Submitted by Ziani DE SOUZA SCHIABER (zianisouza@yahoo.com.br) on 2016-05-02T20:43:07Z No. of bitstreams: 1 Tese_Final_Ziani_Schiaber.pdf: 4224142 bytes, checksum: 63114f480403729da0d811c82872c3cc (MD5) / Approved for entry into archive by Felipe Augusto Arakaki (arakaki@reitoria.unesp.br) on 2016-05-04T19:24:06Z (GMT) No. of bitstreams: 1 schiaber_zs_dr_bauru.pdf: 4224142 bytes, checksum: 63114f480403729da0d811c82872c3cc (MD5) / Made available in DSpace on 2016-05-04T19:24:06Z (GMT). No. of bitstreams: 1 schiaber_zs_dr_bauru.pdf: 4224142 bytes, checksum: 63114f480403729da0d811c82872c3cc (MD5) Previous issue date: 2016-04-19 / Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) / Nanosestruturas de GaN destacam-se devido à baixa densidade de defeitos e consequentemente alta qualidade estrutural e óptica quando comparadas ao material em forma de filme. O entendimento dos mecanismos de formação de nanofios e nanocolunas de GaN por diferentes técnicas é fundamental do ponto de vista da ciência básica e também para o aprimoramento da fabricação de dispositivos eletrônicos e optoeletrônicos baseados nesse material. Neste trabalho discorre-se sobre a preparação e caracterização de nanofios e nanoestruturas de GaN pelas técnicas de epitaxia por magnetron sputtering e epitaxia por feixe molecular em diferentes tipos de substratos. Pela técnica de epitaxia por magnetron sputtering foram obtidos nanocristais e nanocolunas de GaN, além de uma região com camada compacta. Visando criar uma atmosfera propícia para o crescimento de nanoestruturas de GaN não coalescida, atmosfera de N2 puro e um anteparo, situado entre o alvo e o porta-substratos, foram utilizados. O anteparo causou diferença no fluxo incidente de gálio no substrato, ocasionando a formação de diferentes tipos de estruturas. A caracterização das amostras se deu principalmente através de medidas de microscopia eletrônica de varredura, difração de raios X e espectroscopia de fotoluminescência. As nanocolunas, de 220 nm de altura, foram formadas na região distante 2 mm do centro da sombra geométrica do orifício do anteparo e apresentaram orientação [001] perpendicular ao substrato, comumente encontrada em nanofios de GaN depositados por MBE. Em relação aos nanofios obtidos pela técnica de MBE, investigou-se a possibilidade de controlar a densidade de nanofios através de uma camada de Si sobre o GaN–Ga polar visando inibir a coalescência. Diferentes quantidades de Si foram depositadas e a densidade dos nanofios foi diferenciada significativamente. Os nanofios apresentaram densidade média de 108 nanofios/cm2 com 0,60 nm de espessura da camada de Si. Espessuras menores não resultaram no crescimento de nanofios, porém espessuras superiores causaram uma alta densidade de nanofios de 1010 nanofios/cm2 que permaneceu constante, independentemente do tempo de deposição. Medidas de polo por difração de raios X evidenciaram que os nanofios nuclearam-se orientados e em uma camada cristalina de Si ou SixNy. Experimentos de ataque químico com KOH indicaram a polaridade N para o nanofio e as medidas de difração por feixe convergente confirmaram a polaridade de N para o nanofio e Ga para a buffer layer. Os resultados obtidos neste trabalho permitiram um melhor entendimento da nucleação e dos mecanismos de formação de nanoestruturas de GaN, viabilizando maior controle das características dessas nanoestruturas produzidas. / GaN nanowires and nanocolumns stand out due to the low defect density and high structural and optical quality compared to the corresponding thin films. The understanding of the formation mechanism of the different GaN structures using different techniques is critical to improving the manufacture of the electronic and optoelectronic devices based on this material. This thesis focuses on the preparation and characterization of GaN nanowires and nanostructures. The molecular bem epitaxy (MBE) and magnetron sputtering epitaxy (MSE) were used and different substrates were tested. Concerning GaN nanocrystals and nanocolumns obtained by MSE, optimization of the deposition conditions was necessary in order to produce non-coalesced GaN nanostructures. The best conditions were: pure N2 atmosphere, silicon substrate, and