O objetivo deste estudo foi avaliar a rugosidade superficial (µm) e microdureza Vickers (VH) de materiais restauradores temporários: cimento Biodentine™ (M1) e o cimento de ionômero de vidro - Fuji IX (M2) submetidos a diferentes enxaguatórios bucais. Foram confeccionados 54 corpos de prova (cps) por meio de uma matriz de teflon (6mm x 2mm), distribuídos aleatoriamente em 6 grupos de acordo com a solução utilizada: água destilada (S1), enxaguatório com álcool - Listerine Cool Mint (S2) e enxaguatório sem álcool - Colgate Plax (S3). Todos os cps foram mantidos em umidade relativa de 100%, em estufa 37±1°C durante todo o experimento, exceto nos períodos de imersão nos enxaguatórios estabelecidos. Os cps foram colocados individualmente em um frasco contendo 8mL do enxaguatório específico para cada grupo, durante 2 minutos, sob vibração, duas vezes ao dia, por um período de 21 dias. As leituras foram realizdas por meio do microdurômetro e rugosímetro nos tempos de 48 horas (T0), 7 dias (T1), 14 dias (T2) e 21 dias (T3). Os dados obtidos foram agrupados em tabelas e submetidos aos testes estatísticos de normalidade, Kolmogorov-Smirnov, Shapiro-Wilk, Anova e Teste de Tukey por meio do Programa Estatístico Assistat Versão 7.7 beta (2016). Resultados: Verificou-se que os fatores Tempo (T), Solução (S) e Material (M) isoladamente e a interação TxM e SxM tiveram efeito estatisticamente significante na rugosidade superficial. Isoladamente, T3 (0,92±0,02) e M1 (0,87±0,01) apresentaram maior média de rugosidade e S3 (0,72±0,02) a menor média de rugosidade. Nas interações MxT e SXM, respectivamente o M1T3 (1,10±0,03) e M1S1 (1,03±0,03) apresentaram maiores médias de rugosidade. Para a microdureza o fator Material isoladamente, e a interação TxS, TxM e SxM tiveram efeito estatisticamente significante. O M1 (61,2±0,87) apresentou maior microdureza, que M2 (54,4±0,87). Para a interação TxS, a condição S2T2 (54,09±2,61) apresentou menor média de microdureza. Para a interação TxM, o M1 comparado com M2 determinou maior microdureza nos tempos T0, T1 e T2. E para a interação SxM, M1S1 (61,59±1,51) e M1S2 (62,86±1,51) apresentaram maior microdureza que M2S1 (51,53±1,51) e M2S2 (54,34±1,51). De acordo com a metodologia pode-se concluir que: a) o M1 apresentou maior rugosidade superficial nos tempos T1, T2 e T3 e maior microdureza nos tempos T0, T1, e T2 do que o M2 b) O material M1 apresentou maior microdureza independente das soluções. / The aim of this study was to evaluate the surface roughness (µm) and Vickers microhardness of provisory restorative materials: BiodentineTM (M1) and Fuji IX - glass ionomer cement (M2) were submitted to different mouthwashes. Fifty-four specimens were prepared using a Teflon mold (6mm x 2mm), randomly distributed into 6 groups according to the solution used: distilled water (S1), mouthwash containing alcohol -Listerine Cool Mint (S2) and alcohol-free mouthwash - Colgate Plax (S3). During the experiment, all specimens were carried out at a relative humidity of 100% in an oven at 37±1°C, except in the soaking periods in the established mouthwashes. The samples were individually placed in a flask containing 8mL of the specific mouthwash for each group for 1 minute, under vibration twice a day for a period of 21 days. The readings of the variables were carried out at the time of 48 hours (T0), 7 days (T1), 14 days (T2) and 21 days (T3). The obtained data were grouped in tables and submitted to the Normality Tests for Statistical Analysis Kolmogorov-Smirnov, Shapiro-Wilk, Anova and Tukey\'s Test provided by the Statistical software Assistat Program Version 7.7 beta (2016). Results: It was found that there was a significant effect on surface roughness when considered alone Time (T), Solution (S), Material (M) and the interaction between TxM and SxM. On the other hand, T3 (0.92±0.02) and M1 (0.87±0.01) presented the higher roughness and S3 (0.72±0.02) the lowest average roughness. For the interactions MxT and SxM, M1T3 (1,10±0,03) and M1S1 (1,03±0,03) presented higher roughness averages. To microhardness analysis, the material as a alone factor and the interaction TxS, TxM and SxM had a statistically significant effect. M1 (61.2±0.87) presented a higher microhardness than the M2 (54.4±0.87). For the TxS interaction, S2T2 (54.09 ± 2.61) had a lower microhardness average. To TxM interaction, the M1 compared to M2 determined a higher microhardness at T0, T1 and T2. In interaction SxM, M1S1 (61.59±1.51) and M1S2 (62.8 ±1.51) had a higher microhardness than M2S1 (51.53±1.51) and M2S2 (54.3 ±1,51). According to the methodology, it can be concluded that: a) M1 presented greater surface roughnes at T1, T2 and T3 and higher microhardness at T0, T1, and T2 than M2 b) M1 presented a higher microhardness than M2 for S1 and S2.

