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<p dir="ltr">Technological advancements in the semiconductor industry have led to the development of fast, low-power, and high-performance electronic devices. With evolving process technologies, the size of an electronic device has greatly reduced, and the number of features a single device can support has steadily increased. To achieve this, billions of transistors are integrated into small electronic chips leading to an increase in the complexity of manufacturing processes. Electronic chips that are manufactured using such complex manufacturing processes are prone to have a large number of defects that are difficult to test, and cause reliability issues. To tackle these issues and produce highly reliable chips, there is a growing need to test each manufactured chip thoroughly. This requires the application of a large number of tests by a tester. The cost of testing an electronic chip primarily depends on the storage requirements of the tester, and the test application time required. The large number of tests required to rigorously test each chip leads to an increase in the testing cost. Earlier works reduced the testing cost by reducing the input storage requirements of the tester. The input storage requirements are reduced by using each stored test on the tester to apply several different tests to the circuit. Several different tests are also applied based on each stored test to improve the quality of a test set. The goal of this thesis is to aide in producing reliable chips, by creating test sets that can detect faults from different fault models. The test sets are created by improving the quality of a test set. </p><p><br></p><p dir="ltr">First, test sets with low storage requirements are produced for defect detection. A base test set is generated and stored. Each stored test is perturbed to produce several different tests. Algorithms are then described in two different scenarios to select a subset of the perturbed tests. The selected subset of tests improves the quality of defect detection with a minimal increase in the input storage requirements.</p><p><br></p><p dir="ltr">Next, test sets with low-storage requirements are produced for defect diagnosis. A fault detection test set is generated and stored. Each stored test is perturbed to produce several different tests. A procedure is then described to select a subset of the perturbed tests to be used as diagnostic tests. The diagnostic test set selected improves the quality of defect diagnosis with a minimal increase in the input storage requirements.</p><p><br></p><p dir="ltr">Finally, storage-aware test sets are produced targeting several fault models in two steps. In the first step, tests in a base test set are replaced with improved tests to produce an improved test set. The improved test set is stored, and it improves the quality of defect detection with no increase in the storage requirements. In the second step, each improved test is perturbed to produce several different tests. A procedure is then described to select a subset of the perturbed tests. The selected subset of tests further improves the quality of defect detection with a minimal increase in the input storage requirements.</p>

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Projekto tikslas – sukurti sistemą, skirtą schemų testinių atvejų atrinkimui naudojant „juodos dėžės“ modelius ir jiems pritaikytus gedimų modelius. Vykdant projektą buvo atlikta kūrino būdų ir technologijų analizė. Sistemos architektūra buvo kuriama atsižvelgiant į reikalavimą, naudoti schemų modelius, kurie yra parašyti c programavimo kalba. Buvo atlikta schemų failų integravimo efektyvumo analizė, tiriamos atsitiktinio testinių atvejų generavimo sekos patobulinimo galimybės, "1" pasiskirstymo 5taka atsitiktinai generuojam7 testini7 atvej7 kokybei. Tyrim7 rezultatai: • Schemų modelių integracijos tipas mažai įtakoja sistemos darbą. • Pusiau deterministinių metodų taikymas parodė, jog atskirų žingsnių optimizacija nepagerina galutinio rezultato. • "1" pasiskirstymas atsitiktinai generuojamose sekose turi įtaką testo kokybei ir gali būti naudojamas testų procesų pagerinimui. / Project objective – to develop a system, which generates functional tests for non-scan synchronous sequential circuits based on functional delay models. During project execution, the analysis of design and technology solutions was performed. The architecture of the developed software is based on the requirement to be able to use the models of the benchmark circuits that are written in C programming language. Analysis of the effectiveness of the model file integration, possibilities of improving random test sequence generation and the influence of distribution of „1“ in randomly generated test patterns was performed. The results of the analysis were: • Type of the model file integration has little effect when using large circuit models. • The implementation of semi deterministic algorithms showed that the optimisation of separate steps by construction of test subsequences doesn’t improve the final outcome. • The distribution of „1“ in randomly generated test patterns has effect on the fault coverage and can be used to improve test generation process.

