With advances in technology, modern integrated circuits have higher complexities and reduced transistor sizing. In deep sub-micron, the parameter variation-control is difficult and component delays vary from one manufactured chip to another. Therefore, the delays are not discrete values but are a statistical quantity, and statistical evaluation methods have gained traction. Furthermore, fault injection based gate-level fault coverage is non-scalable and statistical estimation methods are preferred. This dissertation focuses on scalable statistical methods to select critical paths in the presence of process variations, and to improve the defect coverage for complex integrated circuits. In particular, we investigate the sensitization probability of a path by a test pattern under statistical delays. Next, we investigate test pattern generation for improving the sensitization probability of a path, selecting critical paths that yield high defect coverage, and scalable method to estimate fault coverage of complex designs using machine learning techniques.

La miniaturisation des circuits intégrés permet d'avoir une intégration plus élevée dans une même puce. Cela, conduit a des problèmes de qualité dans les signaux de communication et d’alimentation comme le phénomène de bruit de diaphonie entre les interconnections (Crosstalk) et de bruit dans le lignes d'alimentation (PSN, GB). Aussi problèmes de fiabilité peuvent éventuellement arriver a cause des variations dans les paramètres technologiques pendant le processus de fabrication. De ce fait, tout ces phénomènes ont un effet négatif sur le délai dans les circuits embarques (IC) et donnent lieu aux défauts sur le retard. Des échecs relie au délai dans les dispositifs semi conducteurs causes une augmentation de taux d'évasion de défaut, une perte de rendement et une diminution dans le taux de fiabilité. Techniques de Design-For-Test ont était développée a fin d'avoir une meilleur contrôlabilité et observabilité dans les nœuds internes du circuit pour détecter et localiser facilement l’emplacement des défauts. Cependant, ils ne sont pas toujours détectés par les modèles de défauts traditionnels.Cette thèse s’intéresse a l’analyse de ces phénomènes a fin de proposer de nouvelle méthodes de test du délai en considérant les phénomènes physiques pour faire face aux défauts provenant du processus de fabrication ou de problèmes physiques. Ces méthodes comprennent l'analyse de la variation du retard d'un chemin en présence du bruit de diaphonie, du bruit d'alimentation, et les variations de processus. Additionnellement, nous développons méthodes d'essai de retard sur un chemin pour identifier les motifs de test qui peuvent causer le pire des cas de retard sur un chemin cible. Les méthodes proposées peuvent être utilisées pour caractériser la vitesse de chemin et il contribue à résoudre le problème de «speed binning». En outre, ils peuvent être utilisés dans l'amélioration de l'approche classique ATPG de génération de «patterns» et elles sont indépendantes de la technologie. L'application de ces contributions peut apporter des améliorations considérables à la qualité de test IC en assurant une meilleure couverture des défauts et en aidant à augmenter le rendement de fabrication au cours de la vitesse du «binning» dans les puces IC. L’évolution en continue de la technologie en échelle nanométrique / Advancing nanometer technology scaling enables higher integration on a single chip with minimal feature size. As a consequence, the effects of signal and power integrity issues such as crosstalk noise between interconnects, power supply noise and ground bounce in the supply networks significantly increases. Also, reliability issues are eventually introduced by variations in the manufacturing process. These issues will negatively impact the timing characteristics in an integrated circuit (IC), as they give rise to delay defects. Delay-related parametric failures increase the defect escape rate, yield loss and diminish reliability rate. Hence, design-for-test techniques are employed to have a better controllability and observability on the internal nodes to easily detect and locate the faults. However, they are not always detected by the traditional fault models. In our work, we target these challenges and propose novel physical design-aware path delay test methods to deal with delay faults coming from manufacturing defects or physical design issues. They include the investigation of path delay variations in the presence of crosstalk noise, power supply noise, ground bounce and process variations. Based on this, we develop technology independent test methods for identifying the test patterns that may cause a worst-case delay on a target path. Then, we develop a dedicated test pattern generation method for path delay testing in the presence of crosstalk noise, power supply noise and ground noise. The proposed methods can be used to characterize the path speed and it helps to address the speed binning problem. Also, they can be employed in improving the classical ATPG approach of pattern generation. The application of these contributions can bring tremendous improvements to the IC test quality by ensuring better defect coverage and for an increased manufacturing yield during speed binning of IC chips.

