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1	A Highly Digital VCO-Based ADC With Lookup-Table-Based Background Calibration Li, Sulin 02 August 2019 (has links) CMOS technology scaling has enabled dramatic improvement for digital circuits both in terms of speed and power efficiency. However, most traditional analog-to-digital converter (ADC) architectures are challenged by ever-decreasing supply voltage. The improvement in time resolution enabled by increased digital speeds drives design towards time-domain architectures such as voltage-controlled-oscillator (VCO) based ADCs. The main challenge in VCO-based ADC design is mitigating the nonlinearity of VCO Voltage-to-frequency (V-to-f) characteristics. Achieving signal-to-noise ratio (SNR) performance better than 40dB requires some form of calibration, which can be realized by analog or digital techniques, or some combination. This dissertation proposes a highly digital, reconfigurable VCO-based ADC with lookup-table (LUT) based background calibration based on "split ADC" architecture. Each of the two split channels, ADC "A" and "B", contains two VCOs in a differential configuration. This helps alleviate even-order distortions as well as increase the dynamic range. A digital controller on chip can reconfigure the ADCs' sampling rates and resolutions to adapt to various application scenarios. Different types of input signals can be used to train the ADC’s LUT parameters through the simple, anti-aliasing continuous-time input to achieve target resolution. The chip is fabricated in a 180 nm CMOS process, and the active area of analog and digital circuits is 0.09 and 0.16mm^2, respectively. Power consumption of the core ADC function is 25 mW. Measured results for this prototype design with 12-b resolution show ENOB improves from uncorrected 5-b to 11.5-b with calibration time within 200 ms (780K conversions at 5 MSps sample rate). Analog-to-digital conversion VCO-based ADC Digital background calibration
2	Lookup-Table-Based Background Linearization for VCO-Based ADCs Pham, Long 30 April 2015 (has links) Scaling of CMOS to nanometer dimensions has enabled dramatic improvement in digital power efficiency, with lower VDD supply voltage and decreased power consumption for logic functions. However, most traditionally prevalent ADC architectures are not well suited to the lower VDD environment. The improvement in time resolution enabled by increased digital speeds naturally drives design toward time-domain architectures such as voltage-controlled-oscillator (VCO) based ADCs. The major obstacle in the VCO-based technique is linearizing the VCO voltage-to-frequency characteristic. Achieving signal-to-noise (SNR) performance better than -40dB requires some form of calibration, which can be realized by analog or digital techniques, or some combination. A further challenge is implementing calibration without degrading energy efficiency performance. This thesis project discusses a complete design of a 10 bit three stage ring VCO-based ADC. A lookup-table (LUT) digital correction technique enabled by the "Split ADC" calibration approach is presented suitable for linearization of the ADC. An improvement in the calibration algorithm is introduced to ensure LUT continuity. Measured results for a 10 bit 48.8-kSps ADC show INL improvement of 10X after calibration convergence. linearization Lookup-table split ADC votlage controlled oscillator background calibration technique Analog to digital converter VCO-based ADC
3	Performance enhancement techniques for low power digital phase locked loops Elshazly, Amr 16 July 2014 (has links) Desire for low-power, high performance computing has been at core of the symbiotic union between digital circuits and CMOS scaling. While digital circuit performance improves with device scaling, analog circuits have not gained these benefits. As a result, it has become necessary to leverage increased digital circuit performance to mitigate analog circuit deficiencies in nanometer scale CMOS in order to realize world class analog solutions. In this thesis, both circuit and system enhancement techniques to improve performance of clock generators are discussed. The following techniques were developed: (1) A digital PLL that employs an adaptive and highly efficient way to cancel the effect of supply noise, (2) a supply regulated DPLL that uses low power regulator and improves supply noise rejection, (3) a digital multiplying DLL that obviates the need for high-resolution TDC while achieving sub-picosecond jitter and excellent supply noise immunity, and (4) a high resolution TDC based on a switched ring oscillator, are presented. Measured results obtained from the prototype chips are presented to illustrate the proposed design techniques. / Graduation date: 2013 / Access restricted to the OSU Community at author's request from July 16, 2012 - July 16, 2014 Phase locked loops Delay locked loops Supply noise mitigation background calibration Digital PLL Supply noise Time to digital converter TDC Switched ring oscillator SRO-TDC Digital circuits Low power Area efficient Digitally controlled oscillator Performance enhancement techniques Integrated circuits Frequency synthesizers Clock multipliers Integrated circuits Microelectronics Analog and mixed Circuits and systems Analog Digital Solid state circuit Phase-locked loops Electronic noise -- Prevention Low voltage systems Frequency synthesizers

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