a perforated screen placed between the target and the substrate holder. The later produced differences on the Ga flow to the substrate, inducing the formation of different structures, depending on the position of growth spot. Samples were characterized using scanning electron microscopy, X-ray diffraction and photoluminescence spectroscopy. Nanocolumns were observed, mainly in sites corresponding to a disc of radius 2 mm from the geometric centre of the hole. The columns were oriented with the GaN [001] axis perpendicular to the Si (111) substrate surface, situation which is commonly found in GaN nanowires deposited by MBE. Regarding the nanowires prepared by MBE technique, in order to inhibit coalescence and to investigate the possibility of controlling the numerical density of nanowires, we have used Si cap layers on top of the Ga-polar GaN buffer layer. Different amounts of Si have been deposited, and the density of the nanowires was significantly modified. With Si layer thickness of 0.60 nm, the nanowires had an average density of 108 nanowires/cm2 . Lower thickness did not result in the growth of nanowires, but higher thickness caused a high density of nanowires of 1010 nanowires/cm2 which remained constant regardless of the deposition time. X-ray diffraction pole figures showed that the different nanowires grown up in oriented fashion in a crystalline layer of Si or SixNy. Etching with KOH indicated N polarity for the grown nanowires, in spite of the fact that they were grown using Ga polar GaN buffer layers. Measurements by convergent beam electron diffraction confirmed the N polarity to the nanowire and Ga polarity for the buffer layer. Aspects obtained in this study allowed a better understanding of nucleation and nanostructures formation mechanisms of GaN, enabling greater control of the characteristics of these nanostructures produced. / FAPESP: 2011/22664-2 / FAPESP: 2013/25625-3

abstract: The state of the solar industry has reached a point where significant advancements in efficiency will require new materials and device concepts. The material class broadly known as the III-N's have a rich history as a commercially successful semiconductor. Since discovery in 2003 these materials have shown promise for the field of photovoltaic solar technologies. However, inherent material issues in crystal growth and the subsequent effects on device performance have hindered their development. This thesis explores new growth techniques for III-N materials in tandem with new device concepts that will either work around the previous hindrances or open pathways to device technologies with higher theoretical limits than much of current photovoltaics. These include a novel crystal growth reactor, efforts in production of better quality material at faster rates, and development of advanced photovoltaic devices: an inversion junction solar cell, material work for hot carrier solar cell, ground work for a selective carrier contact, and finally a refractory solar cell for operation at several hundred degrees Celsius. / Dissertation/Thesis / Doctoral Dissertation Materials Science and Engineering 2016

abstract: It has been a long-standing goal to epitaxially integrate III-V alloys with Si substrates which can enable low-cost microelectronic and optoelectronic systems. Among the III-V alloys, gallium phosphide (GaP) is a strong candidate, especially for solar cells applications. Gallium phosphide with small lattice mismatch (~0.4%) to Si enables coherent/pseudomorphic epitaxial growth with little crystalline defect creation. The band offset between Si and GaP suggests that GaP can function as an electron-selective contact, and it has been theoretically shown that GaP/Si integrated solar cells have the potential to overcome the limitations of common a-Si based heterojunction (SHJ) solar cells. Despite the promising potential of GaP/Si heterojunction solar cells, there are two main obstacles to realize high performance photovoltaic devices from this structure. First, the growth of the polar material (GaP) on the non-polar material (Si) is a challenge in how to suppress the formation of structural defects, such as anti-phase domains (APD). Further, it is widely observed