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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
131

Contact characterization and persistent photoconductivity effects in MBE grown n-type GaN

Frazier, Stuart Thomas. January 1900 (has links)
Thesis (M.S.)--West Virginia University, 1998. / Title from document title page. "December 1998." Document formatted into pages; contains viii, 125 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 84-89).
132

A study of electroluminescence produced by A1GaN/GaN high electron mobility transistors. /

Sarault, Keith Richard. January 1900 (has links)
Thesis (M.App.Sc.) - Carleton University, 2007. / Includes bibliographical references (p. 77-78). Also available in electronic format on the Internet.
133

Hall effect and photoconductivity lifetime studies of GaN, InN, and Hg₁-[subscript x]Cd[subscript x]Te

Swartz, Craig H. January 2005 (has links)
Thesis (Ph. D.)--West Virginia University, 2005. / Title from document title page. Document formatted into pages; contains ix, 72 p. : ill. Includes abstract. Includes bibliographical references (p. 68-72).
134

Estudo comparativo entre semicondutores de silício e nitreto de gálio em circuitos de acionamento de leds / Comparative study between silicon and gallium nitride semiconductors in led drivers

Duarte, Renan Rodrigo 03 March 2017 (has links)
This dissertation presents a comparative study about the performance of silicon (Si) and gallium nitride (GaN) semiconductors in drivers for light emitting diodes. Hereby, it is expected to provide the theoretical background required for the development of future works using this new technology. Theoretical aspects related to the materials used in the manufacture of semiconductors and their implications in the final product, as well as the characteristics and peculiarities of GaN semiconductors are presented. The experimental development consisted of two case studies, each focused on a distinct topology with different types of GaN semiconductors. First, a comparison of Si and enhancement mode GaN transistors was carried out in a family of synchronous buck converters. Ten 48 V to 28.3 V and 22.6 W converters were designed with the same parameters, at five different switching frequencies, ranging from 100 kHz to 1 MHz. Efficiency and temperatures were measured in four different scenarios: with and without an external diode in parallel with the low-side switch and with two different dead-time values, 25 ns and 50 ns. Converters with GaN transistors showed higher efficiency and lower temperatures in all cases, with a maximum efficiency of 96.8% and a minimum of 94.5%. In addition, Si-based converters exhibited greater performance degradation as the switching frequency and dead time increased. In the second study, nine 75 W off-line integrated double buck-boost converters were developed and evaluated. Two different Si technologies were compared with a cascode GaN transistor at three switching frequencies, ranging from 50 to 150 kHz. Again, the efficiency and temperatures of the prototypes were measured. The converters with GaN demonstrated superior performance in all cases, yielding about 5% gain in efficiency over the worst tested Si semiconductor. In both cases, the converters’ loss distribution was presented based on simulation results. It was concluded that the gallium nitride transistors have the potential to replace silicon technology mainly due to its superior performance and requirement of small, or no change, in the original circuit. / A presente dissertação apresenta um estudo comparativo do desempenho de semicondutores de silício (Si) e nitreto de gálio (GaN) em circuitos utilizados na alimentação de diodos emissores de luz. Por meio deste, procura-se fornecer o embasamento teórico necessário para o desenvolvimento de trabalhos futuros utilizando esta nova tecnologia. São apresentados, inicialmente, aspectos teóricos relacionados aos materiais utilizados na fabricação de semicondutores e suas implicações no produto final, além das características e peculiaridades dos semicondutores GaN. O desenvolvimento experimental consistiu de dois estudos de caso, cada um focado em uma topologia distinta com tipos de semicondutores GaN diferentes. Primeiramente, realizou-se um comparativo de transistores Si e GaN do tipo intensificação em uma família de conversores buck síncronos. Dez conversores 48 V para 28,3 V e 22,6 W foram projetados, com os mesmos parâmetros, em cinco diferentes frequências de comutação, variando de 100 kHz a 1 MHz. Eficiência e temperaturas foram medidas em quatro diferentes cenários: com e sem um diodo externo em paralelo com o interruptor de roda-livre e com dois valores diferentes de tempo morto, 25 ns e 50 ns. Os conversores com transistores GaN apresentaram maior eficiência e menores temperaturas em todos os casos, com uma eficiência máxima de 96,8% e uma mínima de 94,5%. Além disso, os conversores com Si exibiram uma maior degradação de desempenho à medida que a frequência de comutação e o tempo morto aumentam. No segundo estudo, nove conversores duplo buck-boost integrados de 75 W com alimentação a partir da rede elétrica foram desenvolvidos e avaliados. Compararam-se duas tecnologias distintas de interruptores de Si com um transistor GaN do tipo cascode, em três frequências de comutação, variando de 50 a 150 kHz. Novamente, mediu-se a eficiência e temperaturas dos protótipos. Os conversores com GaN demonstraram desempenho superior em todos os casos, com um ganho de cerca de 5% no rendimento em relação ao pior semicondutor Si testado. Em ambos os estudos de caso, a distribuição de perdas dos conversores foi apresentada com base em resultados de simulação. Concluiu-se que os transistores de nitreto de gálio têm potencial para substituir a tecnologia de silício utilizada atualmente devido, principalmente, a seu desempenho superior e exigência de pouca, ou nenhuma, mudança no circuito original.
135

