In this thesis, we present a high-speed non-classical unipolar CMOS with a thick sidewall-spacer gate-oxide NMOS load. This unipolar CMOS is composed of a NMOS driver and a thick sidewall-spacer gate-oxide NMOS which replaces a PMOS as load. We focus on the investigation of punch-through current in unipolar CMOS trends. In addition, we also design a conventional CMOS for comparison. According to the simulations, the logical characteristics of our proposed CMOS are valid, in which the average propagation delay time is improved 20 % compared with the conventional CMOS. This is due to the presence of a thick sidewall-spacer gate-oxide NMOS load. For the viewpoint of device fabrication, the N well process can also be eliminated. This means that the proposed NMOS load not only improves the CMOS speed, but also reduces the fabrication cost. Thus, because of the shared-terminal output, the layout area can be significantly decreased 41 %, in comparison with the conventional CMOS.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.

Este trabalho visa propor uma metodologia de análise da variabilidade do tempo de atraso de propagação no FPGA. Para alcançar esse objetivo são utilizados três circuitos diferentes: o circuito 1 mede a diferença de atrasos de dois circuitos, o circuito 2 identifica o atraso menor de dois circuitos e, por fim, o terceiro circuito que consiste do oscilador em anel. Cada circuito foi avaliado individualmente numa estrutura BIST, implementada nos FPGA XC3S200-FT256 e EP2C35F672C6. Os métodos utilizados para análise dos dados foram a média móvel, o plano de mínimos quadrados e o teste t-student. A metodologia permitiu mostrar a variabilidade within-die e suas componentes sistêmica e randômica. / This work aims to propose a methodology of analysis of variability of propagation-delay time in FPGA. To achieve this goal three different circuits are implemented: the circuit 1 measures the delay difference of two logic paths, the circuit 2 identifies smallest delay of two logic paths, and finally the third circuit consists of a ring oscillator. Each circuit has been assessed individually in a BIST structure, implemented in FPGAs XC3S200-FT256 and EP2C35F672C6. The methods used for data analysis were the moving average, least-squares plane and the t-student test. The methodology has allowed to evaluate the within-die variability and its systemic and random components.