constantes ópticas da deposição metálica que suporta a onda de plasma. Nós demonstramos que medições precisas de constantes ópticas permitem a determinação do índice de refração de filmes finos orgânicos luminescentes, evaporados termicamente utilizando o método de substrato com dois metais. Este método, que até onde sabemos é apenas teorizado na literatura, foi aplicado a uma amostra encapsulada com um filme fino de Alq3 comercial. Além disso, a interface metal/Alq3 foi exposta a ar, e a degradação foi monitorada em tempo real, indicando uma diminuição progressiva do ângulo de ressonância da amostra. / [en] Surface Plasmon Resonance Spectroscopy (SPR) is an optical technique widely used to monitor the physical or chemical changes occurring at a metal-dielectric interface. The simultaneous measurement of the thickness and the index of refraction of organic thin films adsorbed or deposited on the metal flat surface require two independent measurements following a methodology commonly named in literature as Two-Colors Method or Two-Medium Method. In the first one, the two measurements are performed using different wavelength of the electromagnetic radiation interacting with the sample. In the second one the index of refraction of the external medium (gas, liquid) is changed between the two measurements.While the first method implies the knowledge of the dispersion function of the organic layer, the second one gives accurate results only when the organic molecules don t interact chemically with the external fluid. Both of these methods present difficulties when applied to the characterization of luminescent organic materials, most of the time highly reactive to humidity and to the contact with organic solvents. In this work an automated SPR spectrometer was assembled and first tested on the characterization of home-made samples in terms of the absolute value and homogeneity of the optical constants of the metal deposition supporting the plasma wave. We demonstrate that accurate measurements of such optical constants allow the determination of the index of refraction of thermally evaporated luminescent organic thin films using a Two-Metal Substrate Method. This method, to our knowledge only theorized up to now in literature, has been applied to an encapsulated sample containing a thin film of commercial Alq3. Further, the degradation of the metal/Alq3 interface exposed to air has been real time monitored indicating a progressive drop in the angle of resonance of the sample.

Notre étude concerne la mesure du déphasage optique non linéaire (NL) d’ordre trois. Deux catégories de procédés seront abordées : i) la technique interférométrique à décalage de phase qui permet la caractérisation de la phase avec une bonne résolution spatiale, ce qui est crucial pour un faisceau focalisé dans le milieu non linéaire. Cette technique utilise le critère des moindres carrés associé à plusieurs interférogrammes. Mise en œuvre à l'aide d'un modulateur spatial de lumière, elle fournit un calibrage pratique pour chaque déphasage considéré. La fiabilité de la méthode proposée est vérifiée par comparaison directe avec la méthode de transformation de Fourier ; ii) les méthodes innovantes de type Z-scan combinées avec un montage imageur. Elles seront ici appliquées aux mesures des coefficients NL d’ordre trois et d’ordres supérieurs. Nous montrerons que la flexibilité d’emploi d'une caméra CCD permet un meilleur pointage et suivi en temps réel du faisceau. Enfin nous nous intéresserons au montage Dark-field Z-scan bénéficiant des avantages de la microscopie à champ sombre à fort contraste. Ces améliorations ouvrent potentiellement un nouveau champ d’exploration microscopique pour l’investigation et la cartographie des effets non linéaires. / Our study concerns the measurement of the nonlinear (NL) optical phase shift of order three. Two categories of methods will be addressed: i) the phaseshift interferometric technique that allows phase characterization with good spatial resolution, which is crucial for a focused beam in the non-linear medium. This technique uses the least squares criterion associated with several interferograms. Implemented using a spatial light modulator, it provides a practical calibration for each phase shift considered. The reliability of the proposed method is verified by direct comparison with the Fourier transformation method; ii) innovative Z-scan methods combined with an imager assembly. They will be applied here to measurements of the NL coefficients of order three and higher. We will show that the flexibility of using a CCD camera allows for better pointing and real-time tracking of the beam. Finally, we will focus on the Dark-field Z-scan setup, which benefits from the advantages of high contrast dark field microscopy. These improvements potentially open up a new field of microscopic exploration for the investigation and mapping of non-linear effects.

