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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
11

最小成本下,規格及X-bar-S管制圖之設計 / The design of specification and X-bar-S charts with minimal cost

沈依潔, Shen, I Chieh Unknown Date (has links)
最小成本下,規格及X-bar-S管制圖之設計 / The design of economic statistical control charts and specification are both crucial research areas in industry. Furthermore, the determination of consumer and producer specifications is important to producer. In this study, we consider eight cost models including the consumer loss function and/or the producer loss function with the economic statistical X-bar and S charts or Shewhart-type economic X-bar and S charts. To determine the design parameters of the X-bar and S charts and consumer tolerance and/or producer tolerance, we using the Genetic Algorithm to minimizing expected cost per unit time. In the comparison of examples and sensitivity analyses, we found that the optimal design parameters of the Shewhart-type economic X-bar and S charts are similar to those of economic statistical X-bar and S control charts, and the expected cost per unit time may lower than the actual cost per unit time when the cost model only considering consumer loss or producer loss. When considering both consumer and producer tolerances in the cost model, the design parameters of the economic X-bar and S charts are not sensitive to the cost models. If the producer tolerance is smaller than the consumer tolerance, and the producer loss is smaller than the consumer loss, the optimal producer tolerance should be small.
12

量測誤差對X-S2管制圖設計參數之影響

郭又升, Kuo, Yu-Sheng Unknown Date (has links)
隨著經濟不斷的發展,企業間的競爭也愈趨激烈,因此在以利潤最大、付出成本最小的前提下,一些可能造成成本增加的因素就不能不重視。在量測產品的特性所使用的量測機器,可能因為量測設備的不精確造成誤差,進而影響測量產品品質特性的實際值。是以量測儀器測量產品特性時的誤差對於管制圖的設計參數的影響及使用管制圖監控製程的能力是我們所關切的課題。 本文探討量測誤差對 — 管制圖的效應。運用George Tagaras非對稱管制圖的概念,及同時考慮Taguchi的損失函數和測量誤差下,以更新理論方法建立 — 管制圖,並推導出目標函數,再透過最佳化的技巧以決定 — 管制圖的最佳經濟設計參數值。另外討論管制圖在統計層面的表現,並與經濟設計的結果作比較。 在資料分析方面,本研究考慮32組製程和成本參數組合,透過最佳化技巧找出 — 經濟及經濟統計管制圖之最小單位時間平均成本及最佳設計參數組合。再利用敏感度分析,觀察量測誤差對設計參數的影響,另外得知重要的製程和成本參數為何。這些可作為製程工程師決策參考之用。
13

損失函數在■管制圖設計上的應用 / The application of loss function in ■ control chart design

施乃萍, Shin, Nai Ping Unknown Date (has links)
最近三十年來,最佳經濟設計管制圖已被考慮用來維持製程的穩定.由於在 實務上■管制圖被廣泛使用,是以大多數管制圖經濟模型的發展,都以單一 非機遇因素下的■管制圖為研究對象,但在實務上製程常會受二個或二個 以上非機遇因素的干擾.是以本研究利用更新理論方法建立二個非機遇因 素成本模式.又為使成本模式包含顧客的聲音以顯示品質的重要,本研究提 出以產品出廠後對社會的損失替代傳統上的成本考量.當推導出能反應顧 客滿意度的二個非機遇因素製程成本模式後,藉著最佳化技巧可決定■管 制圖的最佳設計參數值,並由例子的分析說明模式參數對最佳設計參數值 的影響 .另外,■經濟管制圖與Shewhart■管制圖間的成本比較顯現前者 能有顯著改善.最後,在考慮損失函數下■管制圖的建立與應用將被舉例說 明.
14

無母數指數加權移動平均管制圖伴隨變動管制界限 / A Nonparametric EWMA-Type Signed-Rank Control Chart with Time-Varying Control Limits

