Cluster secondary ion mass spectrometry (SIMS) analyses of layer-by-layer thin films were performed to investigate the depth/volume of SI emission and accuracy of the SI signal. The thin-layered samples were assembled by alternate adsorption of polyethylenimine (PEI), polystyrene sulfonate (PSS), polydiallyldimethylammonium chloride (PDDA) and clay nanoparticles. The films have controlled 3-D structure to test the depth of secondary ion (SI) emission and evaluate planar homogeneity. The SI emission depth is ~ 6-9 nm with 136 keV Au400 4+ (340 eV/atom) and 26 keV C60 + (433 eV/atom) projectile impacts. The diameter of the SI emission area is ~ 15 nm by assuming a semispherical emission volume. The SI yields oscillate with the alternation of the compositions of the topmost layers, which was observed with small cluster projectiles (CsICs+ and Au3 +) as well as with the large cluster projectiles (C60 + and Au400 4+). The SI signals of C- and CH- are enhanced in the presence of metal atoms in the expanding plume. Recoiled C60 projectile fragments (m/z=12, 13, 36) are observed in the SI mass spectra. Caution must be taken when monitoring the yields of such carbon cluster ions from organic surfaces because their yields don’t reflect the true surface concentration. The Au400 4+ projectile impacts produce abundant co-emission. The correlation coefficient between the co-emitted SIs can be used to evaluate the planar homogeneity. The results show that the PSS layer is more uniform than the clay layers. The effect of alkali metal ion implantation on the nature and abundance of SI emission was investigated on Cs+ or Na+ implanted glycine samples. The alkali metal implantation induces surface damage and decreases the glycine molecular ion yields. Glycine molecular ions and fragment ions (CN-, CNO-) are emitted from different depths and locations of the emission volume. The same implanted glycine sample analyzed with different cluster projectiles (Au400 4+ and C60 +) shows different trends in the yields of molecular and fragment ions, which suggest a different mechanism of SI emission with different projectile impacts. The Na+ beam induces more surface damage compared with the Cs+ at equal impact energy.

Cluster secondary ion mass spectrometry (SIMS) analyses of layer-by-layer thin films were performed to investigate the depth/volume of SI emission and accuracy of the SI signal. The thin-layered samples were assembled by alternate adsorption of polyethylenimine (PEI), polystyrene sulfonate (PSS), polydiallyldimethylammonium chloride (PDDA) and clay nanoparticles. The films have controlled 3-D structure to test the depth of secondary ion (SI) emission and evaluate planar homogeneity. The SI emission depth is ~ 6-9 nm with 136 keV Au400 4+ (340 eV/atom) and 26 keV C60 + (433 eV/atom) projectile impacts. The diameter of the SI emission area is ~ 15 nm by assuming a semispherical emission volume. The SI yields oscillate with the alternation of the compositions of the topmost layers, which was observed with small cluster projectiles (CsICs+ and Au3 +) as well as with the large cluster projectiles (C60 + and Au400 4+). The SI signals of C- and CH- are enhanced in the presence of metal atoms in the expanding plume. Recoiled C60 projectile fragments (m/z=12, 13, 36) are observed in the SI mass spectra. Caution must be taken when monitoring the yields of such carbon cluster ions from organic surfaces because their yields don't reflect the true surface concentration. The Au400 4+ projectile impacts produce abundant co-emission. The correlation coefficient between the co-emitted SIs can be used to evaluate the planar homogeneity. The results show that the PSS layer is more uniform than the clay layers. The effect of alkali metal ion implantation on the nature and abundance of SI emission was investigated on Cs+ or Na+ implanted glycine samples. The alkali metal implantation induces surface damage and decreases the glycine molecular ion yields. Glycine molecular ions and fragment ions (CN-, CNO-) are emitted from different depths and locations of the emission volume. The same implanted glycine sample analyzed with different cluster projectiles (Au400 4+ and C60 +) shows different trends in the yields of molecular and fragment ions, which suggest a different mechanism of SI emission with different projectile impacts. The Na+ beam induces more surface damage compared with the Cs+ at equal impact energy.

Secondary ion mass spectrometry, SIMS, is one of the most versatile surface analytical techniques. The significant parameter determining the performance of SIMS is the secondary ion yield. Atomic projectiles, traditionally used in SIMS, are an inefficient method to desorb and generate secondary ions. The use of poly-atomic projectiles, such as (CsI)nCs, Au3, SF5 and C60, has been demonstrated to be an effective means to enhance secondary ion yields. Still larger secondary ion yields can be obtained with massive gold clusters, specifically Au4004+. Secondary ion yields from organic targets approach unity and are in excess of unity for selected inorganic targets. This dissertation is a first study of the secondary ion emission characteristics resulting from surface bombardment of keV Au400. The enhanced secondary ion yields from these massive clusters resulted in a need to detect isobaric secondary ions. An eight-anode detector was designed, built and implemented to study secondary ion emission resulting from massive projectile impacts. Secondary ion yield enhancements, resulting from use of the multi-anode detector, are reported along with secondary ion distributions for organic and inorganic targets. Au-adduct ions have been observed in mass spectra resulting form organic and inorganic targets bombarded by Au400. Data indicate that these adducts are a result of projectile/surface molecule interactions and not a product of Au implantation. Secondary ion yields of these adducts are reported. Although these adduct ion yields are an order of magnitude lower than the non-adduct ions, we have demonstrated their potential usefulness in analytical applications, such as examining surface homogeneity. Finally, these novel projectiles have been used to examine secondary ion emission from targets with different structural properties which have the same stoichiometry. In a comparative study, we have measured a significant difference in secondary ion emission and yields from the two systems, graphite and α-ZrP. Au400, at 136 keV, is effective in terms of secondary ion yield and secondary ion multiplicity enhancement. When used in the event-by-event bombardment/detection mode, the desorption volume has a diameter between 10-20 nm with and emission depth of approximately 5 nm, perturbing less than an attomole of analyte.