The bottom-up processing techniques used for making Microelectromechanical systems (MEMS) devices can produce material properties different from bulk processing. The material properties must be evaluated with the process parameters used and for changes in the process parameters. The mechanical properties are needed to design MEMS devices. A material of interest for MEMS devices is nickel titanium (NiTi) shape memory alloy (SMA) because of the high work output (~107 J/m3). This thesis will focus on the fabrication of thin film NiTi by DC magnetron sputtering deposition and testing mechanical properties of the fabricated films by nanoindentation. Thin film NiTi SMA was successfully created by DC magnetron sputtering deposition and high vacuum annealing in the Microfabrication Laboratory at California Polytechnic State University – San Luis Obispo. Characterization of the thin film by nanoindentation produced an elastic modulus of the thin film NiTi SMA with the developed processing parameters was 67.9 GPa with a hardness of 2.1 GPa. The measured thin film NiTi elastic modulus was greater than bulk NiTi of 40 GPa because of the residual stress from the deposition process. The shape memory effect was evaluated at the nanometer scale by measuring the nanoindents before and after thermally inducing a phase transformation. A maximum indentation depth recovery of 58% was measured upon the heat induced martensitic phase transformation. The low recovery was attributed to the high strain of 8% induced by the Berkovich tip. The effects of deposition power on the NiTi as-sputtered film stress, elastic modulus, hardness, and electrical conductivity were evaluated. At the highest sputtering deposition power of 450 Watts, an elastic modulus of 186 GPa with a hardness of 8.3 GPa was measured by nanoindentation. An increase in deposition power increased the residual film compressive stress, elastic modulus, and hardness while the electrical resistivity increased. The mechanisms for the measured properties are discussed in this thesis.

The objective of this project is to find which type of coating has the best performance characteristics for finishing firearms. This is accomplished by measuring and comparing several performance characteristics, such as: adhesion, hardness, wear resistance, friction control, and corrosion resistance. Appearance is not a factor since any exterior coating that is flashy can be subdued or camouflaged with special purpose paints, which have proven durable enough for such purposes. Cost will not be a limiting factor for this experiment, but will be discussed in the conclusion as a secondary concern. This data will be used to identify the best coating for steel and aluminum firearm parts. The goal is to lengthen a firearm’s life cycle while increasing performance and reliability by applying the best coating.

Debido al crecimiento continuo que se tiene cada año del consumo del concreto como primer material de construcción, resulta de gran ayuda contar con distintos métodos no destructivos que nos permitan conocer, de una manera rápida y sencilla, la resistencia del concreto. Uno de los métodos no destructivos es el índice esclerométrico, que consiste en determinar nivel de compacidad de las partículas del concreto. Durante años se han hecho distintos estudios para correlacionar el índice esclerométrico y la resistencia del concreto, hallando altos niveles de relación; sin embargo, dichos estudios no toman en cuenta la edad del concreto ni el tipo de piedra que se utiliza en la mezcla, siendo parámetros que no resultan ajenos al ensayo de esclerometría. Por ello, la siguiente investigación propone el ensayo de dureza superficial (esclerometría) como un método confiable para la determinación de la resistencia del concreto analizando distintas muestras de acuerdo a su edad y tamaño máximo nominal. Estos factores serán analizados y serán almacenados en una base de datos en la que serán separados según su característica, generando distintos gráficos de regresión lineal para así aumentar el índice de confianza de correlación de Pearson. / The use of concrete as a primary construction material has seen steady increase year after year, which is why it is imperative to have at our disposal different non-destructive methods for quick and easy determination of its resistance. Once non-destructive method is the sclerometric index, which determines the level of compactness of the concrete particles. Various studies over years have found the sclerometric index to be highly correlated to concrete resistance. Nevertheless, these studies didn’t correct for factors such as the age and composition of the concrete mixture, both of which greatly influence sclerometry. They aim of this study was to determine whether superficial hardness testing (sclerometry) is an appropriate method for measuring concrete resistance, by analyzing samples of distinct age and maximum nominal size. These factors were analyzed and stored in a database which generated linear regression graphs, thereby improving the confidence interval for the Pearson correlation coefficient. / Tesis

