• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 11
  • 3
  • 2
  • 1
  • Tagged with
  • 18
  • 18
  • 6
  • 4
  • 4
  • 4
  • 4
  • 4
  • 4
  • 4
  • 3
  • 3
  • 3
  • 3
  • 3
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

The electronic and optical properties of low dimensional structures

Narayan, Vinay January 1997 (has links)
No description available.
2

III-Nitride Hot Electron Transistors for High Speed Electronics

Yang, Zhichao January 2020 (has links)
No description available.
3

Energy Relaxation and Hot-electron Lifetimes in Single Nanocrystals

Dardona, Sameh Ibrahim 11 July 2006 (has links)
Understanding changes in materials properties as a function of size is crucial for both fundamental science development and technological applications. Size restriction results in quantum confinement effects that modify both energy level structures and electron dynamics of solid materials. This study investigates individual quantum states in a single nanocrystal. Single electron charging effects in gold and semiconductor nanocrystals are observed. Charging effects are found to be dominant in samples, where the nanocrystals are weakly coupled to the substrate. For nanocrystals strongly coupled to the substrate, nanocrystal-substrate tunneling rate is larger than tip-nanocrystal tunneling rate. Therefore, the resulting peaks in the dI/dV spectrum are attributed to tunneling through the energy levels of the nanocrystal. A newly developed nanocrystals BEES technique is used successfully to further explore quantized energy levels and electron dynamics in single gold nanocrystals. BEES samples were grown successfully by depositing $unit[10]{nm}$ thick gold on silicon substrates. Nanocrystals are chemically attached to the gold substrate using a self assembled monolayer (SAM) of xyelendithiol molecules. Immobile and single isolated nanocrystals were imaged at low temperature. A BEES turn-on voltage of $unit[0.84]{V}$ was found on nanocrystal-free region of the substrate. The BEES spectrum acquired on a single gold nanocrystal is found to be attenuated by a factor of 10 when compared with BEES acquired on the substrate. The attenuation is attributed to electron relaxation to lower energy states before tunneling out of the nanocrystal. The measured hot electron lifetimes from experimental data were found to be on the order of $unit[16]{picoseconds}$, which is a long time compared to lifetimes in bulk metals or large nanocrystals. The long measured lifetimes result from the molecular-like energy level structures of these small nanocrystals.
4

Electron dynamics in nanomaterials for photovoltaic applications by time-resolved two-photon photoemission

Tritsch, John Russell 23 October 2013 (has links)
The impetus of unsustainable consumption coupled with major environmental concerns has renewed our society's investment in new energy production methods. Solar energy is the poster child of clean, renewable energy. Its favorable environmental attributes have greatly enhanced demand resulting in a spur of development and innovation. Photovoltaics, which convert light directly into usable electrical energy, have the potential to transform future energy production. The benefit of direct conversion is nearly maintenance free operation enabling deployment directly within urban centers. The greatest challenge for photovoltaics is competing economically with current energy production methods. Lowering the cost of photovoltaics, specifically through increasing the conversion efficiency of the active absorbing layer, may enable the invisible hand to bypass bureaucracy. To accomplish the ultimate goal of increased efficiency and lowered cost, it is essential to develop new material systems that provide enhanced output or lowered cost with respect to current technologies. However, new materials require new understanding of the physical principles governing device operation. It is my hope that elucidating the dynamics and charge transfer mechanisms in novel photovoltaic material systems will lead to enhanced design principles and improved material selection. Presented is the investigation of electron dynamics in two materials systems that show great promise as active absorbers for photovoltaic applications: inorganic semiconductor quantum dots and organic semiconductors. Common to both materials is the strong Coulomb interaction due to quantum confinement in the former and the low dielectric constant in the latter. The perceived enhancement in Coulomb interaction in quantum dots is believed to result in efficient multiexciton generation (MEG), while discretization of electronic states is proposed to slow hot carrier cooling. Time-resolved two-photon photoemission (TR2PPE) is utilized to directly map out the hot electron cooling and multiplication dynamics in PbSe quantum dots. Hot electron cooling is found to proceed on ultrafast time scales (< 2ps) and carrier multiplication proceeds through an inefficient bulk-like interband scattering. In organic semiconductors, the strong Coulomb interaction leads to bound electron-hole pairs called excitons. TR2PPE is used to monitor the separation of excitons at the model CuPc/C₆₀ interface. Exciton dissociation is determined to proceed through "hot" charge transfer states that set a fundamental time limit on charge separation. TR2PPE is used to investigate charge and energy transfer from organic semiconductors undergoing singlet fission, an analog of multiple exciton generation. The dynamic competition between one and two-electron transfer is determined for the tetracene/C₆₀ and tetracene/CuPc interfaces. These findings allow for the formulation of design principles for the successful harvesting of hot or multiple carriers for solar energy conversion. / text
5

