This thesis describes firstly, a study involving the thermal rearrangement of substituted 6-e̲x̲o̲-(1-alkenyl) bicyclo-[3.1.0]hexenes, and secondly, the application of this type of transformation to a total synthesis of (±)-sinularene (1̲2̲5̲). The 6-e̲x̲o̲-(1-alkenyl)bicyclo[3.1.0]hexenes (1̲8̲7̲, 1̲8̲9̲, 1̲9̲2̲, 1̲9̲4̲, 2̲4̲0̲, 2̲7̲4̲ and 340) were prepared and thermolyzed in sealed tubes to afford the corresponding bicyclo[3.2.1]octa-2,6-dienes (1̲8̲8̲, 1̲9̲0̲, 1̲9̲3̲, 1̲9̲5̲, 2̲4̲1̲, 2̲7̲6̲ and 3̲4̲1̲) in generally excellent yields. With the exception of 1̲9̲0̲, the thermolysis products were subjected to acid-catalyzed hydrolysis to give the respective bicyclo[3.2.1]octenones. From this study, it is clear that a) the Cope rearrangement of substrates, such as 2̲7̲4̲ and 3̲4̲0̲, containing even sterically bulky substituents on the 6-alkenyl side chain presents a viable means of generating functionalized bicyclo [ 3.2.1] octa-2 , 6-dienes, b) this methodology provides for the placement of synthetically useful functionalities on any of the carbon bridges of the bicyclo-[3.2.1]octane skeleton, and c) the transformations 2̲4̲0̲→2̲4̲1̲ and 2̲7̲4̲→2̲7̲6̲ provide strong evidence for the stereospecificity of the rearrangement process. In the total synthesis of (±)-sinularene (1̲2̲5̲), the key step involved the thermal rearrangement of 3̲2̲2̲ to afford the bicyclo[3.2.1]octadiene 3̲2̲1̲. The compound 3̲2̲2̲̲ was readily prepared as follows. 1-Lithio-3-methyl-1-butyne was treated with methacrolein to furnish the allylic alcohol 3̲3̲1̲, which was transformed into the ester 3̲3̲2̲ v̲i̲a̲ an orthoester Claisen rearrangement (hot triethyl .orthoacetate, propionic acid). Hydrolysis of the ester 3̲3̲2̲, followed by reaction of the resultant acid with oxalyl chloride in refluxing hexane gave the corresponding acid chloride 3̲3̲4̲. Treatment of 3̲3̲4̲ with a cold, ethereal solution of diazomethane afforded the diazo ketone 3̲3̲5̲, which in the presence of copper (II) acetoacetonate in refluxing benzene, underwent an intramolecular carbenoid cyclization to furnish the bicyclic ketone 3̲3̲6̲. Semihydrogenation of 3̲3̲6̲ using Lindlar’s catalyst gave stereoselectively the c̲i̲s̲-alkenyl ketone 3̲3̲7̲. The enone 3̲3̲8̲ was obtained by oxidizing the trimethylsilyl enol ether of 3̲3̲7̲ using palladium (II) acetate in acetonitrile. When the enone 3̲3̲8̲ was treated with lithium divinylcuprate, the two epimeric products 3̲3̲9̲ and 3̲4̲6̲ were obtained in a ratio of 9:1, respectively, and were sus-sequently separated by column chromatography. Trapping the lithium enolate of 3̲3̲9̲ with t̲-butyldimethylsilyl chloride led to the required enol ether 3̲3̲2̲. Thermolysis (220°C, sealed tube) of 3̲3̲2̲ in benzene produced exclusively in 86% yield the desired bicyclic triene 3̲2̲1̲. Subjection of 3̲2̲1̲ to hydroboration using disiamylborane gave, after oxidative workup, the alcohol 3̲4̲7̲, which on treatment with p̲-toluenesulfonyl chloride in the presence of 4-dimethylaminopyridine, afforded the ketone 3̲4̲9̲. Successive hydrogenation of 3̲4̲9̲ and Wittig olefination of the resultant ketone 2̲8̲0̲ completed the total synthesis of (±)-sinularene (1̲2̲5̲). [formula omitted] / Science, Faculty of / Chemistry, Department of / Graduate

TSDC (thermally stimulated depolarization current) is one of the most important and popular technique for investigating electret materials. TSDC technique can indicate the magnitude of polarization and depolarization, relaxation time, charge-storage, glass transition, and activation energy. To fully investigate polarization and relaxation for pure epoxy and filled epoxy materials, a TSDC system was built and verified by the research. The article describes the building processes and verification of the TSDC system. TSDC, TSPC, and TWC tests data for epoxy and filled epoxy samples are presented in the article. To compare TSDC technique with other related techniques, DEA (dielectric analysis), DMA (dynamic mechanical analysis), and DSC (differential scanning calorimetry) tests are introduced.