Mobility Modeling of Gallium Nitride Nanowires

January 2017 (has links)
abstract: Semiconductor nanowires have the potential to emerge as the building blocks of next generation field-effect transistors, logic gates, solar cells and light emitting diodes. Use of Gallium Nitride (GaN) and other wide bandgap materials combines the advantages of III-nitrides along with the enhanced mobility offered by 2-dimensional confinement present in nanowires. The focus of this thesis is on developing a low field mobility model for a GaN nanowire using Ensemble Monte Carlo (EMC) techniques. A 2D Schrödinger-Poisson solver and a one-dimensional Monte Carlo solver is developed for an Aluminum Gallium Nitride/Gallium Nitride Heterostructure nanowire. A GaN/AlN/AlGaN heterostructure device is designed which creates 2-dimensional potential well for electrons. The nanowire is treated as a quasi-1D system in this work. A self-consistent 2D Schrödinger-Poisson solver is designed which determines the subband energies and the corresponding wavefunctions of the confined system. Three scattering mechanisms: acoustic phonon scattering, polar optical phonon scattering and piezoelectric scattering are considered to account for the electron phonon interactions in the system. Overlap integrals and 1D scattering rate expressions are derived for all the mechanisms listed. A generic one-dimensional Monte Carlo solver is also developed. Steady state results from the 1D Monte Carlo solver are extracted to determine the low field mobility of the GaN nanowires. / Dissertation/Thesis / Masters Thesis Electrical Engineering 2017
136

Modeling Reliability of Gallium Nitride High Electron Mobility Transistors

January 2013 (has links)
abstract: This work is focused on modeling the reliability concerns in GaN HEMT technology. The two main reliability concerns in GaN HEMTs are electromechanical coupling and current collapse. A theoretical model was developed to model the piezoelectric polarization charge dependence on the applied gate voltage. As the sheet electron density in the channel increases, the influence of electromechanical coupling reduces as the electric field in the comprising layers reduces. A Monte Carlo device simulator that implements the theoretical model was developed to model the transport in GaN HEMTs. It is observed that with the coupled formulation, the drain current degradation in the device varies from 2%-18% depending on the gate voltage. Degradation reduces with the increase in the gate voltage due to the increase in the electron gas density in the channel. The output and transfer characteristics match very well with the experimental data. An electro-thermal device simulator was developed coupling the Monte Caro-Poisson solver with the energy balance solver for acoustic and optical phonons. An output current degradation of around 2-3 % at a drain voltage of 5V due to self-heating was observed. It was also observed that the electrostatics near the gate to drain region of the device changes due to the hot spot created in the device from self heating. This produces an electric field in the direction of accelerating the electrons from the channel to surface states. This will aid to the current collapse phenomenon in the device. Thus, the electric field in the gate to drain region is very critical for reliable performance of the device. Simulations emulating the charging of the surface states were also performed and matched well with experimental data. Methods to improve the reliability performance of the device were also investigated in this work. A shield electrode biased at source potential was used to reduce the electric field in the gate to drain extension region. The hot spot position was moved away from the critical gate to drain region towards the drain as the shield electrode length and dielectric thickness were being altered. / Dissertation/Thesis / Ph.D. Electrical Engineering 2013
137

Oligonucleotide guanosine conjugated to gallium nitride nano-structures for photonics.

