In the last years, there is a rise of interest in investigation and fabrication of nanometer sized magnetic structures due to their various applications (e.g. for data storage or micro sensors). Over the last several decades ion beam implantation became an important tool for the modification of materials and in particular for the manipulation of magnetic properties. Nanopatterning and implantation can be done simultaneously using focused-ion beam (FIB) techniques. FIB implantation and standard ion implantation differ in their beam current densities by 7 orders of magnitude. This difference can strongly influence the structural and magnetic properties, e.g. due to a rise of the local temperature in the sample during ion implantation. In previous investigations both types of implantation techniques were studied separately. The aim of the current research was to compare both implantation techniques in terms of structural changes and changes in magnetic properties using the same material system. Moreover, to separate any possible annealing effects from implantation ones, the influence of temperature on the structural and magnetic properties were additionally investigated. For the current study a model material system which is widely used for industrial applications was chosen: a 50 nm thick non-ordered nano-crystalline permalloy (Ni81Fe19) film grown on a SiO2 buffer layer based onto a (100)-oriented Si substrate. The permalloy films were implanted with a 30 keV Ga+ ion beam; and also a series of as-deposited permalloy films were annealed in an ultra-high vacuum (UHV) chamber. Several investigation techniques were applied to study the film structure and composition, and were mostly based on non-destructive X-ray investigation techniques, which are the primary focus of this work. Besides X-ray diffraction (XRD), providing the long-range order crystal structural information, extended X-ray absorption fine structure (EXAFS) measurements to probe the local structure were performed. Moreover, the film thickness, surface roughness, and interface roughness were obtained from the X-ray reflectivity (XRR) measurements. Additionally cross-sectional transmission electron microscope (XTEM) imaging was used for local structural characterizations. The Ga depth distribution of the samples implanted with a standard ion implanter was measured by the use of Auger electron spectroscopy (AES) and Rutherford backscattering (RBS), and was compared with theoretical TRIDYN calculation. The magnetic properties were characterized via polar magneto-optic Kerr effect (MOKE) measurements at room temperature. It was shown that both implantation techniques lead to a further material crystallization of the partially amorphous permalloy material (i.e. to an increase of the amount of the crystalline material), to a crystallite growth and to a material texturing towards the (111) direction. For low ion fluences a strong increase of the amount of the crystalline material was observed, while for high ion fluences this rise is much weaker. At low ion fluences XTEM images show small isolated crystallites, while for high ones the crystallites start to grow through the entire film. The EXAFS analysis shows that both Ni and Ga atom surroundings have a perfect near-order coordination corresponding to an fcc symmetry. The lattice parameter for both implantation techniques increases with increasing ion fluence according to the same linear law. The lattice parameters obtained from the EXAFS measurements for both implantation types are in a good agreement with the results obtained from the XRD measurements. Grazing incidence XRD (GIXRD) measurements of the samples implanted with a standard ion implanter show an increasing value of microstrain with increasing ion fluence (i.e. the lattice parameter variation is increasing with fluence). Both types of implantation result in an increase of the surface and the interface roughness and demonstrate a decrease of the saturation polarization with increasing ion fluence. From the obtained results it follows that FIB and standard ion implantation influence structure and magnetic properties in a similar way: both lead to a material crystallization, crystallite growth, texturing and decrease of the saturation polarization with increasing ion fluence. A further crystallization of the highly defective nano-crystalline material can be simply understood as a result of exchange processes induced by the energy transferred to the system during the ion implantation. The decrease of the saturation polarization of the implanted samples is mainly attributed to the simple presence of the Ga atoms on the lattice sites of the permalloy film itself. For the annealed samples more complex results were found. The corresponding results can be separated into two temperature regimes: into low (≤400°C) and high (>400°C) temperatures. Similar to the implanted samples, annealing results in a material crystallization with large crystallites growing through the entire film and in a material texturing towards the (111) direction. The EXAFS analysis shows a perfect near-order coordination corresponding to an fcc symmetry. The lattice parameter of the annealed samples slightly decreases at low annealing temperatures, reaches its minimum at about ~400°C and slightly rises at higher ones. From the GIXRD measurements it can be observed that the permalloy material at temperatures above >400°C reaches its strain-free state. On the other hand, the film roughness increases with increasing annealing temperature and a de-wetting of the film is observed at high annealing temperatures. Regardless of the material crystallization and texturing, the samples annealed at low temperatures demonstrate no change in saturation polarization, while at high temperatures a rise by approximately ~15% at 800°C was observed. The rise of the saturation polarization at high annealing temperatures is attributed to the de-wetting effect.

