NDLTD Global ETD Search
  • Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 3376
  • 1332
  • 514
  • 299
  • 274
  • 183
  • 158
  • 158
  • 158
  • 158
  • 158
  • 157
  • 101
  • 82
  • 54
  • Tagged with
  • 7682
  • 1927
  • 1465
  • 887
  • 774
  • 764
  • 747
  • 655
  • 551
  • 541
  • 527
  • 505
  • 403
  • 393
  • 370
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 191 to 200 of 7682 (0.045 seconds)
191

Reliability and test of high-performance integrated circuits

Mohanram, Kartik 28 August 2008 (has links)
Not available / text
Integrated circuits--Testing
192

Design of radix 4 divirs using high redundancy in 65 nanometer CMOS technology

Pham, Tung Nang 28 August 2008 (has links)
Not available / text
193

Parametric testing, characterization and reliability of integrated circuits

Datta, Ramyanshu 28 August 2008 (has links)
Not available / text
Integrated circuits--Testing
Integrated circuits--Reliability
Integrated circuits--Defects
194

Synthesis for circuit reliability

Dutta, Avijit 28 August 2008 (has links)
Not available / text
Integrated circuits--Reliability
195

DESIGN AND ANALYSIS OF INTEGRATED ELECTROTHERMAL FILTERS

Aramrattana, Manoon January 1979 (has links)
No description available.
196

ELECTRICAL CHARACTERISTICS OF INTEGRATED CIRCUIT PACKAGES

Senthinathan, Ramesh, 1961- January 1987 (has links)
No description available.
Integrated circuits.
Electronic circuits.
197

PERFORMANCE OF INTEGRATED ELECTRO-THERMAL CIRCUITS

Fletcher, Anthony Ray, 1942- January 1970 (has links)
No description available.
198

Synthesis for circuit reliability

Dutta, Avijit 18 August 2011 (has links)
Not available / text
Integrated circuits--Reliability
199

Defect detection in semiconductor die images

Ng, Nga-yi, Ada., 伍雅怡. January 2005 (has links)
published_or_final_version / abstract / Electrical and Electronic Engineering / Master / Master of Philosophy
Integrated circuits - Testing.
Algorithms.
200

Electro-thermal integrated circuits

Gray, Paul R., 1942- January 1969 (has links)
No description available.

Page generated in 0.0725 seconds