The performance of a modern computing system is improving with technology scaling due to advancements in the modern semiconductor industry. However, the power efficiency along with reliability does not scale linearly with performance efficiency. High leakage and standby power in sub 100 nm technology are critical challenges faced by circuit designers. Recent developments in device physics have shown that emerging non-volatile memories are very effective in reducing power dissipation because they eliminate stand by power and exhibit almost zero leakage powerThis dissertation studies the use of emerging non-volatile memory devices in designing circuit architecture for improving power dissipation and the performance of the computing system. More specically, it proposes a novel spintronic Ternary Content AddressableMemory (TCAM), a novel memristive TCAM with improved power and performance efficiency. Our experimental evaluation on 45 nm technology for a 256-bit word-size spintronic TCAM at a supply voltage of 1 V with a sense margin of 50 mV show that the delay is lessthan 200 ps and the per-bit search energy is approximately 3 fJ. The proposed spintronic TCAM consumes at least 30% less energy when compared to state-of-the-art TCAM designs. The search delay on a 144-bit proposed memristive TCAM at a supply voltage of 1 V and a sense margin of 140 mV is 175 ps with per bit search energy of 1.2 fJ on a 45 nm technology. It is 1.12 x times faster and dissipates 67% less search energy per bit than the fastest existing 144-bit MTCAM design.Emerging non-volatile memories are well known for their ability to perform fast analog multiplication and addition when they are arranged in crossbar fashion and are especially suited for neural network applications. However, such systems require the on-chip implementation of the backpropagation algorithm to accommodate process variations. This dissertation studies the impact of process variation in training memristive neural network architecture. It proposes a low hardware overhead on-chip implementation of the backpropagation algorithm that utilizes effectively the very dense memristive cross-bar arrayand is resilient to process variations.Another important issue that needs a careful study due to shrinking technology node is the impact of space or terrestrial radiation in Integrated Circuits (ICs) because the probability of a high energy particle causing an error increases with a decrease in thethreshold voltage and the noise margin. Moreover, single-event effects (SEEs) sensitivity depends on the set of input vectors used at the time of testing due to logical masking. This dissertation analyzes the impact of input test set on the cross section of the microprocessorand proposes a mechanism to derive a high-quality input test set using an automatic test pattern generation (ATPG) for radiation testing of microprocessors arithmetic and logical units..

Safety-critical applications employed in automotive, avionics and aerospace domains are placed under strict demands for performance, power efficiency and fault tolerance. Development of system hardware and software satisfying all criteria is challenging and time-consuming. System co-design based on specifications and desired high-performance requirements, is one solution to this problem, however, it remains a largely unexplored territory. Currently at KTH Royal Institute of Technology, a co-design framework in relation to theoretical system design models is being researched with the objective to move the embedded system design to a higher abstraction level. Presently, it focuses on correct-by-construction design of low power and reliable safety-critical systems. This thesis intends to assess the accuracy of this framework in comparison to conventional design approaches. The accuracy is evaluated empirically in terms of extra functional requirements - average total power consumption and Mean Time Between Failure (MTBF). A simple payload Central Direct Memory Access (CDMA) application is integrated with Xilinx Soft Error Mitigation (SEM) IP Core and source of system failure is a Single Event Upset (SEU) which occurs due to ionizing radiations. Measurements obtained from this reference system are compared to results determined theoretically from model related equations for the same system. Comparison of measured MTBF values with theoretical estimations shows that measured ones are higher by an average huge difference of 324.63%. Similarly for power consumption, measurements were found to be higher than estimated ones by 0.4465 Watts. In conclusion, it can be said that theoretical model design framework is not accurate and models must somehow take into account implementation dependent factors. Nevertheless, this case study provided a good insight and pathways for enhancements and optimizations to turn this reference into a dependable platform. Finally, future work required for desirable experiment system improvements are identified. / Säkerhetskritiska applikationer som används inom fordons-, flyg- och flygindustrin ställs strikta krav på prestanda, energieffektivitet och feltolerans. Utveckling av systemhårdvara och mjukvara som uppfyller alla kriterier är utmanande och tidskrävande. Systemdesign baserad på specifikationer och önskade högpresterande krav är en lösning på detta problem, men det är fortfarande ett i stort sett outforskat område. För närvarande vid KTH Royal Institute of Technology undersöks ett ramverk för samdesign i relation till teoretiska systemdesignmodeller undersöks med målet att flytta den inbyggda systemdesignen till en högre abstraktionsnivå. Nuvarande, den fokuserar på korrekt konstruktion av låg effekt och pålitliga säkerhetskritiska system. Denna avhandling avser att bedöma riktigheten i detta ramverk i jämförelse med konventionella designmetoder. Noggrannheten utvärderas empiriskt när det gäller extra funktionskrav - genomsnittlig total strömförbrukning och medeltid mellan misslyckande (MTBF). En enkel nyttolast central direktminnesåtkomst (CDMA) applikation är integrerad med Xilinx begränsning av en händelse (SEM) IP kärnan och källan till systemfel är en singelhändelse upprörd (SEU) som uppstår på grund av joniserande strålning. Mätningar erhållna från detta referenssystem jämförs med resultat som bestämts teoretiskt från modellrelaterade ekvationer för samma system. Jämförelse av uppmätta MTBF -värden med teoretiska uppskattningar visar att uppmätta värden är högre med en genomsnittlig enorm skillnad på 324,63%. På samma sätt för strömförbrukning befanns mätningarna vara högre än beräknade med 0,4465 Watt. Sammanfattningsvis kan man säga att det teoretiska ramverket för modelldesign inte är korrekt och att modellerna på något sätt måste ta hänsyn till implementeringsberoende faktorer. Ändå gav denna fallstudie en bra insikt och vägar för förbättringar och optimeringar för att göra denna referens till en pålitlig plattform. Slutligen identifieras framtida arbete som krävs för önskvärda experimentsystemförbättringar.