Modeling and Design of GaN High Electron Mobility Transistors and Hot Electron Transistors through Monte Carlo Particle-based Device Simulations

January 2016 (has links)
abstract: In this work, the insight provided by our sophisticated Full Band Monte Carlo simulator is used to analyze the behavior of state-of-art devices like GaN High Electron Mobility Transistors and Hot Electron Transistors. Chapter 1 is dedicated to the description of the simulation tool used to obtain the results shown in this work. Moreover, a separate section is dedicated the set up of a procedure to validate to the tunneling algorithm recently implemented in the simulator. Chapter 2 introduces High Electron Mobility Transistors (HEMTs), state-of-art devices characterized by highly non linear transport phenomena that require the use of advanced simulation methods. The techniques for device modeling are described applied to a recent GaN-HEMT, and they are validated with experimental measurements. The main techniques characterization techniques are also described, including the original contribution provided by this work. Chapter 3 focuses on a popular technique to enhance HEMTs performance: the down-scaling of the device dimensions. In particular, this chapter is dedicated to lateral scaling and the calculation of a limiting cutoff frequency for a device of vanishing length. Finally, Chapter 4 and Chapter 5 describe the modeling of Hot Electron Transistors (HETs). The simulation approach is validated by matching the current characteristics with the experimental one before variations of the layouts are proposed to increase the current gain to values suitable for amplification. The frequency response of these layouts is calculated, and modeled by a small signal circuit. For this purpose, a method to directly calculate the capacitance is developed which provides a graphical picture of the capacitative phenomena that limit the frequency response in devices. In Chapter 5 the properties of the hot electrons are investigated for different injection energies, which are obtained by changing the layout of the emitter barrier. Moreover, the large signal characterization of the HET is shown for different layouts, where the collector barrier was scaled. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2016
6

Particle-Based Modeling of Reliability for Millimeter-Wave GaN Devices for Power Amplifier Applications

January 2018 (has links)
abstract: In this work, an advanced simulation study of reliability in millimeter-wave (mm-wave) GaN Devices for power amplifier (PA) applications is performed by means of a particle-based full band Cellular Monte Carlo device simulator (CMC). The goal of the study is to obtain a systematic characterization of the performance of GaN devices operating in DC, small signal AC and large-signal radio-frequency (RF) conditions emphasizing on the microscopic properties that correlate to degradation of device performance such as generation of hot carriers, presence of material defects and self-heating effects. First, a review of concepts concerning GaN technology, devices, reliability mechanisms and PA design is presented in chapter 2. Then, in chapter 3 a study of non-idealities of AlGaN/GaN heterojunction diodes is performed, demonstrating that mole fraction variations and the presence of unintentional Schottky contacts are the main limiting factor for high current drive of the devices under study. Chapter 4 consists in a study of hot electron generation in GaN HEMTs, in terms of the accurate simulation of the electron energy distribution function (EDF) obtained under DC and RF operation, taking into account frequency and temperature variations. The calculated EDFs suggest that Class AB PAs operating at low frequency (10 GHz) are more robust to hot carrier effects than when operating under DC or high frequency RF (up to 40 GHz). Also, operation under Class A yields higher EDFs than Class AB indicating lower reliability. This study is followed in chapter 5 by the proposal of a novel π-Shaped gate contact for GaN HEMTs which effectively reduces the hot electron generation while preserving device performance. Finally, in chapter 6 the electro-thermal characterization of GaN-on-Si HEMTs is performed by means of an expanded CMC framework, where charge and heat transport are self-consistently coupled. After the electro-thermal model is validated to experimental data, the assessment of self-heating under lateral scaling is considered. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2018
7

Schottky barrier formation at metal-quantum well interfaces studied with ballistic electron emission microscopy

Tivarus, Cristian Alexandru 06 January 2006 (has links)
No description available.
8