Background: Based on the assumptions that depersonalization symptoms are relevant for test anxiety maintenance, we examined their frequency, psychological predictors, association with anxiety symptoms, and association with test performance. Sampling and Methods: In Study 1, 203 students rated their test anxiety severity and depersonalization in their last oral examination. In Study 2, we assessed test anxiety 1 week before an oral examination, depersonalization, safety behaviors, self-focused attention, and negative appraisals of depersonalization directly after the examination, and post-event processing 1 week later among 67 students. Results: In Study 1, 47.3% reported at least one moderate depersonalization symptom. In Study 2, test anxiety and negative appraisals of depersonalization significantly predicted depersonalization. Depersonalization was linked to a higher intensity of safety behaviors and post-event processing but not to self-focused attention. It was not related to performance. Conclusion: Results are limited by the non-random sampling and the small sample size of Study 2. However, by showing that depersonalization contributes to the processes the maintenance of test anxiety, the findings confirm that depersonalization – normally understood as an adaptive mechanism to cope with stressful events – can become maladaptive.

In the last years, there is a rise of interest in investigation and fabrication of nanometer sized magnetic structures due to their various applications (e.g. for data storage or micro sensors). Over the last several decades ion beam implantation became an important tool for the modification of materials and in particular for the manipulation of magnetic properties. Nanopatterning and implantation can be done simultaneously using focused-ion beam (FIB) techniques. FIB implantation and standard ion implantation differ in their beam current densities by 7 orders of magnitude. This difference can strongly influence the structural and magnetic properties, e.g. due to a rise of the local temperature in the sample during ion implantation. In previous investigations both types of implantation techniques were studied separately. The aim of the current research was to compare both implantation techniques in terms of structural changes and changes in magnetic properties using the same material system. Moreover, to separate any possible annealing effects from implantation ones, the influence of temperature on the structural and magnetic properties were additionally investigated. For the current study a model material system which is widely used for industrial applications was chosen: a 50 nm thick non-ordered nano-crystalline permalloy (Ni81Fe19) film grown on a SiO2 buffer layer based onto a (100)-oriented Si substrate. The permalloy films were implanted with a 30 keV Ga+ ion beam; and also a series of as-deposited permalloy films were annealed in an ultra-high vacuum (UHV) chamber. Several investigation techniques were applied to study the film structure and composition, and were mostly based on non-destructive X-ray investigation techniques, which are the primary focus of this work. Besides X-ray diffraction (XRD), providing the long-range order crystal structural information, extended X-ray absorption fine structure (EXAFS) measurements to probe the local structure were performed. Moreover, the film thickness, surface roughness, and interface roughness were obtained from the X-ray reflectivity (XRR) measurements. Additionally cross-sectional transmission electron microscope (XTEM) imaging was used for local structural characterizations. The Ga depth distribution of the samples implanted with a standard ion implanter was measured by the use of Auger electron spectroscopy (AES) and Rutherford backscattering (RBS), and was compared with theoretical TRIDYN calculation. The magnetic properties were characterized via polar magneto-optic Kerr effect (MOKE) measurements at room temperature. It was shown that both implantation techniques lead to a further material crystallization of the partially amorphous permalloy material (i.e. to an increase of the amount of the crystalline material), to a crystallite growth and to a material texturing towards the (111) direction. For low ion fluences a strong increase of the amount of the crystalline material was observed, while for high ion fluences this rise is much weaker. At low ion fluences XTEM images show small isolated crystallites, while for high ones the crystallites start to grow through the entire film. The EXAFS analysis shows that both Ni and Ga atom surroundings have a perfect near-order coordination corresponding to an fcc symmetry. The lattice parameter for both implantation techniques increases with increasing ion fluence according to the same linear law. The lattice parameters obtained from the EXAFS measurements for both implantation types are in a good agreement with the results obtained from the XRD measurements. Grazing incidence XRD (GIXRD) measurements of the samples implanted with a standard ion implanter show an increasing value of microstrain with increasing ion fluence (i.e. the lattice parameter variation is increasing with fluence). Both types of implantation result in an increase of the surface and the interface roughness and demonstrate a decrease of the saturation polarization with increasing ion fluence. From the obtained results it follows that FIB and standard ion implantation influence structure and magnetic properties in a similar way: both lead to a material crystallization, crystallite growth, texturing and decrease of the saturation polarization with increasing ion fluence. A further crystallization of the highly defective nano-crystalline material can be simply understood as a result of exchange processes induced by the energy transferred to the system during the ion implantation. The decrease of the saturation polarization of the implanted samples is mainly attributed to the simple presence of the Ga atoms on the lattice sites of the permalloy film itself. For the annealed samples more complex results were found. The corresponding results can be separated into two temperature regimes: into low (≤400°C) and high (>400°C) temperatures. Similar to the implanted samples, annealing results in a material crystallization with large crystallites growing through the entire film and in a material texturing towards the (111) direction. The EXAFS analysis shows a perfect near-order coordination corresponding to an fcc symmetry. The lattice parameter of the annealed samples slightly decreases at low annealing temperatures, reaches its minimum at about ~400°C and slightly rises at higher ones. From the GIXRD measurements it can be observed that the permalloy material at temperatures above >400°C reaches its strain-free state. On the other hand, the film roughness increases with increasing annealing temperature and a de-wetting of the film is observed at high annealing temperatures. Regardless of the material crystallization and texturing, the samples annealed at low temperatures demonstrate no change in saturation polarization, while at high temperatures a rise by approximately ~15% at 800°C was observed. The rise of the saturation polarization at high annealing temperatures is attributed to the de-wetting effect.

