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Consideration of Deformation of TiN Thin Films with Preferred Orientation Prepared by Ion-Beam-Assisted DepositionHAYASHI, Toshiyuki, MATSUMURO, Akihito, WATANABE, Tomohiko, MORI, Toshihiko, TAKAHASHI, Yutaka, YAMAGUCHI, Katsumi 01 1900 (has links)
No description available.
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Design and Implementation of an Ion Beam Profiling SystemStude, Joan January 2009 (has links)
The work describes the development of a reliable device for profiling anion beam in the intensity cross section. A sensor head consisting of a Faradaycup in combination with a Channel Electron Multiplier was designedand built together with electronics including power supply and front endelectronics. The design was chosen considering financial and long term lifeaspects. Testing, first calibration and error analysis were done using the ionbeam facilities where the unit is supposed to be installed permanently. Theprofiling system performed as designed and the profile of the ion beam couldbe measured reliably with an accuracy down to the femto ampere range.
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Development and characterization of a novel piezoelectric-driven stick-slip actuator with anisotropic-friction surfacesZhang, Qingshu 21 January 2009 (has links)
Piezoelectric actuators (PEA) hold the most promise for precision positioning applications due to their capability of producing extremely small displacements down to 10 pm (1 pm = 10-12 m) as well as their high stiffness and force output. The piezoelectric-driven stick-slip (PDSS) actuator, working on the friction-inertia concept, has the capacity of accomplishing an unlimited range of motion. It also holds the promises of simple configuration and low cost. On the other hand, the PDSS actuator has a relatively low efficiency and low loading capability, which greatly limits its applications. The purpose of this research is to improve the performance of the PDSS actuators by employing specially-designed working surfaces.<p>
The working surfaces, referred as anisotropic friction (AF) surfaces in this study, can provide different friction forces depending on the direction of relative motion of the two surfaces, and are used in this research to accomplish the aforementioned purpose. To fabricate such surfaces, two nanostructure technologies are employed: hot filament chemical vapour deposition (HFCVD) and ion beam etching (IBE). The HFCVD is used to deposit diamond on silicon substrates; and the IBE is used to etch the diamond crystalloid with a certain angle with respect to the coating surface to obtain an unsymmetrical-triangle microstructure. <p>
A PDSS actuator prototype containing the AF surfaces was developed in this study to verify the function of the AF surfaces and characterize the performance of PDSS actuators. The designed surfaces were mounted on the prototype; and the improvement in performance was characterized by conducting a set of experiments with both the normal isotropic friction (IF) surfaces and the AF surfaces, respectively. The results illustrate that the PDSS actuator with the AF surface has a higher efficiency and improved loading capability compared to the one with the IF surfaces.<p>
A model was also developed to represent the displacement of the novel PDSS actuator. The dynamics of the PEA and the platform were approximated by using a second order dynamic system. The pre-sliding friction behaviour involved was investigated by modifying the LuGre friction model, in which six parameters (Note that three parameters are used in the LuGre model) were employed to represent the anisotropic friction. By combining the PEA mechanism model, the modified friction model, and the dynamics of end-effector, a model for the PDSS actuator with the AF surface was developed. The model with the identified parameters was simulated in MATLAB Simulink and the simulation results obtained were compared to the experimental results to verify the model. The comparison suggests that the model developed in this study is promising to represent the displacement of the novel PDSS actuators with AF surfaces.
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Annual Report 2011 - Institute of ion Beam Physics and Materials Research17 July 2012 (has links) (PDF)
The first year of membership of the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) in the Helmholtz Association of German Research Centers (HGF) was a year of many changes also for the Institute of Ion Beam Physics and Materials Research (IIM). The transition period, however, is not yet over, since the full integration of the Center into the HGF will only be completed in the next period of the so-called program-oriented funding (POF). This funding scheme addresses the six core research fields identified by the Helmholtz Association (Energy; Earth and Environment; Health; Key Technologies; Structure of Matter; Aeronautics, Space and Transport) to deal with the grand challenges faced by society, science and industry. Since the Institute has strong contributions to both core fields “Key Technologies” and “Structure of Matter”, intense discussions were held amongst the leading scientists of the Institute, across the Institutes of the HZDR, and finally with leading scientists of other Helmholtz centers, to determine the most appropriate classification of the Institute’s research. At the end we decided to establish ourselves in Structure of Matter, the core field in which most of the large-scale photon, neutron and ion facilities in Germany are located. As a consequence, the Ion Beam Center (IBC) of the Institute submitted an application to become a HGF recognized large-scale facility, providing more than 50% of its available beam time to external users. This application perfectly reflects the development of the IBC over more than a decade as a European Union funded infrastructure in the framework of the projects “Center for Application of Ion Beams in Materials Research (AIM)” (1998-2000, 2000-2003, 2006-2010) and subsequently as the coordinator of the integrated infrastructure initiative (I3) “Support of Public and Industrial Research using Ion Beam Technology (SPIRIT)” (2009-2013). Another part of the Institute’s activities is dedicated to exploit the infrared/THz free-electron laser at the 40 MeV superconducting electron accelerator ELBE for condensed matter research. This facility is also open to external users and funded by the European Union.
