O dióxido de titânio possui diversas aplicações tecnológicas, desde pigmento em tintas, até revestimentos funcionais. É um material resistente à degradação eletroquímica e fotoquímica. Com o aumento da produção industrial de corantes, há um aumento significativo da produção de rejeitos, sendo necessário o desenvolvimento de novas técnicas de degradação, a fim de reduzir a formação de efluentes. Dentre essas técnicas encontram-se os processos oxidativos avançados (POAs), que se baseiam na formação de radicais hidroxila para a degradação dos compostos liberados nos efluentes. A fotocatálise heterogênea utiliza um material semicondutor ativado por radiação ultra-violeta a fim de produzir os radicais hidroxila. Apesar de existirem estudos relacionados à utilização do TiO2 como fotocatalisador, há poucos dados com relação à sua aplicação na forma de filme suportado. Este trabalho teve por objetivos crescer filmes de TiO2 sobre borossilicato, por meio da técnica de deposição química de organometálicos em fase vapor, nas temperaturas de 400 e 500ºC por até 60 minutos, bem como proceder à caracterização microestrutural, morfológica e fotocatalítica desses filmes. Anatase foi a fase identificada em todos os filmes. Os filmes crescidos a 400°C apresentaram estrutura densificada, enquanto que os filmes crescidos a 500°C apresentaram estrutura colunar bem definida. A fotodegradação foi avaliada por meio da degradação do corante alaranjado de metila nos valores de pH 2,00; 7,00 e 10,00. Os resultados de degradação do corante mostraram que a maior eficiência do processo de degradação ocorre em pH = 2. Nessa condição, os melhores resultados ocorrem com o filme crescido por 30 minutos a 400°C, que apresentou 65,3% de degradação. / Titanium dioxide has many technological applications, as pigment in paints, and functional coatings. It is resistant to electrochemical and photochemical degradation. The increase of the industrial production of dyes results in a significant increase in production of wastes, which requires the development of new degradation techniques to reduce the release of effluents. Among these techniques there is the advanced oxidation process (AOP), which is based on the formation of hydroxyl radicals to the degradation of the compounds in the effluent released. The heterogeneous photocatalysis uses a semiconductor material activated by UV radiation to yield hydroxyl radicals. Although there are studies regarding the use of TiO2 as photocatalyst, there are few data related to its application in the form of supported film. The aim of this study was to grow TiO2 films on borosilicate substrate at 400 and 500°C for up to 60 minutes by using metallorganic chemical vapor deposition technique and proceed to the microstructural, morphology and photocatalytic characterization of the films. Anatase phase was identified in all films. The films grown at 400°C presented a densified structure, while the films grown at 500°C showed well defined columnar structure. The photodegradation was assessed by degradation of methyl orange dye in pH 2.00; 7.00 and 10.00. The results of dye degradation showed that the highest efficiency occurred at pH 2. In this condition, the best results occurred for the film grown for 30 minutes at 400°C and presented a degradation of 65.3%.

O dióxido de titânio possui diversas aplicações tecnológicas, desde pigmento em tintas, até revestimentos funcionais. É um material resistente à degradação eletroquímica e fotoquímica. Com o aumento da produção industrial de corantes, há um aumento significativo da produção de rejeitos, sendo necessário o desenvolvimento de novas técnicas de degradação, a fim de reduzir a formação de efluentes. Dentre essas técnicas encontram-se os processos oxidativos avançados (POAs), que se baseiam na formação de radicais hidroxila para a degradação dos compostos liberados nos efluentes. A fotocatálise heterogênea utiliza um material semicondutor ativado por radiação ultra-violeta a fim de produzir os radicais hidroxila. Apesar de existirem estudos relacionados à utilização do TiO2 como fotocatalisador, há poucos dados com relação à sua aplicação na forma de filme suportado. Este trabalho teve por objetivos crescer filmes de TiO2 sobre borossilicato, por meio da técnica de deposição química de organometálicos em fase vapor, nas temperaturas de 400 e 500ºC por até 60 minutos, bem como proceder à caracterização microestrutural, morfológica e fotocatalítica desses filmes. Anatase foi a fase identificada em todos os filmes. Os filmes crescidos a 400°C apresentaram estrutura densificada, enquanto que os filmes crescidos a 500°C apresentaram estrutura colunar bem definida. A fotodegradação foi avaliada por meio da degradação do corante alaranjado de metila nos valores de pH 2,00; 7,00 e 10,00. Os resultados de degradação do corante mostraram que a maior eficiência do processo de degradação ocorre em pH = 2. Nessa condição, os melhores resultados ocorrem com o filme crescido por 30 minutos a 400°C, que apresentou 65,3% de degradação. / Titanium dioxide has many technological applications, as pigment in paints, and functional coatings. It is resistant to electrochemical and photochemical degradation. The increase of the industrial production of dyes results in a significant increase in production of wastes, which requires the development of new degradation techniques to reduce the release of effluents. Among these techniques there is the advanced oxidation process (AOP), which is based on the formation of hydroxyl radicals to the degradation of the compounds in the effluent released. The heterogeneous photocatalysis uses a semiconductor material activated by UV radiation to yield hydroxyl radicals. Although there are studies regarding the use of TiO2 as photocatalyst, there are few data related to its application in the form of supported film. The aim of this study was to grow TiO2 films on borosilicate substrate at 400 and 500°C for up to 60 minutes by using metallorganic chemical vapor deposition technique and proceed to the microstructural, morphology and photocatalytic characterization of the films. Anatase phase was identified in all films. The films grown at 400°C presented a densified structure, while the films grown at 500°C showed well defined columnar structure. The photodegradation was assessed by degradation of methyl orange dye in pH 2.00; 7.00 and 10.00. The results of dye degradation showed that the highest efficiency occurred at pH 2. In this condition, the best results occurred for the film grown for 30 minutes at 400°C and presented a degradation of 65.3%.

