The aim of this thesis is to create data acquisition application. The software module is designed for the industrial panel PC. Power Panel 520 from Bernecker + Reiner and the data acquisition board NI USB-6215 from National Instruments represent the fundamental hardware components for this project. Data acquisition and visualization tasks are controlled by a standalone application made in LabVIEW 2011. OPC, industrial standard in communication, is responsible for mutual interconnection between control (PLC) and data acquisition part. Network shared variables and Apple iPad 2 allow remote surveillance for operator. Finally, the creation of user-friendly interface and integration of technologies from different vendors, are main goals of this project.

Dynamic testing provides valuable insight into the behavior of materials undergoing fast deformation. During Split-Hopkinson Pressure Bar testing, stress waves are measured using strain gauges as voltage variations that are usually very small. Therefore, an amplifier is required to amplify the data and analyze it. One of the few available amplifiers designed for this purpose is provided by Vishay Micro-Measurements which limits the user’s options when it comes to research or industry. Among the challenges of implementing the Hopkinson technology in the industry are the size and cost of the amplifier. In this work, we propose a novel design of a signal conditioning amplifier that provides the following functionalities: voltage excitation for strain gauges, wide gain range (1-1000), signal balancing, shunting, and filtering. The main objective is to make a smaller and cheaper amplifier that provides equivalent or better performance allowing larger application of the Hopkinson technology in the industry.

Made available in DSpace on 2016-08-17T14:53:07Z (GMT). No. of bitstreams: 1 Diomadson Belfort.pdf: 1540332 bytes, checksum: 3100ff3681a43294daea6ee8313b879e (MD5) Previous issue date: 2007-09-05 / In digital measurement systems, signal conditioning circuits have the main functionality of adjusting analog signals for digital conversion. For maximizing the application of a measurement circuit or system, yet considering its integration in a single chip, these circuits must be programmable, in order to serve to different kinds of sensors with diverse output signal characteristics. The main functions of the signal conditioning circuit, in this case, are the amplification and dc level shift of the analog signal. In this master s thesis, an architecture of a signal conditioning integrated circuit with programmable gain and dc level shift, optimized in number of discrete components, using the switched capacitor technique is proposed. The proposed architecture allows the circuit use in differential and single-ended modes, with unipolar and bipolar signals. The design of an integrated circuit is carried out for implementing the proposed architecture using 0.35 mm TSMC CMOS technology, available in the ASIC design kit (ADK) of the Mentor Graphics, IC Nanometer software package. / Em sistemas digitais de medição, circuitos de condicionamento de sinais têm como principal finalidade o ajuste dos sinais analógicos para realização da conversão digital. Para maximização da aplicação de um circuito ou sistema de medição, considerando ainda sua integração em uma única pastilha, esses circuitos têm que ser programáveis, de forma a atender a diversos tipos de sensores com características de sinais de saída diversas. As principais funções do circuito de condicionamento, neste caso, são a amplificação e o ajuste de nível cc do sinal analógico. Nesta dissertação, propõe-se uma arquitetura de um circuito de condicionamento integrado com ajuste de nível cc e ganho programáveis, otimizada em número de componentes discretos, usando a técnica de capacitores chaveados. A arquitetura proposta permite a utilização do circuito nos modos diferencial e de terminação única, unipolar ou bipolar. Um projeto de um circuito integrado é realizado implementando a arquitetura proposta em tecnologia CMOS 0,35 mm TSMC, disponível no ASIC design kit (ADK) do pacote de programas da Mentor Graphics, IC Nanometer.