Die vorliegende Dissertation befasst sich mit dem Wachstum und der Charakterisierung von Silizium- und Germanium-Nanodrähten. Diese Strukturen gelten als aussichtsreiche Komponenten für zukünftige Bauelemente. Für die Anwendung ist die genaue Kenntnis der Größe, der kristallographischen Orientierung und der Position der Nanodrähte erforderlich. Ziel dieser Arbeit war daher die Untersuchung von Si- und Ge-Nanodrähten im Hinblick auf ihre Größe, Orientierung und Position. Die Herstellung erfolgte durch Physikalische Gasphasenabscheidung (PVD) im Ultrahochvakuum nach dem Vapor-Liquid-Solid (VLS)-Verfahren, das auf dem Wachstum aus Lösungsmitteltröpfchen basiert. Die Größe der Nanodrähte konnte im Falle von Silizium auf Si(111) mit Gold als Lösungsmittel durch die Parameter des Experiments reproduzierbar bestimmt werden. Höhere Goldbedeckung und höhere Substrattemperaturen führten zu Tröpfchen mit größerem Duchmesser und somit zu dickeren Drähten. Längere Si-Verdampfungszeiten und höhere Si-Verdampfungsraten führten zu längeren Drähten. Dünnere Drähte wuchsen schneller als dickere. Als zweites Lösungsmittel wurde Indium untersucht, da es sich im Vergleich zu Gold nicht nachteilig auf die elektronischen Eigenschaften von Silizium auswirkt. Basierend auf den Ergebnissen zur Tröpfchenbildung konnten die besseren Wachstumsresultate mit Gold erklärt werden. Germanium-Nanodrähte, die aus Goldtröpfchen auf Ge(111) gezüchtet wurden, zeigten im Gegensatz zu den Si-Nanodrähten nicht die kristallographische [111]-Orientierung des Substrates, sondern eine -Orientierung, was durch Berechnungen von Keimbildungsenergien auf verschiedenen Kristallflächen erklärt werden konnte. Zur Anordnung von Metalltröpfchen und damit von Nanodrähten wurden Substrate mithilfe von fokussierten Ionenstrahlen (FIB) vorstrukturiert, um die Tröpfchenbildung an bestimmten Stellen zu begünstigen. Es gelang, aus angeordneten Goldtröpfchen epitaktisch gewachsene Si- und Ge-Nanodrähte zu züchten. / This dissertation deals with the growth and the characterization of silicon and germanium nanowhiskers, also called nanorods or nanowires. The investigation of these structures is of great interest as they represent promising building blocks for future electronic devices. With regard to a possible application, the knowledge of size, crystallographic orientation and position of the nanowhiskers is essential. The purpose of this work was, therefore, to investigate the growth of Si and Ge nanowhiskers with regard to their size, orientation and position. The nanowhiskers were grown via physical vapor deposition (PVD) in ultra-high vacuum using the vapor-liquid-solid (VLS) mechanism which is based on growth from solution droplets. The size of the nanowhiskers could be reproducibly determined by the experimental parameters in the case of Si nanowhiskers on Si(111) with gold as the solvent. A higher gold coverage as well as a higher substrate temperature led to larger droplet diameters and thus to thicker whiskers. A longer silicon evaporation time and a higher silicon rate led to longer whiskers. Thinner whiskers grew faster than thicker ones. A second material used as the solvent was indium as it is more suitable for electronic application compared to gold. Based on results of droplet formation of the two solvents on silicon, the better results of whisker growth using gold could be explained. Ge nanowhiskers grown from gold droplets on Ge(111) did not show the [111] orientation of the substrate as in the case of Si nanowhiskers on Si(111) but a orientation. By calculating nucleation energies on different crystal facets, the experimental findings could be explained. To position nanodroplets of the solvent material and thus to obtain a regular arrangement of nanowhiskers, substrates were pre-structured with nanopores by focused ion beams (FIB). Silicon and germanium nanowhiskers could be epitaxially grown from ordered arrays of gold droplets.

Background: Focal therapy (FT) is an option to treat localized prostate cancer (PCa) and preserve healthy prostate tissue in order to reduce known side effects from primary whole-gland treatment. The available FT modalities are manifold. Until now, national and international PCa guidelines have been cautious to propose recommendations regarding FT treatment since data from prospective controlled trials are lacking for most FT modalities. Moreover, none of the international guidelines provides a separate section on FT. In this purpose, we provide a synopsis of the consensusbased German S3 guidelines for a possible international use. - Summary: The recently published update of the German S3 guidelines, an evidence- and consensus-based guideline, provides a section on FT with recommendations for diagnostic work-up, indications, modalities, and follow-up. This section consists of 12 statements and recommendations for FT in the treatment of localized PCa. Key Message: The German S3 guidelines on PCa are the first to incorporate recommendations for FT based on evidence and expert consensus including indication criteria for FT, pretreatment, and followup diagnostic pathways as well as an extended overview of FT techniques and the current supportive evidence.

No description available.