A detailed, fundamental understanding of the surface properties of molecular crystals and their interaction with adsorbing molecules (e.g. excipients) is important for tailoring the stability of formulations and the bioavailability of Active Pharmaceutical Ingredient (APIs). Few fundamental experimental studies with surface sensitive probes have been carried out for organic molecular crystals. X-ray photoelectron spectroscopy (XPS) is an established surface analysis method in the fields of adsorption, catalysis and surface chemistry of inorganic crystals. It has high surface sensitivity, probing approximately the top 1-3 nm of a crystal, and allows surface elemental analysis combined with the determination of the chemical state of the elements. To explore the possibilities and limitations of XPS for the surface characterisation of molecular crystal systems, investigation has been made on a range of paracetamol systems, three different poloxamers and blends of paracetamol with poloxamer 188. It was found by investigations of a range of polycrystalline paracetamol forms that the C1s, N1s and O1s core level emissions from the amide group of paracetamol allow to quantify, for the first time, the influence of surface contamination and adsorbed species on the paracetamol XPS data. Results of quantitative XPS analyses must be critically evaluated taking the material and energy-specific escape depth of the photoelectron signals into account. Analysis of the polycrystalline powder samples, including two different polymorphs and various partially amorphous forms of paracetamol, indicated that the core-level shifts associated with varying intermolecular interactions do not perturb the local electronic structure variations in paracetamol enough to become detectable through chemical shifts in the core level photoemission spectra. Subsequently, large, high quality single crystals of the monoclinic form I (with facet diameters between ~5 and ~10 mm) were obtained from different solvents (methanol, ethanol, acetone) to examine the influence of the crystallisation medium on the surface properties. Small spot XPS analysis was performed in several areas across facets to examine the possible influence of roughness and other lateral inhomogeneities. Careful curve-fitting of all results reveals only minor variations in the XPS data as a function of facet orientation, crystallisation medium or degree of crystallinity. Moreover, results indicate that any variations seen in XPS data very likely stem from low-level surface contamination, which is very difficult to avoid, even in a clean-room laboratory environment. In fact, the results indicate that the level of surface contamination depends significantly on the crystallisation apparatus cleanliness. Even minute concentrations of surface active components in the solutions, i.e. below the detection level of techniques for routine analytical methods, are likely to cause significant surface concentrations on crystal facets emersed from the solutions. The study thus highlights the paramount importance of microscopic surface cleanliness when assessing macroscopic facet-specific phenomena such as contact angles. Finally, XPS was employed to analyse milled and physical mixtures of paracetamol with poloxamer 188 at different percent. At minimum mass percentages poloxamer 188 adsorbs on the paracetamol surfaces; in the presence of poloxamer 188 excess the conformation of adsorbed poloxamer on the paracetamol surface changes. Studies of radiation damage on the poloxamer samples were performed both for several pure polxamers as well as for milled mixtures with paracetamol. They allowed the proposal of radiation-induced degradation mechanisms.

The ageing of polymer insulation occurs under long-term exposure to high electric fields and has attracted research due its relevance to high voltage insulation. In this work, polymers that have been electrically aged via a number of methods have been investigated using X-ray photoelectron spectroscopy (XPS). Despite some use in the investigation of outdoor insulation surfaces, XPS has not been used for investigations of polymer bulk electrical ageing before now. The first XPS measurements, using both small spot analysis and XPS imaging, are presented from the exposed inner surfaces of electrically aged artificial voids and electrical breakdown channels, as well as corona discharge aged surfaces and spark discharge by-products. XPS is shown to be a valuable technique for the investigation of polymer electrical ageing. Investigations into breakdown channels are supported by data acquired using X-ray photoemission electron microscopy (XPEEM) and scanning electron microscopy (SEM).Results show that the chemistry present at these surfaces takes the form of significant oxidation over a wide area with localised production of graphitic carbon. C-O-, C=O, and O-C=O species are detected in all cases. It is found that similar ageing products are present regardless of the ageing process or material investigated. However, the level of oxidation and relative ratio of the species seen with XPS is shown to be highly dependant on oxygen availability. Greater intensity of carbon oxides, and a shift towards highly oxidised species, is observed when there is more oxygen in the system. XPS imaging of breakdown channels reveals that high concentrations of oxidised components form on the outer edges of the channel, with graphitic carbon forming in the central regions. In addition, evidence for degradation is seen to extend at least 300 μm from channels in XPS imaging and at least ~650 μm in XPS line scans. Variation with the applied discharge energy was investigated for breakdown channels and spark discharge ageing. Evidence is seen for an energy dependence on the breakdown products, with higher energies producing relatively higher graphitic carbon and reduced oxidation products. Further, the relationship between the applied voltage and graphitic carbon concentration suggests an activated process with an energy barrier before graphitic carbon formation starts. XPS observations are supported by confocal Raman microprobe spectroscopy (CRMS) results from artificial voids and electrical breakdown channels, which identify graphitic carbon on a fluorescent background as the main features. XPS data indicate oxidised species are the origin of the fluorescence seen and provides quantitative information on the levels, chemical states and spatial distribution of these species and of graphitic carbon.

