No description available.

Universiẗat, Diss., 1999--Osnabrück.

Universiẗat, Diss., 2004--Würzburg.

0 / SPK / specialcollections@tulane.edu

The building sector represents the largest energy consumer among the United States' end use sectors. As a result, the public and private sector will continue to place great emphasis on designing energy efficient buildings that minimize operating costs while maintaining a healthy environment for its occupants. Creating design-phase building energy models can facilitate the process of selecting life-cycle appropriate design strategies aimed at maximizing building energy efficiency. The primary objective of this research study is to gain greater insight into likely causes of variation between energy predictions derived from building energy models and building energy performance during post-occupancy. Identifying sources of error can be used to improve future modeling efforts that can potentially lead to greater accuracy and better decisions made during the building's design phase. My research approach is to develop a method for conducting retrospective analysis of building energy models in the areas that affect the building's predicted and actual energy consumption. This entails collecting pre-construction and post-occupancy related data from various entities that exhibit influence on the building's energy performance. The method is then applied to recently-constructed military dormitory buildings that utilized building energy modeling and now have actual, metered building energy consumption data. The study also examines how building occupancy impacts energy performance. The value of this work will provide additional insight to future building energy modeling efforts. / text

Halbleiterbauelemente sind im täglichen Leben allgegenwärtig und haben in den letzten Jahrzehnten unseren Lebensstil vollkommen verändert.Während diemikro-elektronischen Bauelemente hauptsächlich auf Silizium-Technologie basieren, gewannen Anfang der 90-ziger Jahre Verbindungshalbleiter wie GaAs, GaN, CdHgTe oder ZnSe für opto-elektronische Bauelemente immer stärkere Bedeutung. Besonders der II-VI Halbleiter ZnSe war wegen seiner großen Bandlücke und seiner geringen Versetzungsdichte einer der größten Hoffnungsträger, blau emittierende Laserdioden zu realisieren. Wie sich später zeigte, weisen ZnSe-basierte blaue Laserdioden aber binnen kurzer Zeit eine ausgeprägte Degradation ihrer opto-elektronisch aktiven Schicht auf [Guha97]. Dies führte schließlich dazu, dass sich zur Produktion blau-grün emittierender Laserdioden das konkurrierende Halbleitermaterial GaN durchsetzte [Pearton99] und ZnSe in den Hintergrund gedrängt wurde. In jüngster Zeit aber erlebt das ZnSe Halbleitermaterial in spintronischen Bauelementen eine Renaissance [Fiederling99], und auch in Kombination mit Mg und Fe konnten interessante magnetische Eigenschaften nachgewiesen werden [Marangolo01,Marangolo02]. ZurHerstellung der oben erwähnten opto-elektronischen und spintronischen Schichtstrukturen wird hauptsächlich die Molekular-Strahl-Epitaxie (MBE) eingesetzt. Sie gewährleistet erstens eine geringe Defektdichte und einen hohen Reinheitsgrad der erzeugten Schichtstrukturen. Zweitens können die elektronischen Eigenschaften der so erzeugten Schichtstrukturen durchDotierung gezielt beeinflusstwerden. Für das Wachstum der ZnSe-basierten Schichtsysteme ist zum einen die genutzte Substratfläche entscheidend. Als mögliche Substratkristalle bieten sich Halbleitermaterialien wie GaAs und Germanium an, die gegenüber dem ZnSe-Kristall eine sehr kleine Gitterfehlanpassung aufweisen (< 0.3 %). Zum anderen nimmt die ZnSe Oberfläche eine wichtige Rolle ein, weil an ihr das Wachstum abläuft und ihre mikroskopischen Eigenschaften direkt das Wachstum beeinflussen. Die genauen Mechanismen dieses Wachstumsprozesses sind bis jetzt nur in Ansätzen verstanden (siehe z.B. [Pimpinelli99,Herman97]), weshalb die Wachstumsoptimierung meist auf empirischem Weg erfolgt. Aus diesem Grund besteht ein gesteigertes akademisches Interesse an der Aufklärung der mikroskopischen Eigenschaften der Halbleiteroberflächen. Für die Oberflächen von CdTe- und GaAs-Kristallen wurden diesbezüglich bereits