A thorough study on the distribution of defect-related active energy levels has been performed on nanocrystalline TiO2. Films have been deposited on thick-alumina printed circuit boards equipped with electrical contacts, heater and temperature sensors, to carry out a detailed thermally stimulated currents analysis on a wide temperature range (5-630 K), in view to evidence contributions from shallow to deep energy levels within the gap. Data have been processed by numerically modelling electrical transport. The model considers both free and hopping contribution to conduction, a density of states characterized by an exponential tail of localized states below the conduction band and the convolution of standard Thermally Stimulated Currents (TSC) emissions with gaussian distributions to take into account the variability in energy due to local perturbations in the highly disordered network. Results show that in the low temperature range, up to 200 K, hopping within the exponential band tail represents the main contribution to electrical conduction. Above room temperature, electrical conduction is dominated by free carriers contribution and by emissions from deep energy levels, with a defect density ranging within 10(14)-10(18) cm(-3), associated with physio- and chemi-sorbed water vapour, OH groups and to oxygen vacancies.

Trapping centres and their distributions in as-grown TlGaSeS layered single crystals were studied using thermally stimulated current (TSC) measurements. The investigations were performed in the temperature range of 10&ndash / 160 K with various heating rates between 0.6&ndash / 1.2 K/s. Experimental evidence has been found for the presence of three electrons trapping centres with activation energies 12, 20, and 49 meV and one hole trapping centre located at 12 meV. Their capture cross-sections and concentrations were also determined. It is concluded that in these centres retrapping is negligible as confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping. The optical properties of TlGaSeS layered single crystals have been investigated by measuring the transmission and the reflection in the wavelength region between 400 and 1100 nm. The optical indirect transitions with a band gap energy of 2.27 eV and direct transitions with a band gap energy of 2.58 eV were found by analyzing the absorption data at room temperature. The rate of change v of the indirect band gap with temperature was determined from the transmission measurements in the temperature range of 10&ndash / 300 K. The oscillator and the dispersion energies, the oscillator strength, and the zero-frequency refractive index were also reported. The parameters of monoclinic unit cell and the chemical composition of TlGaSes crystals were found by X-ray powder diffraction and energy dispersive spectroscopic analysis, respectively.

Trapping centres in as-grown TlInS2 layered single crystals have been studied by using a thermally stimulated current (TSC) technique. TSC measurements have been performed in the temperature range of 10-300 K with various heating rates. Experimental evidence has been found for the presence of five trapping centres with activation energies 12, 14, 400, 570 and 650 meV. Their capture cross-sections and concentrations were also determined. It is concluded that in these centres retrapping is negligible as confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping. An exponential distribution of traps was revealed from the analysis of the TSC data obtained at different light excitation temperatures. The transmission and reflection spectra of TlInS2 crystals were measured over the spectral region of 400-1100 nm to determine the absorption coefficient and refractive index. The analysis of the room temperature absorption data revealed the coexistence of the indirect and direct transitions. The absorption edge was observed to shift toward the lower energy values as temperature increases from 10 to 300 K. The oscillator and the dispersion energies, and the zero-frequency refractive index were also reported. Furthermore, the chemical composition of TlInS2 crystals was determined from energy dispersive spectroscopic analysis. The parameters of monoclinic unit cell were found by studying the x-ray powder diffraction.

