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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
361

Low-Power Soft-Error-Robust Embedded SRAM

Shah, Jaspal Singh 06 November 2014 (has links)
Soft errors are radiation-induced ionization events (induced by energetic particles like alpha particles, cosmic neutron, etc.) that cause transient errors in integrated circuits. The circuit can always recover from such errors as the underlying semiconductor material is not damaged and hence, they are called soft errors. In nanometer technologies, the reduced node capacitance and supply voltage coupled with high packing density and lack of masking mechanisms are primarily responsible for the increased susceptibility of SRAMs towards soft errors. Coupled with these are the process variations (effective length, width, and threshold voltage), which are prominent in scaled-down technologies. Typically, SRAM constitutes up to 90% of the die in microprocessors and SoCs (System-on-Chip). Hence, the soft errors in SRAMs pose a potential threat to the reliable operation of the system. In this work, a soft-error-robust eight-transistor SRAM cell (8T) is proposed to establish a balance between low power consumption and soft error robustness. Using metrics like access time, leakage power, and sensitivity to single event transients (SET), the proposed approach is evaluated. For the purpose of analysis and comparisons the results of 8T cell are compared with a standard 6T SRAM cell and the state-of-the-art soft-error-robust SRAM cells. Based on simulation results in a 65-nm commercial CMOS process, the 8T cell demonstrates higher immunity to SETs along with smaller area and comparable leakage power. A 32-kb array of 8T cells was fabricated in silicon. After functional verification of the test chip, a radiation test was conducted to evaluate the soft error robustness. As SRAM cells are scaled aggressively to increase the overall packing density, the smaller transistors exhibit higher degrees of process variation and mismatch, leading to larger offset voltages. For SRAM sense amplifiers, higher offset voltages lead to an increased likelihood of an incorrect decision. To address this issue, a sense amplifier capable of cancelling the input offset voltage is presented. The simulated and measured results in 180-nm technology show that the sense amplifier is capable of detecting a 4 mV differential input signal under dc and transient conditions. The proposed sense amplifier, when compared with a conventional sense amplifier, has a similar die area and a greatly reduced offset voltage. Additionally, a dual-input sense amplifier architecture is proposed with corroborating silicon results to show that it requires smaller differential input to evaluate correctly.
362

Design methodology to characterize and compensate for process and temperature variation in digital systems

Cho, Minki 18 September 2012 (has links)
The main objective of this dissertation is to investigate a design methodology that can characterize and compensate for process and temperature variation. First, a design methodology is discussed to handle process variation in low-power memory for image processing application. This is followed by a design technique to characterize and recover TSV-defect-induced signal degradation in a 3D integrated circuit. For thermal variation, the spatiotemporal power migration is proposed as a methodology to handle thermal issues in digital systems both during the test and normal operation. The power migration continuously distributes the generated heat in space and time to control chip temperature. To enable this approach a unique method is developed, and verified through hardware for post-fabrication characterization of thermal system and prediction of transient variation in chip temperature. The inverse temperature dependence in a digital logic is characterized through hardware to help better thermal management in wide operating voltage design.
363

A 1Mbps 0.18μm CMOS Soft-output Decoder for Product Turbo Codes

Bade, Peter 30 July 2009 (has links)
A product turbo code (PTC) decoder application specific integrated circuit (ASIC) is designed in 0.18μm 1P6M CMOS with embedded SRAM. From simulation, an operating frequency of 73.1 MHz at typical conditions is obtained, yielding a throughput of 3.8 Mbps with 4 decoding iterations, while consuming 103.4 mW. The total area is 5.13 mm2. Assuming the ASIC would be used as a hard macro, the area could be reduced to 1.7 mm2. The ASIC was tested at 20 MHz under typical conditions, which resulted in a throughput of 1.0 Mbps at 1.8V supply while consuming 36.6 mW. By making a slight modification, this design can be easily scaled to support IEEE 802.16d WiMAX. Allow for this, and moving to a 45nm process an estimated throughput of 9.44 Mbps with 4 iterations can be obtained. Total macro area would be approximately 0.11 mm2.
364

A 1Mbps 0.18μm CMOS Soft-output Decoder for Product Turbo Codes

Bade, Peter 30 July 2009 (has links)
A product turbo code (PTC) decoder application specific integrated circuit (ASIC) is designed in 0.18μm 1P6M CMOS with embedded SRAM. From simulation, an operating frequency of 73.1 MHz at typical conditions is obtained, yielding a throughput of 3.8 Mbps with 4 decoding iterations, while consuming 103.4 mW. The total area is 5.13 mm2. Assuming the ASIC would be used as a hard macro, the area could be reduced to 1.7 mm2. The ASIC was tested at 20 MHz under typical conditions, which resulted in a throughput of 1.0 Mbps at 1.8V supply while consuming 36.6 mW. By making a slight modification, this design can be easily scaled to support IEEE 802.16d WiMAX. Allow for this, and moving to a 45nm process an estimated throughput of 9.44 Mbps with 4 iterations can be obtained. Total macro area would be approximately 0.11 mm2.
365

