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The increasing development speed via Agile may introduce overlooked security steps in the process, with an example being the Iowa Caucus application. Verifying the protection of confidential information such as social security numbers requires security at all levels, providing protection through any connected applications. CryptoGuard is a static code analyzer for Java. This program verifies that developers do not leave vulnerabilities in their application. The program aids the developer by identifying cryptographic misuses such as hard-coded keys, weak program hashes, and using insecure protocols. In my Master thesis work, I made several important contributions to improving the deployability, accessibility, and usability of CryptoGuard. I extended CryptoGuard to scan source and compiled code, created live documentation, and supported a dual cloud and local tool-suite. I also created build tool plugins and a program aid for CryptoGuard. In addition, I also analyzed several Java-related surveys encompassing more than 50,000 developers and reported interesting current practices of real-world software developers. / Master of Science / Throughout the rise of software development, there has been an increase in development speed with developers embracing methodologies that use higher rates of changes, such as Agile. Since Agile naturally addresses "problems of rapid change", this also increases the likelihood of insecure and vulnerable coding practices. Though consumers depend on various public applications, there can still be failures throughout the development process in applications such as the Iowa caucus application. It was determined the Iowa cacus application development teams' repository credentials (API key) was left within the application itself. API keys provide the credential to be able to directly interact with server systems, and if left unguarded can be easily exploited. Since the Iowa cacus application was released publicly, malicious actors (other people looking to exploit the application) may have already discovered this credential. Within our team we have created CryptoGuard, a program to analyze applications to detect cryptographic issues such as an API key. Creating it with scalability in mind, it was created to be able to scan enterprise code at a reasonable speed. To ensure its use within companies, we have been working on extending and enhancing the work to the current needs of Java developers. Verifying the current Java landscape, we investigated three different companies and their developer ecosystem surveys that are publicly available. Amongst these companies are; JetBrains, known for their Integrated Development Environments (IDE, or application to help write applications) and their own programming language, Snyk, known for their public security platform and anti-virus capability, and Jakarta EE, which is the new platform for the enterprise version of Java. Throughout these surveys, we accumulate more than 50,000 developers' responses, spanning various countries, company experience, and ages. With their responses amalgamated, we enhance CryptoGuard to be available to as many developers and their requests as possible.First, CryptoGuard is enhanced to scan a projects source code. After that, ensuring our project is hosted by a cloud service, we actively are extending our project to the Security Assurance Marketplace (SWAMP). Funded by the DHS, SWAMP not only supplies a public cloud for developers to use, but a local download option to scan a program within the user's own computer. Next, we create a plugin for two most used build tools, Gradle and Maven. Then to ensure CryptoGuard can be have reactive aide, CryptoSoule is created to aide minimal interface aide. Finally utilizing a live documentation service, an open source documentation website was created to provide working examples to the community.

Die bruchmechanischen Eigenschaften von Elastomerwerkstoffen zeigen eine deutliche Abhängigkeit von der Prüfkörpergeometrie. Endscheidenden Einfluss hat die Art der Beanspruchung, die der Belastung des realen Bauteils entsprechen sollte. In dieser Arbeit wird die Methode zur Analyse des dynamischen Risswachstums von Elastomeren im simultanen Tensile- und Pure-shear-Prüfmodus beschrieben. Die Methode, basierend auf der mechanischen Aufrüstung und Weiterentwicklung eines Tear and Fatigue Analyzers, stellt den Prüfmethoden übergreifende Feststellungen zu aussagekräftigen Kennwertdaten des Bruchverhaltens von Elastomeren vor. Die Schwerpunke der Arbeit wurden in zwei Hauptthemen unterteilt, wobei zuerst eine konstruktive Modifizierung des kommerziellen TFA vorgenommen wurde und anschließend die Untersuchungen zur Beschreibung der bruchmechanischen Eigenschaften von Elastomerwerkstoffen und dynamischer Beanspruchung mittels modifiziertem TFA durchgeführt wurden. Es wurde aus den Anforderungen an die quantitative, simultane Analyse von SENT- als auch Pure-shear-Prüfkörpern eine konstruktive Modifizierung des kommerziellen TFA vorgenommen. Insbesondere die Schwerpunkte der Modifizierung wurden der Verminderung des Einflusses der Prüfkörperhalterungsfestigkeit auf die Genauigkeit der Analyse und der Untersuchung des Resonanzbereiches des TFA gewidmet. Die hier dokumentierten Ergebnisse durch den modifizierten TFA haben deutlich das unterschiedliche Bruchverhalten in der Abhängigkeit von der Prüfkörpergeometrie nachgewiesen. Es wurden umfangreiche Untersuchungen zur Charakterisierung der Rissausbreitungsgeschwindigkeiten in Elastomeren in Abhängigkeit von der Prüfkörpergeometrie als auch von der