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The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
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Showing 1 to 7 of 7 (0.053 seconds)Spelling suggestions: "subject:"oberflächenmorphologie"" "subject:"oberflächenmorphologien""
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Markierungsfreie Proteinanalytik mit oberflächenverstärkter Ramanspektroskopie / Label-free protein analytics with surface-enhanced Raman spectroscopyChristou, Konstantin 25 August 2009 (has links)
No description available.
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| 2 |
Surface morphology of AlGaN/GaN heterostructures grown on bulk GaN by MBEHentschel, R., Gärtner, J., Wachowiak, A., Großer, A., Mikolajick, T., Schmult, S. 10 October 2022 (has links)
In this report the influence of the growth conditions on the surface morphology of AlGaN/GaN heterostructures grown on sapphire-based and bulk GaN substrates is nondestructively investigated with focus on the decoration of defects and the surface roughness. Under Ga-rich conditions specific types of dislocations are unintentionally decorated with shallow hillocks. In contrast, under Ga-lean conditions deep pits are inherently formed at these defect sites. The structural data show that the dislocation density of the substrate sets the limit for the density of dislocation-mediated surface structures after MBE overgrowth and no noticeable amount of surface defects is introduced during the MBE procedure. Moreover, the transfer of crystallographic information, e.g. the miscut of the substrate to the overgrown structure, is confirmed. The combination of our MBE overgrowth with the employed surface morphology analysis by atomic force microscopy (AFM) provides a unique possibility for a nondestructive, retrospective analysis of the original substrate defect density prior to device processing.
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Analyse der Glättung rauer Oberflächen durch Dünnschichtdeposition / Analysis of smoothing of rough surfaces by thin film depositionRöder, Johanna 23 June 2009 (has links)
No description available.
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Untersuchung der elektrischen Phasenseparation in dünnen Manganatschichten mit Rastersondenspektroskopie / Intrinsic phase separation in manganite thin films investigated with scanning tunneling spectroscopyBecker, Thomas 08 June 2004 (has links)
No description available.
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Wachstumsanalyse amorpher dicker Schichten und Schichtsysteme / Growth analysis of thick amorphous films and multilayersStreng, Christoph 18 May 2004 (has links)
No description available.
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Wachstumsanalyse amorpher dicker Schichten und Schichtsysteme / Growth analysis of thick amorphous films and multilayersStreng, Christoph 18 May 2004 (has links)
No description available.
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Wachstum amorpher Schichten: Vergleich von Experiment und Simulation im Bereich Oberflächenrauhigkeit und mechanische Spannungen / Growth of amorphous thin films: Comparison of experiment and simulation concerning surface roughness and mechanical stressesMayr, Stefan Georg 01 November 2000 (has links)
No description available.
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