Electronic circuits comprising organic semiconductor thin-films are part of promising technologies for a renewable power generation and an energy-efficient information technology. Whereas TV and mobile phone applications of organic light emitting diodes (OLEDs) got ready for the market awhile ago, organic photovoltaics still lack in power conversion efficiencies, especially in relation to their current fabrication costs. A major reason for the low efficiencies are losses due to the large number of charge carrier traps in organic semiconductors as compared to silicon. It is the aim of this thesis to identify and quantify charge carrier traps in vacuum-deposited organic semiconductor thin-films and comprehend the reasons for the trap formation. For that, the techniques impedance spectroscopy (IS), thermally stimulated currents (TSC), and photoelectron spectroscopy are utilized. In order to assess the absolute energy of charge carrier traps, the charge carrier transport levels are computed for various hole transport materials such as MeO-TPD, pentacene, and ZnPc. Unlike inorganics, organic semiconductors possess in first-order approximation Gaussian distributed densities of states and temperaturedependent transport levels. The latter shift by up to 300 meV towards the energy gap-mid when changing from room temperature to 10 K as it is done for TSC examinations. The frequency-dependent capacitance response of charge carrier traps in organic Schottky diodes of pentacene and ZnPc are studied via impedance spectroscopy. In undoped systems, deep traps with depths of approx. 0.6 eV and densities in the order of 1016...1017 cm−3 are prevailing. For pentacene, the deep trap density is reduced when the material undergoes an additional purification step. Utilizing p-doping, the Fermi level is tuned in a way that deep traps are saturated. Vice versa, the freeze-out of p-doped ZnPc provides further insight into the influence of trap-filling, impurity saturation and reserve on the Fermi level position in organic semiconductors. Furthermore, charge carrier traps are investigated via thermally stimulated currents. It is shown that the trap depths are obtained correctly only if the dispersive transport of the released charge carriers until their extraction is considered. For the first time, the polarity of charge carrier traps in MeO-TPD, ZnPc, and m-MTDATA is identified from TSC’s differences in release time when spacer layers are introduced in the TSC samples. Simultaneously, tiny hole mobilities in the order of 10−13 cm2 Vs−1 are detected for low-temperature thin-films of the hole transporter material Spiro-TTB. It is shown for Spiro-TTB co-evaporated with the acceptor molecule F6-TCNNQ and a p-doped ZnPc:C60 absorber blend that the doping process creates shallow trap levels. Finally, various organic hole transport materials are examined upon their stability in water and oxygen atmosphere during sample fabrication and storage of the organic electronics. In case of pentacene, ZnPc, MeO-TPD, and m-MTDATA, hole traps are already present in unexposed thin-films, which increase in trap density upon oxygen exposure. A global trap level caused by oxygen impurities is found at energies of 4.7...4.8 eV that is detrimental to hole transport in organic semiconductors. / Elektronische Bauelemente aus Dünnschichten organischer Halbleiter sind Teil möglicher Schlüsseltechnologien zur regenerativen Energiegewinnung und energieeffizienten Informationstechnik. Während Fernseh- und Mobilfunkanwendungen organischer Leuchtdioden (OLEDs) bereits vor einiger Zeit Marktreife erlangt haben, ist die organische Photovoltaik (OPV) noch durch zu hohe Fertigungskosten in Relation zu unzureichenden Effizienzen unrentabel. Ein wesentlicher Grund für die niedrigen Wirkungsgrade sind Verluste durch die im Vergleich zu Silizium hohe Zahl an Ladungsträgerfallen in organischen Halbleitern. Ziel dieser Arbeit ist es, mittels Impedanz-Spektroskopie (IS), thermisch stimulierten Strömen (TSC) und Photoelektronenspektroskopie methodenübergreifend Ladungsträgerfallen in vakuumverdampften organischen Dünnschichten zu identifizieren, zu quantifizieren und ihre Ursachen zu ergründen. Um die Energie von Ladungsträgerfallen absolut beziffern zu können, wird zunächst für verschiedene Lochtransportmaterialien wie z.B. MeO-TPD, Pentazen und ZnPc die Transportenergie aus den in erster Ordnung gaußförmigen Zustandsdichten berechnet. Im Gegensatz zu anorganischen Halbleitern ist die