No description available.

Doctor of Philosophy / Department of Physics / Hongxing Jiang / InGaN based, blue and green light emitting diodes (LEDs) have been successfully produced over the past decade. But the progress of these LEDs is often limited by the fundamental problems of InGaN such as differences in lattice constants, thermal expansion coefficients and physical properties between InN and GaN. This difficulty could be addressed by studying pure InN and In[subscript]xGa[subscript]1-xN alloys. In this context Ga-rich In[subscript]xGa[subscript]1-xN (x≤ 0.4) epilayers were grown by metal organic chemical vapor deposition (MOCVD). X-ray diffraction (XRD) measurements showed In[subscript]xGa[subscript]1-xN films with x= 0.37 had single phase. Phase separation occurred for x ~ 0.4. To understand the issue of phase separation in Ga-rich In[subscript]xGa[subscript]1-xN, studies on growth of pure InN and In-rich In[subscript]xGa[subscript]1-xN alloys were carried out. InN and In-rich In[subscript]xGa[subscript]1-xN (x~0.97- 0.40) epilayers were grown on AlN/Al[subscript]2O[subscript]3 templates. A Hall mobility of 1400 cm[superscript]2/Vs with a carrier concentration of 7x1018cm[superscript]-3 was observed for InN epilayers grown on AlN templates. Photoluminescence (PL)emission spectra revealed a band to band emission peak at ~0.75 eV for InN. This peak shifted to 1.15 eV when In content was varied from 1.0 to 0.63 in In-rich In[subscript]xGa[subscript]1-xN epilayers. After growth parameter optimization of In- rich In[subscript]xGa[subscript]1-xN alloys with (x= 0.97-0.40) were successfully grown without phase separation. Effects of Mg doping on the PL properties of InN epilayers grown on GaN/Al[subscript]2O[subscript]3 templates were investigated. An emission line at ~ 0.76 eV, which was absent in undoped InN epilayers and was about 60 meV below the band edge emission peak at ~ 0.82 eV, was observed to be the dominant emission in Mg-doped InN epilayers. PL peak position and the temperature dependent emission intensity corroborated each other and suggested that Mg acceptor level in InN is about 60 meV above the valance band maximum. Strain effects on the emission properties of InGaN/GaN multiple quantum wells (MQWs) were studied using a single blue LED wafer possessing a continuous variation in compressive strain. EL emission peak position of LEDs varies linearly with the biaxial strain; a coefficient of 19 meV/GPa, characterizes the relationship between the band gap energy and biaxial stress of In[subscript]0.2Ga[subscript]0.8N/GaN MQWs.

