Zugl.: Duisburg, Essen, Univ., Diss., 2007

Zugl.: Ilmenau, Techn. Univ., Diss., 2007

Zugl.: Stuttgart, Univ., Diss., 2007.

Zugl.: Bochum, Univ., Diss., 2008

Würzburg, Univ., Diss., 2009. / Zsfassung in dt. Sprache.

Brandenburgische Techn. Univ, Diss., 2000--Cottbus.

Techn. Hochsch., Diss., 2002--Aachen.

This work studies the fundamental connection between lattice strain and magnetic anisotropy in the ferromagnetic semiconductor (Ga,Mn)As. The first chapters provide a general introduction into the material system and a detailed description of the growth process by molecular beam epitaxy. A finite element simulation formalism is developed to model the strain distribution in (Ga,Mn)As nanostructures is introduced and its predictions verified by high-resolution x-ray diffraction methods. The influence of lattice strain on the magnetic anisotropy is explained by an magnetostatic model. A possible device application is described in the closing chapter. / Die vorliegende Arbeit untersucht den fundamentalen Zusammenhang zwischen Gitterverspannung und magnetischer Anisotropie in dem ferromagnetischen Halbleiter (Ga,Mn)As. Die ersten Kapitel bieten eine allgemeine Einleitung in das Materialsystem und eine detaillierte Beschreibung des Wachstumsprozesses mittels Molekularstrahlepitaxie. Eine Finite-Elemente Simulation wird entwickelt, um die Verteilung der Gitterverspannung in (Ga,Mn)As Nanostrukturen zu modellieren. Die daraus abgeleiteten Vorhersagen werden mittels hochauflösender Röntgenbeugung bestätigt. Der Einfluss der Gitterverspannung auf die magnetische Anisotropie wird anhand eines magnetostatischen Modells erklärt. Das abschließende Kapitel gibt einen Ausblick auf eine mögliche praktische Anwendung der beschriebenen Phänomene.

The paper treats the question of feasibility of measuring intrinsic thin film stresses due to nanoindentation. A variety of different methods is proposed and analysed with respect to their applicability. As this accuracy-estimation results in boundary conditions for the measurements which can not be fulfilled yet, the whole topic is considered from a purely academic point of few. With the help of a special software package [25] the following methods are considered: 1. Taking the moment of beginning plastic flow within the substrate as indictor, 2. Taking the moment of beginning plastic flow within the film as indictor, 3. Applying mixed loads (normal and lateral forces), 4. Applying the concept of the effectively shaped indenter. While the methods 2 to 4 appear to be in principle feasible, method 1 can completely be ruled out as being of no practical use. The mentioned software package (FilmDoctor prototype) is part of the supplemental material of this study.

Zugl.: Stuttgart, Univ., Diss., 2001.