SYNTHESIS AND APPLICATIONS OF PLASMONIC NANOSTRUCTURES

Sil, Devika January 2015 (has links)
The localized surface plasmon resonance (LSPR), arising due to the collective oscillation of free electrons in metal nanoparticles, is a sensitive probe of the nanostructure and its surrounding dielectric medium. Synthetic strategies for developing surfactant free nanoparticles using ultrafast lasers providing direct access to the metallic surface that harvest the localized surface plasmons will be discussed first followed by the applications. It is well known that the hot carriers generated as a result of plasmonic excitation can participate and catalyze chemical reactions. One such reaction is the dissociation of hydrogen. By the virtue of plasmonic excitation, an inert metal like Au can become reactive enough to support the dissociation of hydrogen at room temperature, thereby making it possible to optically detect this explosive gas. The mechanism of sensing is still not well understood. However, a hypothesis is that the dissociation of hydrogen may lead to the formation of a metastable gold hydride with optical properties distinct from the initial Au nanostructures, causing a reversible increase in transmission and blue shift in LSPR. It will also be shown that by tracking the LSPR of bare Au nanoparticles grown on a substrate, the adsorption of halide ions on Au can be detected exclusively. The shift in LSPR frequency is attributed to changes in electron density rather than the morphology of the nanostructures, which is often the case. / Chemistry
9

Microscopie à émission d’électrons balistiques : du magnétotransport d’électrons chauds à l’imagerie magnétique / Ballistic electron emission microscopy : from hot electron magnetotransport to magnetic imaging

Hervé, Marie 12 July 2013 (has links)
Au cours de ces travaux de thèse, nous avons étudié par microscopie magnétique à émission d’électrons balistiques (BEMM) les propriétés de magnétotransport d’électrons chauds de la vanne de spin Fe/Au/Fe épitaxiée sur GaAs(001). Dans ces expériences, la pointe d’un microscope à effet tunnel (STM) injecte localement un courant d’électrons chauds à la surface de la vanne de spin. La mesure sous champ magnétique du courant d’électrons balistiques collecté à l’arrière de l’échantillon donne accès aux propriétés locales de magnétoconductance de l’échantillon. Nous avons dans un premier temps étudié les propriétés de magnétotransport de vannes de spin planaires. Les mesures BEMM démontrent un magnétocourant d’électrons chauds pouvant atteindre 500 % à température ambiante. Ces forts effets de magnétoconductance ne sont que très faiblement dépendants des épaisseurs des électrodes de fer et ne peuvent donc être dus à l’asymétrie en spin de la longueur d’atténuation des électrons chauds dans les couches de fer. Dans cette structure épitaxiée, la polarisation en spin du faisceau d’électrons chauds s’acquiert principalement aux interfaces via des effets de structure électronique. L’électron traversant les couches minces métalliques se propage comme un état de Bloch. Sa transmission aux différentes interfaces se fait en conservant d’une part la composante transverse k║ du vecteur d’onde électronique, et d’autre part, la symétrie de la fonction d’onde. Au-dessus de la barrière Schottky, les électrons chauds sont collectés dans la vallée Г du GaAs se projetant à l’interface dans la direction k║=0. Dans cette direction k║=0, la conservation de la symétrie de la fonction d’onde à l’interface Fe/Au conduit au filtrage des états de Bloch de symétrie Δ1 du fer. Ces états de symétrie Δ1, totalement polarisés en spin, sont responsables des forts magnétocourants d’électrons chauds observés. Cette analyse est confirmée expérimentalement