No description available.

Darbo tikslas yra ištirti neatkaitintų ir atkaitintų prie aukštų temperatūrų vakuume LaNiO3 sluoksnių Rentgeno fotoelektronų spektrus. Darbe aprašyti Rentgeno fotoelektronų spektroskopijos (RFS) (XPS- X-ray photoelectron spectroscopy) metodo, naudojamo įvairių medžiagų paviršių cheminei sudėčiai nustatyti, pagrindai. Pirmame skyriuje aprašyti: La- Ni oksidiniai junginiai ir jų tyrimų metodika, plonų nanostruktūrizuotų medžiagų sluoksnių nusodinimo iš dujų fazės (plazmos) metodas- magnetroninis dulkinimas (magnetron sputtering), aparatūra, XPSPeak programos pritaikymas Rentgeno fotoelektronų spektrų tyrimui bei jos naudojimo galimybės. Antrasis skyrius yra skirtas Rentgeno fotoelektroninių spektrų matavimų, naudojant spektrometrą XSAM 800 (Kratos Analytical, Didžioji Britanija) ypatumams ir bandinių gamybos metodikai aptarti. Trečiajame skyriuje pateikiami eksperimentiniai rezultatai gauti, matuojant LaNiO3-x Rentgeno fotoelektronų spektrus. Darbo pabaigoje yra pateikiamos išvados, kurios galėtų būti naudingos, tobulinant LaNiO3-x bandinių gamybos technologiją. / The aim of presented work was to investigate the X-ray photoelectron spectra (XPS) of LaNiO3-x thin films. The films were produced by DC magnetron sputtering. It is known that the temperature dependence of resistivity of as grown films has the metallic character. After the temperature annealing in the high vacuum condition this dependence changes to the semiconductor like character. XPS spectra of the oxygen region of as grown samples indicate that oxygen ions are in three states – O2-, hydroxyl groups (OH)-, and water. After the temperature annealing in the high vacuum condition oxygen ions are only in the two states - O2- and hydroxyl groups (OH)-. Thus the changes of the resistivity temperature dependence are caused by the changes of the oxygen ions system after the temperature annealing in the high vacuum. After temperatures processing in vacuum the samples some time have been sustained in atmospheric conditions, the temperature dependence of resistance again came back to an initial metal condition. This fact means that for the synthesis of qualitative thin layers it is necessary to change technological conditions of production.