that the minority-carrier lifetime of the Si substrates is significantly decreased during epitaxially growth of GaP on Si. In this dissertation, two different GaP growth methods were compared and analyzed, including migration-enhanced epitaxy (MEE) and traditional molecular beam epitaxy (MBE). High quality GaP can be realized on precisely oriented (001) Si substrates by MBE growth, and the investigation of structural defect creation in the GaP/Si epitaxial structures was conducted using high resolution X-ray diffraction (HRXRD) and high resolution transmission electron microscopy (HRTEM). The mechanisms responsible for lifetime degradation were further investigated, and it was found that external fast diffusors are the origin for the degradation. Two practical approaches including the use of both a SiNx diffusion barrier layer and P-diffused layers, to suppress the Si minority-carrier lifetime degradation during GaP epitaxial growth on Si by MBE were proposed. To achieve high performance of GaP/Si solar cells, different GaP/Si structures were designed, fabricated and compared, including GaP as a hetero-emitter, GaP as a heterojunction on the rear side, inserting passivation membrane layers at the GaP/Si interface, and GaP/wet-oxide functioning as a passivation contact. A designed of a-Si free carrier-selective contact MoOx/Si/GaP solar cells demonstrated 14.1% power conversion efficiency. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2017

Ce travail de thèse a porté sur la synthèse de boîtes quantiques (BQs) de semi-conducteurs nitrures orientés (11-22) ou (0001) par épitaxie par jets moléculaires à plasma d'azote, pour des applications aux capteurs chimiques pour la détection du niveau de pH, d'hydrogène ou des hydrocarbures dans des environnements gazeux ou liquides. Dans la première partie de ce manuscrit, je décri la synthèse des couches bidimensionnelles semi-polaires (11-22) : des couches binaires (AlN, GaN, and InN) et des ternaires (AlGaN et InGaN), qui sont requises pour le contact de référence dans les transducteurs et aussi pour établir une connaissance de base pour comprendre la transition dès la croissance bidimensionnelle à la croissance tridimensionnel des BQs. Un résultat particulièrement relevant est l'étude de la cinétique de croissance et l'incorporation de l'indium dans les couches d'InGaN(11-22). De même que pour InGaN polaire (0001), les conditions optimales de croissance pour l'orientation cristallographique semi-polaire correspondent à la stabilisation de 2 ML d'In sur la surface, en excellent accord avec des calculs théoriques. Les limites de la fenêtre de croissance en termes de température du substrat et de flux d'In sont les mêmes pour les matériaux semi-polaire et polaires. Cependant, j'ai constaté une inhibition de l'incorporation de l'In dans les couches semi-polaires, même pour une température en dessous du seuil de la ségrégation pour l'InGaN polaire. Dans une deuxième étape, j'ai fabriqué des super-réseaux de BQs de GaN/AlN et InGaN/GaN, à la fois dans l'orientation polaire et semi-polaire. Les mesures de photoluminescence et de photoluminescence en temps résolu confirment la réduction du champ électrique interne dans les boîtes semi-polaires. D'autre part, les BQs semi-polaires à base d'InGaN doit relever le défi de l'incorporation d'In dans cette orientation cristallographique. Pour surmonter ce problème, l'influence de la température de croissance sur les propriétés des boîtes quantiques InGaN polaires et semi-polaires a été étudiée, en considérant la croissance à haute température (TS = 650–510 °C, où la désorption d'In est active) et à basse température (TS = 460–440 °C, où la désorption d'In est négligeable). J'ai démontré que les conditions de croissance à faible TS ne sont pas compatibles avec le plan polaire, tandis qu'ils fournissent un environnement favorable au plan semi-polaire pour améliorer l'efficacité quantique interne de nanostructures InGaN. Enfin, j'ai synthétisé un certain nombre de transducteurs à BQs de GaN/AlN et InGaN/GaN selon les axes de croissance polaire et semi-polaire. Dans chaque cas, les conditions de croissance pour atteindre la fourchette spectrale ciblée (420-450 nm d'émission à avec