Risslänge durchgeführt, wobei festgestellt wurde, dass die bruchmechanischen Eigenschaften nicht nur von der Risslänge, sondern auch signifikant von der Kerbgeometrie abhängen. Die Ergebnisse haben weiterhin gezeigt, dass ein großer Einfluss der Herstellungsparameter der Prüfkörper unter Berücksichtigung von Kautschukbasis und Kautschukmischungsrezeptur auf die bruchmechanischen Eigenschaften besteht. Die vorgestellte Methode zur Bestimmung der dynamisch-bruchmechanischen Eigenschaften von Elastomeren stellt zusammen mit der Berücksichtigung der Herstellungsparameter einen genauen Vergleich zwischen den experimentell ermittelten Prüfwerten unabhängig von der Prüfkörpergeometrie dar. / The mechanical properties of rubber materials can be shown to be a function of the geometry of the test specimen. The main affecting parameters are the loading conditions. The present work proposes a new fracture mechanical testing concept for determination of dynamic crack propagation of rubber materials. This concept implements a method of simultaneous tensile- and pure-shear-mode testing. The present approach is based on an upgrade of the Tear and Fatigue Analyzers, on the fracture mechanics theory of dynamically loaded test specimens and on the definition of pure-shear states according to the test specimen’s geometry ratio. The main focus of this work can be divided in two parts. Firstly it is introduced the development of a method for analysis of dynamic crack propagation in filled rubber by simultaneous tensile- and pure shear mode testing. The servo-hydraulic machine with controlled temperature testing chamber is equipped with simultaneously operating two mode test equipment which represents a new fracture testing method. Secondarily the analysis of crack propagation under the dynamic loading conditions is practised with this method. It is shown how the tearing energy and the crack growth rate depend on the test specimen’s geometry ratio and crack length. It is also demonstrated that the values for tearing energies and also crack growth rates for short crack lengths in SENT- as well as in pure-shear test specimens are identical. Another important aspect is related to the different values of tearing energies and crack growth rates for cracks with short and large lengths in pure-shear test specimens. The results show the dependence of fracture behavior on manufacturing the test specimens. The new fracture mechanical testing concept offers a comparison between fracture behavior of rubber materials independent of the test specimens geometry.

Les transistors à haute mobilité d’électrons (HEMTs) en nitrure de gallium (GaN) s’affirment comme les candidats prometteurs pour les futurs équipements à micro-ondes - tels que les amplificateurs de puissance à état solide (SSPA), grâce à leurs excellentes performances. Une première démonstration d'émetteur en technologie GaN-MMIC a été développée et embarquée dans la mission spatiale PROBA-V. Mais cette technologie souffre encore des effets de pièges par des défauts présents au sein de la structure. L’objectif de ce travail est donc l'étude d’effets de pièges et des aspects de fiabilité des transistors de puissance GH50 pour des applications en bande C. Un protocole d’investigation des phénomènes de pièges est présenté, qui permet l’étude des dynamiques des effets de pièges du mode de fonctionnement DC au mode de fonctionnement radiofréquence, basé sur la combinaison des mesures IV impulsionnelles, des mesures de transitoires du courant de drain avec des impulsions DC et RF et des mesures de paramètres [S] en basse fréquence. Un modèle de HEMT AlGaN/GaN non-linéaire électrothermique est présenté, incluant un nouveau modèle thermique de pièges restituant le comportement dynamique de ces pièges et leurs variations en température afin de prédire correctement les performances en conditions réelles de fonctionnement RF. Enfin, une méthodologie temporelle pour l’évaluation de la fiabilité et de limites réelles d'utilisation de transistors dans l'amplificateur de puissance RF en régime d’overdrive (très forte compression), basée sur la mesure monitorée de Formes d'Onde Temporelles (FOT), est proposée. / GaN-based high electron mobility transistors (HEMTs) are promising candidates for future microwave equipment, such as new solid state power amplifiers (SSPAs), thanks to their excellent performance. A first demonstration of GaN-MMIC transmitter has been developed and put on board the PROBA-V mission. But this technology still suffers from the trapping phenomena, principally due to lattice defects. Thus, the aim of this research is to investigate the trapping effects and the reliability aspects of the GH50 power transistors for C-band applications. A new trap investigation protocol to obtain a complete overview of trap behavior from DC to radio-frequency operation modes, based on combined pulsed I/V measurements, DC and RF drain current measurements, and low-frequency dispersion measurements, is proposed. Furthermore, a nonlinear electro-thermal AlGaN/GaN model with a new additive thermal-trap model including the dynamic behavior of these trap states and their associated temperature variations is presented, in order to correctly predict the RF performance during real RF operating conditions. Finally, an advanced time-domain methodology is presented in order to investigate the device’s reliability and to determine its safe operating area. This methodology is based on the continual monitoring of the RF waveforms and DC parameters under overdrive conditions in order to assess the degradation of the transistor characteristics in the RF power amplifier.