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The Study of Microstructure of TiO2 Thin Films grown by Dual Ion Beam Sputtering SystemLi, Chun-hsiang 02 September 2004 (has links)
Abstract
Recently, titanium dioxide¡]TiO2¡^ is one of the most extensively studied transition-metal oxides because of its remarkable photocatalyst efficiency and electronic properties. In this paper, thin films ware obtained by dual ion beam sputtering. By different processes, these samples can be classified into three categories. Firstly, thin films, deposited on 200 mash copper grids for 15 minutes, were investigated that many TiO grains is about 5 nm in size by transmission electron microscopy¡]TEM¡^. Next, TiO2 thin films, sputtered on si wafers and glass for 180 minutes in an O2 environment by using titanium target, were initially identified by X ray diffraction instrument¡]XRD¡^. The result shows that some thin films have good orientations. By TEM, TiO2 grains on bottom of films are about 20 nm. By scanning electron microscopy¡]SEM¡^, TiO2 grains on the surface are about 1~2 £gm in size and are oblong in shape. The last, TiO thin films were directly deposited on si wafer for 180 minutes in no O2 environment by using titanium target and then annealed to transform from TiO to TiO2. By XRD, the thin film, annealed at 600¢J for 1hr, has good orientation. By TEM, TiO2 grains, annealed at 1000¢J for 24hr, grow up to 1-2 £gm in size and are oblong in shap.
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The Fabrication of 3D Submicron Glass Structures by FIBWu, Jhih-rong 17 August 2006 (has links)
The fabrication characteristic of focused ion beam (FIB) for Pyrex glass was investigated. FIB has several advantages such as high sensitivity, high material removal rates, low forward scattering, and direct fabrication in selective area without any etching mask, etc. In this study, FIB etched Pyrex glass was used for fast fabrication of 3-D submicron structures. A high-aspect-ratio (HRA) glass structure of 5 (1.97µm depth/0.39µm width) was fabricated. The experimental results in terms of limiting beam size, ion dose¡]ion/cm2¡^, beam current, etc was discussed. Xenon difluoride (XeF2) was applied to enhance the FIB process. Its influence on glass fabrication is studied and characterized.
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Selective 3D Submicron Glass Imprint Heads Fabrication by FIB for UV CureYang, Shih-yi 14 February 2007 (has links)
Focused Ion Beam (FIB) has several advantages such as high sensitivity, high material removal rates, low forward scattering and directing fabrication. Without any etched mask, processing time can be reduced. Pyrex glass etched by FIB is used for fast fabrication of 3-D submicron structure mold. In this study, glass is used as substrate. The UV-cured resin that spin-coated onto a mold has 3-D structure patterns. 3-D structure patterns are transferred on the plate to investigate the effects of parameters of UV cured, pressure and exposure time on the occurrence of defects. The relationship of these processing parameters for the imprinting process is also realized. Besides, the material property of UV-cured resin is investigated. UV-Cured resin is investigated by thermogravimetric Analysis (TGA) to measure the degradation temperature (Td). The hardness and modulus of UV-Cured resin was measured by nanoindentation to realize deformed ability of material for the imprinting process. Moreover, the contact angle of Pyrex glass is measured to investigate its surface quality for the imprint process.
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Analysis of a direct energy conversion system using medium energy helium ionsCarter, Jesse James 16 August 2006 (has links)
A scaled direct energy conversion device was built to convert kinetic energy of
singly ionized helium ions into an electric potential by the process of direct conversion.
