Materiais piezocompósitos laminados são compostos por camadas de material piezelétrico, metálico e compósito (matriz epóxi com fibras de carbono ou de vidro), que possibilitam obter vantagens em relação aos materiais piezelétricos convencionais, permitindo obter características superiores que não podem ser conseguidas pelos seus componentes de forma isolada como, por exemplo, maior flexibilidade e resistência mecânica ou menor peso. Sob esse enfoque, este trabalho tem por objetivo o desenvolvimento de Estruturas Piezocompósitas Laminadas (EPLA) que consistem basicamente em estruturas multicamadas, através do projeto da sua resposta transiente e harmônica visando aplicações dinâmicas. Entre as potenciais aplicações dessas estruturas, tem-se atuadores, motores, sonares e dispositivos de coleta de energia (\"energy harvester\"), sendo de muito interesse a melhora das suas características dinâmicas e o seu desempenho. O projeto dinâmico de uma EPLA é complexo, porém pode ser sistematizado utilizando o Método de Otimização Topológica (MOT). O MOT é um método baseado na distribuição de material num domínio de projeto fixo com o objetivo de extremizar uma função de custo sujeita às restrições inerentes do problema, combinando algoritmos de otimização e de elementos finitos. A formulação de MOT para o projeto dinâmico de EPLA pretende determinar tanto a topologia ótima dos materiais nas diferentes camadas quanto o sinal de polarização do material piezelétrico e o ângulo da fibra na camada compósita, tendo como finalidade a maximização da amplitude de vibração em pontos determinados (em atuadores) ou da geração de energia elétrica a partir de excitações mecânicas (em coletores de energia). Além disso, é formulado um problema combinando os enfoques harmônico e transiente com o intuito de customizar a resposta da EPLA, de modo que, o nível da resposta seja o mesmo perante diferentes tipos de onda de excitação (transdutores multi-entrada). O trabalho inclui as etapas de projeto, simulação, fabricação e caracterização de protótipos. / Laminated piezocomposite materials are composed by layers of piezoelectric, metal and composite material (epoxy matrix with carbon or glass fiber), which have advantages over conventional piezoelectric materials, because of their superior characteristics, which cannot be achieved by any of its components isolated, for example, more flexibility and strength and less weight. Under this approach, this work aims at the development of Laminated Piezocomposite Structures (LAPS) what primarily consist of multi-layer structures, through the transient and harmonic response design aiming at dynamic applications. Among the potential applications of these structures it can be cited actuators, motors, sonar devices and energy harvester, being of great interest the improvement of its dynamic characteristics and performance. The dynamic design of a LAPS is complex however it can be systematized by using the Topology Optimization Method (TOM). The TOM is a method based on the distribution of material in a fixed design domain with the aim of extremizing a cost function subject to constraints inherent to the problem by means of combining the optimization algorithms and the finite element method (FEM). The TOM formulation for the LAPS dynamic project aims to determine together the optimal topology of the materials for different layers, the polarization sign of the piezoelectric material and the fiber angle of the composite layer, in order to maximize the vibration amplitude at certain points (in actuators), or the generation of electrical energy from mechanical excitations (in energy harvesters). In addition, a TOM problem combining harmonic and transient approaches is formulated with the purpose of customizing EPLA response so that the response level is the same for different excitation waveforms (multi-entry transducers). The work includes design, simulation, manufacturing and characterization of prototypes.