鄭舜壕 Unknown Date (has links)
根據Steiner (1999) 提出指數加權移動平均 (EWMA) 管制圖之管制界限應伴隨時間變動,相較於傳統以漸近管制界限建構的 X-bar EWMA 管制圖,具備類似於快速起始反應之功能。然而,無母數EWMA 管制圖相關文獻中,大多採用漸近管制界限,甚少提及變動管制界限對於製程初期偵測能力之影響,因此本研究依據Wilcoxon 符號排序統計量為基礎,建構無母數EWMA 管制圖,並定義變動管制界限之形式,進而探討在製程初期的監控效果。假設製程為常態、均勻或雙指數分配下,使用非齊一性馬可夫鏈及蒙地卡羅模擬,求得製程穩定或失控狀態下的平均連串長度。模擬結果顯示,當加權常數越小,若採用變動管制界限能有效提升對於製程初期異常之偵測能力,且在厚尾分配下(例如:雙指數分配) 效果更為明顯。 / According to Steiner (1999), the control limits of exponentially weighted moving average (EWMA) control charts should vary with time, so that the charts would have properties similar to the fast initial response (FIR) feature, when compared with asymptotic X-bar EWMA charts. However, previous analyses of nonparametric EWMA control charts consider only asymptotic control limits and are not sensitive to the shifts in a process at early stages. In this thesis, a nonparametric control chart with time-varying control limits is constructed based on EWMA control chart built upon the Wilcoxon signed-rank statistics. When the underlying distribution is normal, uniform, or double exponential, the average run lengths in both in-control and out-of-control conditions are approximated using non-homogenous Markov chain and based on Monte Carlo simulations. Simulation results show that EWMA charts with varying control limits are more efficient to detect early process shifts when weighting constants are small, and the underlying distributions are heavy-tailed distribution (such as double exponential distribution).
15

無母數模糊相關權重指數加權移動平均管制圖設計 / An nonparametric Fuzzy Relative Weight Exponentially Weighted Moving Average control chart design

游善涵, You, Shan Han Unknown Date (has links)
隨著品質管制技術的開發,越來越多產業將品質管制的理念應用在產業資料中,而品質管制的方法非常多樣,其中統計製程管制(SPC)為品質管制中重要的技術,其主要是以統計理論背景做支持對產品製程進行監控,本文也將針對SPC中理論背景較完整的管制圖方法做進一步的研究,然而品管在實務應用上,母體資料通常為非特定分配或者未知分配,諸多文獻中已證實,若使用特定假設分配的有母數管制圖用於製程狀態為非假設分布時,會導致管制狀態下的平均連串長度不穩健的情形,若使用無母數管制圖做監控,其管制狀態平均連串長度具有穩健性,因此無母數管制圖實用性能高出許多,近年來對無母數管制圖的研究越來越進步,然而現存的無母數管制圖大多是針對產品製程中平均數、變異數的變動,或者是使用符號函數(sign function)、排序(rank)等方式對觀測值和目標值的差距做監控,又或者觀察資料的分佈狀況監控其分配或目標值是否有偏移的情形等,較少有針對觀測值前後之間變動的差距來偵測資料出現偏移的狀況,因此本文提出一個新的無母數管制圖,想利用模糊相關權重統計量的性質來呈現觀測值之間變動的情形,以此統計量為基礎,建構無母數模糊相關權重指數加權平均(FRWEWMA)管制圖,對製程資料中的平均數(位置參數)和標準差(尺度參數)進行監控,並透過平均連串長度來比較FRWEWMA 管制圖和其他管制圖偵測效能的差異與優勢為何。
16

兩相依製程之調適性管制圖 / Adaptive Control Charts for Two Dependent Process Steps

蘇惠君 Unknown Date (has links)
近年來,許多調適性管制圖都只探討單一製程,然而現今存在許多相依製程的問題.因此本論文提出兩相依製程之調適性管制圖,並以ATS測量管制圖的績效.本論文所提出的變動抽樣間隔時間之調適性管制圖對於偵測製程中幅度及小幅度的偏移有良好的績效.此外,本論文所提出的變動抽樣樣本大小及變動抽樣間隔時間之調適性管制圖對於偵測製程極小幅度的偏移有良好的績效. / In recent years, many research papers about adaptive control charts all consider a single process step. However, there are many multiple process steps in industry process. In this article, we propose adaptive control charts to monitor two dependent process steps, and their average time to signal (ATS) is calculated by Markov chain approach to measure the performance of these proposed control charts. It has been shown that the performance of the adaptive sampling interval (ASI) control charts in detecting small and moderate shifts in process means is better than the fixed sampling interval control charts, especially for small shifts, and the proposed adaptive sample size and sampling interval (ASSI) control charts have better performance in detecting very small shifts in process means than the fixed sample size and sampling interval control charts and the adaptive sample size control charts.
17