The shift to the Cu/low-k interconnect scheme requires the development of diffusion barrier/adhesion promoter materials that provide excellent performance in preventing the diffusion and intermixing of Cu into the adjacent dielectrics. The integration of Cu with low-k materials may decrease RC delays in signal propagation but pose additional problems because such materials are often porous and contain significant amounts of carbon. Therefore barrier metal diffusion into the dielectric and the formation of interfacial carbides and oxides are of significant concern. The objective of the present research is to investigate the fundamental surface interactions between diffusion barriers and various low-k dielectric materials. Two major diffusion barriers¾ tatalum (Ta) and titanium nitride (TiN) are prepared by DC magnetron sputtering and metal-organic chemical vapor deposition (MOCVD), respectively. Surface analytical techniques, such as X-ray photoelectronic spectroscopy (XPS), transmission electron microscopy (TEM), and atomic force microscopy (AFM) are employed. Ta sputter-deposited onto a Si-O-C low dielectric constant substrate forms a reaction layer composed of Ta oxide and TaC. The composition of the reaction layer varies with deposition rate (1 Å-min-1 vs. 2 Å-sec-1), but in both cases, the thickness of the TaC layer is found to be at least 30 Å on the basis of XPS spectra, which is corroborated with cross-sectional TEM data. Sputter-deposited Cu will not wet the TaC layer and displays facile agglomeration, even at 400 K. Deposition for longer time at 2 Å-sec-1 results in formation of a metallic Ta layer. Sputter deposited Cu wets (grows conformally) on the metallic Ta surface at 300 K, and resists significant agglomeration at up to ~ 600 K. Cu diffusion into the substrate is not observed up to 800 K in the UHV environment. Tetrakis(diethylamido) titanium (TDEAT) interactions with SiO2, Cu and a variety of low-k samples in the presence (~ 10-7 Torr or co-adsorbed) and absence of NH3 result in different products. TDEAT interactions with SiO2 are dominated by Ti interactions with substrate oxygen sites, and that Ti oxide/sub-oxide bond formation can proceed with relatively low activation energy. No Ti carbide or Si carbide formation is observed. Co-adsorption of TDEAT and NH3 on SiO2 at 120K followed by annealing to higher temperature results in enhanced Ti-N bond formation, which is stable against oxidation up to 900K in UHV. Similarly, continuous exposures of TDEAT on SiO2 at 500K in the presence of NH3 exhibit a relatively enhanced Ti-N spectral component. Co-adsorption of NH3 and TDEAT on Cu (poly) surface at 120K, followed by annealing to 500K, results in complete desorption of Ti, N or C-containing species from the Cu substrate. Reaction of TDEAT with a Cu surface at 500K yields a Ti-alkyl species via a b-hydride elimination pathway. TDEAT/Cu interactions are not observably affected by overpressures of NH3 of 10-7 Torr. TDEAT interaction with a porous carbon doped oxide low-k substrate at 700K demonstrates undissociated or partly dissociated Ti-NR species trapped in the dielectrics matrix due to its high porosity. In addition, carbide formation is observed from C(1s) XPS spectra. For a hydrocarbon low-k film, the majority sites (carbon) are highly unreactive towards TDEAT even at higher temperature due to a lack of functional groups to initiate the TDEAT/low-k surface chemistry.

Wang Yuhao = 利用X光电子谱和导电原子力显微镜对聚3, 4-乙烯二氧噻酚 : 聚苯磺酸改性的研究 / 王宇昊. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2005. / Includes bibliographical references. / Text in English; abstracts in English and Chinese. / Wang Yuhao = Li yong X guang dian zi pu he dao dian yuan zi li xian wei jing dui ju 3, 4-yi xi er yang sai fen : ju ben huang suan gai xing de yan jiu / Wang Yuhao. / Abstract --- p.ii / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.ix / List of Tables --- p.xiii / Chapter CHAPTER 1 --- INTRODUCTION --- p.1 / Chapter 1.1 --- Review of conducting conjugated polymers --- p.1 / Chapter 1.1.1 --- Development of conjugated polymer --- p.1 / Chapter 1.1.2 --- Basic concepts in independent-electron theories of conducting conjugated polymers --- p.2 / Chapter 1.1.2.1 --- "Huckel model and its difficulty, the importance of election-phonon" --- p.2 / Chapter 1.1.2.2 --- The SSH model and dimerization --- p.3 / Chapter 1.1.2.3 --- "Charge carriers in conducting conjugated polymers: soliton, polaron and bipolaron" --- p.5 / Chapter 1.1.3 --- "Poly(3,4-ethylenedioxythiophene) or PEDT" --- p.5 / Chapter 1.1.4 --- Derivatives of PEDT --- p.6 / Chapter 1.1.5 --- Application of PEDT and its derivatives --- p.7 / Chapter 1.2 --- Polymeric light emitting diodes (PLED) --- p.7 / Chapter 1.2.1 --- Invention