<p>Electromagnetic transients impinging on electromagnetic power devices - such as electric machines, transformers and reactors - can stress the design severely. Thus the magnitudes of the transients are often decisive for the design of the devices. Further, the operation of a device can be transient in itself. This is the case for the explosive magnetic flux compression generator (EMG) and a ferromagnetic actuator. </p><p>Models are presented that are mainly intended for transients in the millisecond range and faster. Hence, eddy currents and the related skin and proximity effect become significant in windings, magnetic cores and in the armatures of the devices. These effects are important for, e.g., the damping of the transients. Further, the displacement current in the insulation of the winding is significant. It changes the response of the windings dramatically, as it manifests the finite velocity of propagation of the electromagnetic fields. Under such circumstances, reflections and excited resonances can make the transient voltage and current distribution highly irregular. </p><p>Induced voltages are modelled with self and mutual inductances or reluctances combined with winding templates. The displacement currents are modelled with capacitances or coefficients of potential. Cauer circuits and their dual form are used to model eddy currents in laminated cores and in conductors. The Cauer circuit enables one to consider hysteresis and the non-linear response of a magnetic core. It is also used to model the eddy currents in the moving armature of an EMG. </p><p>A set-up is presented that can be used to study the transient voltage and the current distribution along a coil. </p><p>The transient response of coaxially insulated windings is analysed and modelled in detail. A lumped circuit model is developed for a coil, Dryformer^TM - the new high-voltage transformer - and Powerformer^TM, the new high-voltage generator. An alternative model, a combined lumped circuit and FEM model, is presented for a coaxially insulated winding in two slot cores.</p>

Electromagnetic transients impinging on electromagnetic power devices - such as electric machines, transformers and reactors - can stress the design severely. Thus the magnitudes of the transients are often decisive for the design of the devices. Further, the operation of a device can be transient in itself. This is the case for the explosive magnetic flux compression generator (EMG) and a ferromagnetic actuator. Models are presented that are mainly intended for transients in the millisecond range and faster. Hence, eddy currents and the related skin and proximity effect become significant in windings, magnetic cores and in the armatures of the devices. These effects are important for, e.g., the damping of the transients. Further, the displacement current in the insulation of the winding is significant. It changes the response of the windings dramatically, as it manifests the finite velocity of propagation of the electromagnetic fields. Under such circumstances, reflections and excited resonances can make the transient voltage and current distribution highly irregular. Induced voltages are modelled with self and mutual inductances or reluctances combined with winding templates. The displacement currents are modelled with capacitances or coefficients of potential. Cauer circuits and their dual form are used to model eddy currents in laminated cores and in conductors. The Cauer circuit enables one to consider hysteresis and the non-linear response of a magnetic core. It is also used to model the eddy currents in the moving armature of an EMG. A set-up is presented that can be used to study the transient voltage and the current distribution along a coil. The transient response of coaxially insulated windings is analysed and modelled in detail. A lumped circuit model is developed for a coil, DryformerTM - the new high-voltage transformer - and PowerformerTM, the new high-voltage generator. An alternative model, a combined lumped circuit and FEM model, is presented for a coaxially insulated winding in two slot cores.

Rotary air-to-air energy exchangers (also called energy wheels) transfer both heat and moisture between supply and exhaust airstreams in buildings. In this thesis, it is hypothesized that the transient step response characteristics of an energy wheel are uniquely related to the steady-state cyclic response of the wheel. The primary objective of this research is to study the transient response of a humidity/temperature sensor and measure energy wheel performance with a new test procedure that uses only transient response characteristics. In this thesis, the transient characteristics of a humidity/temperature sensor and an energy wheel to a step change in relative humidity and temperature are investigated through two types of measurements. One test uses a small airflow, at controlled temperature and humidity conditions, passing through a small section of a porous wheel while measuring the outlet conditions after the inlet conditions are suddenly changed. For a step input, it is shown that the outlet humidity/temperature sensor data correlate with an exponential function with two time constants. Since the transient response characteristics of the humidity/temperature sensor must be known to predict the response of the wheel alone, a second test is required that is similar to the first test except that the wheel is removed. This test is used to obtain the transient response of the sensor alone. Data from these tests show that both the sensor and the sensor plus wheel have two sets of two time constants. An analysis is presented to determine the transient response of the wheel alone using the correlated properties of the sensor alone and the sensor with a wheel upstream. The challenge undertaken in this research was the development of a more flexible, lower cost test facility than that presented in ASHRAE Standard 84-1991(Method of Testing Air-to-Air Heat Exchangers). In future work, this new laboratory experimental test facility should be adapted to test most types of energy wheels. The configuration allows a wide range of mass flow rates, inlet supply air temperatures and relative humidities. Uncertainty analysis is used for each transient test for the sensors and air-to-air energy wheels to specify the sensor and wheel plus sensor characteristics. This uncertainty analysis shows that accurate sensor calibration under equilibrium conditions and the start time for the humidity sensor step change is crucial to achieve low uncertainties in the transient behaviour of sensor and energy wheels. Knowing the uncertainty in the characteristics of the sensors and the wheel plus sensors the uncertainty in the transient response of the wheel alone is predicted. The first time constant of the humidity sensor is found to be about 3 seconds, while the second time constant is found to be about 100 seconds. It is found that the predicted response of the wheel alone gives time constants that are about 6 seconds and 140 seconds. Other researchers can use this information presented in this thesis to estimate the effectiveness of an energy wheel.