全製程過度調整下之變動抽樣時間 / Economic Design of VSI Control Charts for Monitoring Over-adjusted Process

柯芝穎 Unknown Date (has links)
The over-adjustment means that the process is adjusted unnecessarily when a false alarm occurs. It may result in shifts in process mean and variance affecting the quality of products and have the effect of an increase in variability and cost. In this paper, the economic variable sample interval (VSI) standard and control charts are proposed to monitor effectively the mean and variance of the over-adjusted process. We use a Markov chain approach to derive the design parameters of the standard and charts by the minimum of the cost function. An example of shampoo making process is used to illustrate the application and performance of the proposed VSI standard and charts in detecting shifts in process mean and variance. Furthermore, we compare the cost and performances for the economic FSI (fixed sampling interval) and VSI control charts. Support for this research was provided in part by the National Science Council of the Republic of China, grant No. NSC 94-2118-M-004-003. / The over-adjustment means that the process is adjusted unnecessarily when a false alarm occurs. It may result in shifts in process mean and variance affecting the quality of products and have the effect of an increase in variability and cost. In this paper, the economic variable sample interval (VSI) standard and control charts are proposed to monitor effectively the mean and variance of the over-adjusted process. We use a Markov chain approach to derive the design parameters of the standard and charts by the minimum of the cost function. An example of shampoo making process is used to illustrate the application and performance of the proposed VSI standard and charts in detecting shifts in process mean and variance. Furthermore, we compare the cost and performances for the economic FSI (fixed sampling interval) and VSI control charts. Support for this research was provided in part by the National Science Council of the Republic of China, grant No. NSC 94-2118-M-004-003.
18

量測誤差對偵測小幅偏移量管制圖之效應

蔡麗美, Tsai, Li-Mei Unknown Date (has links)
對於任何一種產品不論其設計如何完善,製造過程如何完備,機器如何精密,操作技術如何純熟,所製造出來的產品一定會有所差異。造成產品差異性的原因有很多,其中因素之一為:量測產品的特性所使用的量測設備,可能因為量測的不精確進而存在量測誤差,以至於測量產品特性值不正確。以往建立管制圖之數學模式中,大多不考慮測量誤差的存在,因為一般認為量測誤發生次數或頻率太少,故在模式中忽略了量測誤差的重要性。目前沒有相關文獻探討量測誤差對偵測小偏移量管制圖之效應,因此本研究考慮在製程含有量測誤差的情形下建立EWMA管制圖和 區域管制圖,且分別以Crowder(1987a,b)提出的數值方法和Davis, Homer and Woodall(1990)提出的馬可夫鏈(Markov Chain)的方法計算EWMA管制圖和 區域管制圖之平均連串長度,分析探討量測誤差分別對EWMA管制圖和 區域管制圖的設計參數及偵測能力之影響,最後比較EWMA管制圖和 區域管制圖的偵測力差異。
19