zahlreicheUntersuchungen durchgeführt, die die geometrische und elektronische Struktur und dieMorphologie dieser Oberflächen analysieren.MitHilfe von experimentellen Methoden wie Rastertunnel-Mikroskopie (STM), Photoelektronen-Spektroskopie (PES, ARUPS) und verschiedenen Beugungsmethoden (SXRD,HRXRD und LEED) bzw. theoretischen Berechnungen (DFT) wurde das Verhalten dieser Oberflächen untersucht. Ihren Eigenschaften wird Modell-Charakter zugewiesen, der oft auf andere II-VI und III-V Halbleiteroberflächen angewendet wird. Überraschenderweise ist das Verhalten der ZnSe Oberfläche, obwohl sie so lange im Mittelpunkt der Forschung um den blauen Laser stand, weit weniger gut verstanden. Unter anderemexistieren für die geometrische Struktur der c(2×2)-rekonstruierten ZnSe(001)Wachstumsoberfläche zwei konkurrierende Strukturmodelle, die sich widersprechen. Ziel der nachfolgenden Abhandlung ist es, zuerst die geometrische Struktur und die Morphologie der verschieden rekonstruierten ZnSe(001) Oberflächen zu untersuchen und mit dem Verhalten anderer II-VI Oberflächen zu vergleichen. Dadurch soll festgestellt werden, welche Eigenschaften der II-VI Halbleiteroberflächen Modell-Charakter besitzen, also übertragbar auf andere II-VI Halbleiteroberflächen sind, und welche der Oberflächen-Eigenschaften materialspezifisch sind (siehe Tab. 5.1). Zweitens wird die geometrische Struktur und dieMorphologie der Te-passivierten Ge(001) Oberfläche untersucht. Diese Oberfläche ist wegen ihrer geringen Gitterfehlanpassung bzgl. des ZnSe Kristalls eine erfolgversprechende Substratoberfläche, um das ZnSe-Wachstum auch auf nicht-polaren Halbleiteroberflächen zu etablieren. Zur Untersuchung der geometrischen Struktur bzw. Morphologie der Halbleiteroberflächen wurden die zwei komplementären Methoden SXRD und SPA-LEED eingesetzt. Die oberflächenempfindliche Röntgenbeugung (SXRD) ermöglicht es, die geometrische Struktur, also den genauen atomaren Aufbau der Oberfläche, aufzuklären. Die hochauflösende niederenergetische Elektronenbeugung (SPA-LEED) hingegen liefert Informationen über die Morphologie, also die Gestalt der Oberfläche auf mesoskopischer Größenskala. Diese Untersuchungen werden durch hochauflösende klassische Röntgenbeugung (HRXRD), Rasterkraft-Mikroskopie (AFM), hochauflösender Photoelektronen-Spektroskopie (PES, ARUPS) und Massen-Spektroskopie (QMS) ergänzt. Die vorliegende Arbeit gliedert sich in folgende drei Teile: Zuerst wird in die SXRD und SPA-LEED Methoden eingeführt, mit denen hauptsächlich gearbeitet wurde (Kapitel 2). Anschließend werden die experimentellen Untersuchungen an der Te/Ge(001) Oberfläche und an den verschieden rekonstruierten ZnSe(001) Oberflächen vorgestellt (Kapitel 5 bis 8). Im dritten und letzten Teil werden schließlich die wichtigsten Ergebnisse und Schlussfolgerungen zusammengefasst (Kapitel 9). / The field of II-VI compound semiconductors has attracted considerable interest, due to important progress in the fabrication of electronic and opto-electronic devices. Since interface effects are often important in thin film systems, a good knowledge of the electronic and geometric structure of surfaces and interfaces is indispensable to design optimized devices. For example, to achieve high-quality pseudomorphic growth of II-VI compound thin films on III-V substrates a detailed knowledge about the II-VI/III-V interface and the II-VI surface is essential. An example of recent progress in this field is the c(2×2)-reconstructed ZnSe(001) surface. However, there is still an ongoing discussion concerning the exact geometric structure of the c(2×2)-reconstructed ZnSe(001) surface, which is somewhat surprising, since this system has been extensively investigated in the past and is considered to be a model-system for II-VI MBE growth. Also the hetero-epitaxial growth of compound semiconductors on surfaces such as silicon or germanium is strongly affected by the chemical bonding at the interface. Therefore, in this work the geometric and morphologic structure of the reconstructed ZnSe surface is investigated and compared to other II-VI surfaces. Furthermore, the morphologic structure of the Te covered Ge(001) surface is analyzed to decide whether Te provides better