A VLSI algorithm for computing the Euclidean norm of a 3D vector

高木, 直史, Takagi, Naofumi 10 1900 (has links)
No description available.
366

Design of an Analog VLSI Cochlea

Shiraishi, Hisako January 2003 (has links)
The cochlea is an organ which extracts frequency information from the input sound wave. It also produces nerve signals, which are further analysed by the brain and ultimately lead to perception of the sound. An existing model of the cochlea by Fragni`ere is first analysed by simulation. This passive model is found to have the properties that the living cochlea does in terms of the frequency response. An analog VLSI circuit implementation of this cochlear model in CMOS weak inversion is proposed, using log-domain filters in current domain. It is fabricated on a chip and a measurement of a basilar membrane section is performed. The measurement shows a reasonable agreement to the model. However, the circuit is found to have a problem related to transistor mismatch, causing different behaviour in identical circuit blocks. An active cochlear model is proposed to overcome this problem. The model incorporates the effect of the outer hair cells in the living cochlea, which controls the quality factor of the basilar membrane filters. The outer hair cells are incorporated as an extra voltage source in series with the basilar membrane resonator. Its value saturates as the input signal becomes larger, making the behaviour rather closer to that of a passive model. The simulation results show this nonlinear phenomenon, which is also seen in the living cochlea. The contribution of this thesis is summarised as follows: a) the first CMOS weak inversion current domain basilar membrane resonator is designed and fabricated, and b) the first active two-dimensional cochlear model for analog VLSI implementation is developed.
367

High-level optimization of performance and power in very deep sub-micron interconnects

Murgan, Tudor. Unknown Date (has links) (PDF)
Darmstadt, Techn. University, Diss., 2006.
368

Asynchronous wave pipelines for energy efficient gigahertz VLSI

Hauck, Oliver. Unknown Date (has links)
Techn. University, Diss., 2006--Darmstadt.
369

Σχεδίαση αρχιτεκτονικών VLSI με παράμετρο την θερμοκρασία

Κυρίτσης, Κωνσταντίνος 20 July 2012 (has links)
Αντικείμενο της παρούσας διπλωματικής εργασίας είναι η μελέτη τεχνικών θερμικής διαχείρισης ολοκληρωμένων κυκλωμάτων. Μελετώνται διαφορετικοί τρόποι βέλτιστης απαγωγής της θερμότητας καθώς και μέθοδοι μέτρησης θερμοκρασίας με την χρήση ψηφιακών κυκλωμάτων. / Subject of this diploma thesis is the research of various methods of integrated circuit thermal management. Different methods of optimal heat removal have been compared and digital temperature sensing techniques have been studied.
370

Graph-based algorithms for transistor count minimization in VLSI circuit EDA tools / Algoritmos baseados em grafos para minimização de transistors em ferramentas EDA para circuitos VLSI

Matos, Jody Maick Araujo de January 2014 (has links)
Esta dissertação de mestrado introduz um conjunto de algoritmos baseados em grafos para a obtenção de circuitos VLSI com um número reduzido de transistores utilziando células simples. Esses algoritmos têm um foco principal na minimização do número de nodos em representações AIG e mapear essa estrutura otimizada utilizando células simples (NAND2 e NOR2) com um número mínimo de inversores. Devido à minimização de nodos, o AIG tem um alto compartilhamento lógico, o que pode derivar circuitos intermediários contendo células com fanouts infactíveis para os nodos tecnológicos atuais. De forma a resolver essas ocorrências, o circuito intermediário é submetido a um algoritmo para limitação de fanout. Os algoritmos propostos foram aplicados num conjunto de circuitos de benchmark e os resultados obtidos mostram a utilidade do método. Os circuitos resultantes tiveram, em média, 32% menos transistores do que as referências anteriores em números de transistores utilizando células simples. Adicionalmente, quando comparando esses resultados com trabalhos que utilizam células complexas, nossos números demonstraram que abordagens anteriores estão algumas vezes longe do número mínimo de transistores que pode ser obtido com o uso eficiente de uma biblioteca reduzida de células, composta por poucas células simples. Os circuitos baseados em células simples obtidos com a aplicação dos algoritmos proposto neste trabalho apresentam um menor número de transistores em muitos casos quando comparados aos resultados previamente publicados utilizando células complexas (CMOS estático e PTL). / This master’s thesis introduces a set of graph-based algorithms for obtaining reduced transistor count VLSI circuits using simple cells. These algorithms are mainly focused on minimizing node count in AIG representations and mapping this optimized AIG using simple cells (NAND2 and NOR2) with a minimal number of inverters. Due to the AIG node count minimization, the logic sharing is probably highly present in the optimized AIG, what may derive intermediate circuits containing cells with unfeasible fanout in current technology nodes. In order to fix these occurrences, this intermediate circuit is subjected to an algorithm for fanout limitation. The proposed algorithms were applied over a set of benchmark circuits and the obtained results have shown the usefulness of the method. The circuits generated by the methods proposed herein have, in average, 32% less transistor than the previous reference on transistor count using simple cells. Additionally, when comparing the presented results in terms of transistor count against works advocating for complex cells, our results have demonstrated that previous approaches are sometimes far from the minimum transistor count that can be obtained with the efficient use of a reduced cell library composed by only a few number of simple cells. The simple-cells-based circuits obtained after applying the algorithms proposed herein have presented a lower transistor count in many cases when compared to previously published results using complex (static CMOS and PTL) cells.

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