韋伯分配對偵測小偏移量管制圖的效應研究

盧鑫理 Unknown Date (has links)
自Duncan提出管制圖的經濟設計以來,陸續有學者提出各種不同型態經濟管制圖的設計。這些文章中,只考慮到特殊原因發生的時間服從期望值為1/Lambda的指數分配,由於指數分配具有固定的失敗率(Hazard Rate),但實務上很多零組件的壽命卻隨著時間的遞增而增加,若只考慮到指數分配的層面似乎有其欠妥的地方,因此,Hu提出韋伯模式下X-bar經濟管制圖的設計,由於Hu所提出的韋伯模式只考慮到固定抽樣間隔時間的情況,於是Banerjee and Rahim在1987年提出韋伯模式下經濟X-bar管制圖的設計在兩種抽樣方式(變動與固定抽樣間隔時間)下,對單位時間平均成本的影響。上述所提出的韋伯模式下X-bar經濟管制圖,皆未將描點的連串檢定列入考慮,Jaehn的區域管制圖不但可以解決管制圖沒將描點的連串檢定列入考慮的缺失,在操作上亦比管制圖加上連串檢定方便。 於是,本研究提出韋伯模式下X-bar & S-square區域管制圖的經濟設計,並考慮變動與固定抽樣間隔時間下,對單位時間平均成本的影響。另外,我們根據Saniga提出經濟統計管制圖的概念,建立韋伯模式下X-bar & S-square區域管制圖的經濟統計設計,即在統計表現的基本要求下,找出符合此統計表現下使成本最小的最適設計參數值。雖然X-bar & S-square區域管制圖之經濟統計設計的最小成本會稍大於X-bar & S-square區域管制圖之經濟設計的成本,但經濟統計設計的統計表現則符合我們所設定的要求。另外,固定抽樣間隔時間下所得到的最小成本亦會明顯地大於變動抽樣間隔時間下所得到的最小成本。因此,考慮變動抽樣間隔時間的區域管制圖是較好的。
20

EWMA管制圖在多等級產品的管制

劉泰亨 Unknown Date (has links)
隨著經濟不斷的發展與進步,商品市場的需求漸趨多元,廠商彼此之間的競爭愈來愈激烈,為了滿足客戶多元的需求,採用多等級製程的生產方式成為廠商製造產品的一種策略。Doganaksoy, Schmee, and Vandeven (1996)提出使用EWMA管制圖監控多等級產品製程的方法,利用合併資料之EWMA管制圖可以更快速地偵測出同時影響所有等級產品品質特性之非機遇因素是否發生。但是他們並沒有考慮到管制圖的經濟層面,因此本文主要探討如何由經濟觀點設計EWMA管制圖以監控生產多等級產品的製程。 本研究所探討之多等級產品製程可生產二個等級產品。在同時影響所有等級產品品質特性之非機遇因素不存在的情況下,我們擴展Banerjee and Rahim(1987)的更新理論方法,建立了二個獨立的EWMA經濟管制圖;另外我們還討論管制圖在統計層面的表現,即以平均連串長度(ARL)為統計上的限制式,仿照經濟設計的做法,建立了二個獨立的EWMA經濟統計管制圖,並和經濟設計的結果做比較。最後我們考慮同時影響所有等級產品品質特性之非機遇因素發生在製程的情況下,擴展更新理論方法建立三個EWMA經濟管制圖以追蹤此製程狀態,文末並以例子說明如何使用EWMA經濟管制圖以監控多等級產品製程。 在資料分析方面,本研究考慮32組製程與成本參數組合,透過最佳化技巧找出EWMA經濟及經濟統計管制圖之最低成本及最佳設計參數組合。再利用敏感度分析,我們可以得知重要的製程與成本參數為何。這些訊息可做為製程工程師決策參考之用。 / With the progress of the economic of the world and the various demands of the consumers, there is a new strategy to product with multiple product grades. Doganaskoy, Schmee, and Vandeven(1996) had provided a method of using a combined exponentially weighted moving average (EWMA) control charts that allow speedy detection of assignable causes affecting all grades. But this control scheme is not designed from economic viewpoint. In this paper we will discuss how to construct an economic model for the EWMA control chart to monitor the process with multiple product grades. We discuss the process with two product grades. We expand the renewal theory method proposed by Banaerjee and Rahim (1987) to construct two independent economic EWMA control charts to monitor the process with two product grades. Besides, we also present a statistically constrained economic model of the EWMA control chart, subject to statistical constraints on average run length (ARL). If the assignable cause affecting all grades does exist, we also construct the three economic EWMA control charts by expanding the renewal theory approach. Finally, we illustrate how to use the economic EWMA control chart to monitor the process. In data analysis, 32 combinations of the cost and process parameters are considered. The minimum cost and the optimal design parameters of economical and economic statistical EWMA control charts are determined by using optimal techniques. Sensitivity analyses show the significant cost and process parameters.

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