Les métamatériaux sont définis comme étant des matériaux artificiels présentant des propriétés exotiques qui modifient la propagation des ondes électromagnétiques. À la fin des années 90, Pendry et al. démontrèrent théoriquement qu'il est possible de générer de tels métamatériaux, grâce à des structures particulières au sein du matériau (le fameux "splitring resonator"). Les métamatériaux sont donc structurés à une échelle inférieure à la longueur d'onde incidente, et décrits par une permittivité et une perméabilité effective. En 2000, Smith et al. fabriquèrent le premier métamatériau mais dans la gamme micro-onde. Les perspectives dans le domaine de l'optique (300800 nm) sont très prometteuses, mais le transfert des technologies utilisées en micro-ondes rencontre des obstacles. Un des défis dans le domaine émergent des métamatériaux est d'assembler à grande échelle des nanoparticules NPs (10-50 nm) en des super-réseaux présentant des propriétés collectives. Des nanostructures tridimensionnelles de matériaux nobles, ayant de fortes réponses plasmoniques, peuvent en effet générer des matériaux aux nouvelles propriétés optiques. Cette thèse fait partie du projet européen METACHEM, dont le but est de fabriquer des métamatériaux dans le domaine de l'infrarouge et du visible, en se basant sur l'utilisation de la nanochimie et de l'assemblage de matériaux. Plus précisément, ce travail de thèse se situe à l'interface entre les groupes de chimie qui synthétisent des nanoparticules en dispersion, et les groupes de caractérisation optique des matériaux. Dans ce travail de thèse, nous utilisons une technique originale la microévaporation basée sur les outils microfluidiques, afin de générer de façon contrôlée des assemblées 3D de nanoparticules (dimensions typiques 1 mm10 m 50 m). / 1-Microevaporation - Microfluidics is the branch of fluid mechanics dedicated to the study of flows in the channel withdimensions between 1 micron and 100 micron. The object of this chapter is to illustrate the basicprinciples and possible applications of microfluidic chip, called microevaporator. In the first part ofthe chapter, we present a detailed description of the physics of microevaporators using analyticalarguments, and describe some applications. In the second part of the chapter, we present theexperimental protocol of engineering of micro evaporator and different type of microfluidics device.2- On-chip microspectroscopy - The object of this chapter is to illustrate a method to measure absorption spectra during theprocess of growth of our materials in our microfluidic tools. The aim is to make an opticalcharacterization of our micro materials and to carry-out a spatio-temporal study of kineticproperties of our dispersion under study. This instrumental chapter presents the theoretical basis !of the method we used.3-Role of colloidal stability in the growth of micromaterials - We used combined microspectroscopy and videomicroscopy to follow the nucleation and growth ofmaterials made of core-shell Ag@SiO2 NPs in micro evaporators.!We evidence that the growth is actually not always possible, and instead precipitation may occurduring the concentration process. This event is governed by the concentration of dispersion in thereservoir and we assume that its origin come from ionic species that are concentrated all togetherwith the NPs and may alter the colloidal stability en route towards high concentration. 4-Microfluidic-induced growth and shape-up of three-dimensional extended arrays of denselypacked nano particles - In this chapter I present in details microfluidic evaporation experiments to engineer various denselypacked 3D arrays of NPs.5-Bulk metamaterials assembled by microfluidic evaporation - In this chapter I introduced the technique we used (microspot ellipsometry) in close collaborationswith V.Kravets and A.Grigorenko(University of Manchester) and with A.Aradian, P.Barois, A.Baron,K.Ehrhardt(CRPP, Pessac) to characterized the solids made of densely packed NPs. I describe theconstraints that emerge from the coupling between the small size of our materials and the opticalrequirements, the analysis and interpretation of the ellipsometry experiments show that for thematerial with high volume fraction of metal exists the strong electrical coupling between the NPsand the materials display an extremely high refraction index in the near infra-red regime.

[pt] O presente trabalho aborda o desenvolvimento de sistemas de detecção de gases na região do infravermelho. Conceitos fundamentais sobre a teoria eletromagnética da luz e como o sinal luminoso pode ser absorvido por gases é apresentado na etapa inicial. Em seguida, são apresentados novos métodos de detecção utilizando fibras ópticas através de simulações eletromagnéticas destas fibras e por observações de medições em laboratório. O software utilizado é o Optiwave. Um sistema de interrogação baseado em um laser em anel é desenvolvido para o comprimento de onda em 2000 nm. São aplicados dispositivos ópticos, fibras padrão, fibras micro estruturadas como elementos constituintes de sistemas de detecção de gases. Adicionalmente, um método de detecção coerente homodina e um subsistema capaz de detectar variações do índice de refração até pelo menos a sexta casa decimal são introduzidos, discutidos e propostos como novas técnicas a serem utilizadas na detecção e medição de gases. O desenvolvimento das técnicas aqui propostas tem ainda por finalidade segurança industrial e ambiental, avaliação de riscos de explosões, e no controle de vazamentos, emissões e poluição atmosférica. / [en] This thesis discusses the development of gas detection systems in the infrared region. Fundamental concepts on the electromagnetic theory of light and how the light signal can be absorbed by gases is shown in the initial stage. Then, the possibility of new optical fiber detection methods is presented using electromagnetic simulations and laboratory observations activities. The software used is the Optiwave. A scanning system based on laser ring is designed for the wavelength of 2000 nm. In this step, the study of Bragg gratings is explored. Other systems using optical devices, Micro structured optical fibers, coherent homodyne systems are presented and realized. Besides, a subsystem able to detect at least 10- 6 variations of the refraction index is introduced and evaluated as a gas detection application. All procedures presented can also be activated in industrial security, environment and atmospheric pollution evaluation, gas leakage, and gas blasts risks.