par l’observation d’une corrélation entre amplitude du magnétocourant et masse effective du substrat semiconducteur. En augmentant la masse effective du semiconducteur, on ouvre le collimateur filtrant le courant d’électrons chauds autour de la direction k║=0, et le magnétocourant diminue sans modifier la vanne de spin. Dans un second temps, tirant partie de la résolution latérale du microscope et de sa sensibilité au magnétisme, des microstructures de fer préparées sous ultra-vide par évaporation à travers un masque (méthode du nanostencil) ont été étudiées. Dans ces structures, la modulation du courant collecté par la structure locale en domaines magnétiques a permis la réalisation d’images magnétiques avec une haute résolution spatiale. Les contrastes observés sur ces microstructures sont en excellent accord avec les images BEMM calculées à partir de simulations micromagnétiques ouvrant la voie à une microscopie magnétique quantitative à forte sensibilité et résolution latérale nanométrique. / During this thesis work, we studied by ballistic electron magnetic microscopy (BEMM) the hot electron magnetotransport properties of epitaxial Fe/Au/Fe/GaAs(001) heterostructures. In these experiments, hot electrons are injected from an STM tip through the metallic base. The measurement of the ballistic electron current collected at the back of the substrate under magnetic field gives access to the local magnetoconductance properties of the sample. The first part of this work consists in the study of a planar heterostructures. BEMM measurements on epitaxial Fe/Au/Fe/GaAs(001) samples demonstrate hot electron magnetocurrent as high as 500% at room temperature. This high magnetocurrent value is observed to be almost independent of the Fe layers thickness, and thus can not be explained by the spin asymmetry of the electron attenuation length in the iron layers. In this epitaxial heterostructure, the hot electron beam is mainly spin-polarized at the interfaces due to band structure effects. In the metallic thin films, electrons propagate as Bloch states. The electron wave function transmission at the interfaces should satisfy two selection rules: the transverse momentum (k║) of the electron wave vector and the symmetry of the electron wave function should be conserved. Above the Schottky barrier height, hot-electrons are collected in the Г valley of GaAs selecting thus only electrons with a transverse momentum (k║) close to zero. Among these k|| ≈ 0 states, conservation of the electron wave-function symmetry at the Fe/Au epitaxial interfaces additionally selects electrons with the Δ1 symmetry. These Δ1 states are fully spin-polarized and are responsible for the observed high magnetocurrent in these heterostructures. This analysis is experimentally confirmed by the observation of a correlation between the magnetocurrent value and the semiconductor effective mass. By increasing the semiconductor effective mass, we open the collimator which filters the electronic states around k║=0 and the magnetocurrent value decreases. To take advantage of the lateral resolution of the microscope and of its high sensitivity to magnetism, the second part of this work was devoted to the study of sub-micrometric iron structures prepared under UHV by evaporation through a nanostencil. In these structures, the modulation of the collected current by the local magnetic domain structure in the Fe dots allows magnetic imaging with a high spatial resolution. The experimental magnetocontrasts observed on these sub-micrometric Fe dots are in excellent agreement with BEMM current maps calculated from micromagnetic simulation results. This opens the way to a quantitative magnetic microscopy with high contrast and nanometric lateral resolution.
10

