This thesis presents work done investigating methods for constructing patterns on the nanometer scale. Various methods of nanolithography using atomic force microscopes (AFMs) are investigated. The use of AFMs beyond their imaging capabilities is demonstrated in various experiments involving nanografting and surface electrochemical modification. The use of an AFM to manipulate a monolayer of thiols deposited on a gold substrate via nanografting is shown in our work to enable chemical modification of the surface of the substrate by varying the composition of the monolayer deposited on it. This leads to the selective deposition of various polymers on the patterned areas. Conditions for enhancing the selective deposition of the self-assembled polymers are studied. Such conditions include the types of polymers used and the pH of the polyelectrolyte solutions used for polymer deposition. Another method of nanolithography is investigated which involves the electrochemical modification of a monolayer of silanes deposited on a silicon substrate. By applying a potential difference and maintaining the humidity of the ambient environment at a certain level we manage to change the chemical properties of select areas of the silane monolayer and thus manage to establish selective deposition of polymers and gold nanoparticles on the patterned areas. Parameters involved in the patterning process using surface electrochemical modification, such as humidity levels, are investigated. The techniques established are then used to construct circuit elements such as wires. / Ph. D.

The adhesion and removal of particles from surfaces is a contemporary problem in many industrial applications like Semiconductor manufacturing, Bioaerosol removal, Pharmaceuticals, Adhesives and Petroleum industry. The complexity of the problem is due to the variety of factors like roughness, temperature, humidity, fluid medium etc. that affect pull-off of particles from surfaces. In particle removal from surfaces using fluid motion, the dynamic effects of particle separation will play an important role. Thus it is essential to study the dynamic effects of particle removal. Velocity of pull-off and force duration effects are two important dynamic factors that might affect pull-off. Particle adhesion studies can be made using the Atomic Force Microscope (AFM). The velocity of pull-off and force duration can be varied while making the AFM measurements. The objective of the current work is to obtain the dependence of pull-off force on pull-off velocity. Experiments were conducted using AFM and the data obtained from the experiments is processed to obtain plots for pull-off force vs. particle size and pull-off force vs. pull-off velocity. The pull-off force is compared with the predictions of previous contact adhesion theories. A velocity effect on pull-off force is observed from the experiments conducted.

Graphene, one-atom-thick planar sheet of carbon atoms densely packed in a honeycomb crystal lattice, has grabbed appreciable attention due to its exceptional electronic, mechanical and optical properties. Chemical functionalization schemes are needed to integrate graphene with the different materials required for potential applications. Molecular self-assembly behavior on graphene is a key method to investigate the mechanism of interaction between molecules and graphene and the promising applications related to molecular devices. In this thesis, we report the molecular self-assembly behavior of phenyl-C61-butyric acid methyl ester (PCBM), C60, perylenetetracarboxylic dianhydride (PTCDA) and Gd3N@C80 on flat and rippled graphene 2D material by the experimental methods of scanning tunneling microscope (STM) and atomic force microscope (AFM) and by the theoretical method of density functional theory (DFT). We found that molecules form ordered structures on flat graphene, while they form disordered structure on rippled graphene. For example, PCBM forms bilayer and monolayer structures, C60 and Gd3N@C80 form hexagonal close packed (hcp) structure on flat graphene and PTCDA forms herringbone structure on flat graphene surface. Although C60 and Gd3N@C80 both form hcp structure, C60 forms a highly ordered hcp structure over large areas with little defects and Gd3N@C80 forms hcp structure only over small areas with many defects. These differences of structure that forms on flat graphene is mainly due to the molecule-molecule interactions and the shape of the molecules. We find that the spherical C60 molecules form a quasi-hexagonal close packed (hcp) structure, while the planar PTCDA molecules form a disordered herringbone structure. From DFT calculations, we found that molecules are more effected by the morphology of rippled graphene than the molecule-molecule interaction, while the molecule-molecule interaction plays a main role during the formation process on flat graphene. The results of this study clearly illustrate significant differences in C60 and PTCDA molecular packing on rippled graphene surfaces. / Doctor of Philosophy / As the first physical isolated two-dimensional (2D) material, graphene has attracted exceptional scientific attention. Due to its impressive properties including high carrier density, flexibility and transparency, graphene has numerous potential applications, such as solar cell, sensors and electronics. 2D molecular self-assembly is an area that focuses on organization and interaction between self-assembly behaviors of molecules on surface. Graphene is an excellent substrate for the study of molecular self-assembly behavior, and study of molecular study is very important for graphene due to potential applications of molecules on graphene. In this thesis, we present investigations of the molecular self-assembly of PCBM, C60, PTCDA and Gd3N@C80 on graphene substrate. First, we report the two types of bilayer PCBM configuration on HOPG with a step height of 1.68 nm and 1.23 nm, as well as two types of monolayer PCBM configuration with a step height of 0.7 nm and 0.88 nm, respectively. On graphene, PCBM forms one type of PCBM bilayer with a step height of 1.37 nm and one type of PCBM monolayer with a step height of 0.87 nm. By building and analyzing the models of PCBM bilayers and monolayers, we believe the main differences between two configurations of PCBM bilayer and monolayer is the tilt angle between PCBM and HOPG, which makes type I configuration the higher molecule density and binding energy. Secondly, we report the investigation of self-assembly behaviors of C60 and PTCDA on flat graphene and rippled graphene by experimental scanning tunneling microscope (STM) and theoretical density functional theory (DFT). On flat graphene, C60 forms hexagon close pack (hcp) structure, while PTCDA forms herringbone structure. On rippled graphene, C60 forms quasi-hcp structure while PTCDA forms disordered herringbone structure. By DFT calculation, we study the effect of graphene curvature on spherical C60 and planar PTCDA. Finally, we report a STM study of a monolayer of Gd3N@C80 on graphene substrate. Gd3N@C80 forms hcp structure in a small domain with a step height of 0.88 nm and lattice constant of 1.15 nm. According to our DFT calculation, for the optimal organization of Gd3N@C80 and graphene, the gap between Gd3N@C80 and graphene is 3.3 Å and the binding energy is 0.95 eV. Besides, the distance between Gd3N@C80 and Gd3N@C80 is 3.5 Å and the binding energy is 0.32 eV.