Polymeric light emitting diodes (PLED) --- p.7 / Chapter 1.2.2 --- Electric structure of PLEDs --- p.7 / Chapter 1.2.3 --- Transition from excitons to photons --- p.8 / Chapter 1.2.4 --- Controlling electron and hole injection --- p.8 / Chapter 1.2.5 --- Application of PEDT-PSS as hole transporting layer in PLED --- p.9 / Chapter 1.2.6 --- "Phase separating in PEDT-PSS blend, removing the PSS rich layer" --- p.9 / Chapter 1.3 --- Motivations of the thesis work --- p.10 / References --- p.10 / Chapter CHAPTER 2 --- INSTRUMENTATION --- p.27 / Chapter 2.1 --- X-ray Photoelectron Spectroscopy --- p.27 / Chapter 2.1.1 --- History of XPS techniques --- p.27 / Chapter 2.1.2 --- Physical Basis --- p.28 / Chapter 2.1.3 --- Chemical Shift of Binding Energy in XPS --- p.29 / Chapter 2.1.4 --- Binding Energy Referencing in XPS --- p.29 / Chapter 2.1.5 --- Sampling Depth of XPS --- p.30 / Chapter 2.1.6 --- Instrumental Setup of XPS --- p.30 / Chapter 2.2 --- Scanning Probe Microscopy --- p.31 / Chapter 2.2.1 --- Introduction --- p.31 / Chapter 2.2.2 --- Atomic Force Microscopy and Conductive Atomic Force Microscopy --- p.31 / Chapter 2.2.3 --- Instrumental Setup for Conductive AFM --- p.32 / Chapter 2.3 --- The Low Energy Ion Beam (LEIB) system at CUHK --- p.32 / Chapter 2.3.1 --- Introduction --- p.32 / Chapter 2.3.2 --- Principle --- p.33 / Chapter 2.3.3 --- Instrumentation Setup --- p.33 / References --- p.33 / Chapter CHAPTER 3 --- Effects of Ar+ bombardment at 500 and 100eV --- p.42 / Chapter 3.1 --- Introduction --- p.42 / Chapter 3.2 --- Sample Preparation --- p.42 / Chapter 3.3 --- Ar+ sputtering and XPS measurement of the sputtered sample. --- p.43 / Chapter 3.4 --- Results and Discussion --- p.44 / References --- p.49 / Chapter CHAPTER 4 --- Effects of annealing on PEDT-PSS thin films studied by XPS and AFM --- p.60 / Chapter 4.1 --- Introduction --- p.60 / Chapter 4.2 --- Sample Preparation --- p.60 / Chapter 4.3 --- XPS measurements and results --- p.61 / Chapter 4.3.1 --- XPS of C 1s core level of PEDT-PSS --- p.61 / Chapter 4.3.2 --- XPS of O 1s core level of PEDT-PSS --- p.62 / Chapter 4.3.3 --- XPS of S 2p core level of PEDT-PSS --- p.62 / Chapter 4.3.4 --- XPS of Valence Band of PEDT-PSS --- p.64 / Chapter 4.4 --- C-AFM measurements and results --- p.65 / Chapter 4.4.1 --- C-AFM measurements on PEDT-PSS --- p.65 / Chapter 4.5 --- Measurements and results about film insolubility and conductivity --- p.65 / Chapter 4.5.1 --- Insolubility measurements --- p.66 / Chapter 4.5.2 --- Conductivity measurements --- p.66 / Chapter 4.5.3 --- Results from the film insolubility and conductivity measurements --- p.66 / Chapter 4.6 --- Conclusion --- p.67 / References --- p.68 / Chapter CHAPTER 5 --- Effects of low energy proton bombardment of PEDT-PSS films studied by XPS and AFM --- p.90 / Chapter 5.1 --- Introduction --- p.90 / Chapter 5.2 --- XPS and c-AFM studies of PEDT-PSS films bombarded by H+ --- p.90 / Chapter 5.2.1 --- Sample preparation --- p.90 / Chapter 5.2.2 --- Results and discussion --- p.90 / Chapter 5.3 --- Conductivity measurements --- p.92 / Chapter 5.3.1 --- Sample preparation for conductivity measurements --- p.92 / Chapter 5.3.2 --- Results and discussion --- p.93 / Chapter 5.4 --- Conclusion --- p.93 / References --- p.93 / Chapter CHAPTER 6 --- Concluding Remarks and Future Works --- p.106 / Chapter 6.1 --- Concluding Remarks --- p.106 / Chapter 6.2 --- Future Work --- p.106 / Chapter APPENDIX --- The SSH model in describing polyacetylene --- p.108 / Chapter Part 1 --- Assumptions of the SSH model --- p.108 / Chapter Part 2 --- Bloch model and SSH model. --- p.113 / Reference --- p.117

>Magister Scientiae - MSc / Solar cells offer SA an additional energy source. While Si cells are abundantly available they are not at an optimal efficiency and the cost is still high. One technology that can enhance their performance is SiNW. However, material properties such as the diameter, porosity and length determine their effectiveness during application to solar cell technology. One method of growing SiNW uses Sn catalysts on a Si substrate. As the properties of the Sn nanoparticle govern the properties of the SiNW, this thesis investigates their formation and properties by depositing a Sn layer on a Si wafer and then subjecting it to different temperatures, during process the layer forms into nanoparticles. At each temperature the morphology, composition and crystallinity will be determined using XPS, SEM, TEM and EDS. Thus, in Chapter 1 there is an overview, Chapter 2 deals with techniques used in this study, Chapter 3 will give the quantitative and qualitative results on the XPS analysis and Chapter 4 will illustrate the structural behaviour of the annealed Sn film samples.

