Casamento de padrões de pontos é um problema fundamental em reconhecimento de padrões. O objetivo é encontrar uma correspondência entre dois conjuntos de pontos, associados a características relevantes de objetos ou entidades, mapeando os pontos de um conjunto no outro. Este problema está associado a muitas aplicações, como por exemplo, reconhecimento de objetos baseado em modelos, imagens estéreo, registro de imagens, biometria, entre outros. Para encontrar um mapeamento, os objetos são codificados por representações abstratas, codificando as características relevantes consideradas na comparação entre pares de objetos. Neste trabalho, objetos são representados por grafos, codificando tanto as características `locais\' quanto as relações espaciais entre estas características. A comparação entre objetos é guiada por uma formulação de atribuição quadrática, que é um problema NP-difícil. Para estimar uma solução, duas técnicas de casamento entre grafos são propostas: uma baseada em grafos auxiliares, chamados de grafos deformados; e outra baseada em representações `esparsas\', campos aleatórios de Markov e propagação de crenças. Devido as suas respectivas limitações, as abordagens são adequadas para situações específicas, conforme mostrado neste documento. Resultados envolvendo as duas abordagens são ilustrados em quatro importantes aplicações: casamento de imagens de gel eletroforese 2D, segmentação interativa de imagens naturais, casamento de formas, e colorização assistida por computador. / Point set matching is a fundamental problem in pattern recognition. The goal is to match two sets of points, associated to relevant features of objects or entities, by finding a mapping, or a correspondence, from one set to another set of points. This issue arises in many applications, e.g. model-based object recognition, stereo matching, image registration, biometrics, among others. In order to find a mapping, the objects can be encoded by abstract representations, carrying relevant features which are taken into account to compare pairs of objects. In this work, graphs are adopted to represent the objects, encoding their `local\' features and the spatial relations between these features. The comparison of two given objects is guided by a quadratic assignment formulation, which is NP-hard. In order to estimate the optimal solution, two approximations techniques, via graph matching, are proposed: one is based on auxiliary graphs, called deformed graphs; the other is based on `sparse\' representations, Markov random fields and belief propagation. Due to their respective limitations, each approach is more suitable to each specific situation, as shown in this document. The quality of the two approaches is illustrated on four important applications: 2D electrophoresis gel matching, interactive natural image segmentation, shape matching, and computer-assisted colorization.

Die Arbeit beschäftigt sich mit zerstörungsfreien Untersuchungen von Kristalldefekten an kompakten Proben mittels röntgenographischer Kossel- u. Weitwinkel-Mikrobeugung im Rasterelektronenmikroskop. Das REM wurde durch ein neu entwickeltes Aufnahmeverfahren so erweitert, daß die äußerst intensitätsschwachen Kossel-Röntgeninterferenzen mittels Phosphorszintillator und hochauflösendem, extrem empfindlichen CCD-Flächendetektor registriert werden können. Das aufwendige Röntgenfilmverfahren wurde damit abgelöst. Die Aufnahme-Techniken wurden so kombiniert, daß die sich gegenseitig ergänzenden Methoden, v.a. die Kossel- u. Pseudo-Kossel-, aber auch die Rückstreu-Elektronen-Beugung, erstmals mit einem einzigen CCD-System im REM ausführbar sind. Die Aufnahme von Kikuchi-Bändern wurde so weit verbessert, daß diese erstmalig bei vertikaler Inzidenz des Elektronenstrahls auf der Probe beobachtet werden konnten. Durch Einsatz einer fokussierenden Polykapillarlinse in einem Röntgenfluoreszenzspektrometer konnte die Anregung von Kossel-Linien durch Bremsstrahlung und erheblich kürzere Belichtungszeiten sowie deutlich höhere laterale Auflösungen erzielt werden. Für die komplementären Mikrobeugungsmethoden wurde ein einheitliches Programm entwickelt, dessen neue Art der Simulation komplizierter Weitwinkel-Kurven 4. Ordnung die Lokalisierung von Gitterbaufehlern im kompakten Kristall ermöglichte. Entsprechende Simulationen und Verfeinerungen der Kanüle erlaubten in feinkörnigen Polykristallen, wie Bariumtitanat, eine Einzelkornanalyse mit der Weitwinkel-Beugung. Insbesondere wurden markante Erhöhungen der Versetzungsdichte nahe der Korngrenze einzelner Kristallite in FeAl festgestellt. An intermetallischen Fe-Al-Verbindungen wurden in Weitwinkel-Kurven Feinstrukturen gefunden, die sich durch Umweganregungen in Zusammenhang mit Überstrukturen erklären lassen. An zugverformten Ni-Kristallen wurden Kossel- u. Weitwinkel-Linienbreiten in Abhängigkeit des Azimuts im symmetrischen Bragg-Fall ausgewertet u. mit theoretischen Modellen verglichen. Anisotrope Linienverbreiterungen durch die Wirkung von Stufenversetzungen konnten quantitativ nachgewiesen werden. Erste Kossel- u. Weitwinkel-Untersuchungen an zyklisch verformten Ni-Einkristallen zeigten, daß beobachtete perlenkettenförmige Intensitätsanhäufungen an Weitwinkelreflexen die Konfiguration von Versetzungswänden aus Stufenversetzungsdipolen im Kristallvolumen widerspiegeln. Erstmals konnte der Einfluß von Stapelfehlern auf Weitwinkel-Linien, der sich durch linsenförmige Intensitätsaufspaltungen zeigte, experimentell nachgewiesen, theoretisch erklärt und quantitativ bestimmt werden. / The thesis deals with the nondestructive investigation of crystal