Les travaux présentés dans cette thèse proposent une méthode de génération automatique de tests à partir de modèles.Cette méthode emploie deux langages de modélisations UML4MBT et OCL4MBT qui ont été spécifiquement dérivées d’ UML et OCL pour la génération de tests. Ainsi les comportements, la structure et l’état initial du système sont décrits au travers des diagrammes de classes, d’objets et d’états-transitions.Pour générer des tests, l’évolution du modèle est représente sous la forme d’un système de transitions. Ainsi la construction de tests est équivalente à la découverte de séquences de transitions qui relient l’´état initial du système à des états validant les cibles de test.Ces séquences sont obtenues par la résolution de scénarios d’animations par des prouveurs SMT et solveurs CSP. Pour créer ces scénarios, des méta-modèles UML4MBT et CSP4MBT regroupant formules logiques et notions liées aux tests ont été établies pour chacun des outils.Afin d’optimiser les temps de générations, des stratégies ont été développé pour sélectionner et hiérarchiser les scénarios à résoudre. Ces stratégies s’appuient sur la parallélisation, les propriétés des solveurs et des prouveurs et les caractéristiques de nos encodages pour optimiser les performances. 5 stratégies emploient uniquement un prouveur et 2 stratégies reposent sur une collaboration du prouveur avec un solveur.Finalement l’intérêt de cette nouvelle méthode à été validée sur des cas d’études grâce à l’implémentation réalisée. / This thesis describes an automatic test generation process from models.This process uses two modelling languages, UML4MBT and OCL4MBT, created specificallyfor tests generation. Theses languages are derived from UML and OCL. Therefore the behaviours,the structure and the initial state of the system are described by the class diagram, the objectdiagram and the state-chart.To generate tests, the evolution of the model is encoded with a transition system. Consequently,to construct a test is to find transition sequences that rely the initial state of the system to thestates described by the test targets.The sequence are obtained by the resolution of animation scenarios. This resolution is executedby SMT provers and CSP solvers. To create the scenario, two dedicated meta-models, UML4MBTand CSP4MBT have been established. Theses meta-models associate first order logic formulas withthe test notions.7 strategies have been developed to improve the tests generation time. A strategy is responsiblefor the selection and the prioritization of the scenarios. A strategy is built upon the properties ofthe solvers and provers and the specification of our encoding process. Moreover the process canalso be paralleled to get better performance. 5 strategies employ only a prover and 2 make theprover collaborate with a solver.Finally the interest of this process has been evaluated through a list of benchmark on variouscases studies.

Táto práca sa zaoberá fuzz testovaním REST API. Po prezentovaní prehľadu techník používaných pri fuzz testovaní a posúdení aktuálnych nástrojov a výskumu zameraného na REST API fuzz testovanie, sme pristúpili k návrhu a implementácii nášho REST API fuzzeru. Základom nášho riešenia je odvodzovanie závislostí z OpenAPI formátu popisu REST API, umožňujúce stavové testovanie aplikácie. Náš fuzzer minimalizuje počet po sebe nasledujúcich 404 odpovedí od aplikácie a testuje aplikáciu viac do hĺbky. Problém prehľadávania dostupných stavov aplikácie je riešený pomocou usporiadania závislostí tak, aby sa maximalizovala pravdepodobnosť získania potrebných vstupných dát pre povinné parametre, v kombinácii s rozhodovaním, ktoré povinné parametre môžu využívať aj náhodne generované hodnoty. Implementácia je rozšírením Schemathesis projektu, ktorý generuje vstupy za pomoci Hypothesis knižnice. Implementovaný fuzzer je použitý na testovanie Red Hat Insights aplikácie, kde našiel 32 chýb, z čoho jednu chybu je možné reprodukovať len za pomoci stavového testovania.

Cieľom tejto práce je vývoj nástroja na automatické generovanie testov pre aplikácie s grafickým užívateľským rozhraním v~prostredí GNOME. Na generovanie testov sú použité metadáta asistenčných technológií, konrétne AT-SPI. Navrhnutý generátor testov využíva dané metadáta na vytvorenie modelu testovanej aplikácie. Model mapuje sekvencie udalostí, ktoré generátor vykoná na testovanej aplikácii počas generovania testov. Súčasťou procesu generovania je zároveň detekcia závažných chýb v testovaných aplikáciách. Výstupom procesu generovania sú automatizované testy, ktoré sú vhodné na regresné testovanie. Funkčnosť implementovaného generátora testov bola úspešne overená testovaním 5 aplikácií s otvoreným zdrojovým kódom. Počas testovania aplikácií navrhnutým nástrojom sa preukázala schopnosť detekovať nové chyby.