<p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-bidi-font-weight:bold'>M-DNA is a novel complex formed between DNA and transition metal ions under alkaline conditions.<span style='mso-spacerun:yes'>  </span>The unique properties of M-DNA were manipulated in order to rationally place metal ions at specific regions within a double-stranded DNA helix.<span style='mso-spacerun:yes'>   </span>Investigations using thermal denaturation profiles and the ethidium fluorescence assay illustrate that the pH at which M-DNA formation occurs is influenced heavily by the DNA sequence and base composition.<span style='mso-spacerun:yes'>  </span>For instance, DNA with a sequence consisting of poly[d(TG)d(CA)] is completely converted to M-DNA at pH 7.9 while DNA consisting entirely of poly[d(AT)] remains in the B-DNA conformation until a pH of 8.6 is reached.<span style='mso-spacerun:yes'>  </span>The pH at which M-DNA formation occurs is further decreased by the incorporation of 4-thiothymine (s⁴T).<span style='mso-spacerun:yes'>  </span>DNA oligomers with a mixed sequence composed of </span>half d(AT) and the other half d(TG)d(CA)<span style='mso-bidi-font-weight: bold'> showed that only 50% of the DNA is able to incorporate Zn²⁺ ions at pH 7.9.<span style='mso-spacerun:yes'>  </span>This suggests that only regions corresponding to the tracts of <span class=GramE>d(</span>TG)d(CA) are being transformed.<span style='mso-spacerun:yes'>   </span><o:p></o:p></span></p> <p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-fareast-language:ZH-CN'>Duplex DNA monolayers were self-assembled on gold through <span class=GramE>a</span> Au-S linkage and both B- and M-DNA conformations were studied using X-ray photoelectron spectroscopy (XPS) in order to better elucidate the location of the metal ions.<span style='mso-spacerun:yes'>  </span>The film thickness, density, elemental composition and ratios for samples were analyzed and compared.<span style='mso-spacerun:yes'>  </span>The DNA surface coverage, calculated from both XPS and electrochemical measurements, was <span class=GramE>approximately 1.2 x 10¹³molecules/cm²</span>for B-DNA.<span style='mso-spacerun:yes'>  </span>All samples showed distinct peaks for C 1s, O 1s, N 1s, P 2p and S 2p as expected for a thiol-linked DNA.<span style='mso-spacerun:yes'>  </span></span><span style='mso-bidi-font-weight: bold'>On addition of Zn²⁺ to form M-DNA the C 1s, P 2p and S 2p showed only small changes </span><span style='mso-fareast-language:ZH-CN'>while both the N 1s and O 1s spectra changed considerably.<span style='mso-spacerun:yes'>  </span>This result is consistent with Zn²⁺ interacting with oxygen on the phosphate backbone as well as replacing the imino protons of thymine (T) and guanine (G) in M-DNA.<span style='mso-spacerun:yes'>   </span>Analysis of the Zn 2p spectra also demonstrated that the concentration of Zn²⁺ present under M-DNA conditions is consistent with Zn²⁺ binding to both the phosphate backbone as well as replacing the imino protons of T or G in each base pair.<span style='mso-spacerun:yes'>  </span>After the M-DNA monolayer is washed with a buffer containing only Na⁺ the Zn²⁺ bound to the phosphate backbone is removed while the Zn²⁺ bound internally still remains. </span><span style='mso-bidi-font-weight:bold'>Variable angle x-ray photoelectron spectroscopy (VAXPS) was also used to examine monolayers consisting of mixed sequence oligomers.<span style='mso-spacerun:yes'>  </span>Preliminary results suggest that under M-DNA conditions, the zinc to phosphate ratio changes relative to the position of the <span class=GramE>d(</span>TG)d(CA) tract being at the top or bottom of the monolayer.<span style='mso-spacerun:yes'>  </span><span style='mso-spacerun:yes'> </span><o:p></o:p></span></p> <p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-bidi-font-weight:bold'>Electrochemistry was also used to investigate the properties of M-DNA monolayers on gold and examine how the localization of metal ions affects the resistance through the DNA monolayer.