une couche contact transparente pour des longueurs d'onde plus courtes que 325 nm) ont été identifiés. L'influence d'un champ électrique externe sur la luminescence des transducteurs ont confirmé que la meilleure performance (plus grande variation de la luminescence en fonction de la polarisation) a été fournie par des structures à base de BQs d'InGaN/GaN. Avec ces données, les spécifications des transducteurs opto-chimiques ont été fixées : 5 perides de BQs d'InGaN/GaN sur une couche contact d'Al0.35Ga0.65N:Si). Puis, j'ai synthétisé un certain nombre de ces transducteurs afin d'obtenir un aperçu sur la reproductibilité, limites et les étapes critiques du processus de fabrication. En utilisant ces échantillons, nous avons réalisé un système capteur intégré qui a été utile pour le suivi de la valeur du pH de l'eau. / This thesis work has focused on the synthesis of (In)GaN-based quantum dot (QD) structures by plasma-assisted molecular-beam epitaxy (PAMBE), deposited in both polar (0001) and semipolar (11-22) crystallographic orientations, for application as optical transducers for chemical sensors for detection of pH levels, and hydrogen or hydrocarbon concentrations in gas or liquid environments. In the first part of this work, I describe the synthesis of semipolar-oriented two-dimensional layers: binary alloys (AlN, GaN and InN) and ternary alloys (AlGaN and InGaN), which are required for the reference contact of the transducers and set the basic know-how to understand the transition from two-dimensional growth to three-dimensional QD nanostructures. It is particularly relevant the study of indium kinetics and indium incorporation during the PAMBE growth of InGaN(11-22) layers. Similarly to (0001)-oriented InGaN, optimum growth conditions for this semipolar crystallographic orientation correspond to the stabilization of 2 ML of In on the growing InGaN surface, in excellent agreement with first-principles calculations. The limits of the growth window in terms of substrate temperature and In flux lie at same values for polar and semipolar materials. However, I observe an inhibition of the In incorporation in semipolar layers even for substrate temperatures below the segregation threshold for polar InGaN. In a second stage, I report the successful fabrication of superlattices (SLs) of GaN/AlN and InGaN/GaN QDs, both in polar and semipolar orientations. Photoluminescence and time-resolved photoluminescence confirmed the reduction of the internal electric field in the semipolar GaN/AlN QDs in comparison with polar structures. On the other hand, semipolar InGaN QDs must face the challenge of In incorporation in this crystallographic orientation. To overcome this problem, the influence of the growth temperature on the properties of the polar and semipolar InGaN QDs has been studied, considering growth at high temperature (TS = 650–510 °C, where In desorption is active) and at low temperature (TS = 460–440 °C, where In desorption is negligible). I demonstrate that low-TS growth conditions are not compatible with polar plane whereas they provide a favorable environment to semipolar plane to enhance the internal quantum efficiency of InGaN nanostructures. Finally, I have synthesized a number of GaN/AlN and InGaN/GaN QD optical transducers, grown in polar and semipolar orientations. In each case, the growth conditions to attain the targeted spectral range (emission at 420-450 nm with buffer transparent for wavelengths shorter than 325 nm) were identified. The influence of an external electric field on the luminescence of the transducers confirmed that the best performance (larger variation of the luminescence as a function of bias) was provided by InGaN/GaN QD structures. With this feedback, the specifications of the targeted opto-chemical transducer structures have been established (5 InGaN/GaN QD layers on Al0.35Ga0.65N:Si). Then, I have synthesized a number of InGaN/GaN opto-chemical transducers in order to get an insight on the reproducibility, limitations and critical steps in the fabrication process. Using these samples, we have achieved an integrated sensor system based on polar InGaN QD SLs, and the system was useful for monitorization of the pH value of water.