Secondary ion mass spectrometry, SIMS, is one of the most versatile surface analytical techniques. The significant parameter determining the performance of SIMS is the secondary ion yield. Atomic projectiles, traditionally used in SIMS, are an inefficient method to desorb and generate secondary ions. The use of poly-atomic projectiles, such as (CsI)nCs, Au3, SF5 and C60, has been demonstrated to be an effective means to enhance secondary ion yields. Still larger secondary ion yields can be obtained with massive gold clusters, specifically Au4004+. Secondary ion yields from organic targets approach unity and are in excess of unity for selected inorganic targets. This dissertation is a first study of the secondary ion emission characteristics resulting from surface bombardment of keV Au400. The enhanced secondary ion yields from these massive clusters resulted in a need to detect isobaric secondary ions. An eight-anode detector was designed, built and implemented to study secondary ion emission resulting from massive projectile impacts. Secondary ion yield enhancements, resulting from use of the multi-anode detector, are reported along with secondary ion distributions for organic and inorganic targets. Au-adduct ions have been observed in mass spectra resulting form organic and inorganic targets bombarded by Au400. Data indicate that these adducts are a result of projectile/surface molecule interactions and not a product of Au implantation. Secondary ion yields of these adducts are reported. Although these adduct ion yields are an order of magnitude lower than the non-adduct ions, we have demonstrated their potential usefulness in analytical applications, such as examining surface homogeneity. Finally, these novel projectiles have been used to examine secondary ion emission from targets with different structural properties which have the same stoichiometry. In a comparative study, we have measured a significant difference in secondary ion emission and yields from the two systems, graphite and α-ZrP. Au400, at 136 keV, is effective in terms of secondary ion yield and secondary ion multiplicity enhancement. When used in the event-by-event bombardment/detection mode, the desorption volume has a diameter between 10-20 nm with and emission depth of approximately 5 nm, perturbing less than an attomole of analyte.

"Initiation: The Writing Process of Affiliated” documents the writing process of Affiliated, an one-hour gang drama set in Wichita, Kansas. The report also explores the background of the writer as well as the writing process of both drafts one and two of the pilot script. / text

Inaug.-diss.--Greifswald. / Lebenslauf. At head of title: Englisch. "Literaturverzeichnis": p. [165]-168.

Inaug.-diss.--Greifswald. / Lebenslauf. At head of title: Englisch. "Literaturverzeichnis": p. [165]-168.

Studies of influence deposition parameters on heterostructures by SIMS

The chemical characterization of individual nanoparticles (NPs) </= 100 nm in diameter is one of the current frontiers in analytical chemistry. We present here, a methodology for the characterization of individual NPs by obtaining molecular information from single massive cluster impacts. The clusters used in this secondary ion mass spectrometry (SIMS) technique are Au4004+ and C60+. The ionized ejecta from each impact are recorded individually which allows to identify ions emitted from a surface volume of ~10 nm in diameter and 5-10 nm in depth. The mode of analyzing ejecta individually from each single cluster impact gives insight into surface homogeneity, in our case NPs and their immediate surroundings. We show that when the NPs (50 nm Al) are larger than the size of the volume perturbed by the projectile, the secondary ion emission (SI) resembles that of a bulk surface. However, when the NP (5 nm Ag) is of the size range of the volume perturbed by projectile the SI emission is different from that of a bulk surface. As part of this sub-assay volume study, the influence of neighboring NP on the SI emission was examined by using a mixture of different types of NPs (5 nm Au and 5 nm Ag). The methodology of using cluster SIMS via a sequence of stochastic single impacts yield information on the surface coverage of the NPs, as well as the influence of the chemical environment on the type of SI emission. We also present a case of soft landing NPs for laser desorption ionization mass spectrometry. NPs enhance the SI emission in a manner that maintains the integrity of the spatial distribution of molecular species. The results indicate that the application can be extended to imaging mass spectrometry.

Todays gaming habits between women and men depends on the age range. Both sexes are playing but how do they create a character when they have free hands? Are there any differences from a gender perspective? The main purpose is to answer the question: How does women and men create characters in the computergame The Sims? By looking at the result of four women and four mens created character and then interviewing them for profound information, we have received data to answer those questions for our study. Data has shown that the men were less personal when they created a character, used more imagination and took less time to create the character. The majority of the women created themselfs or part of themselfs and took more time on details. / Dagens spelvanor mellan kvinnor och män beror på åldern. Båda könen spelar men hur skapar de karaktär när de har fria händer? Finns det skillnader ur ett genusperspektiv? Det huvudsakliga syftet är att besvara frågan: Hur skapar kvinnor och män karaktärer i spelet The Sims? Genom att titta på resultatet av fyra kvinnor och fyra mäns karaktär och sedan intervjua dem för djupgående information har vi fått data som besvarar dessa frågor för vår studie. Data har visat att männen var mindre personliga när de skapade en karaktär,använde mer fantasi och tog mindre tid att skapa karaktär. Majoriteten av kvinnorna skapade själva eller delar av sig själva och tog mer tid vid detaljer.