Orientador: Carlos Lenz Cesar / Dissertação (mestrado) - Universidade Estadual de Campinas, Instituto de Física Gleb Wataghin / Made available in DSpace on 2018-08-20T14:50:59Z (GMT). No. of bitstreams: 1 Marques_GustavoPires_M.pdf: 1771357 bytes, checksum: 8ee6919633e2615608f25b33bec98e96 (MD5) Previous issue date: 2005 / Resumo: O microscópio de força atômica é uma ferramenta que possibilita a medida de forças precisamente localizadas com resoluções no tempo, espaço e força jamais vistas. No coração deste instrumento está um sensor a base de uma viga (cantilever) que é responsável pelas características fundamentais do AFM. O objetivo desta pesquisa foi usar a deflexão deste cantilever para obter uma calibração rápida e precisa da força da armadilha da pinça óptica, assim como testar e comparar com os método tradicionalmente utilizados para este propósito. Para isso, foi necessário analisar e entender o condicionamento de sinais utilizados no AFM. Foram estudados cantilever tradicionais, cujo sistema de detecção é baseado na deflexão de um feixe laser em conjunto com fotodetectores, bem como cantilevers piezoresistivos. Cantilevers piezoresistivos fornecem uma alternativa simples e conveniente aos cantilevers ópticos. A integração de um elemento sensorial dentro do cantilever elimina a necessidade de um laser externo e de um detector utilizados na maioria dos AFMs. Isto elimina a etapa delicada de alinhamento da laser ao cantilever e fotodetector que normalmente precede uma medida com AFM, uma simplificação que expande o potencial do AFM para o uso em meios adversos, como câmaras de ultra alto vácuo ou, como no caso específico das Pinças Ópticas, onde existem esferas em solução líquida e também restrições de dimensão / Abstract: The atomic force microscope (AFM) is a tool that enables the measurement of precisely localized forces with unprecedented resolution in time, space and force. At the heart of this instrument is a cantilever probe that sets the fundamental features of the AFM. The objective of this research has been using the deflection of this cantilever to get a fast and accurate calibration of optical tweezers trap force, as well as testing and comparing to the traditionally used methods of calibration for this purpose. For that it was necessary to resolve and understand the sensors signals conditioning used in the AFM. Traditional cantilevers, whose detection system is based on the deflection of a laser beam in addition with a photodetector, as well as piezoresistive cantilevers has been studied. Piezoresistive cantilevers provide a simple and convenient alternative to optically detected cantilevers. Integration of a sensing element into the cantilever eliminates the need for the external laser and detector used in most AFMs. This removes the delicate step of aligning the laser to the cantilever and photodetector which usually precedes an AFM measurement, a simplification which expands the potential of the AFM for use in difficult environments such as ultrahigh vacuum chambers or, as in Optical Tweezers specific case, where there are spheres into a liquid solution as well as dimensional constraints / Mestrado / Física / Mestre em Física

Ultraprecision single point diamond turning is required to produce parts with sub-nanometer surface roughness and sub-micrometer surface profiles tolerances. These parts have applications in the optics industry, where tight form accuracy is required while achieving high surface finish quality. Generally, parts can be polished to achieve the desired finish, but then the form accuracy can easily be lost in the process rendering the part unusable. Currently, most mid to low spatial frequency surface finish errors are inspected offline. This is done by physically removing the workpiece from the machining fixture and mounting the part in a laser interferometer. This action introduces errors in itself through minute differences in the support conditions of the over constrained part on a machine as compared to the mounting conditions used for part measurement. Once removed, the fixture induced stresses and the part’s internal residual stresses relax and change the shape of the generally thin parts machined in these applications. Thereby, the offline inspection provides an erroneous description of the performance of the machine. This research explores the use of a single, high resolution, capacitance sensor to quickly and qualitatively measure the low to mid spatial frequencies on the workpiece surface, while it is mounted in a fixture on a standard ultraprecision single point diamond turning machine after a standard facing operation. Following initial testing, a strong qualitative correlation exists between the surface profiling on a standard offline system and this online measuring system. Despite environmental effects and the effects of the machine on the measurement system, the capacitive system with some modifications and awareness of its measurement method is a viable option for measuring mid to low spatial frequencies on a workpiece surface mounted on an ultraprecision machine with a resolution of 1nm with an error band of ±5nm with a 20kHz bandwidth. / Thesis / Master of Applied Science (MASc)