Electrical and structural properties of Bismuth thin films were studied simultaneously. Electrical properties of the Bismuth thin films have been characterized by measuring temperature dependent conductivity and Hall effect. Structural analysis were carried out by X-ray diffraction technique and using a room temperature Atomic Force Microscope (RT-AFM).

Doctor of Philosophy / Department of Physics / Bruce M. Law / Three diverse first author surfaces science experiments conducted by Sean P. McBride 1-3 will be discussed in detail and supplemented by secondary co-author projects by Sean P. McBride, 4-7 all of which rely heavily on the use of an atomic force microscope (AFM). First, the slip length parameter, b of liquids is investigated using colloidal probe AFM. The slip length describes how easily a fluid flows over an interface. The slip length, with its exact origin unknown and dependencies not overwhelming decided upon by the scientific community, remains a controversial topic. Colloidal probe AFM uses a spherical probe attached to a standard AFM imaging tip driven through a liquid. With the force on this colloidal AFM probe known, and using the simplest homologous series of test liquids, many of the suspected causes and dependencies of the slip length demonstrated in the literature can be suppressed or eliminated. This leaves the measurable trends in the slip length attributed only to the systematically varying physical properties of the different liquids. When conducting these experiments, it was realized that the spring constant, k, of the system depends upon the cantilever geometry of the experiment and therefore should be measured in-situ. This means that the k calibration needs to be performed in the same viscous liquid in which the slip experiments are performed. Current in-situ calibrations in viscous fluids are very limited, thus a new in-situ k calibration method was developed for use in viscous fluids. This new method is based upon the residuals, namely, the difference between experimental force-distance data and Vinogradova slip theory. Next, the AFM’s ability to acquire accurate sub nanometer height profiles of structures on interfaces was used to develop a novel experimental technique to measure the line tension parameter, τ, of isolated nanoparticles at the three phase interface in a solid-liquid-vapor system. The τ parameter is a result of excess energy caused by the imbalance of the complex intermolecular forces experienced at the three phase contact line. Many differences in the sign and magnitude of the τ parameter exist in the current literature, resulting in τ being a controversial topic.