defects by X-ray Kossel and Pseudo Kossel microdiffraction on compact specimens in the scanning electron microscope. The SEM was extended by means of a newly developed detection method in such a way that X-ray Kossel interferences, which are extremely faint in intensity, can be observed by a phosphor scintillator as well as a high resolution and ultra-sensitive CCD area detector. The demanding X-ray film method was thus replaced. The observation techniques were combined so that the mutually complementary methods, above all the Kossel and Pseudo Kossel, but also the electron backscattered diffraction, are made possible for the first time by using just one CCD system in the SEM. The detection of Kikuchi bands was improved to such a degree that these could be recorded even at vertical incidence of the electron beam on the specimen for the first time. It was shown that the lateral resolution of the Kossel technique under polychromatic X-ray tube excitation could be enhanced considerably and the exposure times strongly reduced by using a polycapillary lens in an X-ray fluorescence spectrometer. For the complementary microdiffraction methods a homogeneous simulation program was developed, whose novel way of simulating the complicated Pseudo Kossel curves of the fourth order enable the lattice defect localization in compact crystals. The corresponding simulations and refinements of the target tube allowed a single grain analysis also in fine-grained polycrystals like barium titanate with Pseudo Kossel X-ray diffraction. Particularly, a marked increase of the dislocation density was ascertained near the grain boundary of individual crystallites in FeAl. At intermetallic Fe-Al compounds Pseudo Kossel curves fine structures were found, which can be explained by umweg (detour) excitations in relation to superstructures. Kossel and Pseudo Kossel line widths were analyzed in dependence on the azimuth and compared with theoretical models at tensile deformed Ni-crystals in the symmetrical Bragg case. Anisotropic line broadenings through the effect of edge dislocations could be proved quantitatively. Conclusions could be drawn from the initial Kossel and Pseudo Kossel investigations of cyclically deformed nickel crystals with respect to the observed pearl-necklace-like intensity thickening at Pseudo Kossel lines reflecting the strong local variations of the dislocation density and, thus, the configuration of dislocation walls of edge dislocation dipoles inside the crystalline volume. For the first time, the effect of stacking faults on Pseudo Kossel reflections appearing by lens-shaped intensity splittings could be proved experimentally, explained theoretically and determined quantitatively.

Casamento de padrões de pontos é um problema fundamental em reconhecimento de padrões. O objetivo é encontrar uma correspondência entre dois conjuntos de pontos, associados a características relevantes de objetos ou entidades, mapeando os pontos de um conjunto no outro. Este problema está associado a muitas aplicações, como por exemplo, reconhecimento de objetos baseado em modelos, imagens estéreo, registro de imagens, biometria, entre outros. Para encontrar um mapeamento, os objetos são codificados por representações abstratas, codificando as características relevantes consideradas na comparação entre pares de objetos. Neste trabalho, objetos são representados por grafos, codificando tanto as características `locais\' quanto as relações espaciais entre estas características. A comparação entre objetos é guiada por uma formulação de atribuição quadrática, que é um problema NP-difícil. Para estimar uma solução, duas técnicas de casamento entre grafos são propostas: uma baseada em grafos auxiliares, chamados de grafos deformados; e outra baseada em representações `esparsas\', campos aleatórios de Markov e propagação de crenças. Devido as suas respectivas limitações, as abordagens são adequadas para situações específicas, conforme mostrado neste documento. Resultados envolvendo as duas abordagens são ilustrados em quatro importantes aplicações: casamento de imagens de gel eletroforese 2D, segmentação interativa de imagens naturais, casamento de formas, e colorização assistida por computador. / Point set matching is a fundamental problem in pattern recognition. The goal is to match two sets of points, associated to relevant features of objects or entities, by finding a mapping, or a correspondence, from one set to another set of points. This issue arises in many applications, e.g. model-based object recognition, stereo matching, image registration, biometrics, among others. In order to find a mapping, the objects can be encoded by abstract representations, carrying relevant features which are taken into account to compare pairs of objects. In this work, graphs are adopted to represent the objects, encoding their `local\' features and the spatial relations between these features. The comparison of two given objects is guided by a quadratic assignment formulation, which is NP-hard. In order to estimate the optimal solution, two approximations techniques, via graph matching, are proposed: one is based on auxiliary graphs, called deformed graphs; the other is based on `sparse\' representations, Markov random fields and belief propagation. Due to their respective limitations, each approach is more suitable to each specific situation, as shown in this document. The quality of the two approaches is illustrated on four important applications: 2D electrophoresis gel matching, interactive natural image segmentation, shape matching, and computer-assisted colorization.