The Honey Sweet carrots were canned with Ethyienediamine tetracetic acid (CaNa 2 EDTA) and Sodium hexametaphosphate (Ha-HMP) at five different water hardness (0 , 20, 40, 80, 160 ppm of calcium and 20 of magnesium) , then stored at temperatures of 70 and 100 F. Evaluations were made at sixty-day i intervals for six months. Firmness and color degradation decreased significantly when water hardness or storage time increased. Under storage at 100 F and 0 hardness of water, the decrease of color and firmness was constantly accelerated. When hard water (above 80 ppm or below 40 ppm) was used for canning Van sweet cherries and Large Early Montgament apricots, the firmness , volatile reducing substances, and pH decreased. Sensory acceptability was maximum at 40 and 80 ppm. However, when either CaNa 2 EDTA or Na-HMP was used at the 500 ppm, it was found that they counteracted the effects of hard water and the quality of canned sweet cherries and apricots improved, when compared with control.

There is a technological need for hard thin films with high elastic modulus. Silicon Carbide (SiC) fulfills such requirements with a variety of applications in high temperature and MEMS devices. A detailed study of SiC thin films mechanical properties was performed by means of nanoindentation. The report is on the comparative studies of the mechanical properties of epitaxially grown cubic (3C) single crystalline and polycrystalline SiC thin films on Si substrates. The thickness of both the Single and polycrystalline SiC samples were around 1-2 µm. Under indentation loads below 500 µ-Newton both films exhibit Elastic contact without plastic deformation. Based on the nanoindentation results polycrystalline SiC thin films have an elastic modulus and hardness of 422 plus or minus 16 GPa and 32.69 plus or minus 3.218 GPa respectively, while single crystalline SiC films elastic modulus and hardness of 410 plus or minus 3.18 Gpa and 30 plus or minus 2.8 Gpa respectively. Fracture toughness experiments were also carried out using the nanoindentation technique and values were measured to be 1.48 plus or minus 0.6 GPa for polycrystalline SiC and 1.58 plus or minus 0.5 GPa for single crystal SiC, respectively. These results show that both polycrystalline SiC thin films and single crystal SiC more or less have similar properties. Hence both single crystal and polycrystalline SiC thin films have the capability of becoming strong contenders for MEMS applications, as well as hard and protective coatings for cutting tools and coatings for MEMS devices.

<p>The ATLAS experiment is a general purpose experiment being constructed at the Large Hadron Collider (LHC) at CERN, Geneva. ATLAS is designed to exploit the full physics potential of LHC, in particular to study topics con- cerning the Higgs mechanism, Super-symmetry and CP violation. The cross sections for the processes under study are extremely small, requiring very high luminosity colliding beams. The SemiConductor Tracker (SCT) is an essential part of the Inner Detector tracking system of ATLAS. The active elements of the SCT is 4088 detector modules, tiled on four barrel cylinders and eighteen endcap disks. As a consequence of the high luminosity, the detector modules will operate in a harsh radiation environment. This the- sis describes work concerning radiation hardness, beam test performance and methods for production testing of detector modules. The radiation hardness studies have been focused on the electrical performance of the front-end ASIC and the detector module. The results have identifed features of the ASIC failing after irradiation and conrmed the good performance of the re-designed ASIC. The beam tests have been performed in the late prototyping and the pre-production phase, verifying the specied performance of the detector modules. Special effort have been made to evaluate the performance of irradiated detector modules. The assembly, quality assurance and characterisation of the detector modules will be done in the collaborating institutes. The thesis reports on methods developed for use during the production, to assess the electrical performance.</p>

