In this thesis the methods of optical beam induced current (OBIC), multi-photon excitation, and confocal microscopy were employed to study InGaN LED¡¦s. Recently, important breakthrough and achievement have been made in the developments of InGaN based opto-electronic components. As a result, it is important to characterize the properties and the performance of InGaN based devices with various techniques. In this thesis, we have used 2-photon OBIC microscopy to observe various such LED¡¦s. We found that the LED¡¦s exhibit dotted pattern which can not be seen under 1-photon excitation. In addition, we have employed micro-spectroscopy to characterize the active layer of these LED¡¦s. These results will be discussed in this thesis in detail.

The major purpose of LED is the electroluminescence. We use the time-resolved electroluminescence (TR-EL) method to measure the response time of LED in our experiments. In addition, typical diode has optical beam induced current (OBIC) characteristic in its depletion region. Combining upon physical reaction we can compare TR-EL and OBIC in the same LED. We are using the high frequency function generator, pulsed laser with high repetition rate, laser scanning confocal microscopy and a high frequency phase sensitive lock-in loop to achieve temporal resolution. The response time of LED can be measured in two different physical characteristic.

We have implemented the time-resolved technique at frequency domain on a laser scanning microscope to investigate light emitting diodes. Leds are not high-speed device, so we use e-o modulator to change its frequency of Laser and finish the experiment. In this way, temporal response of a device can be mapped at high spatial resolution. We are using a Ti : sapphire laser and a high frequency phase sensitive lock-in loop to achieve time-resolved the dynamics properties of the light emitting devices.Laser used to excite carriers in the depletion region detected form the contract signal for scanning imaging. We can observe the OBIC effect and measure the response time of light emitting devices.

A polymer light-emitting electrochemical cell (LEC) is a solid-state polymer device operating according to in situ electrochemical doping and the formation of a light-emitting polymer p-n junction. This operating mechanism, however, has been the subject of much debate. Planar LECs with millimeter scale interelectrode spacings offer great advantages for directly observing the electrochemical doping process. Photoluminescence quenching and the formation of a light-emitting junction have been observed in planar polymer LECs, demonstrating the existence of electrochemical doping. The chemical potential difference between the p- and n-doped regions creates a built-in potential/electric field in the junction region, which can be probed by measuring the optical beam induced current (OBIC). This study utilizes a versatile and easy-to-use method of performing OBIC analysis. The OBIC and photoluminescence profiles of LECs have been simultaneously measured by scanning a focused light beam across large planar LECs that have been turned on and cooled to freeze the doping profile. The photoluminescence intensity undergoes a sharp transition between the p- and n-doped regions. The OBIC photocurrent is only observed in the transition region that is narrower than the width of the excitation beam, which is about 35 μm. The results depict a static planar polymer p-n junction with a built-in electric field pointing from n to p. The electrode interfaces do not produce a measurable photocurrent indicating ohmic contact. / Thesis (Master, Physics, Engineering Physics and Astronomy) -- Queen's University, 2013-05-28 12:52:14.171

Optical beam induced current (OBIC) mapping has found wide-spread applications in characterizing semiconductor devices and integrated circuitry. In this study, we have used a two-photon scanning microscope to investigate InGaN light emitting diodes (LED). The defects induced by electrostatic discharge (ESD) can be clearly identified by DC-OBIC images. Additionally, we have combined an E-O modulator and a high frequency phase sensitive lock-in amplifier to conduct time-resolved study on the dynamical properties of the LEDs. The defects also exhibit different delay time when compared with the normal parts.