With rapid advancement in science and technology and decreasing feature size of transistors, the complexity of VLSI designs is constantly increasing. With increasing density and complexity of the designs, the probability of occurrence of defects also increases. Therefore testing of designs becomes essential in order to guarantee fault-free operation of devices. Testing of VLSI designs involves generation of test patterns, test pattern application and identification of defects in design. In case of scan based designs, the test set size directly impacts the test application time which is determined by the number of memory elements in the design and the test storage requirements. There are various methods in literature which are used to address the issue of large test set size classified as static or dynamic compaction methods depending on whether the test compaction algorithm is performed as a post-processing step after test generation or is integrated within the test generation. In general, there is a trade-off between the test compaction achievable and the run-time. Methods which are computationally intensive might provide better compaction, however, might have longer run times owing to the complexity of the algorithm. In the first part of the thesis we address the problem of large test set size in partially scanned designs by proposing an incremental dynamic compaction method. Typically, the fault coverage curve of designs ramp up very quickly in the beginning and later slows down and ultimately the curve flattens towards the tail of the curve. In the initial phase of test generation a greedy compaction method is used because initially there are easy-to-detect faults and the scope for compaction is better. However, in the later portion of the curve, there are hard-to-detect faults which affect compaction and we propose to use a dynamic compaction approach. We propose a novel mechanism to identify redundant faults during dynamic compaction to avoid targeting them later. The effectiveness of method is demonstrated on industrial designs and test size reduction of 30% is achieved. As the device complexity is increasing, delay defects are also increasing. Speed path debug is necessary in order to meet performance requirements. Speed paths are the frequency limiting paths in a design identified during debug. Speed paths can be tested using functional patterns, transition n-detect patterns or path delay patterns. However, usage of functional patterns for speed path debug is expensive because generation of functional patterns is expensive and the application cost is also high because the number of patterns is large and requires functional testers. In the second part of the dissertation we propose a simple path sensitization approach that can be used to generate pseudo-robust tests, which are near robust tests and can be used for designs that have multiple clock domains. The fault coverage for path delay fault APTG can be further improved by dividing the paths that are not testable under pseudo robust conditions, into shorter sub-paths. The effectiveness of the method is demonstrated on industrial designs.

A circuit design of Fast Fourier Transform for DVB-H system is presented in this thesis. This circuit is based on SDF (single path delay feedback) pipeline architecture with radix-2 computation element. We propose a novel method of timing scheduling that can share one complex multiplier for couple of stage and promote the utilization of complex multiplier to 100%, so we can improve the implementation with radix-2 computation. The number of bits is carefully selected by system simulation to meetthe requirements of DVB-H system. In addition, a memory table permutation deletion method for memory scheduling, which can reduce the size of memory storing twiddle factors tables. The circuit is carried out by CMOS 0.18£gm 1P6M process with core area 2.08 x 2.076 mm2. In the gate level simulation, the output data rate of this circuit is above 50MHz, so the circuit can meet the requirement of DVB-H system.

Process variations is one of the most challenging phenomena in deep submicron. Delay fault testing becomes more complicated because gate delays are not fixed but instead, they are statistical quantities due to the variations in the transistor characteristics. On the other hand, testing for hardware Trojan is also challenging in the presence of process variations because it can easily mask the impact of the inserted Trojan. This work consists of two parts. In the first part, an approach to detect ultra-low-power no-payload Trojans by analyzing IDDT waveforms at each gate in the presence of process variations is presented. The approach uses a novel ATPG to insert a small number of current sensors to analyze the behavior of individual gates at the IDDT waveform. The second part focuses on identifying a test set that maximizes the defect coverage for path delay fault. The proposed approach utilizes Monte-Carlo simulation efficiently and uses a machine-learning algorithm to select a small test set with high detect coverage.

Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of functional testing has driven the industry to automatically-generated structural tests, applied by low-cost testers taking advantage of design-for-test (DFT) circuitry on the chip. Traditional at-speed functional testing of digital circuits is increasingly challenged by new defect types and the high cost of functional test development. This research addressed the problems of accurate delay testing in DSM circuits by targeting resistive open and short circuits, while taking into account manufacturing process variation, power dissipation and power supply noise. In this work, we developed a class of structural delay tests in which we extended traditional launch-on-capture delay testing to additional launch and capture cycles. We call these Pseudofunctional Tests (PFT). A test pattern is scanned into the circuit, and then multiple functional clock cycles are applied to it with at-speed launch and capture for the last two cycles. The circuit switching activity over an extended period allows the off-chip power supply noise transient to die down prior to the at-speed launch and capture, achieving better timing correlation with the functional mode of operation. In addition, we also proposed advanced compaction methodologies to compact the generated test patterns into a smaller test set in order to reduce the test application time. We modified our CodGen K longest paths per gate automatic test pattern generator to implement PFT pattern generation. Experimental results show that PFT test generation is practical in terms of test generation time.

