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201	Wachstumsanalyse amorpher dicker Schichten und Schichtsysteme / Growth analysis of thick amorphous films and multilayers Streng, Christoph 18 May 2004 (has links) No description available. Mathematics and Computer Science Dünne Schichten dicke Schichten Multilagen UHV Elektronenstrahlverdampfen metallische Gläser Rastertunnelmikroskopie Rasterkraftmikroskopie Oberflächenmorphologie diffuse Röntgenstreuung Röntgenreflektivität Molekulardynamiksimulation Kontinuumsmodell 530 Physik Thin films thick films multilayers UHV electron beam evaporation metallic glasses scanning tunneling microscopy scanning force microscopy surface morphology diffuse X-ray scattering X-ray reflection molecular dynamics simulation continuum model stochastic partial differential equation 33.66 33.68
202	Wachstumsanalyse amorpher dicker Schichten und Schichtsysteme / Growth analysis of thick amorphous films and multilayers Streng, Christoph 18 May 2004 (has links) No description available. Mathematics and Computer Science Dünne Schichten dicke Schichten Multilagen UHV Elektronenstrahlverdampfen metallische Gläser Rastertunnelmikroskopie Rasterkraftmikroskopie Oberflächenmorphologie diffuse Röntgenstreuung Röntgenreflektivität Molekulardynamiksimulation Kontinuumsmodell 530 Physik Thin films thick films multilayers UHV electron beam evaporation metallic glasses scanning tunneling microscopy scanning force microscopy surface morphology diffuse X-ray scattering X-ray reflection molecular dynamics simulation continuum model stochastic partial differential equation 33.66 33.68
203	Topographie, Struktur und Dynamik thermisch aufgedampfter Polymerfilme / Topography, structure and dynamics of thermally evaporated polymer films Vree, Christian 06 July 2009 (has links) No description available. 530 Physik Mathematics and Computer Science Polymere Oberflächen Entnetzung Strukturbildung thermisches Aufdampfen Molekulardynamiksimulationen Kontinuumsmodellierung Rasterkraftmikroskopie Glas Polycarbonat polymers surfaces dewetting pattern formation thermal evaporation molecular dynamics simulation continuum modeling scanning force microscopy glass polycarbonate 33.66 33.68
204	Time-resolved spectroscopic study on fundamental chemical reactions in a unique class of solvents / 時間分解分光法による化学反応素過程の研究 : 超臨界流体からイオン液体まで / ジカンブンカイブンコウホウニヨルカガクハンノウソカテイノケンキュウ : チョウリンカイリュウタイカライオンエキタイマデ藤井香里, Kaori Fujii 22 March 2021 (has links) 多数の溶媒分子に取り囲まれている溶液中において溶質分子の化学反応素過程を考える場合、溶媒分子による反応の平衡論的、動的な効果を考える必要がある。本研究では、ユニークな反応場として水や有機溶媒とは区別される、超臨界流体とイオン液体をとり上げ、溶質分子のプロトン移動反応、光解離反応について、時間分解レーザー分光と分子動力学計算、理論的解析を行い、その現象を明らかにする試みをおこなった。 / In solution, solvent molecules involve chemical reaction of solute molecules and could alter both reaction yield and kinetics. In this thesis, the author focused on fundamental chemical reactions (intermolecular proton transfer and photodissociate reaction) in a unique class of solvents, supercritical fluids and ionic liquids. By measuring time-resolved fluorescence spectrum and transient absorption spectrum of solutes, the author discusses how the reaction yield and kinetics are described by solvent physicochemical properties. / 博士(理学) / Doctor of Philosophy in Science / 同志社大学 / Doshisha University イオン液体超臨界メタノール時間分解蛍光スペクトル過渡吸収スペクトル励起状態プロトン移動反応光解離反応溶媒和ダイナミクス分子動力学計算拡散律速反応 Ioinic liquids Supercritical methanol Time-resolved fluorescence spectrum Transient absorption spectrum Photodissociation Solvation dynamics Molecular dynamics simulation Diffusion limited reaction
205	Wachstum amorpher Schichten: Vergleich von Experiment und Simulation im Bereich Oberflächenrauhigkeit und mechanische Spannungen / Growth of amorphous thin films: Comparison of experiment and simulation concerning surface roughness and mechanical stresses Mayr, Stefan Georg 01 November 2000 (has links) No description available. 530 Physik Mathematics and Computer Science Dünne Schichten UHV Elektronenstrahlverdampfen Sputtern PLD Metallene Gläser Polymorphe Kristallisation Rastertunnelmikroskopie Oberflächenmorphologie Röntgenbeugung Mechanische Spannungen Elektrische Widerstandsmessung Monte-Carlo-Simulation Molekulardynamiksimulation Kontinuumswachstumsmodell Thin films UHV electron beam evaporation sputtering PLD metallic glasses polymorphous crystallization scanning tunneling microscopy surface morphology X-ray diffraction mechanical stresses electrical resistivity Monte-Carlo simulation molecular dynamics simulation continuum growth model stochastic partial differential equation 33.66 33.68

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