<span style='mso-spacerun:yes'>  </span>T</span>he effectiveness of using the IrCl₆^2-/3-redox couple to investigate DNA monolayers and the potential advantages of this system over the standard Fe(CN)₆^3-/4- redox couple are demonstrated.<span style='mso-spacerun:yes'>  </span>B-DNA monolayers were converted to M-DNA by incubation in buffer containing 0.4 mM Zn²⁺ at pH 8.6 and studied by cyclic voltammetry (CV), electrochemical impedance spectroscopy (EIS) and chronoamperometry (CA) with IrCl₆^2-/3-.<span style='mso-spacerun:yes'>  </span>^{<span style='mso-spacerun:yes'> </span>}Compared to B-DNA, M-DNA showed significant changes in CV, EIS and CA spectra.<span style='mso-spacerun:yes'>  </span>However, only small changes were observed when the monolayers were incubated in Mg²⁺at pH 8.6 or in Zn²⁺ at pH 6.0.<span style='mso-spacerun:yes'>  </span>The heterogeneous electron-transfer rate (<i style='mso-bidi-font-style:normal'>k</i>_ET) between the redox probe and the surface of a bare gold electrode was determined to be 5.7 x 10^-3 cm/s.<span style='mso-spacerun:yes'>  </span>For a B-DNA modified electrode, the <i style='mso-bidi-font-style:normal'>k</i>_ET through the monolayer was too slow to be measured.<span style='mso-spacerun:yes'>  </span>However, under M-DNA conditions, a <i style='mso-bidi-font-style:normal'>k</i>_ET of 1.5 x 10^-3 cm/s was reached.<span style='mso-spacerun:yes'>  </span>As well, the percent change in resistance to charge transfer (R_CT), measured by EIS, <span class=GramE>was</span> used to illustrate the dependence of M-DNA formation on pH.<span style='mso-spacerun:yes'>  </span>This result is consistent with Zn²⁺ ions replacing the imino protons on thymine and guanine residues.<span style='mso-spacerun:yes'>  </span>Also, at low pH values, the percent change in R_CT seems to be greater for <span class=GramE><span style='mso-bidi-font-weight:bold'>d(</span></span><span style='mso-bidi-font-weight: bold'>TG)₁₅d(CA)₁₅ compared to oligomers with mixed d(AT) and d(TG)d(CA) tracts.<span style='mso-spacerun:yes'>  </span></span>The IrCl₆^2-/3-redox couple was also effective in differentiating between single-stranded and double-stranded DNA during dehybridization and rehybridization experiments.<span style='mso-spacerun:yes'>  </span><span style='mso-bidi-font-weight:bold'><o:p></o:p></span></p>

<p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-bidi-font-weight:bold'>M-DNA is a novel complex formed between DNA and transition metal ions under alkaline conditions.<span style='mso-spacerun:yes'>  </span>The unique properties of M-DNA were manipulated in order to rationally place metal ions at specific regions within a double-stranded DNA helix.<span style='mso-spacerun:yes'>   </span>Investigations using thermal denaturation profiles and the ethidium fluorescence assay illustrate that the pH at which M-DNA formation occurs is influenced heavily by the DNA sequence and base composition.<span style='mso-spacerun:yes'>  </span>For instance, DNA with a sequence consisting of poly[d(TG)d(CA)] is completely converted to M-DNA at pH 7.9 while DNA consisting entirely of poly[d(AT)] remains in the B-DNA conformation until a pH of 8.6 is reached.<span style='mso-spacerun:yes'>  </span>The pH at which M-DNA formation occurs is further decreased by the incorporation of 4-thiothymine (s⁴T).<span style='mso-spacerun:yes'>  </span>DNA oligomers with a mixed sequence composed of </span>half d(AT) and the other half d(TG)d(CA)<span style='mso-bidi-font-weight: bold'> showed that only 50% of the DNA is able to incorporate Zn²⁺ ions at pH 7.9.<span style='mso-spacerun:yes'>  </span>This suggests that only regions corresponding to the tracts of <span class=GramE>d(</span>TG)d(CA) are being transformed.<span style='mso-spacerun:yes'>   </span><o:p></o:p></span></p> <p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-fareast-language:ZH-CN'>Duplex DNA monolayers were self-assembled on gold through <span class=GramE>a</span> Au-S linkage and both B- and M-DNA conformations were studied using X-ray photoelectron spectroscopy (XPS) in order to better elucidate the location of the metal ions.