Ce travail porte sur l'étude du comportement rhéologique de fluide en milieu confiné. Pour cela le levier d'un microscope à force atomique (AFM) est utilisé pour sonder les propriétés rhéologiques d'un fluide confiné entre deux surfaces : la surface d'une sphère collée à l'extrémité du levier et une surface plane sur lequel le fluide est déposé. Le dispositif expérimental est constitué du système de mesure d'un AFM et d'un piézoélectrique permettant d'approcher ou d'éloigner de la sphère la surface plane. Un modèle analytique permet d'extraire les propriétés rhéologiques du fluide confiné à partir de la déflexion du levier induite par le pincement du fluide. Cette méthode a été validée pour les fluides newtoniens. Par contre pour les fluides non-newtoniens comme par exemple la solution de polyacrylami de nous avons trouvé que la viscosité dépend de la distance D et que le cisaillement n'est pas le seul paramètre pertinent pour interpréter les propriétés rhéologiques. / This thesis focuses on the study of the rheological behavior of confined fluids. For this purpose, the microcantilever of an atomic force microscope (AFM) is used to probe the rheological properties of a fluid confined between two surfaces, the surface of a sphere glued to the free-end of the AFM microcantilever and a flat solid surface on which the fluid is deposited. The set-up consists of an AFM, an electrical system for the deflection measurement and a piezoelectric device to move the solid surface (approach, oscillation, etc.). An analytical model allows to determine the rheological properties of the confined fluid from the measurement of the microcantilever deflection due to the hydrodynamic force exerted by the fluid on the sphere.This method has been validated for Newtonian fluids. For non-Newtonian fluids, such as polyacrylamide solution, we found that the viscosity depends on the distance D between the sphere and the plane surface and the shear rate is not the only relevant parameter for interpreting the rheological properties.

Nanofibres are found in a broad variety of hierarchical biological systems as fundamental structural units, and nanofibrillar components are playing an increasing role in the development of advanced functional materials. Accurate determination of the mechanical properties of single nanofibres is thus of great interest, yet measurement of these properties is challenging due to the intricate specimen handling and the exceptional force and deformation resolution that is required. The atomic force microscope (AFM) has emerged as an effective, reliable tool in the investigation of nanofibrillar mechanics, with the three most popular approaches—AFM-based tensile testing, three-point deformation testing, and nanoindentation—proving preferable to conventional tensile testing in many (but not all) cases. Here, we review the capabilities and limitations of each of these methods and give a comprehensive overview of the recent advances in this field.

L’importante augmentation de fluage des plaques de plâtre en milieu humide est un vieux problème dans l’industrie du bâtiment, dont l’origine n’est pas encore établie. Afin d’en comprendre le mécanisme une étude à trois échelles (macro : réponse mécanique, micro : cinétique de dissolution et nano : observation atomique) a été réalisée. Une corrélation forte existe entre le fluage du plâtre en immersion et la cinétique de dissolution du gypse. La concordance de cette corrélation avec une loi de déformation par dissolution sous contrainte, très utilisés en géologie, permet de proposer la dissolution sous contrainte comme un des mécanismes responsables du fluage du plâtre en immersion. L’évolution de la topographie de la surface du cristal de gypse immergé dans une solution aqueuse de gypse est observée par microscopie à force atomique (AFM). La cinétique de migration des marches atomiques est très dépendante de la sous-saturation de la solution, de la force d’appui de la pointe de l’AFM ainsi que des additifs utilisés. L’étude de l’influence de la force d’appui sur les vitesses des marches met en évidence la présence de deux mécanismes complètement différents. A fortes forces (> 15 nN) on observe un mécanisme d’usure de la surface, tandis qu’à faibles forces (< 10 nN) le mécanisme observé semble être la dissolution sous contrainte. L’évolution des vitesses des marches atomiques avec la force appliquée par la pointe est concordante avec une loi connue de dissolution sous contrainte. / The huge enhancement of the creep of plasterboard by humid environments is an old problem in the building industry, but its origin remains unknown. To understand this mechanism a three scales study (macro : mechanical behavior, micro : dissolution kinetics, nano : atomic observation) has been done. There is a strong correlation between wet plaster creep and gypsum dissolution kinetics. The concordance between this correlation and the law of deformation by pressure solution, well-known in geology, permits to propose pressure solution as one of the mechanisms responsible of wet plaster creep. The topological evolution of the cleaved surface of a gypsum single crystal during its dissolution in a flowing under-saturated aqueous solution has been observed with an atomic force microscope. The kinetics of step migration strongly depends on the saturation state of the solution, the force applied by the tip on the surface, as well as the used additives. The study of the influence of the force applied by the tip on the step velocity evidence two different dissolution enhancement regimes. At high forces (> 15 nN) a corrosive wear behavior is observed, while at low forces (< 10 nN) pressure solution is the observed mechanism. The step velocity evolution with the force obeys the known kinetic law of pressure solution.

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