Rotary air-to-air energy exchangers (also called energy wheels) transfer both heat and moisture between supply and exhaust airstreams in buildings. In this thesis, it is hypothesized that the transient step response characteristics of an energy wheel are uniquely related to the steady-state cyclic response of the wheel. The primary objective of this research is to study the transient response of a humidity/temperature sensor and measure energy wheel performance with a new test procedure that uses only transient response characteristics. In this thesis, the transient characteristics of a humidity/temperature sensor and an energy wheel to a step change in relative humidity and temperature are investigated through two types of measurements. One test uses a small airflow, at controlled temperature and humidity conditions, passing through a small section of a porous wheel while measuring the outlet conditions after the inlet conditions are suddenly changed. For a step input, it is shown that the outlet humidity/temperature sensor data correlate with an exponential function with two time constants. Since the transient response characteristics of the humidity/temperature sensor must be known to predict the response of the wheel alone, a second test is required that is similar to the first test except that the wheel is removed. This test is used to obtain the transient response of the sensor alone. Data from these tests show that both the sensor and the sensor plus wheel have two sets of two time constants. An analysis is presented to determine the transient response of the wheel alone using the correlated properties of the sensor alone and the sensor with a wheel upstream. The challenge undertaken in this research was the development of a more flexible, lower cost test facility than that presented in ASHRAE Standard 84-1991(Method of Testing Air-to-Air Heat Exchangers). In future work, this new laboratory experimental test facility should be adapted to test most types of energy wheels. The configuration allows a wide range of mass flow rates, inlet supply air temperatures and relative humidities. Uncertainty analysis is used for each transient test for the sensors and air-to-air energy wheels to specify the sensor and wheel plus sensor characteristics. This uncertainty analysis shows that accurate sensor calibration under equilibrium conditions and the start time for the humidity sensor step change is crucial to achieve low uncertainties in the transient behaviour of sensor and energy wheels. Knowing the uncertainty in the characteristics of the sensors and the wheel plus sensors the uncertainty in the transient response of the wheel alone is predicted. The first time constant of the humidity sensor is found to be about 3 seconds, while the second time constant is found to be about 100 seconds. It is found that the predicted response of the wheel alone gives time constants that are about 6 seconds and 140 seconds. Other researchers can use this information presented in this thesis to estimate the effectiveness of an energy wheel.

Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a estratégia a ele aplicada é baseada em um método de teste também estrutural, conhecido como OBT (Oscillation-Based Test). Neste método o circuito é dividido em blocos simples que são transformados em osciladores. Os parâmetros do sinal obtido, tais como a freqüência de oscilação e a amplitude, têm relação direta com os componentes utilizados na implementação do oscilador. Desta maneira, é possível detectar falhas no FPAA observando os parâmetros do sinal gerado. Esta estratégia é estudada inicialmente considerando uma análise externa dos parâmetros do sinal. Como uma alternativa de redução de custos e melhoria na cobertura de falhas, um analisador de resposta baseado em um duplo integrador é adotado, permitindo que a avaliação do sinal gerado pelo oscilador seja feita internamente, utilizando-se os recursos programáveis do próprio FPAA. Os resultados obtidos para as análises interna e externa são então comparados. O segundo FPAA estudado, da Anadigm Company, é um dispositivo a capacitores chaveados que tem como característica a programabilidade funcional. Por esta razão o desenvolvimento de uma técnica de teste estrutural é dificultado, pois não se conhece detalhes da arquitetura do componente. Por esta razão, uma técnica de teste funcional, conhecida como Transient Response Analysis Method, é aplicada ao teste deste FPAA. Neste método o circuito sob teste é dividido em blocos funcionais de primeira e segunda ordem e a resposta transiente destes blocos para um dado estímulo de entrada é analisada. O bloco sob teste é então duplicado e um esquema de auto-teste integrado baseado em redundância é desenvolvido, com o intuito de se obter um sinal de erro. Este sinal de erro representa a diferença das respostas transientes dos blocos duplicados. Como proposta para se aumentar a observabilidade do sinal de erro o mesmo é integrado ao longo tempo, aumentando a capacidade de detecção de falhas quando utilizado este método. Em ambas estratégias o objetivo principal do trabalho é testar os blocos analógicos programáveis dos FPAAs explorando ao máximo a programabilidade dos dispositivos e utilizando recursos pré-existentes para auxiliar no teste. Os resultados obtidos mostram que as estratégias desenvolvidas configuram boas alternativas para o auto-teste integrado deste tipo de componente. / This work addresses the test of programmable analog devices. Several analog test methodologies are studied and some of them are applied in the developed strategies. In order to validate these strategies, two commercial FPAAs (Field Programmable Analog Arrays), of different vendors and distinct models, are considered as devices under test. The first studied device is a continuous-time FPAA from Lattice Semiconductors. One important characteristic of such device is the structural programmability. For this reason the test strategy applied to this FPAA is based in a structural method known as OBT (Oscillation-Based Test). In this method, blocks of the circuit under test are individually converted into oscillators. The parameters of the generated signal, such as the frequency and amplitude, can be expressed as function of the components used in the oscillator implementation. This way, it is possible to detect faults in the FPAA simply observing such parameters. This method is firstly studied considering an external analysis of the signal parameters. However, in a second moment, an internal response analyzer, based on a double integrator, is built with the available programmable resources of the FPAA. This way, overall test cost is reduced, while the fault coverage is increased with no area overhead. The obtained results considering the external analysis and the built-in response evaluation are compared. The second considered FPAA, from Anadigm Company, is a switched capacitor device whose programming characteristic is strictly functional. Thus, a structural test method cannot be easily developed and applied without the previous knowledge of he device architectural details. For this reason, a functional test method known as TRAM (Transient Response Analysis Method) is adopted. In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks for a given input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between the fault-free and faulty Configurable Analog Blocks (CABs). As a proposal to augmenting the observability, the error signal is integrated, enhancing de fault detection capability when using this method. In both developed strategies the main objective is to test the CABs of the FPAAs exploiting the device programmability, using the existing resources in order to aid the test. The obtained results show that the developed strategies represent good alternatives to the built-in self-test of such type of device.

Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a estratégia a ele aplicada é baseada em um método de teste também estrutural, conhecido como OBT (Oscillation-Based Test). Neste método o circuito é dividido em blocos simples que são transformados em osciladores. Os parâmetros do sinal obtido, tais como a freqüência de oscilação e a amplitude, têm relação direta com os componentes utilizados na implementação do oscilador. Desta maneira, é possível detectar falhas no FPAA observando os parâmetros do sinal gerado. Esta estratégia é estudada inicialmente considerando uma análise externa dos parâmetros do sinal. Como uma alternativa de redução de custos e melhoria na cobertura de falhas, um analisador de resposta baseado em um duplo integrador é adotado, permitindo que a avaliação do sinal gerado pelo oscilador seja feita internamente, utilizando-se os recursos programáveis do próprio FPAA. Os resultados obtidos para as análises interna e externa são então comparados. O segundo FPAA estudado, da Anadigm Company, é um dispositivo a capacitores chaveados que tem como característica a programabilidade funcional. Por esta razão o desenvolvimento de uma técnica de teste estrutural é dificultado, pois não se conhece detalhes da arquitetura do componente. Por esta razão, uma técnica de teste funcional, conhecida como Transient Response Analysis Method, é aplicada ao teste deste FPAA. Neste método o circuito sob teste é dividido em blocos funcionais de primeira e segunda ordem e a resposta transiente destes blocos para um dado estímulo de entrada é analisada. O bloco sob teste é então duplicado e um esquema de auto-teste integrado baseado em redundância é desenvolvido, com o intuito de se obter um sinal de erro. Este sinal de erro representa a diferença das respostas transientes dos blocos duplicados. Como proposta para se aumentar a observabilidade do sinal de erro o mesmo é integrado ao longo tempo, aumentando a capacidade de detecção de falhas quando utilizado este método. Em ambas estratégias o objetivo principal do trabalho é testar os blocos analógicos programáveis dos FPAAs explorando ao máximo a programabilidade dos dispositivos e utilizando recursos pré-existentes para auxiliar no teste. Os resultados obtidos mostram que as estratégias desenvolvidas configuram boas alternativas para o auto-teste integrado deste tipo de componente. / This work addresses the test of programmable analog devices. Several analog test methodologies are studied and some of them are applied in the developed strategies. In order to validate these strategies, two commercial FPAAs (Field Programmable Analog Arrays), of different vendors and distinct models, are considered as devices under test. The first studied device is a continuous-time FPAA from Lattice Semiconductors. One important characteristic of such device is the structural programmability. For this reason the test strategy applied to this FPAA is based in a structural method known as OBT (Oscillation-Based Test). In this method, blocks of the circuit under test are individually converted into oscillators. The parameters of the generated signal, such as the frequency and amplitude, can be expressed as function of the components used in the oscillator implementation. This way, it is possible to detect faults in the FPAA simply observing such parameters. This method is firstly studied considering an external analysis of the signal parameters. However, in a second moment, an internal response analyzer, based on a double integrator, is built with the available programmable resources of the FPAA. This way, overall test cost is reduced, while the fault coverage is increased with no area overhead. The obtained results considering the external analysis and the built-in response evaluation are compared. The second considered FPAA, from Anadigm Company, is a switched capacitor device whose programming characteristic is strictly functional. Thus, a structural test method cannot be easily developed and applied without the previous knowledge of he device architectural details. For this reason, a functional test method known as TRAM (Transient Response Analysis Method) is adopted. In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks for a given input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between the fault-free and faulty Configurable Analog Blocks (CABs). As a proposal to augmenting the observability, the error signal is integrated, enhancing de fault detection capability when using this method. In both developed strategies the main objective is to test the CABs of the FPAAs exploiting the device programmability, using the existing resources in order to aid the test. The obtained results show that the developed strategies represent good alternatives to the built-in self-test of such type of device.