Ce travail de thèse porte sur la croissance par épitaxie par jets moléculaires assistée plasma et sur la caractérisation de nanofils (NF) de GaN et d'hétérostructures filaires de GaN/AlN. Dans un premier temps, la morphologie des NFs de GaN (densité, longueur moyenne, diamètre moyen, dispersion de longueurs) est étudiée en fonction des paramètres de croissance. Via la diffraction d'électrons rapides, la morphologie des NFs GaN est corrélée à la dynamique de nucléation de ces derniers. Des expériences de diffraction de rayons X en incidence rasante effectuées à l'ESRF permettent également de clarifier les processus de nucléation des NFs GaN. Nous démontrons ensuite l'utilisation de la diffraction de rayons X résonnante pour déterminer la polarité des NFs GaN. Nous montrons que ces derniers sont de polarité N lorsque fabriqués sur Si nu. Des tests complémentaires de gravure sélective au KOH révèlent que les NFs GaN fabriqués sur un substrat de Si recouvert d'un fin buffer d'AlN ainsi que ceux dont la fabrication est initiée après pré-déposition de Ga sur la surface du Si, sont aussi de polarité N. Concernant les hétérostructures filaires GaN-AlN, la croissance d'AlN autour et sur les nanofils de GaN est étudiée en fonction de divers paramètres de croissance. Le rapport d'aspect des coquilles d'AlN (longueur/épaisseur) est décrit par un modèle géométrique. En utilisant une combinaison de diffraction anomale multi-longueurs d'onde, de microscopie en transmission de haute résolution et des calculs théoriques, l'état de contrainte des coeurs de GaN est analysé en fonction de l'épaisseur de la coquille. Cette contrainte augmente avec l'épaisseur de la coquille tant que l'AlN croît de manière homogène autour des NFs de GaN. Dès lors que la coquille est asymétrique, le système relaxe plastiquement. Nous étudions enfin la possibilité de fabriquer des îlots de GaN dans des NFs AlN. Nous déterminons le rayon critique de NFs AlN au-dessus duquel le GaN déposé subit une transition de forme de 2D à 3D. L'analyse des propriétés optiques de ces nanostructures originales revèle la présence de nombreux états localisés. / This work focuses on the growth by plasma-assisted molecular beam epitaxy and on the characterization of GaN nanowires (NWs) and of GaN/AlN NW heterostructures. We first investigate GaN NW morphology (density, mean length, mean diameter, length dispersion) dependence on the growth parameters. Using reflection high energy electron diffraction, GaN NW morphology is correlated to their nucleation dynamics. In situ grazing-incidence X-ray diffraction experiments performed at the ESRF allow clarifying GaN NW nucleation processes on bare Si(111) and when usinga thin AlN buffer deposited on Si(111). The use of resonant X-ray diffraction for the determination of GaN NW polarity is then successfully demonstrated. GaN NWs grown on bare Si(111) are shown to be N-polar. Additional KOH selective etching tests reveal that both GaN NWs grown using a thin AlN buffer on Si(111) and when pre-depositing Ga on the Si(111) surface are N-polar, too. Regarding GaN-AlN NW heterostructures, the growth of an AlN shell around GaN NWs is studied as a function of various growth parameters. The AlN shell aspect ratio is described by a geometrical model. Using a combination of multiwavelength anomalous diffraction, high resolution transmission microscopy and theoretical calculations, GaN core strain state is investigated as a function of the AlN shell thickness. This strain is shown to increase with the shell thickness as long as AlN grows homogeneously around GaN NWs. When the shell is asymmetric, the system relaxes plastically. Eventually, we study the possibility to fabricate island-like GaN insertions in AlN NWs. We determine the critical AlN NW radius above which GaN undergoes a 2D to 3D shape-transition. Regarding optical properties of these novel structures, the presence of multiple localized states is identified.