growth conditions for ZnSe films on the Ge(001) surface. The crystallography of surfaces has been investigated primarily by surface x-ray diffraction performed at the Hamburger Synchrotronstrahlungslabor (HASYLAB) at the Deutsches Elektronen-Synchrotron (DESY) inHamburg and themorphology of surfaces by high resolution low energy electron diffraction (SPA-LEED), which was implemented in the MBE-machine of Experimentelle Physik III. Additional experimental techniques used were photoelectron spectroscopy (PES), atomic force microscopy (AFM), quadrupole mass spectroscopy (QMS), and high resolution x-ray diffraction (HRXRD). As shown by SPA-LEED, the Te covered Ge(001) surface is a strained surface, which results in a missing row reconstruction. Large Te covered domains of the surface are interrupted by long parallel rows without adsorbates. This arrangement allows the Te rows to expand laterally into the Te-free rows and lowers the stress of the Te covered Ge(001) surface. This is also achieved by double steps,which also exist on the Te covered Ge(001) surface. By annealing the Te covered Ge(001) surface Te desorbs, and the randomly arranged missing rows form an ordered grating, the period of which increase if the Te coverage is reduced. When the tellurium is completely desorbed, the surface shows the well-known (2×1)-reconstruction of a clean Ge(001) surface. Furthermore, a (113)-faceting of the (001) surface occurs during Te adsorption at higher substrate temperatures. For these reasons, the Te covered Ge(001) surface is not suited as a substrate for the ZnSe growth. However, the stripe pattern of this surface may be adapted as a template for a preferential adsorption of, e.g., organic molecules. Using high-resolution low-energy electron diffraction (SPA-LEED) correlations of neighboring superstructure domains of the ZnSe(001) surface across steps are found. These steps run along the [110]- and [1¯10]-directions at the (2×1)-reconstructed ZnSe(001) surface and formso-called incommensurate domainwalls. This behavior of the ZnSe(001) surface is in contrast to the behavior of the CdTe(001) surface. It may be explained by the different elastic properties of the ZnSe and the CdTe crystal, respectively. At the c(2×2)-reconstructed surface the neighboring superstructure domains are correlated across [100]- and [010]-oriented steps. This is well known from sputtered and annealed ZnSe surfaces by the work of Chen et al. [Chen02]. We show that this is also true for MBE grown ZnSe surfaces and, therefore, the correlations of the superstructure domains are an intrinsic property of the c(2×2)-reconstructed ZnSe(001) surface. The ZnSe(001) surface sublimates at temperatures above 450 &#9702;C. In contrast to Cd-Te(001), deep cavities arise during sublimation. Since this sublimation temperature is much higher than the growth temperature, sublimation does not affect the growth of ZnSe. Also the ZnSe/GaAs layer-system shows an unexpected morphologic effect. As normal for metal surfaces, above a critical thickness of 100 nm the topmost ZnSe layer relaxes by forming large mosaic domains, which are tilted by 0.2&#9702; with respect to the macroscopic surface. The misfit of the ZnSe/GaAs interface probably induces this formation of mosaic domains. The geometric structure of the c(2×2)-reconstructed ZnSe(001) surface is studied by surface X-ray diffraction performed under ultra-high vacuum using synchrotron radiation, which reveals the precise atomic geometry. The results are in excellent agreement with the Zn-vacancy model proposed earlier on the basis of density functional theory calculations [Park94]. The Se-vacancy model [Ohtake99b], which challenges this theoretical calculation, can be excluded on the basis of our measurements. The special morphologic properties of the (2×1)-reconstructed ZnSe surface prohibit a precise quantitative analysis of the surface structure. Nevertheless, it was discovered that asymmetrical translated Se-dimers, which are well-known from the Si(001)-(2×1) and Ge(001)-(2×1) surfaces, but unexpected from the theoretical point of view for the ZnSe surface, form on the reconstructed surface. These findings are confirmed by PES-measurements.