<span style='mso-spacerun:yes'>  </span>The film thickness, density, elemental composition and ratios for samples were analyzed and compared.<span style='mso-spacerun:yes'>  </span>The DNA surface coverage, calculated from both XPS and electrochemical measurements, was <span class=GramE>approximately 1.2 x 10¹³molecules/cm²</span>for B-DNA.<span style='mso-spacerun:yes'>  </span>All samples showed distinct peaks for C 1s, O 1s, N 1s, P 2p and S 2p as expected for a thiol-linked DNA.<span style='mso-spacerun:yes'>  </span></span><span style='mso-bidi-font-weight: bold'>On addition of Zn²⁺ to form M-DNA the C 1s, P 2p and S 2p showed only small changes </span><span style='mso-fareast-language:ZH-CN'>while both the N 1s and O 1s spectra changed considerably.<span style='mso-spacerun:yes'>  </span>This result is consistent with Zn²⁺ interacting with oxygen on the phosphate backbone as well as replacing the imino protons of thymine (T) and guanine (G) in M-DNA.<span style='mso-spacerun:yes'>   </span>Analysis of the Zn 2p spectra also demonstrated that the concentration of Zn²⁺ present under M-DNA conditions is consistent with Zn²⁺ binding to both the phosphate backbone as well as replacing the imino protons of T or G in each base pair.<span style='mso-spacerun:yes'>  </span>After the M-DNA monolayer is washed with a buffer containing only Na⁺ the Zn²⁺ bound to the phosphate backbone is removed while the Zn²⁺ bound internally still remains. </span><span style='mso-bidi-font-weight:bold'>Variable angle x-ray photoelectron spectroscopy (VAXPS) was also used to examine monolayers consisting of mixed sequence oligomers.<span style='mso-spacerun:yes'>  </span>Preliminary results suggest that under M-DNA conditions, the zinc to phosphate ratio changes relative to the position of the <span class=GramE>d(</span>TG)d(CA) tract being at the top or bottom of the monolayer.<span style='mso-spacerun:yes'>  </span><span style='mso-spacerun:yes'> </span><o:p></o:p></span></p> <p class=MsoNormal style='text-align:justify;text-indent:.5in;line-height:150%'><span style='mso-bidi-font-weight:bold'>Electrochemistry was also used to investigate the properties of M-DNA monolayers on gold and examine how the localization of metal ions affects the resistance through the DNA monolayer.<span style='mso-spacerun:yes'>  </span>T</span>he effectiveness of using the IrCl₆^2-/3-redox couple to investigate DNA monolayers and the potential advantages of this system over the standard Fe(CN)₆^3-/4- redox couple are demonstrated.<span style='mso-spacerun:yes'>  </span>B-DNA monolayers were converted to M-DNA by incubation in buffer containing 0.4 mM Zn²⁺ at pH 8.6 and studied by cyclic voltammetry (CV), electrochemical impedance spectroscopy (EIS) and chronoamperometry (CA) with IrCl₆^2-/3-.<span style='mso-spacerun:yes'>  </span>^{<span style='mso-spacerun:yes'> </span>}Compared to B-DNA, M-DNA showed significant changes in CV, EIS and CA spectra.<span style='mso-spacerun:yes'>  </span>However, only small changes were observed when the monolayers were incubated in Mg²⁺at pH 8.6 or in Zn²⁺ at pH 6.0.<span style='mso-spacerun:yes'>  </span>The heterogeneous electron-transfer rate (<i style='mso-bidi-font-style:normal'>k</i>_ET) between the redox probe and the surface of a bare gold electrode was determined to be 5.7 x 10^-3 cm/s.<span style='mso-spacerun:yes'>  </span>For a B-DNA modified electrode, the <i style='mso-bidi-font-style:normal'>k</i>_ET through the monolayer was too slow to be measured.<span style='mso-spacerun:yes'>  </span>However, under M-DNA conditions, a <i style='mso-bidi-font-style:normal'>k</i>_ET of 1.5 x 10^-3 cm/s was reached.<span style='mso-spacerun:yes'>  </span>As well, the percent change in resistance to charge transfer (R_CT), measured by EIS, <span class=GramE>was</span> used to illustrate the dependence of M-DNA formation on pH.