With increasing miniaturization in microelectronics the wirebonds used in IC packages are witnessing a thrust towards fine pitch wirebonding. To have a precise control over loop height of the wirebond for fine pitch wirebonding, it is imperative to do mechanical characterization of the wirebond. The present work studies the mechanical properties of gold wire and wirebond using nanoindentation. The wirebond specimen surface was planarized using mechanical polishing. The loop height of the gold wirebond is directly proportional to the length of the heat affected zone (HAZ) above the ball of gold wirebond. Metallographic preparation of gold wirebond cross section reveals the presence of undesirable coarse grain structure in HAZ due to recrystallization and grain growth in the gold wire adjacent to the ball. The recrystallization temperature of our gold wire was found using D.S.C. to be 340.66°C. The doping elements present in the gold wire used, were identified using TOF-SIMS. Nanoindentation of the gold wire was done at different maximum loads to observe the hardness variation with load. The nanoindentation of gold wirebond has confirmed a v-shaped hardness profile in the HAZ. The hardness minima for the particular gold wire used with a ball size ratio of 2.4 was observed at distance of 160-170 µm from the neck of the ball. The elastic modulus was found to vary randomly and to be independent of the microstructure in the wirebond. A yield stress profile based on empirical hardness-yield strength correlation has been predicted for the gold wirebond. / Singapore-MIT Alliance (SMA)

Electronic components, based on current semiconductor technologies and operating in radiation rich environments, suffer degradation of their performance as a result of radiation exposure. Silicon carbide (SiC) provides an alternate solution as a radiation hard material, because of its wide bandgap and higher atomic displacement energies, for devices intended for radiation environment applications. However, the radiation tolerance and reliability of SiC-based devices needs to be understood by testing devices  under controlled radiation environments. These kinds of studies have been previously performed on diodes and MESFETs, but multilayer devices such as bipolar junction transistors (BJT) have not yet been studied. In this thesis, SiC material, BJTs fabricated from SiC, and various dielectrics for SiC passivation are studied by exposure to high energy ion beams with selected energies and fluences. The studies reveal that the implantation induced crystal damage in SiC material can be partly recovered at relatively low temperatures, for damag elevels much lower than needed for amorphization. The implantation experiments performed on BJTs in the bulk of devices show that the degradation in deviceperformance produced by low dose ion implantations can be recovered at 420 oC, however, higher doses produce more resistant damage. Ion induced damage at the interface of passivation layer and SiC in BJT has also been examined in this thesis. It is found that damaging of the interface by ionizing radiation reduces the current gain as well. However, for this type of damage, annealing at low temperatures further reduces the gain. Silicon dioxide (SiO2) is today the dielectric material most often used for gate dielectric or passivation layers, also for SiC. However, in this thesis several alternate passivation materials are investigated, such as, AlN, Al2O3 and Ta2O5. These materials are deposited by atomic layer deposition (ALD) both as single layers and in stacks, combining several different layers. Al2O3 is further investigated with respect to thermalstability and radiation hardness. It is observed that high temperature treatment of Al2O3 can substantially improve the performance of the dielectric film. A radiation hardness study furthermore reveals that Al2O3 is more resistant to ionizing radiation than currently used SiO2 and it is a suitable candidate for devices in radiation rich applications. / QC 20120117

The ATLAS experiment is a general purpose experiment being constructed at the Large Hadron Collider (LHC) at CERN, Geneva. ATLAS is designed to exploit the full physics potential of LHC, in particular to study topics con- cerning the Higgs mechanism, Super-symmetry and CP violation. The cross sections for the processes under study are extremely small, requiring very high luminosity colliding beams. The SemiConductor Tracker (SCT) is an essential part of the Inner Detector tracking system of ATLAS. The active elements of the SCT is 4088 detector modules, tiled on four barrel cylinders and eighteen endcap disks. As a consequence of the high luminosity, the detector modules will operate in a harsh radiation environment. This the- sis describes work concerning radiation hardness, beam test performance and methods for production testing of detector modules. The radiation hardness studies have been focused on the electrical performance of the front-end ASIC and the detector module. The results have identifed features of the ASIC failing after irradiation and conrmed the good performance of the re-designed ASIC. The beam tests have been performed in the late prototyping and the pre-production phase, verifying the specied performance of the detector modules. Special effort have been made to evaluate the performance of irradiated detector modules. The assembly, quality assurance and characterisation of the detector modules will be done in the collaborating institutes. The thesis reports on methods developed for use during the production, to assess the electrical performance.