The InGaN system provides the opportunity to fabricate light emitting devices over the whole visible and ultraviolet spectrum due to band-gap energies E[subscript g] varying between 3.42 eV for GaN and 1.89 eV for InN. However, high In content in InGaN layers will result in a significant degradation of the crystalline quality of the epitaxial layers. In addition, unlike other III-V compound semiconductors, the ratio of gallium to indium incorporated in InGaN is in general not a simple function of the metal atomic flux ratio, f[subscript Ga]/f[subscript In]. Instead, In incorporation is complicated by the tendency of gallium to incorporate preferentially and excess In to form metallic droplets on the growth surface. This phenomenon can definitely affect the In distribution in the InGaN system. Scanning electron microscopy, room temperature photoluminescence, and X-ray diffraction techniques have been used to characterize InGaN layer grown on InN and InGaN buffers. The growth was done on c-plane sapphire by MOCVD. Results showed that green emission was obtained which indicates a relatively high In incorporation. / Singapore-MIT Alliance (SMA)

This thesis presents the development of III-nitride materials for deep-ultraviolet (DUV) light emitting devices. The goal of this research is to develop a DUV laser diode (LD) operating at room temperature. Epitaxial structures for these devices are grown by metalorganic chemical vapor deposition (MOCVD) and several material analysis techniques were employed to characterize these structures such as atomic force microscopy, electroluminescence, Hall-effect measurement, photoluminescence, secondary ion mass spectrometry, transmission electron microscopy, transmission line measurement, and X-ray diffraction. Each of these will be discussed in detail. The active regions of III-nitride based UV emitters are composed of AlxGa1-xN alloys, the bandgap of which can be tuned from 3.4 eV to 6.2 eV, which allows us to attain the desired wavelength in the DUV by engineering the molar fraction of aluminum and gallium. In order to emit photons in the DUV wavelength range (> 4.1 eV), high aluminum molar fraction AlxGa1-xN alloys are required. Since aluminum has very low ad-atom mobility on the growth surface, a very low group V to group III precursor ratio (known as V/III ratio), high growth temperature, and low growth pressure is required to form a smooth surface and subsequently abrupt heterointerfaces. The first part of this work focuses on developing high-quality multi-quantum well structures using high aluminum molar fraction ([Al] > 60%) AlxGa1-xN alloys. Optically pumped DUV lasers were demonstrated with threshold power density as low as 250 kW/cm² for the emission wavelength as short as 248.3 nm. Transverse electric (TE) -like emission dominates when the lasers were operating above threshold power density, which suggests the diode design requires the active region to be fully strained to promote better confinement of the optical mode in transverse direction. The second phase of this project is to achieve an electrically driven injection diode laser. Owing to their large bandgap, low intrinsic carrier concentration, and relatively high dopant activation energy, the nature of these high aluminum molar fraction materials are highly insulating; therefore, efficiently transport carriers into active region is one of the main challenges. Highly conducting p-type material is especially difficult to achieve because the activation energy for magnesium, a typical dopant, is relatively large and some of the acceptors are compensated by the hydrogen during the growth. Furthermore, due to the lack of a large work function material to form a p-type ohmic contact, the p-contact layer design is limited to low aluminum molar fraction material or gallium nitride. Besides the fabrication challenges, these low aluminum molar fraction materials are not transparent to the laser wavelength causing relatively high internal loss (αi). In this work, an inverse tapered p-waveguide design is employed to transport holes to active region efficiently while the graded-index separate-confinement heterostructure (GRINSCH) is employed for the active region design. Together, a multi-quantum well (MQW) ultraviolet emitter was demonstrated.

The material and device characteristics of InGaN/GaN heterojunction bipolar transistors (HBTs) grown by metalorganic chemical vapor deposition are examined. Two structures grown on sapphire with different p-InxGa1-xN base-region compositions, xIn = 0.03 and 0.05, are presented in a comparative study. In a second experiment, NpN-GaN/InGaN/GaN HBTs are grown and fabricated on free-standing GaN (FS-GaN) and sapphire substrates to investigate the effect of dislocations on III-nitride HBT epitaxial structures. The performance characteristics of HBTs on FS-GaN with a 20×20 m2 emitter area exhibit a maximum collector-current density of ~12.3 kA/cm2, a D.C. current gain of ~90, and a maximum differential gain of ~120 without surface passivation. For the development of deep-ultraviolet optoelectronics, several various structures of optically-pumped lasers at 257, 246, and 243 nm are demonstrated on (0001) AlN substrates. The threshold-power density at room temperature was reduced to as low as 297 kW/cm2. The dominating polarization was measured to be transverse electric in all cases. InAlN material was developed to provide lattice matched, high-bandgap energy cladding layers for a III-N UV laser structure. This would alleviate strain and dislocation formation in the structure, and also mitigate the polarization charge. However, a gallium auto-doping mechanism was encountered which prevents the growth of pure ternary InAlN, resulting instead in quaternary InAlGaN. This phenomenon is quantitatively examined and its source is explored.

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No description available.

No description available.