Li, Jianyou 08 1900 (has links)
In this work, I studied the hybrid system based on self-assembled guanosine crystal (SAGC) conjugated to wide-bandgap semiconductor gallium nitride (GaN). Guanosine is one of the four bases of DNA and has the lowest oxidation energy, which favors carrier transport. It also has large dipole moment. Guanosine molecules self-assemble to ribbon-like structure in confined space. GaN surface can have positive or negative polarity depending on whether the surface is Ga- or N-terminated. I studied SAGC in confined space between two electrodes. The current-voltage characteristics can be explained very well with the theory of metal-semiconductor-metal (MSM) structure. I-V curves also show strong rectification effect, which can be explained by the intrinsic polarization along the axis of ribbon-like structure of SAGC. GaN substrate property influences the properties of SAGC. So SAGC has semiconductor properties within the confined space up to 458nm. When the gap distance gets up to 484nm, the structure with guanosine shows resistance characteristics. The photocurrent measurements show that the bandgap of SAGC is about 3.3-3.4eV and affected by substrate properties. The MSM structure based on SAGC can be used as photodetector in UV region. Then I show that the periodic structure based on GaN and SAGC can have photonic bandgaps. The bandgap size and the band edges can be tuned by tuning lattice parameters. Light propagation and emission can be tuned by photonic crystals. So the hybrid photonic crystal can be potentially used to detect guanosine molecules. If guanosine molecules are used as functional linker to other biomolecules which usually absorb or emit light in blue to UV region, the hybrid photonic crystal can also be used to tune the coupling of light source to guanosine molecules, then to other biomolecules.
138

Design and Development of High Performance III-Nitrides Photovoltaics

January 2020 (has links)
abstract: Wurtzite (In, Ga, Al) N semiconductors, especially InGaN material systems, demonstrate immense promises for the high efficiency thin film photovoltaic (PV) applications for future generation. Their unique and intriguing merits include continuously tunable wide band gap from 0.70 eV to 3.4 eV, strong absorption coefficient on the order of ∼105 cm−1, superior radiation resistance under harsh environment, and high saturation velocities and high mobility. Calculation from the detailed balance model also revealed that in multi-junction (MJ) solar cell device, materials with band gaps higher than 2.4 eV are required to achieve PV efficiencies greater than 50%, which is practically and easily feasible for InGaN materials. Other state-of-art modeling on InGaN solar cells also demonstrate great potential for applications of III-nitride solar cells in four-junction solar cell devices as well as in the integration with a non-III-nitride junction in multi-junction devices. This dissertation first theoretically analyzed loss mechanisms and studied the theoretical limit of PV performance of InGaN solar cells with a semi-analytical model. Then three device design strategies are proposed to study and improve PV performance: band polarization engineering, structural design and band engineering. Moreover, three physical mechanisms related to high temperature performance of InGaN solar cells have been thoroughly investigated: thermal reliability issue, enhanced external quantum efficiency (EQE) and conversion efficiency with rising temperatures and carrier dynamics and localization effects inside nonpolar m-plane InGaN quantum wells (QWs) at high temperatures. In the end several future work will also be proposed. Although still in its infancy, past and projected future progress of device design will ultimately achieve this very goal that III-nitride based solar cells will be indispensable for today and future’s society, technologies and society. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2020
139

Depozice Ga a GaN nanostruktur na grafenový substrát / Depositon Ga and GaN nanostructures on graphen substrate

Hammerová, Veronika January 2017 (has links)
This diploma thesis is focused on deposition Ga and GaN structures on graphene fabricated by method of mechanical exfoliation. For mechanical exfoliation was used new method with using DGL Gel-Film with kinetically controlled adhesion. Ga is deposited by Molecular beam epitaxy with using eusion cell in UHV conditions. GaN was obtained by post-nitridation of Ga islands. These structures were investigated with optical microscope, SEM, Raman spectroscopy and photoluminiscence.
140

Depozice Ga a GaN ultratenkých vrstev na grafenový substrát / Deposition of Ga and GaN ultrathin layers on graphene substrate

Dvořák, Martin January 2013 (has links)
This diploma thesis deals with preparation of graphene samples for depositions of ultrathin layers of gallium and gallium nitride. Graphene substrates were prepared by chemical vapour deposition in home-build high temperature reactor. After graphene transfer to silicon wafers, a series of chemical and thermal treatments were performed. Obtained samples were suitable for the study of growth of ultrathin layers of Ga and GaN. The growth of Ga and GaN was realized in ultra high vacuum conditions. Molecular beam epitaxy technique was used for gallium depositions together with ion source for nitridation. Obtained ultrathin layers were studied with X-ray photoelectron spectroscopy, atomic force microscopy and with scanning electron microscopy.

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