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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
21

Digital DLTS studies on radiation induced defects in Si, GaAs and GaN

Meyer, Walter Ernst. January 2006 (has links)
Thesis (Ph.D.)(Physics)--University of Pretoria, 2006. / Includes summary. Includes bibliographical references. Available on the Internet via the World Wide Web.
22

Investigation of deep level defects in GaN:C, GaN:Mg and pseudomorphic AlGaN/GaN films

Armstrong, Andrew M. 21 November 2006 (has links)
No description available.
23

Comparing the Development of Intragroup Trust and Performance Feedback Influence in Interdisciplinary and Homogeneous Teams

Thompson, Nicole J. 21 September 2011 (has links)
The present study seeks to advance understanding of intragroup trust and team diversity. The dynamic interrelationships between intragroup trust, information sharing, and performance were examined over feedback cycles in interdisciplinary and homogeneous teams. In a three-hour lab session, participants completed a management simulation task in teams of four. Performance feedback was administered and process variables were measured periodically throughout the task. Several hypotheses were posed predicting differences between team type as well as the dynamic influence of performance feedback on the nature of trust. Findings both add to knowledge about the development of trust as well as point to future research directions. Although trust displayed an overall positive linear trend independent of team type, Cycle 1 performance feedback contributed to the trust trajectory. Additionally, considerations for operationalizations of information sharing and team performance are discussed in light of findings. / Master of Science
24

Scanned Probe Spectroscopy of Traps in Cross-Sectioned AlGaN/GaN Devices

Gleason, Darryl A. 04 September 2019 (has links)
No description available.
25

Quantitative spectroscopy of reliability limiting traps in operational gallium nitride based transistors using thermal and optical methods

Sasikumar, Anup January 2014 (has links)
No description available.
26

Characterizing and Understanding Performance Limiting Defects in β-Ga<sub>2</sub>O<sub>3</sub> Transistors

McGlone, Joseph Francis, II January 2022 (has links)
No description available.
27

Investigation of electrically-active defects in AlGaN/GaN high electron mobility transistors by spatially-resolved spectroscopic scanned probe techniques.

Cardwell, Drew 16 September 2013 (has links)
No description available.
28

Deep level defects study of arsenic implanted ZnO single crystal

Zhu, Congyong., 朱從佣. January 2008 (has links)
published_or_final_version / Physics / Master / Master of Philosophy
29

Development of optimized deconvoluted coincidence doppler broadening spectroscopy and deep level transient spectroscopies with applicationsto various semiconductor materials

Zhang, Jingdong., 張敬東. January 2006 (has links)
published_or_final_version / abstract / Physics / Doctoral / Doctor of Philosophy
30

Fourier deep level transient spectroscopy and its application to gold in silicon

Divekar, Prasad K. 03 July 2002 (has links)
A primarily software based Fourier Deep Level Transient Spectroscope (FDLTS) is built. The raw capacitance transient is acquired and digitized using capacitance meter HP4280A whereas the signal analysis is done using a customized software module. The software module calculates both the conventional DLTS spectrum and the Fourier DLTS spectrum. This home-made FDLTS set up was compared to a commercial conventional box-car DLTS system (Sula Technology's DLTS) as well as to a commercial Fourier DLTS system (Bio-rad) and it was found to be either equivalent to the commercial systems or even better in some respects. In one case, Fourier analysis using the home-made setup, led to the detection of a trap completely undetected by the commercial conventional DLTS. The FDLTS system together with the commercial conventional DLTS were used to study possible gold contamination in an industrial process. The study was accomplished by comparing conventional and Fourier DLTS spectra and corresponding calculated trap properties using Schottky barrier diodes fabricated on the suspect wafers and an intentionally gold diffused reference sample wafer. During the investigation minority carrier emission in DLTS using Schottky barrier diodes was observed. The study revealed the presence of some possible gold-like contamination which trapped minority carriers (i.e. electrons) in p type silicon. / Graduation date: 2003

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