<span style='mso-spacerun:yes'>  </span>This result is consistent with Zn²⁺ ions replacing the imino protons on thymine and guanine residues.<span style='mso-spacerun:yes'>  </span>Also, at low pH values, the percent change in R_CT seems to be greater for <span class=GramE><span style='mso-bidi-font-weight:bold'>d(</span></span><span style='mso-bidi-font-weight: bold'>TG)₁₅d(CA)₁₅ compared to oligomers with mixed d(AT) and d(TG)d(CA) tracts.<span style='mso-spacerun:yes'>  </span></span>The IrCl₆^2-/3-redox couple was also effective in differentiating between single-stranded and double-stranded DNA during dehybridization and rehybridization experiments.<span style='mso-spacerun:yes'>  </span><span style='mso-bidi-font-weight:bold'><o:p></o:p></span></p>

Although silicon (Si) nanostructures exhibit size dependent light emission, which can be attributed to quantum confinement, the role of surface passivation is not yet fully understood. This understanding is central to the development of nanocrystal-based detectors. This study investigated the growth, surface chemistry, passivation with deuterium (D2), ammonia (ND3) and diborane (B2D6) and the resulting optical properties of Si nanostructures. Si nanocrystals less than 6 nm in diameter are grown on SiO2 surfaces in an ultra high vacuum chamber using hot-wire chemical vapor deposition and the as grown surfaces are exposed to atomic deuterium. Temperature programmed desorption (TPD) spectra show that that the nanocrystals surfaces are covered by a mix of monodeuteride, dideuteride and trideuteride species. The manner of filling of the deuteride states on nanocrystals differs from that for extended surfaces as the formation of the dideuteride and trideuteride species is facilitated by the curvature of the nanocrystal. No photoluminescence (PL) is observed from the as grown unpassivated nanocrystals. As the deuterium dose is increased, the PL intensity also begins to increase. This can be associated with increasing amounts of mono-, di- and trideuteride species on the nanocrystal surface, which results in better passivation of the dangling bonds and relaxing of the reconstructed surface. At high deuterium doses, the surface structure breaks down and amorphization of the top layer of the nanocrystal takes place. Amorphization reduces the PL intensity. Finally, as the nanocrystal size is varied, the PL peak shifts, which is characteristic of quantum confinement. The dangling bonds and the reconstructed bonds at the NC surface are also passivated and transformed with D and NDx by using deuterated ammonia (ND3), which is predissociated over a hot tungsten filament prior to adsorption. At low hot wire ND3 doses PL emission is observed at 1000 nm corresponding to reconstructed surface bonds capped by predominantly monodeuteride and Si-ND2 species. As the hot wire ND3 dose is increased, di- and trideuteride species form and intense PL is observed around 800 nm that does not shift with NC size and is associated with defect levels resulting from NDx insertion into the strained Si-Si bonds forming Si2=ND. The PL intensity at 800 nm increases as the ND3 dose is increased and the intensity increase is correlated to increasing concentrations of deuterides. At extremely high ND3 doses PL intensity decreases due to amorphization of the NC surface. In separate experiments, Si NCs were subjected to dissociative (thermal) exposures of ammonia followed by exposures to atomic deuterium. These NCs exhibited size dependent PL and this can be attributed to the prevention of the formation of Si2=ND species. Finally, deuterium-passivated Si NCs are exposed to BDx radicals formed by dissociating deuterated diborane (B2D6) over a hot tungsten filament and photoluminescence quenching is observed. Temperature programmed desorption spectra reveal the presence of low temperature peaks, which can be attributed to deuterium desorption from surface Si atoms bonded to subsurface boron atoms. The subsurface boron likely enhances nonradiative Auger recombination. / text