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abstract: Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation. Therefore low-overhead built-in Self-Test (BIST) solution for advanced RF transceiver is proposed. In this dissertation. Firstly, comprehensive BIST solution for RF polar transceivers using on-chip resources is presented. In the receiver, phase and gain mismatches degrade sensitivity and error vector magnitude (EVM). In the transmitter, delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to violation of spectral mask requirements. Characterization and calibration of these parameters with analytical model would reduce the test time and cost considerably. Hence, a technique to measure and calibrate impairments of the polar transceiver in the loop-back mode is proposed. Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced. Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method. Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed. Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2015

The cost to test chips has risen tremendously. Additionally, the process for testing all functionalities of both analog and digital part is far from simple. One attractive option is moving some or all of the testing functions onto the chip itself leading to the use of built-in self-tests (BISTs). The frequency generator or frequency synthesizer is a key element of the BIST. It generates the clock frequencies needed for testing. A wide-band frequency synthesizer is designed in the project. The architecture of a PLL is analyzed as well as the modifications carried out. The modified structure has three blocks: basic PLL based frequency synthesizer, frequency down-converter, and output selector. Each of these blocks is analyzed and designed. This frequency synthesizer system overcomes challenges faced by the traditional PLL based frequency synthesizer.

Thesis--Auburn University, 2010. / Abstract. Includes bibliographic references (p.162-167).

Zugl.: Dresden, Techn. Univ., Diss., 2005

Techn. Universiẗat, Diss., 2005--Darmstadt.

Zugl.: Bremen, Universiẗat, Diss., 2007.

Thesis(M.S.)--Auburn University, 2005. / Abstract. Vita. Includes bibliographic references (p.91-96).

Universiẗat, Diss., 2003--Bremen.