Die Arbeit beschäftigt sich mit zerstörungsfreien Untersuchungen von Kristalldefekten an kompakten Proben mittels röntgenographischer Kossel- u. Weitwinkel-Mikrobeugung im Rasterelektronenmikroskop. Das REM wurde durch ein neu entwickeltes Aufnahmeverfahren so erweitert, daß die äußerst intensitätsschwachen Kossel-Röntgeninterferenzen mittels Phosphorszintillator und hochauflösendem, extrem empfindlichen CCD-Flächendetektor registriert werden können. Das aufwendige Röntgenfilmverfahren wurde damit abgelöst. Die Aufnahme-Techniken wurden so kombiniert, daß die sich gegenseitig ergänzenden Methoden, v.a. die Kossel- u. Pseudo-Kossel-, aber auch die Rückstreu-Elektronen-Beugung, erstmals mit einem einzigen CCD-System im REM ausführbar sind. Die Aufnahme von Kikuchi-Bändern wurde so weit verbessert, daß diese erstmalig bei vertikaler Inzidenz des Elektronenstrahls auf der Probe beobachtet werden konnten. Durch Einsatz einer fokussierenden Polykapillarlinse in einem Röntgenfluoreszenzspektrometer konnte die Anregung von Kossel-Linien durch Bremsstrahlung und erheblich kürzere Belichtungszeiten sowie deutlich höhere laterale Auflösungen erzielt werden. Für die komplementären Mikrobeugungsmethoden wurde ein einheitliches Programm entwickelt, dessen neue Art der Simulation komplizierter Weitwinkel-Kurven 4. Ordnung die Lokalisierung von Gitterbaufehlern im kompakten Kristall ermöglichte. Entsprechende Simulationen und Verfeinerungen der Kanüle erlaubten in feinkörnigen Polykristallen, wie Bariumtitanat, eine Einzelkornanalyse mit der Weitwinkel-Beugung. Insbesondere wurden markante Erhöhungen der Versetzungsdichte nahe der Korngrenze einzelner Kristallite in FeAl festgestellt. An intermetallischen Fe-Al-Verbindungen wurden in Weitwinkel-Kurven Feinstrukturen gefunden, die sich durch Umweganregungen in Zusammenhang mit Überstrukturen erklären lassen. An zugverformten Ni-Kristallen wurden Kossel- u. Weitwinkel-Linienbreiten in Abhängigkeit des Azimuts im symmetrischen Bragg-Fall ausgewertet u. mit theoretischen Modellen verglichen. Anisotrope Linienverbreiterungen durch die Wirkung von Stufenversetzungen konnten quantitativ nachgewiesen werden. Erste Kossel- u. Weitwinkel-Untersuchungen an zyklisch verformten Ni-Einkristallen zeigten, daß beobachtete perlenkettenförmige Intensitätsanhäufungen an Weitwinkelreflexen die Konfiguration von Versetzungswänden aus Stufenversetzungsdipolen im Kristallvolumen widerspiegeln. Erstmals konnte der Einfluß von Stapelfehlern auf Weitwinkel-Linien, der sich durch linsenförmige Intensitätsaufspaltungen zeigte, experimentell nachgewiesen, theoretisch erklärt und quantitativ bestimmt werden. / The thesis deals with the nondestructive investigation of crystal defects by X-ray Kossel and Pseudo Kossel microdiffraction on compact specimens in the scanning electron microscope. The SEM was extended by means of a newly developed detection method in such a way that X-ray Kossel interferences, which are extremely faint in intensity, can be observed by a phosphor scintillator as well as a high resolution and ultra-sensitive CCD area detector. The demanding X-ray film method was thus replaced. The observation techniques were combined so that the mutually complementary methods, above all the Kossel and Pseudo Kossel, but also the electron backscattered diffraction, are made possible for the first time by using just one CCD system in the SEM. The detection of Kikuchi bands was improved to such a degree that these could be recorded even at vertical incidence of the electron beam on the specimen for the first time. It was shown that the lateral resolution of the Kossel technique under polychromatic X-ray tube excitation could be enhanced considerably and the exposure times strongly reduced by using a polycapillary lens in an X-ray fluorescence spectrometer. For the complementary microdiffraction methods a homogeneous simulation program was developed, whose novel way of simulating the complicated Pseudo Kossel curves of the fourth order enable the lattice defect localization in compact crystals. The corresponding simulations and refinements of the target tube allowed a single grain analysis also in fine-grained polycrystals like barium titanate with Pseudo Kossel X-ray diffraction. Particularly, a marked increase of the dislocation density was ascertained near the grain boundary of individual crystallites in FeAl. At intermetallic Fe-Al compounds Pseudo Kossel curves fine structures