The experiments in this paper aimed to achieve higher potentials and higher efficiencies
than ever before. The predicted maximum potential that could be produced by the 150 kV
accelerator at the Texas A&M Ion Beam Lab was 150 kV, which was achieved with 92%
collection efficiency. Also, an investigation into factors affecting collection efficiency
was made. It was concluded that charge was being lost due to charge exchange occurring
near the surface of the target which caused positive target atoms to be ejected from the
face and accelerated away. Introducing a wire mesh near the face of the target with an
electric potential, positive or negative, which aimed to control secondary ion emissions,
did not have an effect on the collection efficiency of the system. Also, it was found that
the gas pressure inside the chamber did not have an effect on the collection efficiency.
The goal of achieving higher electric potentials and higher efficiencies than previous
direct conversion work was met.
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Precision absolute frequency laser spectroscopy of argon II in parallel and antiparallel geometry using a frequency comb for calibrationLioubimov, Vladimir 14 January 2010 (has links)
A collinear fast ion beam laser apparatus was constructed and tested. It will be used
on-line to the SLOW RI radioactive beam facility in RIKEN (Japan) and as in the
present experiment for precision absolute frequency measurements of astrophysically
important reference lines. In the current work we conducted absolute measurements
of spectral lines of Ar ions using parallel and antiparallel geometries. To provide
a reference for the laser wavelength iodine saturation spectroscopy was used. The
precision of this reference was enhanced by simultaneously observing the beat node
between the spectroscopy laser and the corresponding mode of a femtosecond laser
frequency comb.
When performing collinear and anticollinear measurements simultaneously for
the laser induced fluorescence, the exact relativistic formula for the transition
frequency v0 = pvcoll � vanticoll can be applied. In this geometry ion source instabilities
due to pressure and anode voltage fluctuation are minimized.
The procedure of fluorescence lineshapes fitting is discussed and the errors
in the measurements are estimated. The result is v0 = 485, 573, 619.7 � 0.3MHz
corresponding to (delta v)/v = 6 � 10?10 and is an improvement of two orders of magnitude
over the NIST published value.
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Development of a method for correlating integrin beta 1 expression and surface characteristics under individual cellsMyers, Meredith A. 12 August 2011 (has links)
Osseointegration, or the direct integration of an implant into bone tissue, is necessary for implant success. Titanium is commonly used clinically in dental and orthopaedic implants because of its passivating oxide layer, which facilitates osseointegration, and its mechanical properties such as a modulus of elasticity similar to bone. Diverse studies have shown that surface microtopography, chemistry, and surface energy affect osteoblast behavior. The problem with these studies is that they access the average behavior of a culture in response to a substrate and not the behavior of individual cells. The objective of this study was to develop a method for correlating the behavior of individual cells with the characteristics of the surface underneath them. More specifically, this work developed a method to correlate integrin beta-1 (β1) expression with the surface characteristics under individual cells. Integrins are cell surface receptors that bind to specific proteins in the extracellular matrix adsorbed on the implant surface. Previous work has shown that expression of certain integrins is increased when osteoblasts on titanium substrates develop a more differentiated phenotype, and that integrin β1 is necessary for osteoblast response to roughness on titanium substrates.
This study used molecular beacons specific to integrin β1 to quantify integrin β1 expression of MG63 cells cultured on titanium disks. A template was designed to coordinate the location of cells using fluorescence microscopy and scanning electron microscopy (SEM) in reference to laser etchings on the disks. After live cell imaging, cells were fixed, dried, and critical point dried for focused ion beam (FIB) milling. Transmission electron microscopy (TEM) sections of cells identified with high and low integrin β1 molecular beacon intensity were milled, and cells with high and low integrin β1 molecular beacon intensity were also serial sectioned. While our TEM results were inconclusive, SEM images from serial sectioning showed contact points between the cell body and the substrate, consistent with previous results. Cells cultured on pretreatment (PT) or sandblasted acid etched (SLA) titanium surfaces were also serial sectioned, showing that cells on SLA surfaces have more regions of contact between the cells and the substrate than cells on PT surfaces.
This work is significant as it is the first study to develop a method to correlate individual cell behavior with the substrate surface characteristics under the individual cells. Previous studies have reported the average cell behavior in response to their substrates, while this work allows for the study of substrate surface characteristics that positively affect integrin β1 expression in individual cells. Further optimization of the fluorescence imaging process and FIB milling process could be done, and the method developed in this study could be used in future studies to investigate surface characteristics after using other fluorescent analyses of cell behavior, such as immunocytochemistry.
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