Transportenergie in organischen Halbleitern temperaturabhängig. Sie verschiebt sich beim Übergang von Raumtemperatur zu 10 K, wie für TSC Untersuchungen bedeutsam, um bis zu 300 meV in Richtung der Bandlückenmitte. Mittels Impedanz-Spektroskopie wird die frequenzabhängige Kapazitätsantwort von Ladungsträgerfallen in organischen Schottky-Dioden aus Pentazen und ZnPc untersucht. In undotierten Systemen dominieren Defekte mit Tiefen um 0.6 eV, deren Dichte in der Größenordnung von 1016...1017 cm−3 liegt, sich aber im Fall von Pentazen durch einen zusätzlichen Materialaufreinigungsschritt halbieren lässt. Über p-Dotierung wird das Fermi-Level so eingestellt, dass tiefe Fallen abgesättigt werden können. Umgekehrt liefert das Ausfrieren von p-dotiertem ZnPc weitere Belege für den Einfluss von Fallenzuständen, Störstellen-Erschöpfung und Reserve auf das Fermi-Level in dotierten organischen Halbleitern. Im Weiteren werden Ladungsträgerfallen über thermisch stimulierte Ströme untersucht. Es wird gezeigt, dass die Fallentiefen nur dann konsistent bestimmt werden, wenn der dispersive Transport von freigesetzten Ladungsträgern zur Extraktionsstelle berücksichtigt wird. Durch Einführung von ’Abstandshalterschichten’ werden erstmalig über TSC die Polaritäten von Ladungsträgerfallen in MeO-TPD, ZnPc und m-MTDATA per Laufzeitunterschied bestimmt. Gleichzeitig werden geringste Löcherbeweglichkeiten in der Größenordnung von 10−13 cm2 Vs−1 für stark gekühlte Dünnschichten des Lochtransporters Spiro-TTB gemessen. Wie für Spiro-TTB koverdampft mit dem Akzeptormolekül F6-TCNNQ und p-dotierte Mischschichten der Absorbermaterialien ZnPc und C60 gezeigt, erzeugt Dotierung relativ flache Störstellen. Abschließend werden verschiedene organische Lochtransporter-Materialien auf ihre Stabilität in Wasser- und Sauerstoffatmosphären während der Prozessierung und der Lagerung fertiger elektronischer Bauelemente untersucht. Für Pentazen, ZnPc, MeO-TPD und m-MTDATA werden Löcherfallen in intrinsischen Dünnschichten nachgewiesen. Bei Kontakt mit Sauerstoff nimmt deren Defektdichte zu. Es findet sich ein universales Fallenniveau bei rund 4.7...4.8 eV, verursacht durch Sauerstoffverunreinigungen, welches den Lochtransport in organischen Halbleitern limitiert.

Electronic circuits comprising organic semiconductor thin-films are part of promising technologies for a renewable power generation and an energy-efficient information technology. Whereas TV and mobile phone applications of organic light emitting diodes (OLEDs) got ready for the market awhile ago, organic photovoltaics still lack in power conversion efficiencies, especially in relation to their current fabrication costs. A major reason for the low efficiencies are losses due to the large number of charge carrier traps in organic semiconductors as compared to silicon. It is the aim of this thesis to identify and quantify charge carrier traps in vacuum-deposited organic semiconductor thin-films and comprehend the reasons for the trap formation. For that, the techniques impedance spectroscopy (IS), thermally stimulated currents (TSC), and photoelectron spectroscopy are utilized. In order to assess the absolute energy of charge carrier traps, the charge carrier transport levels are computed for various hole transport materials such as MeO-TPD, pentacene, and ZnPc. Unlike inorganics, organic semiconductors possess in first-order approximation Gaussian distributed densities of states and temperaturedependent transport levels. The latter shift by up to 300 meV towards the energy gap-mid when changing from room temperature to 10 K as it is done for TSC examinations. The frequency-dependent capacitance response of charge carrier traps in organic Schottky diodes of pentacene and ZnPc are studied via impedance spectroscopy. In undoped systems, deep traps with depths of approx. 