abstract: The modern era of consumer electronics is dominated by compact, portable, affordable smartphones and wearable computing devices. Power management integrated circuits (PMICs) play a crucial role in on-chip power management, extending battery life and efficiency of integrated analog, radio-frequency (RF), and mixed-signal cores. Low-dropout (LDO) regulators are commonly used to provide clean supply for low voltage integrated circuits, where point-of-load regulation is important. In System-On-Chip (SoC) applications, digital circuits can change their mode of operation regularly at a very high speed, imposing various load transient conditions for the regulator. These quick changes of load create a glitch in LDO output voltage, which hamper performance of the digital circuits unfavorably. For an LDO designer, minimizing output voltage variation and speeding up voltage glitch settling is an important task. The presented research introduces two fully integrated LDO voltage regulators for SoC applications. N-type Metal-Oxide-Semiconductor (NMOS) power transistor based operation achieves high bandwidth owing to the source follower configuration of the regulation loop. A low input impedance and high output impedance error amplifier ensures wide regulation loop bandwidth and high gain. Current-reused dynamic biasing technique has been employed to increase slew-rate at the gate of power transistor during full-load variations, by a factor of two. Three design variations for a 1-1.8 V, 50 mA NMOS LDO voltage regulator have been implemented in a 180 nm Mixed-mode/RF process. The whole LDO core consumes 0.130 mA of nominal quiescent ground current at 50 mA load and occupies 0.21 mm x mm. LDO has a dropout voltage of 200 mV and is able to recover in 30 ns from a 65 mV of undershoot for 0-50 pF of on-chip load capacitance. / Dissertation/Thesis / Masters Thesis Electrical Engineering 2016

Materiais piezocompósitos laminados são compostos por camadas de material piezelétrico, metálico e compósito (matriz epóxi com fibras de carbono ou de vidro), que possibilitam obter vantagens em relação aos materiais piezelétricos convencionais, permitindo obter características superiores que não podem ser conseguidas pelos seus componentes de forma isolada como, por exemplo, maior flexibilidade e resistência mecânica ou menor peso. Sob esse enfoque, este trabalho tem por objetivo o desenvolvimento de Estruturas Piezocompósitas Laminadas (EPLA) que consistem basicamente em estruturas multicamadas, através do projeto da sua resposta transiente e harmônica visando aplicações dinâmicas. Entre as potenciais aplicações dessas estruturas, tem-se atuadores, motores, sonares e dispositivos de coleta de energia (\"energy harvester\"), sendo de muito interesse a melhora das suas características dinâmicas e o seu desempenho. O projeto dinâmico de uma EPLA é complexo, porém pode ser sistematizado utilizando o Método de Otimização Topológica (MOT). O MOT é um método baseado na distribuição de material num domínio de projeto fixo com o objetivo de extremizar uma função de custo sujeita às restrições inerentes do problema, combinando algoritmos de otimização e de elementos finitos. A formulação de MOT para o projeto dinâmico de EPLA pretende determinar tanto a topologia ótima dos materiais nas diferentes camadas quanto o sinal de polarização do material piezelétrico e o ângulo da fibra na camada compósita, tendo como finalidade a maximização da amplitude de vibração em pontos determinados (em atuadores) ou da geração de energia elétrica a partir de excitações mecânicas (em coletores de energia). Além disso, é formulado um problema combinando os enfoques harmônico e transiente com o intuito de customizar a resposta da EPLA, de modo que, o nível da resposta seja o mesmo perante diferentes tipos de onda de excitação (transdutores multi-entrada). O trabalho inclui as etapas de projeto, simulação, fabricação e caracterização de protótipos. / Laminated piezocomposite materials are composed by layers of piezoelectric, metal and composite material (epoxy matrix with carbon or glass fiber), which have advantages over conventional piezoelectric materials, because of their superior characteristics, which cannot be achieved by any of its components isolated, for example, more flexibility and strength and less weight. Under this approach, this work aims at the development of Laminated Piezocomposite Structures (LAPS) what primarily consist of multi-layer structures, through the transient and harmonic response design aiming at dynamic applications. Among the potential applications of these structures it can be cited actuators, motors, sonar devices and energy harvester, being of great interest the improvement of its dynamic characteristics and performance. The dynamic design of a LAPS is complex however it can be systematized by using the Topology Optimization Method (TOM). The TOM is a method based on the distribution of material in a fixed design domain with the aim of extremizing a cost function subject to constraints inherent to the problem by means of combining the optimization algorithms and the finite element method (FEM). The TOM formulation for the LAPS dynamic project aims to determine together the optimal topology of the materials for different layers, the polarization sign of the piezoelectric material and the fiber angle of the composite layer, in order to maximize the vibration amplitude at certain points (in actuators), or the generation of electrical energy from mechanical excitations (in energy harvesters). In addition, a TOM problem combining harmonic and transient approaches is formulated with the purpose of customizing EPLA response so that the response level is the same for different excitation waveforms (multi-entry transducers). The work includes design, simulation, manufacturing and characterization of prototypes.

Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a estratégia a ele aplicada é baseada em um método de teste também estrutural, conhecido como OBT (Oscillation-Based Test). Neste método o circuito é dividido em blocos simples que são transformados em osciladores. Os parâmetros do sinal obtido, tais como a freqüência de oscilação e a amplitude, têm relação direta com os componentes utilizados na implementação do oscilador. Desta maneira, é possível detectar falhas no FPAA observando os parâmetros do sinal gerado. Esta estratégia é estudada inicialmente considerando uma análise externa dos parâmetros do sinal. Como uma alternativa de redução de custos e melhoria na cobertura de falhas, um analisador de resposta baseado em um duplo integrador é adotado, permitindo que a avaliação do sinal gerado pelo oscilador seja feita internamente, utilizando-se os recursos programáveis do próprio FPAA. Os resultados obtidos para as análises interna e externa são então comparados. O segundo FPAA estudado, da Anadigm Company, é um dispositivo a capacitores chaveados que tem como característica a programabilidade funcional. Por esta razão o desenvolvimento de uma técnica de teste estrutural é dificultado, pois não se conhece detalhes da arquitetura do componente. Por esta razão, uma técnica de teste funcional, conhecida como Transient Response Analysis Method, é aplicada ao teste deste FPAA. Neste método o circuito sob teste é dividido em blocos funcionais de primeira e segunda ordem e a resposta transiente destes blocos para um dado estímulo de entrada é analisada. O bloco sob teste é então duplicado e um esquema de auto-teste integrado baseado em redundância é desenvolvido, com o intuito de se obter um sinal de erro. Este sinal de erro representa a diferença das respostas transientes dos blocos duplicados. Como proposta para se aumentar a observabilidade do sinal de erro o mesmo é integrado ao longo tempo, aumentando a capacidade de detecção de falhas quando utilizado este método. Em ambas estratégias o objetivo principal do trabalho é testar os blocos analógicos programáveis dos FPAAs explorando ao máximo a programabilidade dos dispositivos e utilizando recursos pré-existentes para auxiliar no teste. Os resultados obtidos mostram que as estratégias desenvolvidas configuram boas alternativas para o auto-teste integrado deste tipo de componente. / This work addresses the test of programmable analog devices. Several analog test methodologies are studied and some of them are applied in the developed strategies. In order to validate these strategies, two commercial FPAAs (Field Programmable Analog Arrays), of different vendors and distinct models, are considered as devices under test. The first studied device is a continuous-time FPAA from Lattice Semiconductors. One important characteristic of such device is the structural programmability. For this reason the test strategy applied to this FPAA is based in a structural method known as OBT (Oscillation-Based Test). In this method, blocks of the circuit under test are individually converted into oscillators. The parameters of the generated signal, such as the frequency and amplitude, can be expressed as function of the components used in the oscillator implementation. This way, it is possible to detect faults in the FPAA simply observing such parameters. This method is firstly studied considering an external analysis of the signal parameters. However, in a second moment, an internal response analyzer, based on a double integrator, is built with the available programmable resources of the FPAA. This way, overall test cost is reduced, while the fault coverage is increased with no area overhead. The obtained results considering the external analysis and the built-in response evaluation are compared. The second considered FPAA, from Anadigm Company, is a switched capacitor device whose programming characteristic is strictly functional. Thus, a structural test method cannot be easily developed and applied without the previous knowledge of he device architectural details. For this reason, a functional test method known as TRAM (Transient Response Analysis Method) is adopted. In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks for a given input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between the fault-free and faulty Configurable Analog Blocks (CABs). As a proposal to augmenting the observability, the error signal is integrated, enhancing de fault detection capability when using this method. In both developed strategies the main objective is to test the CABs of the FPAAs exploiting the device programmability, using the existing resources in order to aid the test. The obtained results show that the developed strategies represent good alternatives to the built-in self-test of such type of device.