Thin-film solar cells are potentially low-cost devices to convert sunlight into electricity. Improvements in the conversion efficiencies of these cells reduce material utilization cost and make it commercially viable. Solar cells from the Thin-Film Physics Group, ETH Zurich, Switzerland and the Florida Solar Energy Center (FSEC), UCF were characterized for defects and other microstructural features within the thin-film structure and at the interfaces using transmission electron microscopy (TEM). The present thesis aims to provide a feedback to these groups on their deposition processes to understand the correlations between processing, resulting microstructures, and the conversion efficiencies of these devices. Also, an optical equipment measuring photocurrents from a solar cell was developed for the identification of defect-prone regions of a thin-film solar cell. The focused ion beam (FIB) technique was used to prepare TEM samples. Bright-field TEM along with scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDS) including elemental distribution line scans and maps were extensively used for characterizing the absorber layer and interfaces both above and below the absorber layer. Energy-filtered transmission electron microscopy (EFTEM) was applied in cases where EDS results were inconclusive due to the overlap of X-ray energies of certain elements, especially molybdenum and sulfur. Samples from ETH Zurich were characterized for changes in the CIGS (Cu(In,Ga)Se2) microstructure due to sodium incorporation from soda-lime glass or from a post-deposition treatment with NaF as a function of CIGS deposition temperature. The CIGS-CdS interface becomes smoother and the small columnar CIGS grains close to the Mo back contact disappear with increasing CIGS deposition temperature. At 773 K the two sodium incorporation routes result in large differences in the microstructures with a significantly larger grain size for the samples after post-deposition Na incorporation. Porosity was observed in the absorber layer close to the back contact in the samples from FSEC. The reason for porosity could be materials evaporation in the gallium beam of the FIB or a processing effect. The porosity certainly indicates heterogeneities of the composition of the absorber layer near the back contact. A Mo-Se rich layer (possibly MoSe2) was formed at the interface between CIGS/CIGSS and Mo improving the quality of the junction. Other chemical heterogeneities include un-sulfurized Cu-Ga deposits, residual Se from the selenization/ sulfurization chamber in CIGS2 and the formation of Cu-rich regions which are attributed to decomposition effects in the Ga beam of the FIB. Wavy absorber surfaces were observed for some of the cells with occasional discontinuities in the metal grids. The 50 nm thick CdS layer, however, remained continuous in all the samples under investigation. For a sample with a transparent back contact, a 10 nm Mo layer was deposited on ITO (indium tin oxide) before deposition of the CIGS2 (Cu(In,Ga)S2) layer. EFTEM maps indicate that a MoS2 layer does not form for such a Mo/MoS2-ITO back contact. Instead, absorber layer material diffuses through the thin Mo layer onto the ITO forming two layers of CIGS2 on either side of Mo with different compositions. Furthermore, an optical beam induced current (OBIC) system with micron level resolution was successfully developed and preliminary photocurrent maps were acquired to microscopically identify regions within a thin-film solar cell with undesirable microstructural features. Such a system, when fully operational, will provide the means for the identification of special regions from where samples for TEM analysis can be obtained using the FIB technique to study specifically the defects responsible for local variations in solar cell properties.

With rapid development of light emitting device, the detection techniques of semiconductor are more and more important, which include time-resolved photoluminescence (TRPL) and optical beam induced current (OBIC) microscopy. In this thesis, we realize the carrier behaviors of active region with multiple quantum wells (MQWs) by these microscopies, and the samples are light emitting diodes (LEDs). However, PL intensity of LEDs increase but OBIC not due to external field compensates, on the other hand, reducing PL lifetime indicates the response time of device shorter with higher reverse bias.

In this study, we have successfully developed a high performance transmission mode Laser scanning for SHG imaging. This setup is capable of acquiring images of size 512¡Ñ512 pixels at a rate of 5.4 seconds/frame. The of samples can thus be imaged, which reflects the samples¡¦ structure and symmetry.

Le carbure de silicium (SiC) possède plusieurs propriétés exceptionnelles comme une large bande interdite, un champ électrique critique et une vitesse de saturation des porteurs élevée pour remplacer le silicium (Si) dans des domaines de fonctionnement jusque-là inaccessibles avec le Si. Un nombre important de démonstrateurs des composants de puissance en SiC faisant état de performances remarquables ainsi que la disponibilité commerciale des composants en SiC confirment la maturité de la filière SiC et montrent les progrès technologiques réalisés au cours des dernières années. Cependant, il existe peu d’études sur les coefficients d’ionisation du SiC, lesquels sont pourtant indispensables pour prévoir précisément la tenue en tension des composants de puissance en SiC. Ce travail contribue donc à mieux déterminer ces coefficients. Pour cela, un bon nombre de diodes spécialement conçues pour la détermination des coefficients d’ionisation du SiC par la technique OBIC (Optical Beam Induced Current) ont été réalisées sur différents wafers de SiC-4H et de SiC-6H, deux polytypes courant du SiC. Cette technique repose sur un faisceau de laser ultraviolet qui génère des paires électrons-trous dans la zone de charge d’espace d’une diode sous test. La mesure du courant résultant permet d’accéder aux coefficients d’ionisation. A partir des mesures OBIC sur les diodes réalisées, nous avons pu déduire les coefficients pour ces deux polytypes du SiC. Plus particulièrement, les coefficients d’ionisation du SiC-4H sont déterminés dans une large gamme de champ électrique grâce aux mesures sur les différents dopages. Les paramètres des coefficients déterminés dans ce travail peuvent être utilisés en conception de dispositifs haute tension pour prédire plus précisément l’efficacité de leur protection périphérique. / Silicon carbide (SiC) has several exceptional properties as a wide band-gap, a high critical electric field and a high saturation velocity of carriers to replace silicon (Si) in the applications previously inaccessible with Si. A significant number of SiC power devices showing outstanding performances and the commercial availability of SiC devices confirm the maturity of SiC industry and show the SiC technological advances in recent years. However, there are few studies on the ionization coefficients in SiC, which nevertheless essential to accurately predict the breakdown voltage of SiC power devices. This work contributes to better determine these coefficients. For this, numerous diodes which are specifically designed for the determination of ionization coefficients in SiC by using OBIC (Optical Beam Induced Current) technique were realized on different wafers of 4H-SiC and 6H-SiC, two usual polytypes of SiC. This technique relies on an ultraviolet laser beam which generates electron-hole pairs in the space charge region of a diode under test. The resulting current measurement provides access to the ionization coefficients. From OBIC measurements performed on the diodes, we were able to deduce the ionization coefficients for the both polytypes of SiC. In particular, the ionization coefficients for 4H-SiC are determined in a wide range of electric field through measurements on devices with different doping level. The parameters of ionization coefficients determined in this work can be used in design of high voltage devices to predict more accurately the efficiency of periphery protections.