Ce travail a pour objectif la fabrication, en épitaxie par jets moléculaires, de nanofils coeurcoquilleà base de GaAs et AlGaAs déposés sur des substrats Si(111), en vue de réaliser desréseaux de fils pour de nouvelles cellules solaires, et pour des fils photoniques permettant uneapproche bottom-up d’émetteurs de photons uniques.La première partie de ce travail est une étude systématique des paramètres clés qui contrôlent lacroissance uni-dimensionnelle de fils GaAs élaborés par un mécanisme vapeur-liquide-solideauto-catalysé, à savoir le rapport des flux As/Ga, la température du substrat, et la vitesse decroissance.La seconde partie se concentre sur la croissance et la caractérisation de fils GaAs recouvertsd’une coquille d’alliages AlGaAs (35% Al) afin de s’affranchir des recombinaisons de surface.Ces coquillesde AlGaAs sont fabriquées en conditions riche-As (rapport As/Ga > 10) afin deconsommer les gouttes de catalyseur gallium et de promouvoir une croissance radiale (le taux decroissance maximal axial/radial est égal à 6). Diverses caractérisations optiques sont réalisées àbasse température sur ces ensembles de fils : cathodoluminescence, photoluminescence etspectroscopie résolue en temps. L’intensité de luminescence et la durée de vie des porteursaugmentent fortement avec la présence de la coquille : une épaisseur de 7 nm de cette dernièreest suffisante pour optimiser la passivation des nanofils et supprimer les recombinaisons liéesaux états de surface. Une fine couche extérieure de GaAs est nécessaire pour éviter touteoxydation de la coquille d’alliage AlGaAs.De plus, grâce à des mesures de CL résolues spatialement, les longueurs de diffusion desexcitons dans ces fils ont été obtenues, allant de 0.7 μm à 1.5 μm pour des épaisseurs decoquilles comprises entre 20 et 50 nm. Des valeurs plus petites sont mesurées pour des coquillesplus épaisses, ce qui tend à montrer l’introduction de défauts dans l’alliage qui pourraientlimiter la qualité de l’interface. Le décalage en énergie de l’émission fournit des informationssur la génération de contraintes dans ces fils coeur-coquille et sur le champ piézo-électrique quien découle. / This report focuses on the fabrication of GaAs nanowires and GaAs/AlGaAs core-shellstructures by molecular beam epitaxy, deposited on Si (111) substrates in order to providearrays of wires for innovative solar cells and bottom-up photonic wires for efficient singlephoton emitters.The first part of this work is a systematic study of the key parameters which control the onedimensionalgrowth of bare GaAs NWs with a self-assisted vapor-liquid-solid growth process,namely the As-to-Ga flux ratio, the substrate temperature, and the deposition rate.The second part concentrates on the growth and characterization of GaAs wires covered with ashell of AlGaAs alloy (35 % Al) in order to get rid of the surface recombinations. These shellswere fabricated under As-rich condition with ratio As/Ga >10 in order to consume the Gadropletscompletely and to promote a radial growth. The obtained axial-to-radial growth ratio is6. The optical characterizations on ensemble were carried out at low temperature via thecathodoluminescence (CL), photoluminescence (PL), and time-resolved PL measurements. Theresults show that the lifetime of carriers and luminescence intensity increase significantly withshell coverage. About 7 nm thick shell is enough to optimize the passivation and suppress thesurface state recombination. A thin outer cap of GaAs is required in order to prevent someoxidation of the AlGaAs alloy shell.In addition, the exciton diffusion lengths of these NWs, studied via the spatially resolved CL,are in the range of 0.7 - 1.5 μm for NWs with shell thicknesses between 20 - 50 nm. Thesevalues are smaller for thicker shells due to the defect formation, leading to limit the quality ofcore-shell interface. The shift in optical emission experiments provides the information of thestrain generation of core-shell when we vary the shell thickness. The piezoelectric field wasnoticed in these samples.

Nesse trabalho, foi investigado um novo tipo de fotodetector de radiação infravermelha baseado em pontos quânticos de submonocamada de InAs obtidos pela técnica de epitaxia por feixe molecular (MBE, Molecular Beam Epitaxy). Suas propriedades foram comparadas com as de fotodetectores de pontos quânticos de InAs convencionais obtidos pela mesma técnica de deposição, mas no modo de crescimento Stranski-Krastanov. Medidas de corrente de escuro, de ruído, de responsividade e de absorção mostraram que, dependendo da estrutura das amostras, os dispositivos com pontos quânticos de submonocamada podem ter um excelente desempenho. / In this work, we investigated a new type of infrared photodetector based on InAs sub-monolayer quantum dots grown by molecular beam epitaxy (MBE). Their properties were compared with those of photodetectors containing conventional InAs quantum dots obtained by the same deposition technique, but in the Stranski-Krastanov growth mode. Dark current, noise, responsivity and absorption measurements have shown that, depending on the structure of the samples, the devices with sub-monolayer quantum dots can perform very well.