Submitted by Gisely Teixeira (gisely.teixeira@uniceub.br) on 2018-06-16T14:29:38Z No. of bitstreams: 1 51500817.pdf: 1716717 bytes, checksum: b7977e8cd1242b5ed57073ad7453f950 (MD5) / Made available in DSpace on 2018-06-16T14:29:38Z (GMT). No. of bitstreams: 1 51500817.pdf: 1716717 bytes, checksum: b7977e8cd1242b5ed57073ad7453f950 (MD5) Previous issue date: 2018 / Com a popularização da sustentabilidade, diversos setores da indústria e comércio tiveram que rever suas políticas e forma de atuação para conseguirem enquadrar suas atividades dentro desse conceito. Com a construção civil não foi diferente, e por ser um dos setores onde o consumo de materiais e energia são muito elevados, foram criadas diversas diretrizes para que se alcançasse a harmonia entre a produção, o ambiente e a comunidade local. Este trabalho busca conceituar a sustentabilidade dentro do parâmetro ambiental, econômico e social, além de abordar a questão das certificações ambientais, com foco no LEED. Os estudos de caso apresentados foram de dois edifícios comerciais em Brasília com certificação LEED, onde fora feita a análise buscando a ligação entre os conceitos sustentáveis e as soluções adotadas por cada edifício para se alcançar a certificação ambiental. Como resultado dos levantamentos, observou-se uma tendência dentre as soluções adotadas pelas edificações, o que pode tornar os sistemas cada vez mais acessíveis e comuns nas construções. E de que é possível mitigar os impactos ambientais gerados pela construção ao seguir as diretrizes apontadas pelos certificadores ambientais.

