• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 665
  • 127
  • 83
  • 78
  • 54
  • 37
  • 34
  • 20
  • 17
  • 16
  • 12
  • 12
  • 7
  • 5
  • 5
  • Tagged with
  • 1442
  • 705
  • 646
  • 445
  • 318
  • 208
  • 185
  • 166
  • 155
  • 137
  • 126
  • 117
  • 116
  • 112
  • 109
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
91

Fast Fourier Transform implementation using Field Programmable Gate Array technology for Orthogonal Frequency Division Multiplexing systems

Lolla, Rama Krishna. January 2002 (has links)
Thesis (M.S.)--University of Florida, 2002. / Title from title page of source document. Includes vita. Includes bibliographical references.
92

MizzouSMP

Nash, Sean. Tyrer, Harry W. January 2009 (has links)
Title from PDF of title page (University of Missouri--Columbia, viewed on Feb 18, 2010). The entire thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file; a non-technical public abstract appears in the public.pdf file. Thesis advisor: Dr. Harry Tyrer. Includes bibliographical references.
93

An FPGA architecture for improved arithmetic performance /

Rajagopalan, Kamal. January 2001 (has links) (PDF)
Thesis (M. Eng. Sc.)--University of Queensland, 2002. / Includes bibliographical references.
94

Design and development of a configurable fault-tolerant processor (CFTP) for space applications /

Ebert, Dean A. January 2003 (has links) (PDF)
Thesis (M.S. in Electrical Engineering)--Naval Postgraduate School, June 2003. / Thesis advisor(s): Herschel H. Loomis, Alan A. Ross. Includes bibliographical references (p. 219-224). Also available online.
95

A run-time hardware task execution framework for FPGA-accelerated heterogeneous cluster

Choi, Yuk-ming, 蔡育明 January 2013 (has links)
The era of big data has led to problems of unprecedented scale and complexity that are challenging the computing capability of conventional computer systems. One way to address the computational and communication challenges of such demanding applications is to incorporate the use of non-conventional hardware accelerators such as FPGAs into existing systems. By providing a mix of FPGAs and conventional CPUs as computing resources in a heterogeneous cluster, a distributed computing environment can be achieved to address the need of both compute-intensive and data-intensive applications. However, utilizing heterogeneous clusters requires application developers’ comprehensive knowledge on both hardware and software. In order to assist programmers to take advantage of the synergy between hardware and software easily, an easy-to-use framework for virtualizing the underlying FPGA computing resources of the heterogeneous cluster is motivated. In this work, a heterogeneous cluster consisting of both FPGAs and CPUs was built and a framework for managing multiple FPGAs across the cluster was designed. The major contribution of the framework is to provide an abstraction layer between the application developer and the underlying FPGA computing resources, so as to improve the overall design productivity. An inter-FPGA communication system was implemented such that gateware executing on FPGAs can communicate with each other autonomously to the CPU. Furthermore, to demonstrate a real-life application on the heterogeneous cluster, a generic k-means clustering application was implemented, using the MapReduce programming model. The implementation of the k-means application on multiple FPGAs was compared with a software-only version that was run on a Hadoop multi-core computer cluster. The performance results show that the FPGA version outperforms the Hadoop version across various parameters. An in-depth study on the communication bottleneck presented in the system was also carried out. A number of experiments were specifically designed to benchmark the performance of each I/O channel. The study shows that the major source of I/O bottleneck lies at the communication between the host system and the FPGA. This gives insight into programming considerations of potential applications on the cluster as well as improvement to the framework. Moreover, the benefit of multiple FPGAs was investigated through a series of experiments. Compared with putting all mappers on a single FPGA, it was found that distributing the same amount of mappers across more FPGAs can provide a tradeoff between FPGA resources and I/O performance. / published_or_final_version / Electrical and Electronic Engineering / Master / Master of Philosophy
96

Characterization and reliability of HFO₂ and hfsion gate dielectrics with tin metal gate

Krishnan, Siddarth A. 28 August 2008 (has links)
Not available / text
97

Charge trapping effects on mobility and threshold voltage instability in high-k gate stacks

Sim, Jang Hoan 28 August 2008 (has links)
Not available / text
98

High-permittivity dielectrics and high mobility semiconductors for future scaled technology: Hf-based High-K gate dielectrics and interface engineering for HfO₂/Ge CMOS device

Lu, Nan 28 August 2008 (has links)
Not available / text
99

Elliptic curve cryptography: a study and FPGAimplementation

Ng, Chiu-wa., 吳潮華. January 2004 (has links)
published_or_final_version / abstract / toc / Electrical and Electronic Engineering / Master / Master of Philosophy
100

TRANSIT AND DC MODEL OF FLOATING GATE TRANSISTOR IN 90NM CMOS TECHNOLOGY

Saheb, Zina 19 June 2013 (has links)
This thesis presents a new simulation model for floating gate transistor (FGMOS) in nanometer scale technology where the transistors suffer from non-negligible gate leakage current due to the very thin Silicon oxide (SiO2) layer. The new FGMOS simulation model is used for transient and DC simulation and with any industry standard simulators such as Spector and various SPICE programs (i.e. HSPICE, WinSPICE, etc.). This model can be used for any technology that has SiO2 thickness less than 3nm and suffer from gate leakage current with no changes to the model itself; however, minimal changes need to be done to the gate tunnelling cell to comply with the technology parameters where the gate tunnelling current exponentially increases as tox decreases.

Page generated in 0.025 seconds