0.6 eV and densities in the order of 1016...1017 cm−3 are prevailing. For pentacene, the deep trap density is reduced when the material undergoes an additional purification step. Utilizing p-doping, the Fermi level is tuned in a way that deep traps are saturated. Vice versa, the freeze-out of p-doped ZnPc provides further insight into the influence of trap-filling, impurity saturation and reserve on the Fermi level position in organic semiconductors. Furthermore, charge carrier traps are investigated via thermally stimulated currents. It is shown that the trap depths are obtained correctly only if the dispersive transport of the released charge carriers until their extraction is considered. For the first time, the polarity of charge carrier traps in MeO-TPD, ZnPc, and m-MTDATA is identified from TSC’s differences in release time when spacer layers are introduced in the TSC samples. Simultaneously, tiny hole mobilities in the order of 10−13 cm2 Vs−1 are detected for low-temperature thin-films of the hole transporter material Spiro-TTB. It is shown for Spiro-TTB co-evaporated with the acceptor molecule F6-TCNNQ and a p-doped ZnPc:C60 absorber blend that the doping process creates shallow trap levels. Finally, various organic hole transport materials are examined upon their stability in water and oxygen atmosphere during sample fabrication and storage of the organic electronics. In case of pentacene, ZnPc, MeO-TPD, and m-MTDATA, hole traps are already present in unexposed thin-films, which increase in trap density upon oxygen exposure. A global trap level caused by oxygen impurities is found at energies of 4.7...4.8 eV that is detrimental to hole transport in organic semiconductors. / Elektronische Bauelemente aus Dünnschichten organischer Halbleiter sind Teil möglicher Schlüsseltechnologien zur regenerativen Energiegewinnung und energieeffizienten Informationstechnik. Während Fernseh- und Mobilfunkanwendungen organischer Leuchtdioden (OLEDs) bereits vor einiger Zeit Marktreife erlangt haben, ist die organische Photovoltaik (OPV) noch durch zu hohe Fertigungskosten in Relation zu unzureichenden Effizienzen unrentabel. Ein wesentlicher Grund für die niedrigen Wirkungsgrade sind Verluste durch die im Vergleich zu Silizium hohe Zahl an Ladungsträgerfallen in organischen Halbleitern. Ziel dieser Arbeit ist es, mittels Impedanz-Spektroskopie (IS), thermisch stimulierten Strömen (TSC) und Photoelektronenspektroskopie methodenübergreifend Ladungsträgerfallen in vakuumverdampften organischen Dünnschichten zu identifizieren, zu quantifizieren und ihre Ursachen zu ergründen. Um die Energie von Ladungsträgerfallen absolut beziffern zu können, wird zunächst für verschiedene Lochtransportmaterialien wie z.B. MeO-TPD, Pentazen und ZnPc die Transportenergie aus den in erster Ordnung gaußförmigen Zustandsdichten berechnet. Im Gegensatz zu anorganischen Halbleitern ist die Transportenergie in organischen Halbleitern temperaturabhängig. Sie verschiebt sich beim Übergang von Raumtemperatur zu 10 K, wie für TSC Untersuchungen bedeutsam, um bis zu 300 meV in Richtung der Bandlückenmitte. Mittels Impedanz-Spektroskopie wird die frequenzabhängige Kapazitätsantwort von Ladungsträgerfallen in organischen Schottky-Dioden aus Pentazen und ZnPc untersucht. In undotierten Systemen dominieren Defekte mit Tiefen um 0.6 eV, deren Dichte in der Größenordnung von 1016...1017 cm−3 liegt, sich aber im Fall von Pentazen durch einen zusätzlichen Materialaufreinigungsschritt halbieren lässt. Über p-Dotierung wird das Fermi-Level so eingestellt, dass tiefe Fallen abgesättigt werden können. Umgekehrt liefert das Ausfrieren von p-dotiertem ZnPc weitere Belege für den Einfluss von Fallenzuständen, Störstellen-Erschöpfung und Reserve auf das Fermi-Level in dotierten organischen Halbleitern. Im Weiteren werden Ladungsträgerfallen über thermisch stimulierte Ströme untersucht. Es wird gezeigt, dass die Fallentiefen nur dann konsistent bestimmt werden, wenn der dispersive Transport von freigesetzten Ladungsträgern zur Extraktionsstelle berücksichtigt wird. Durch Einführung von ’Abstandshalterschichten’ werden erstmalig über TSC die Polaritäten von Ladungsträgerfallen in MeO-TPD, ZnPc und m-MTDATA per Laufzeitunterschied bestimmt. Gleichzeitig werden geringste Löcherbeweglichkeiten in der Größenordnung von 10−13 cm2 Vs−1 für stark gekühlte Dünnschichten des Lochtransporters Spiro-TTB gemessen. Wie für Spiro-TTB koverdampft mit dem Akzeptormolekül F6-TCNNQ und p-dotierte Mischschichten der Absorbermaterialien ZnPc und C60 gezeigt, erzeugt Dotierung relativ flache Störstellen. Abschließend werden verschiedene organische Lochtransporter-Materialien auf ihre Stabilität in Wasser- und Sauerstoffatmosphären während der Prozessierung und der Lagerung fertiger elektronischer Bauelemente untersucht. Für Pentazen, ZnPc, MeO-TPD und m-MTDATA werden Löcherfallen in intrinsischen Dünnschichten nachgewiesen. Bei Kontakt mit Sauerstoff nimmt deren Defektdichte zu. Es findet sich ein universales Fallenniveau bei rund 4.7...4.8 eV, verursacht durch Sauerstoffverunreinigungen, welches den Lochtransport in organischen Halbleitern limitiert.