L’utilisation des semi-conducteurs à large bande interdite (wide bandgap ou WBG) tels que le carbure de silicium SiC, le nitrure de gallium GaN, le diamant, etc… s’est répandue dans le domaine de l’électronique de puissance ces dernières décennies. Leurs caractéristiques électroniques et mécaniques font des WBGs des solutions alternatives pour remplacer le traditionnel silicium. Cependant, des études supplémentaires sont indispensables pour améliorer la tenue en tension, les pertes statiques et dynamiques et les performances en fonctionnement à haute température des composants WBGs. Dans ce cadre, deux bancs expérimentaux OBIC (Optical Beam Induced Current) spécifiques « en cours de développement » sont mis en place pendant cette thèse. L’OBIC consiste à éclairer avec un faisceau laser de longueur d’onde appropriée une jonction polarisée en inverse, des porteurs de charge sont alors créés par absorption photonique. On peut alors mesurer un courant induit par faisceau optique (OBIC) lorsque les porteurs sont générés dans la zone de charge d’espace. Après une première phase de préparation et d’adaptation de l’environnement expérimental, des essais ont mené à la démonstration du principe de génération multi-photonique en éclairant une jonction SiC avec un faisceau vert (532 nm). L’analyse des différentes mesures OBIC nous a permis de construire une image du champ électrique à la surface de la diode : une analyse non destructive pour étudier l’efficacité des protections périphériques des jonctions et pour détecter les défauts dans la structure cristalline. Egalement, la durée de vie des porteurs minoritaires a été déduite par l’analyse de la décroissance du courant OBIC au bord de la jonction. Les coefficients d’ionisation sont également déterminés par la méthode OBIC, ces coefficients sont des paramètres clés pour la prévision de la tension de claquage des composants. Nous avons réalisé des mesures OBIC dans le GaN, et nous avons observé un effet d’absorption bi-photonique dans le diamant avec un faisceau UV (349 nm). / In the last few decades, the use of wide bandgap (WBG) semiconductors (silicon carbide SiC, gallium nitride GaN, diamond, etc…) has become popular in the domain of power electronics. Their electronic and mechanical characteristics made of the WBGs a good alternative to the traditional silicon. However, additional studies are mandatory to improve the breakdown voltage, static and dynamic losses, and the performance at high temperature of the WBG devices. In this context, two specific experimental benches OBIC (Optical Beam Induced Current) -under development- are set up during this thesis. OBIC method consists to generate free charge carriers in a reverse biased junction by illuminating the device with an appropriate wavelength. An OBIC signal is measured if the charge carriers are generated in the space charge region. After a first phase of preparation and adaptation of the experimental environment, OBIC measurements led to demonstrate the multi-photonic generation by illuminating a SiC junction with a green laser (532 nm). OBIC measurements allowed giving an image of the electric field at the surface of the diode: OBIC presents a non-destructive analysis to study the efficiency of the peripheral protection and to detect the defects in the semi-conductor. Minority carrier lifetime was also deduced by studying the OBIC decrease at the edge of the space charge region. Ionization rates were extracted using OBIC method; these coefficients are key parameters to predict the breakdown voltage of the devices. OBIC measurements were also realized on the GaN, and two-photon generation was highlighted by measuring an OBIC current in the diamond when illuminating it with a UV laser beam (349 nm).