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Investigation of Cax[subscript]Srx[subscript]PO:Eu for application to the plasma display panel / Investigation of Ca₂₋[subscript x]Sr[subscript x] P₂O₇:Eu ²⁺ for Application to the Plasma Display PanelGilstrap, Richard A. 01 December 2003 (has links)
No description available.
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Simulation results of an inductively-coupled rf plasma torch in two and three dimensions for producing a metal matrix composite for nuclear fuel claddingHolik III, Eddie Frank (Trey) 15 May 2009 (has links)
I propose to develop a new method for the synthesis of metal matrix composites
(MMC) using aerosol reactants in a radio frequency (RF) plasma torch. An inductivelycoupled
RF plasma torch (ICPT) may potentially be designed to maintain laminar flow
and a radial temperature distribution. These two properties provide a method by which a
succession of metal layers can be applied to the surface of SiC fibers. In particular, the
envisaged method provides a means to fully bond any desired metal to the surface of the
SiC fibers, opening the possibility for MMCs in which the matrix metal is a highstrength
steel.
A crucial first step in creating the MMC is to test the feasibility of constructing
an ICPT with completely laminar flow in the plasma region. In this work, a
magnetohydrodynamic (MHD) model is used along with a computational fluid dynamic
(CFD) software package called FLUENT© to simulate an ICPT. To solve the
electromagnetic equations and incorporate forces and resistive heating, several userdefined
functions (UDF) were written to add to the functionality of FLUENT©. Initially,
an azimuthally-symmetric, two-dimensional model was created to set a test baseline for
operating in FLUENT© and to verify the UDF. To incorporate coil angle and current
leads, a fully three dimensional model UDF was written. Preliminary results confirm the
functionality of the code. Additionally, the results reveal a non-mixing, laminar flow
outer region for an axis-symmetric ICPT.
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Process and reliability assessment of plasma-based copper etch processLiu, Guojun 15 May 2009 (has links)
The plasma-based etching processes of copper (Cu) and titanium tungsten (TiW)
thin films, and the electromigration of the copper lines patterned by above etching
processes were studied. Instead of vaporizing the plasma/copper reaction product, a
dilute hydrogen chloride solution was used to dissolve the nonvolatile reaction product.
The plasma/copper reaction process was affected by many factors including the
microstructure of the copper film and the plasma conditions. Under the same chlorine
plasma exposure condition, the copper conversation rate and the copper chloride (CuClx)
formation rate increased monotonically with the Cu grain size. The characteristics of the
Cu etching process were explained by diffusion mechanisms of Cl and Cu in the plasmacopper
reaction process as well as microstructures of Cu and CuClx. The Cu chlorination
process was also affected by the additive gas in the Cl2 plasma. The additive gas, such as
Ar, N2, and CF4, dramatically changed the plasma phase chemistry, i.e., the Cl
concentration, and the ion bombardment energy, which resulted in changes of the Cu
chlorination rate and the sidewall roughness. TiW thin films, used as the diffusion barrier layer for the Cu film, were reactive
ion etched with CF4/O2, CF4/Cl2, and CF4/HCl plasma. Process parameter such as feed
gas composition, RF power, and plasma pressure showed tremendous effects on the etch
rate and the etch selectivity. The TiW etch rate was a function of the sum of Cl and F
concentrations and the ion bombardment energy. Cu/diffusion barrier metal stack was
successfully patterned by above plasma etch processes. The electromigration (EM)
performance of the Cu lines was evaluated by the accelerated isothermal test. The
activation energy of 0.5~0.6 eV and the current density exponent of 2.7 were obtained.
Failure analysis showed that both copper-silicon nitride cap layer interface and the
copper grain boundary were active diffusion paths. The EM induced stress caused the
cap layer crack and affected the reliability of Cu lines.
The processes studied in this dissertation can be applied in advanced
microelectronic fabrication including large area flexible microelectronics.
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The study of optic characteristics of attenuated total reflection and scattering of Ag rough surface in liquid crystalsLin, Wen-xiang 27 July 2006 (has links)
The attenuated total reflection (ATR) method and the scattering spectrum analysis are used to study the effects due to the surface plasma of Ag nanoparticles. A slide is coated with a thin Ag film of thickness about 40nm and anneals the sample few minutes at 197¢XC. The Ag film is thus congregated to be a rough surface. By ATR(with the slide attached to the back of the prism), the intensity of the total refection light and the reflective angle are measured. Then we can determine the dielectric coefficient of the rough Ag surface. We also coat a thin Ag film about 8nm on the ITO glass and anneal the sample. The thin Ag film is thus congregated to be nanoparticles. We discuss the effects due to the surface plasma excited on the Ag nanoparticles by analyzing the absorbance and scattering spectrums from Ag nanoparticles in liquid crystals environment.