No description available.

abstract: III-V-bismide semiconductor alloys are a class of materials with applications in the mid and long wave infrared spectrum. The quaternary alloy InAsSbBi is attractive because it can be grown lattice-matched to commercially available GaSb substrates, and the adjustment of the Bi and Sb mole fractions enables both lattice constant and bandgap to be tuned independently. This dissertation provides a comprehensive study of the surface morphology and the structural and chemical properties of InAsSbBi alloys grown by molecular beam epitaxy. 210 nm thick InAsSbBi layers grown at temperatures from 280 °C to 430 °C on (100) on-axis, (100) offcut 1° to (011), and (100) offcut 4° to (111)A GaSb substrates are investigated using Rutherford back scattering, X-ray diffraction, transmission electron microscopy, Nomarski optical microscopy, atomic force microscopy, and photoluminescence spectroscopy. The results indicate that the layers are coherently strained and contain dilute Bi mole fractions. Large surface droplets with diameters and densities on the order of 3 µm and 106 cm-2 are observed when the growth is performed with As overpressures around 1%. Preferential orientation of the droplets occurs along the [011 ̅] step edges offcut (100) 1° to (011) substrate. The surface droplets are not observed when the As overpressure is increased to 4%. Small crystalline droplets with diameters and densities on the order of 70 nm and 1010 cm-2 are observed between the large droplets for the growth at 430°C. Analysis of one of the small droplets indicates a misoriented zinc blende structure composed of In, Sb, and Bi, with a 6.543 ± 0.038 Å lattice constant. Lateral variation in the Bi mole fraction is observed in InAsSbBi grown at high temperature (400 °C, 420 °C) on (100) on-axis and (100) offcut 4° to (111)A substrates, but is not observed for growth at 280 °C or on (100) substrates that are offcut 1° to (011). Improved crystal and optical quality is observed in the high temperature grown InAsSbBi and CuPtB type atomic ordering on the {111}B planes is observed in the low temperature grown InAsSbBi. Strain induced tilt is observed in coherently strained InAsSbBi grown on offcut substrates. / Dissertation/Thesis / Doctoral Dissertation Materials Science and Engineering 2020

Die vorliegende Arbeit befasst sich mit dem Einfluss einer hyperthermischen Stickstoffionenbestrahlung (Ekin < 25 eV) auf das Galliumnitrid-Schichtwachstum. Dabei wird insbesondere der Einfluss einer Oberflächenrekonstruktion, einer Strukturierung der Oberfläche, einer Zwischenschicht (Pufferschicht) und der Einfluss verschiedener Siliziumsubstratorientierungen auf das epitaktische Wachstum von dünnen Galliumnitrid-Schichten nach einer hyperthermischen Stickstoffionenbestrahlung diskutiert. Ziel war es, möglichst dünne, epitaktische und defektarme Galliumnitrid-Schichten zu erhalten. Für die Charakterisierung der Galliumnitrid-Schichten und der Siliziumsubstrate standen diverse Analysemethoden zur Verfügung. Die kristalline Oberflächenstruktur konnte während des Wachstums mittels Reflexionsbeugung hochenergetischer Elektronen beobachtet werden. Nachfolgend wurde die Oberflächentopografie, die kristalline Struktur und Textur, sowie die optischen Eigenschaften der Galliumnitrid-Schichten mittels Rasterkraftmikroskopie, Röntgenstrahl-Diffraktometrie, hochauflösender Transmissionselektronenmikroskopie und Photolumineszenzspektroskopie untersucht.