Among most of the LEED registered and LEED certified health-care facilities, there is a credit variation between the LEED pilot checklist and the final checklist. The credit variation between the LEED pilot and final checklists implies failure in achieving the pre-defined green objectives. Most of the credits were given up due to financial reasons. Although most of the credits in the LEED credit list emerge as design issues, accomplishing a LEED rating is primarily the owner??s responsibility. In order to minimize the variation between the LEED pilot checklist and LEED approved checklist, the owner needs to conduct significant project planning. The owner should integrate the LEED objectives early in the project and should include the cost of the LEED process in the capital budget. Since there are limited LEED certified health-care projects, adoption of the systems approach for planning and developing a green health-care facility using the IDEF0 method is recommended. The IDEF0 method can produce an outcome array which represents the matrix of all possible circumstances. This will give the owner and the project team the ability to better forecast cost and schedule decisions, even when there is a lack of historical data relating to green health-care projects. The approach will be beneficial in analyzing the various outcomes, cost, and feasibility of projects in terms of integrating LEED objectives early on. This could minimize the credit variation, as well as cost and schedule overruns during the project execution stage. Adequately defining the full development process upfront is vital to the overall success of any project, especially for green buildings, since they are a developing trend in the construction industry.

Thermal annealing 4H-SiC(0001) substrates to produce epitaxial graphene on Si-terminated SiC was performed using five different procedures, i.e. direct and indirect current heating at different based pressures and a temperature of about 1300 . The aim is to study the effects of graphene growth under different conditions and also to produce large homogeneous graphene. To investigate the prepared samples, two surface analytical techniques, i.e. low energy electron microscopy (LEEM) and photoelectron spectroscopy (PES) have been used. LEEM was first used to observe the surface morphologies of the prepared samples. In combination with LEEM instrument, low energy electron diffraction (LEED) was used to verify the existence of graphene on SiC substrate. The number of graphene layer was determined by collecting electron reflectivity at different electron energies. The number of dips observed in the electron reflectivity curve corresponds to the number of graphene layer. The experimental results obtained from LEEM and LEED have demonstrated that a film consisting of fairly large domains of 1 and 2 monolayer (ML) graphene was obtained by direct current heating of SiC under high vacuum (HV) condition with the based pressure of 10-6 Torr. A domain size in the range of up to about 5 to 10 μm have been observed. Meanwhile another graphene film prepared by the same method and the same temperature but under ultra high vacuum (UHV) condition with the based pressure of 10-10 Torr has much smaller domain size of 1 ML graphene compared to that grown under HV condition. We therefore suggested that the based pressure during the graphene growth has a strong influence on the morphology of graphene. This is because the Si evaporation rate is suppressed when heated in a high pressure environment, which normally leads to the improvement of the surface quality. The suppression of the Si evaporation rate has also been verified by a result obtained from the other sample directly heated under much higher based pressure, i.e. in an argon (Ar) environment of 1 atm. In addition to LEEM and LEED, the existence of graphene on SiC substrate has also been verified by the PES measurement. The C1s spectrum of graphene sample grown on SiC(0001) substrate showed three components, i.e. bulk SiC, graphene (G) and the buffer layer (B) located at 283.7 eV, 284.5 eV and 285.1 eV, respectively. The intensity ratios of the three components in the C1s spectrum were also used to estimate the number of graphene layer. The estimated number of graphene layer corresponds to the result obtained from LEEM.

Since 1998, the United States Green Building Council, via the Leadership in Energy and Environmental Design (LEED) standards, has established the premiere set of guidelines for construction ethics from the standpoint of eco-friendliness and occupant safety and health in the U.S. and around the world. These guidelines are skyrocketing in use due in part to two reasons: · increased awareness of a need for reducing, reusing, and recycling in order to save resources and natural areas for future generations; and, · increased amount of time spent indoors in work places and homes. The LEED guidelines encourage sustainable and responsible use of land, water, energy, and materials, and promote a safe and healthy environment through use of innovative designs and technology. As part of the responsible use of materials, the LEED guidelines encourage the use of rapidly renewable materials such as cotton, straw, wool, and cork as insulation products. Although these products can be produced naturally and quickly from nature, they are also cellulose or carbohydrate based products. Cellulose and carbohydrate based materials are typically optimal food sources for mold in the presence of moisture, ironically destroying facilities and creating poor living and work environments. Samples of wool, cork, straw, and cotton--rapidly renewable materials used as exterior wall insulation products--were exposed to different moisture amounts in an encapsulated environment, representing the environment within a wall cavity when exposed to water from pipes, leaks, condensation and absorption, or from initial construction. The samples were monitored over time for mold growth. The data logged from the samples were analyzed to determine the degree of mold susceptibility of each material. In addition, samples with increased amounts of moisture were examined to determine increased promotion of mold growth. The results from this study showed that all of the above mentioned materials were highly susceptible to mold growth and that the moisture amount did not increase the rate of mold growth. Based on the data collected from this study, recommendations were made to review the current use of rapidly renewable and other cellulose and carbohydrate based materials in wall construction.