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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Analysis of Zincblende-Phase GaN, Cubic-Phase SiC, and GaAs MESFETs Including a Full-Band Monte Carlo Simulator

Weber, Michael Thomas 06 October 2005 (has links)
The objective of this research has been the study of device properties for emerging wide-bandgap cubic-phase semiconductors. Though the wide-bandgap semiconductors have great potential as high-power microwave devices, many gaps remain in the knowledge about their properties. The simulations in this work are designed to give insight into the performance of microwave high-power devices constructed from the materials in question. The simulation are performed using a Monte Carlo simulator which was designed from the ground up to include accurate, numerical band structures derived from an empirical pseudo-potential model. Improvements that have been made to the simulator include the generalized device structure simulation, the fully numerical final state selector, and the inclusion of the overlap integrals in the final-state selection. The first comparison that is made among the materials is direct-current breakdown. The DC voltage at which breakdown occurs is a good indication of how much power a transistor can provide. It is found that GaAs has the smallest DC breakdown, with 3C-SiC and ZB-GaN being over 3 times higher. This follows what is expected and is discussed in detail in the work. The second comparison made is the radio-frequency breakdown of the transistors. When devices are used in high-frequency applications it is possible to operate them beyond DC breakdown levels. This phenomenon is caused by the reaction time of the carriers in the device. It is important to understand this effect if these materials are used in a high-frequency application, since this effect can cause a change in the ability of a material to produce high-power devices. MESFETs made from these materials are compared and the results are discussed in detail.
2

Numerical study of femtosecond laser interactions with dielectric materials : application to the definition of damage threshold of optical components / Etude numérique des interactions d'un laser femtoseconde avec des cibles diélectriques : applications à la détermination du seuil d'endommagement des composants optiques

Shcheblanov, Nikita 09 April 2013 (has links)
Avec l'apparition de nouveaux systèmes laser ultra-courts, des intensités laser extrêmement élevées sont devenues accessibles, permettant ainsi un traitement au laser de pratiquement tous les matériaux. En conséquence, les techniques de traitement extrêmement précises sont en cours de développement étendant considérablement le nombre des applications industrielles et médicales correspondantes. Des progrès dans ce domaine nécessitent une meilleure compréhension des processus fondamentaux impliqués dans les interactions laser. De plus le succès à l’international du développement et de l’utilisation de systèmes laser de forte puissance, dépend de la capacité de la définition minutieuse du seuil d’endommagement de leurs composants optiques. Ces points illustrent l'importance d'une modélisation numérique détaillée des interactions de laser avec des matériaux diélectriques. Sous irradiation laser, des électrons germes apparaissent dans la bande de conduction des matériaux diélectriques en raison de processus de photo-ionisation. En collision avec un troisième corps, ces électrons sont encore chauffés dans le domaine du laser. Lorsque l'énergie des électrons de seuil est atteinte, l'ionisation par impact d'électrons commence. Dans le même temps, les impulsions laser considérées sont si courtes que le sous-système électronique n'a pas le temps d'atteindre un état d'équilibre. Les propriétés optiques résultant sont affectées et la définition du critère de dommages devrait être révisée. Cela représente l'approche proposée pour le non-équilibre et fournit une description détaillée de tous les processus impliqués. En particulier, on considère le processus et l’impact de photo- ionisation, ainsi que électron-électron, électron-phonon et les collisions électron-ion. La distribution d'énergie des électrons et le chauffage de sous-systèmes électroniques et phonons est discutée. Le rôle des paramètres du laser (longueur d'onde, durée d'impulsion, fluence) et les propriétés des matériaux (de l'écart de l'énergie, de la structure de bande) sont étudiées. Le temps de thermalisation est calculé et caractérise l'état de non-équilibre en fonction de la durée d'impulsion du laser. Un nouveau critère thermique est proposé pour la définition des dommages sur la base des énergies d'électrons et phonons. Les seuils d’endommagement calculés sont comparés aux résultats expérimentaux récents. Une analyse d'autres critères (claquage optique classique et thermique) est également effectuée / With the appearance of new ultra-short laser systems, extremely high laser intensities became accessible thus allowing laser treatment of practically all materials. As a result, extremely precise processing techniques are under development considerably extending the number of the corresponding industrial and medical applications. Further progress in this field requires a better understanding of fundamental processes involved in the laser interactions. In addition, the success of several national and international involving the development and use of high power laser systems depends on the capacity of careful definition of damage threshold of their optical components. These points illustrate the importance of a detailed numerical modeling of laser interactions with dielectric materials. Under laser irradiation, seed electrons appear in the conduction band of dielectric materials due to photo-ionization process. Colliding with a third-body, these electrons are further heated in laser field. When the threshold electron energy is reached, electron-impact ionization begins. At the same time, the considered laser pulses are so short that electron sub-system has no time to reach an equilibrium state. The resulting optical properties are affected and the definition of the damage criterion should be revised. The proposed approach accounts for the non-equilibrium and provides a detailed description of all the involved processes. In particular, we consider the photo- and impact-ionization processes, as well as electron-electron, electron-phonon and electron-ion collisions. The electron energy distribution and heating of electronic and phonon subsystems is discussed. The role of laser parameters (wavelength, pulse duration, fluence) and material properties (energy gap, band structure) is investigated. The thermalization time is calculated and characterizes the non-equilibrium state as a function of laser pulse duration. A novel thermal criterion is proposed for damage definition based on the electron and phonon energies. The calculated damage thresholds are compared with recent experimental findings. An analysis of other criteria (classical optical breakdown and thermal) is also performed
3

C axis optical property of a family of a high temperature superconductors LaSrCuO

Yazdani, Maryam, Yazdani January 2016 (has links)
No description available.

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