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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

IC Design and Implementation of 6-T SRAM Cell Using Dual Threshold Voltage Transistors and Low Power Quenchersand Programmable PLL-Based Frequency Multiplier

Chen, Kuo-Long 26 June 2002 (has links)
Two different topics associated with their respective applications are proposed in this thesis. The first topic is the implementation of a 6-T SRAM cell using dual threshold voltage transistors and low power quenchers. We proposed a SRAM cell with dual threshold voltage transistors. The advantages of such a design is to reduce the access time and maintain data retention at the same time. Besides, the unwanted oscillation of the output data lines caused by large currents is reduced by adding two back-to-back quenchers. The second topic is focused on the implementation of a programmable PLL-based frequency multiplier. Using the method of a phase-locked loop and a programmable divisor to implement a frequency multiplier. ¢Ï synchronous clock signal can be generated by the proposed design. It can also be used in wireless communication systems, e.g. local oscillators.
2

Dual Threshold Voltage SRAM & BIST Comparators

Lee, Po-Ming 24 September 2003 (has links)
Since the invention of SRAM (Static Random Access Memory), many improvements have been proposed. The major targets are speed, area, and power consumption. The evolution of the CMOS process technology makes it possible to implement SRAM by using dual threshold voltage transistors. Hence, we will use TSMC (Taiwan Semiconductor Manufacturing Company) 0.25 $mu$m 1P5M CMOS process to realize the dual threshold voltage SRAM in this thesis. In order to reduce SRAM internal power consumption, we also propose quenchers to suppress unwanted oscillation between bit lines. In addition, several types of BIST (Build In Self Test) comparators are also proposed to test the mentioned SRAM. After detailed simulations, the proposed comparators possess impressive results in high fan-in, low transistor count, and high speed. The proposed SRAM and BIST comparators are fabricated by the CMOS process provided by National Science Council Chip Implementation Center (CIC). The measurements of the chips are fully corrected to meet the design goals.
3

Circuit Level Techniques for Power and Reliability Optimization of CMOS Logic

Diril, Abdulkadir Utku 21 April 2005 (has links)
Technology scaling trends lead to shrinking of the individual elements like transistors and wires in digital systems. The main driving force behind this is cutting the cost of the systems while the systems are filled with extra functionalities. This is the reason why a 3 GHz Intel processor now is priced less than what a 50MHz processor was priced 10 years ago. As in most cases, this comes with a price. This price is the complex design process and problems that stem from the reduction in physical dimensions. As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.
4

Hierarchical Optimization of Digital CMOS Circuits for Power, Performance and Reliability

Dhillon, Yuvraj Singh 20 April 2005 (has links)
Power consumption and soft-error tolerance have become major constraints in the design of DSM CMOS circuits. With continued technology scaling, the impact of these parameters is expected to gain in significance. Furthermore, the design complexity continues to increase rapidly due to the tremendous increase in number of components (gates/transistors) on an IC every technology generation. This research describes an efficient and general CAD framework for the optimization of critical circuit characteristics such as power consumption and soft-error tolerance under delay constraints with supply/threshold voltages and/or gate sizes as variables. A general technique called Delay-Assignment-Variation (DAV) based optimization was formulated for the delay-constrained optimization of directed acyclic graphs. Exact mathematical conditions on the supply and threshold voltages of circuit modules were developed that lead to minimum overall dynamic and static power consumption of the circuit under delay constraints. A DAV search based method was used to obtain the optimal supply and threshold voltages that minimized power consumption. To handle the complexity of design of reliable, low-power circuits at the gate level, a hierarchical application of DAV based optimization was explored. The effectiveness of the hierarchical approach in reducing circuit power and unreliability, while being highly efficient is demonstrated. The usage of the technique for improving upon already optimized designs is described. An accurate and efficient model for analyzing the soft-error tolerance of CMOS circuits is also developed.
5

A Low-power High-speed 8-bit Pipelining CLA Design Using Dual Threshold Voltage Domino Logic and Low-cost Digital I/Q Separator for DVB-T

Cheng, Tsai-Wen 10 July 2006 (has links)
This thesis includes two topics. One is a low-power high-speed 8-bit pipelining CLA design using dual threshold voltage (dual- Vth) domino logic. The other is a low-cost digital I/Q separator for DVB-T receivers. A high speed and low power 8-bit CLA using dual- Vth domino logic blocks arranged in a PLA-like style with pipelining is presented. According to parallely precharge and sequentially evaluate in a cascaded set of domino logic blocks, transistors in the precharge part and the evaluation part of dual- Vth domino logic are, respectively, replaced by high Vth transistors to reduce subthreshold leakage current through OFF transistors, and low Vth transistors. Moreover, an nMOS transistor is inserted in the precharge phase of the output inverter such that the two-phase dual- Vth domino logic can be properly applied in a pipeline structure. Consequently, the proposed design keeps the advantage of high speed while attaining the effect of low power dissipation. A low-cost digital I/Q separator is presented in the second part of this thesis. Using digital I/Q separator in place of the traditional analog I/Q separator guarantees the design conquer gain and phase mismatch problems between the I and Q channels. The proposed design can berealized by inverters and shifters such that the goal of low cost can be achieved.

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