were found, which can be explained by umweg (detour) excitations in relation to superstructures. Kossel and Pseudo Kossel line widths were analyzed in dependence on the azimuth and compared with theoretical models at tensile deformed Ni-crystals in the symmetrical Bragg case. Anisotropic line broadenings through the effect of edge dislocations could be proved quantitatively. Conclusions could be drawn from the initial Kossel and Pseudo Kossel investigations of cyclically deformed nickel crystals with respect to the observed pearl-necklace-like intensity thickening at Pseudo Kossel lines reflecting the strong local variations of the dislocation density and, thus, the configuration of dislocation walls of edge dislocation dipoles inside the crystalline volume. For the first time, the effect of stacking faults on Pseudo Kossel reflections appearing by lens-shaped intensity splittings could be proved experimentally, explained theoretically and determined quantitatively.

L’abeille domestique (Apis mellifera) est un insecte qui contribue à l’agriculture par sa pollinisation. Le taux élevé des mortalités hivernales des colonies est préoccupant depuis des décennies au Canada. Plusieurs facteurs sont impliqués, particulièrement Varroa destructor; un parasite qui se nourrit du corps gras de l’abeille. Le développement d’outils adaptés permettrait un meilleur suivi des colonies. Le projet consiste à corréler l’infestation de varroa avec les concentrations en sucres sériques et les co-infections (virales et bactériennes). Cette étude compare dans le temps six ruches fortement infestées et six ruches traitées (témoins). Un prélèvement d’hémolymphe a été effectué pour mesurer les concentrations en sucres en utilisant un glucomètre humain préalablement validé. Les concentrations en sucres (glucose et tréhalose) dans l’hémolymphe étaient significativement plus faibles (p<0.001) dans les ruches fortement infestées que les témoins en septembre. L’analyse RT-PCR multiplexe de six virus (DWV A/B, BCQV, KBV, IAPV et ABPV) a démontré que les ruches fortement infestées présentent une infection simultanée virale avec des charges plus élevées que chez les ruches témoins (p<0.05) pour la majorité des virus, sauf pour ABPV. Chez les ruches fortement parasitées, les charges virales pour DWVA et BQCV sont plus élevées en septembre qu’en juillet (p≤0.0001). Serratia marcescens a été seulement détectée dans une ruche infestée et une ruche témoin. Une exposition continue et élevée à varroa occasionne, en automne, une augmentation des charges virales et une diminution des sucres, suggérant une altération de l’immunité, du métabolisme et des réserves. Ces paramètres provoquent une faiblesse et une mortalité des colonies. / The European honeybee (Apis mellifera) contributes to the agriculture by its pollination; however, the mean overwintering loss rate of colonies over the last decades in Canada is worrisome. Varroa destructor, which feeds on the fat bodies of honeybees, is considered one of the most important causes of bee colony declines. The development of adapted diagnostic tools would improve the monitoring of honeybee health. This project aims to correlate the infestation by varroa to the hemolymph sugar concentrations (trehalose and glucose) and bacterial and viral coinfections. Six highly infested and six treated hives were compared over time. Pooled hemolymph of honeybees was collected for sugar concentration measurements using a previously validated portable glucometer. The hemolymph samples were also submitted for bacteriology. Multiplex RT-PCR analyses were performed on pooled honeybees for six viruses: Deformed wing virus A and B (DWV-A/B), Bee Queen Cell Virus (BQCV), Acute Bee Paralysis Virus (ABPV), Kashmere Bee Virus (KBV), Israeli Acute Paralysis Virus (IAPV). The results show that, in September, sugar concentrations in hemolymph were significantly lower in highly infested hives (p<0.001). Infested hives showed markedly higher viral loads (p<0.05), except for ABPV. Viral loads were significantly higher (p≤0.0001) in September than in July for DWV-A and BQCV. Serratia marcescens was only detected in one infested hive and one control. Overall, a continued and severe exposure to varroa leads to increased viral charges and decreased sugar concentrations, suggesting alterations in immunity, metabolism and reserve mobilization. All these parameters contribute to the weakening and mortality of the colonies.