Une approche du vieillissement électrique des isolants polymères par mesure d'électroluminescence et de cathodoluminescence / Electrical ageing of insulating polymers : approach through electroluminescence and cathodoluminescence analyses

Qiao, Bo 16 October 2015 (has links)
L'électroluminescence (EL) de isolants polymères est étudiée car elle peut permettre d'approcher les phénomènes de vieillissement électrique en fournissant la signature optique d'espèces excitées sous champ électrique. Le vieillissement et la rupture diélectrique dans les isolants polymères est d'un intérêt fondamental pour les chercheurs, concepteurs et fabricants de dispositif du génie électrique. À cet égard, les décharges partielles (DPs) sont un des principaux processus conduisant au vieillissement et à la défaillance des isolants. Cependant, avec le développement des matériaux et procédés, les DPs sont évitées dans certaines situations, par exemple, les câbles haute tension, les condensateurs, etc. Par conséquent, le besoin reste prégnant pour la compréhension des mécanismes de dégradation électrique sous forte contrainte électrique, qui peut être initiée par des porteurs énergétiques. Dans ce travail, l'EL, la cathodoluminescence (CL) excitée sous faisceau d'électrons, ainsi que d'autres techniques de luminescence ont été appliquées à la caractérisation de polyoléfines et d'autres polymères isolants. Afin de comprendre la formation d'excitons dans des films minces de Polypropylène (PP) et Polyéthylène (PE), la dépendance en champ de l'EL et du courant sous contrainte continue, et de l'EL et de sa résolution selon la phase sous contrainte AC, sont étudiées. Les spectres d'EL du PP et du PE ont le même pic principal à environ 570 nm, ce qui implique des structures et des défauts chimiques similaires pour les deux matériaux, et le même processus de dégradation. Le pic principal peut être complété par une émission à environ 750 nm dominante à faible champ. L'impact de la nature des électrodes a été étudiée sur du PEN pour comprendre l'origine de l'émission dans le rouge. A travers la dépendance en champ de l'EL et sa résolution selon la phase avec des métallisations or et ITO, on montre que l'émission dans le rouge est liée à la nature des électrodes et correspond à l'excitation de plasmons de surface ou d'états d'interface. Une étude plus approfondie est effectuée sur la cathodoluminescence d'isolants polymères. Des couches minces de PP, PE, ainsi que de Polyethylene Naphthalate (PEN) et de Polyether Ether Ketone (PEEK) ont été irradiés par faisceau d'électrons jusqu'à 5 keV. Nous avons pu reconstruire les spectres de CL et d'EL du PE et du PP à partir de quatre composants élémentaires: fluorescence, chimiluminescence, luminescence induite par recombinaison, et composante principale du spectre d'EL à 570nm décrite plus haut et considérée comme signature du vieillissement. Pour la première fois, la nature de l'EL et de la CL de polyoléfines est décomposée en quatre composantes de base avec des contributions relatives différentes. L'identification de ces composantes spectrales est utile pour interpréter la luminescence de polyoléfines et autres isolants polymères, et établir les liens entre distribution de charge d'espace et vieillissement diélectrique. A travers ces recherches sur l'EL et la CL dans plusieurs isolants polymères, i.e. polyoléfines ou polyesters, la formation d'excitons et les processus de relaxation d'énergie sous contrainte électrique et électrons énergétiques sont mis en évidence. Surtout, l'analyse en composantes spectrales et la reconstruction des spectres donne accès aux mécanismes d'excitation de la luminescence et à une corrélation avec le vieillissement électrique. A l'avenir, les mesures de luminescence peuvent devenir une méthode standard pour sonder et analyser les isolants polymères. / Electroluminescence (EL) of insulating polymers is a subject of great interest because it is associated with electrical ageing and could provide the signature of excited species under electric field. Electrical ageing and breakdown in insulating polymers is of fundamental interest to the researchers, the design engineers, the manufacturers and the customers of electrical apparatus. In this respect, Partial Discharge (PD) is a harmful process leading to ageing and failure of insulating polymers. However, with the development of the materials and apparatus, PDs can be weakened or avoided in some situations, e.g. extra high voltage cables, capacitors, etc. Therefore, there is urgent demand for understanding electrical degradation mechanisms under high electric field, which can be triggered by energetic charge carriers. In this work, Electroluminescence, EL, and cathodoluminescence, CL, excited under electron beam, along with other luminescence-family techniques are carried out for probing polyolefins and other insulating polymers. In order to uncover the excitons formation in Polypropylene (PP) and Polyethylene (PE) thin films, the field dependence of EL and current under DC stress and field dependence of EL and phase-resolved EL under AC stress, are investigated. The EL spectra of both PP and PE have the same main peak at approximately 570 nm, pointing towards similar chemical structures and defects in both polyolefins, and same route to degradation. This main peak can be complemented by an emission at approximately 750 nm dominating at low field. Electrode effect on the EL of Polyethylene Naphthalte (PEN) was investigated to understand the origin of the red emission at 750 nm. Through field dependence of EL and phase-resolved EL of Au or ITO electrodes, we proved the red component is due to the nature of electrode, more precisely Surface Plasmons and/or interface states. Further thorough study was carried out on cathodoluminescence of insulating polymers. Thin films of PP, PE, along with Polyethylene Naphthalate (PEN) and Polyether Ether Ketone (PEEK) were irradiated under electron beam up to 5 keV to be excited. We could reconstruct EL and CL spectra of both PE and PP using four elementary components: i.e. Fluorescence, Chemiluminescence, Recombination-induced Luminescence, and main component of the EL spectrum at 570 nm reported above and constituting an ageing marker. For the first time the nature of both EL and CL in polyolefins is uncovered, containing four basic components with different relative contributions. Identification of these spectral components is helpful to interpret the nature of light emission from polyolefins and other insulating polymers and to bridge the gap between space charge distribution and electrical ageing or breakdown. Through researches on EL and CL in several insulating polymers, i.e. polyolefins and a polyester, excitons formation and relaxation processes under electric stress and kinetic electrons are evidenced. More importantly, the spectral components analyses and reconstruction uncovers the nature of luminescence and its correlation to electrical ageing. In the future, luminescence measurement can be developed to be a standard method to probe and analyze insulating polymers.

Page generated in 0.0498 seconds