In dieser Arbeit wird die ultraschnelle Dynamik von Leitungsbandelektronen in Halbleitermaterialien mit Hilfe nichtlinearer Terahertz-Spektroskopie erforscht. Insbesondere wird n-dotiertes Galliumarsenid bei mittleren Dotierdichten zwischen 10^(16) cm^(-3) und 10^(17) cm^(-3) untersucht. Für die Erzeugung intensiever THz Strahlung wurde eine neuartige Quelle entwickelt, die THz Transienten mit nur einer Oszillationsperiode und maximalen Feldamplituden von mehr als 400 kV/cm liefert. Diese THz-Quelle benutzt ultrakurze optische Laserpulse aus einem Ti:Saphir Oszillator. Zusätzlich wurde ein neuartiger zwei-Farben Anrege-Abtast Experimentierplatz aufgebaut, der zweidimensionale, zeitaufgelöste Messungen im mittleren und fernen Infrarotbereich ermöglicht. Feldionisation flacher, neutraler Störstellen im Galliumarsenid-Gitter mittels intensiver, ultrakurzer THz Impulse und die anschliessende kohärente, strahlende Rekombination von Elektronen in die Störstellen-Grundzustände bei Raumtemperatur wird gezeigt. Der superradiante Zerfall der nichtlinearen Polarisation führt zur Abstrahlung eines kohärenten Signals mit Lebensdauern von über einer Pikosekunde. Solche nichtlinearen Signale, die 10-fache Lebensdauern im Vergleich zum linearen Fall aufweisen, wurden in dieser Arbeit zum ersten Mal gemessen. Bei niedrigen Temperaturen und THz Feldstärken unter 5 kV/cm werden Rabi-Oszillationen an Übergängen in flachen Störstellen demonstriert. Zum ersten Mal konnte die polare Elektron-LO-Phonon Wechselwirkung im quantenkinetischen Regime direkt gemessen werden. Die quasi-instantane Beschleunigung von Leitungsbandelektronen im polaren Galliumarsenid-Gitter und die anschließende Messung der Transmission im mittleren Infrarot-Bereich, zeigen eine Modulation der Transmission entlang der Anrege-Abtast Verzögerung mit der Frequenz des LO Phonons. Diese Oszillation ist ein direktes Maß der relativen Phase zwischen der Elektronenbewegung und der umgebenden Phonon Wolke. Quantenkinetische Modellrechnungen reproduzieren vollständig die beobachteten Effekte. / In this thesis, the ultrafast dynamics of conduction band electrons in semiconductors are investigated by nonlinear terahertz (THz) spectroscopy. In particular, n-doped gallium arsenide samples with doping concentrations in the range of 10^16cm^(-3) to 10^17 cm^(-3) are studied. A novel source for the generation of intense THz radiation is developed which yields single-cycle THz transients with field amplitudes of more then 400 kV/cm. The THz source uses ultrashort optical laser pulses provided by a Ti:sapphire oscillator. In addition, a two-color THz-pump mid-infrared-probe setup is implemented, which allows for two-dimensional time-resolved experiments in the far-infrared wavelength range. Field ionization of neutral shallow donors in gallium arsenide with intense, ultrashort THz pulses and subsequent coherent radiative recombination of electrons to impurity ground states is observed at room temperature. The superradiant decay of the nonlinear polarization results in the emission of a coherent signal with picosecond lifetimes. Such nonlinear signals, which exhibit a lifetime ten times longer than in the linear regime are observed for the first time. At low temperatures and THz field strengths below 5 kV/cm, Rabi flopping on shallow donor transitions is demonstrated. For the first time, the polar electron-LO phonon interaction is directly measured in the quantum kinetic transport regime. Quasi-instantaneous acceleration of conduction band electrons in the polar gallium arsenide lattice by the electric field of intense THz pulses and subsequent probing of the mid-infrared transmission reveals a modulation of the transmission along the THz-mid-infrared delay coordinate with the frequency of the LO phonon. These modulations directly display the relative phase between the electron motion and its surrounding virtual phonon cloud. Quantum kinetic model calculations fully account for the observed phenomena.

The electrical properties of ZnO and contacts to ZnO have been investigated using different techniques. Temperature dependent Hall (TDH) effect measurements have been used to characterize the as-received melt grown ZnO samples in the 20 – 330 K temperature range. The effect of argon annealing on hydrogen peroxide treated ZnO samples has been investigated in the 200 – 800oC temperature range by the TDH effect measurement technique. The experimental data has been analysed by fitting a theoretical model written in Matlab to the data. Donor concentrations and acceptor concentrations together with the associated energy levels have been extracted by fitting the models to the experimentally obtained carrier concentration data by assuming a multi-donor and single charged acceptor in solving the charge balance equation. TDH measurements have revealed the dominance of surface conduction in melt grown ZnO in the 20 – 40 K temperature range. Surface conduction effects have proved to increase with the increase in annealing temperature. Surface donor volume concentrations have been determined in the 200 – 800oC by use of theory developed by D. C. Look. Good rectifying Schottky contacts have been fabricated on ZnO after treating the samples with boiling hydrogen peroxide. Electrical properties of these Schottky contacts have been investigated using current-voltage (IV) and capacitance-voltage (CV) measurements in the 60 – 300 K temperature range. The Schottky contacts have revealed the dominance of predominantly thermionic emission at room temperature and the existence of other current transport mechanisms at temperatures below room temperature. Polarity effects on the Schottky contacts deposited on the O-polar and Zn-polar faces of ZnO have been demonstrated by the IV technique on the Pd and Au Schottky contacts at room temperature. Results obtained indicate a strong dependence of the Schottky contact quality on the polarity of the samples at room temperature. The quality of the Schottky contacts have also indicated their dependence on the type of metal used with the Pd producing contacts with the better quality as compared to the Au. Schottky barrier heights determined using temperature dependent IV measurements have been observed to increase with increasing temperature and this has been explained as an effect of barrier inhomogeneities, while the ones obtained from CV measurements have proved to follow the negative temperature coefficient of the II – VI semiconductor material, i.e. a decrease in barrier height with increasing temperature. However, the values have proved to be larger than the energy gap of ZnO, an effect that has been explained as caused by an inversion layer. Copyright / Dissertation (MSc)--University of Pretoria, 2010. / Physics / unrestricted