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Observation of Equatorial Plasma Depletions at Southern Taiwan by 6300Å OI AirglowLiao, Cang-Hsien 27 June 2000 (has links)
Abstract
In this study, we use a fisheye lens (180o field of view) and Chare-Couple Device to take the all-sky 6300Å airglow images emitting from ionosphere. By analyzing these Images we can study the phenomenon of equatorial plasma depletions (plasma bubble). Plasma bubbles generate above the magnetic equator; and they drift up to higher altitude and spread to higher latitude area along magnetic lines. The all-sky imaging system was operated at Mt. A-Li (23.511oN, 120.823oE). Because this year is the most active time of sunspots in the solar cycle, we expect that we can take mounts of plasma bubble images in this year.
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Abatement of perfluorocompounds and chlorofluorocarbons using surface wave plasma technologyFrantzen, Michelle E. Gunn 25 April 2007 (has links)
Application of surface wave plasma technology for effective abatement of
environmentally harmful gases such as perfluorocompounds and chlorofluorocarbons is
investigated. Perfluorocompounds (PFCs) are gases that contribute to forced global
warming and have been favored for wafer etch and chamber clean applications in the
semiconductor industry. Chlorofluorocarbons (CFCs) are ozone depleting gases that
were used as refrigerants for commercial and domestic condensers and air conditioners,
but current reserves still pose threats to environmental sustainability. Increased average
global temperatures and further destruction of the ozone layer have prompted proposal
of international initiatives such as the Montreal Protocols and the Kyoto Agreement to
curtail emissions of such fugitive gases into the environment. These have increased the
need for effective abatement technologies to control such emissions and include surface
wave plasma abatement, the subject of this dissertation. Surface wave plasmas are
considered high frequency non-equilibrium traveling wave discharges in contrast to the
more frequently used standing wave discharges. The use of surface wave plasmas have
the advantages of a variety of discharge vessel shapes, reproducibility of application, numerous operating conditions and large plasma volumes which ultimately produce low,
molecular weight byproducts that are associated with high effective electron
temperatures but low heavy particle temperatures. For these reasons, surface wave
plasma abatement technology was developed for the destruction and removal of PFCs
and CFCs.
Results include final destruction and removal efficiencies (DREs) for
octafluorocyclobutane greater than 99.8%, dichlorodifluoromethane greater than
99.995% and trichlorofluoromethane greater than 99.999% using moderate applied
microwave powers of less than 2000 watts with the production of low molecular weight
byproducts, such as CO2, CO, HF and HCl, that prevent environmentally harmful
process emissions from entering the atmosphere. Characterizations of the initial and
final products were accomplished by the use of Fourier transform infrared spectroscopy
and quadrupole mass spectrometry to provide independent quantitative analyses of
plasma processes. In addition to these analytical methods, Global_Kin a kinetic model,
of plasma reactions were conducted and compared to all the experimental data
determined in order to facilitate understanding of the chemistry involved in the surface
wave plasma abatement applications studied. Basic plasma reaction mechanisms were
determined for the abatement of octafluorocyclobutane and dichlorodifluoromethane.
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Spectroscopic studies of etching gases and microwave diagnostics of plasmas related to the semiconductor industry.Vas̆eková, Eva. January 2006 (has links) (PDF)
Thesis (Ph. D.)--Open University.
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Investigation of the shear layer versus the last closed flux surface on TEXT-upgradeCraig, Joseph Lackey. January 2001 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2001. / Vita. Includes bibliographical references. Available also from UMI/Dissertation Abstracts International.
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Investigation of Ca₂₋x[subscript]rx[subscript]P₂O₇:Eu²⁺ for application to the plasma display panelGilstrap, Richard A., January 2003 (has links) (PDF)
Thesis (M.S. in M.S.E.)--School of Materials Science and Engineering, Georgia Institute of Technology, 2004. Directed by Christopher J. Summers. / Includes bibliographical references (leaves 148-152).
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Neutrino electron plasma instability /Lai, Chi-hsuan, January 1999 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 1999. / Vita. Includes bibliographical references (leaves 53-56). Available also in a digital version from Dissertation Abstracts.
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