Os algoritmos para síntese de circuitos digitais em geral visam a melhoria de uma função de custo composta de quatro critérios: área, desempenho, potência e testabilidade. Normalmente estes algoritmos conseguem uma relação de compromisso para a otimização de dois critérios. Efeitos indesejáveis também podem surgir com a otimização de um destes critérios. Por exemplo, as otimizações de desempenho podem introduzir falhas de colagem não testáveis (redundâncias) em um circuito, reduzindo a sua testabilidade. Muitos algoritmos de síntese lógica exploram propriedades específicas de determinadas funções a serem sintetizadas. Um exemplo de função com propriedades específicas são as funções ditas unate. Um exemplo deste tipo de função é o sinal de carry de um somador completo. Este tipo de função exige cuidados especiais para evitar a introdução de redundâncias. Muitos dos algoritmos para síntese lógica empregam a decomposição de Shannon para melhorar o desempenho de um circuito. A equação geral da decomposição de Shannon é expressa através de uma função binate. As redundâncias sempre serão introduzidas nos circuitos quando uma equação binate é utilizada para representar uma função unate. Diagramas de Decisão Binária (BDDs) são um tipo estruturas de dados muito utilizadas em algoritmos para síntese lógica. A decomposição de Shannon também é utilizada para derivar circuitos a partir de BDDs. Este tipo de estrutura representa uma função lógica, mas não mantém uma representação sem redundâncias da mesma. Infelizmente, os circuitos derivados a partir desta estrutura poderão ser redundantes, principalmente quando a decomposição de Shannon for utilizada. Existem estruturas de dados capazes de representar uma função sem redundâncias. Este é o caso dos VPBDDs , que possuem propriedades especiais que preservam características de testabilidade da função representada. Baseando-se nas propriedades dos VPBDDs, um novo algoritmo para remoção de redundâncias foi proposto. Este algoritmo é capaz de gerar circuitos sem redundâncias, mesmo quando a função, que é representada pelo VPBDD, é unate. Além da geração de circuitos sem redundâncias, o algoritmo garante que o atraso do circuito não aumenta após a remoção de redundâncias. A área dos circuitos resultantes pode aumentar, diminuir ou permanecer a mesma, considerando o número de portas lógicas utilizadas. Todos os resultados obtidos neste trabalho mostram que o algoritmo consegue realizar a remoção de redundâncias, sem prejudicar o atraso do circuito. Além disso, todos os caminhos redundantes do circuito têm seu atraso reduzido, pois com a remoção de redundâncias o número de portas lógicas em série é reduzido. A aplicação deste algoritmo apresenta bons resultados para circuitos aritméticos. Isto se deve principalmente ao fato do carry ser uma função unate, o que pode introduzir redundâncias no circuito se esta propriedade (de ser unate) não for tratada adequadamente. O algoritmo proposto também abre possibilidades para a criação de outras ferramentas de CAD, como por exemplo: uma ferramenta para análise de timing, um gerador de circuitos aritméticos sem redundâncias, ou ainda uma ferramenta para geração de teste, incluindo lista de falhas, vetores de teste e cobertura de falhas. / Algorithms for digital circuit design aim the reduction of a cost function composed of four criteria: area, delay, power and testability. Usually these algorithms are able to obtain a trade-off for the optimization of two of these criteria. Undesired effects may occur due to the optimization of one of the criteria. For instance, delay optimizations may introduce non testable stuck-at faults (redundancies) in a circuit, this way reducing its testability. Several logic synthesis algorithms exploit specific properties of the logic functions to be synthesized. One example of function with specific properties are the socalled unate functions. An example of this kind of function is the carry-out sign in a full adder circuit. This kind of function require special care in order to avoid redundancy introduction. Shannon decomposition [SHA 38] is used in many logic synthesis algorithms for improving circuit performance. The general case of the Shannon decomposition is represented by a binate (not unate) equation. Redundancies are introduced in a circuit when a binate equation is used to express a unate function. Binary Decision Diagrams (BDDs) are a kind of data structures widely used in the field of logic synthesis. Shannon decomposition is also used to derive circuits from BDDs. This data structure is used to represent logic functions, but it is not able to maintain an irredundant representation of any logic function. Unfortunately, circuits derived from BDDs will possibly have redundancies, specially when Shannon decomposition is used. Some data structures are able to represent any logic function in a irredundant form. This is the case of the VPBDDs [REI 95a] [REI 2000], which have special properties that preserve the testability properties of the functions being represented. Based on VPBDD properties, a novel algorithm for redundancy removal was proposed [MAR 2002]. This algorithm is able to generate irredundant circuits even when the function represented by the VPBDD is unate. In addition to the generation of irredundant circuits, the algorithm guarantees that the circuit delay will not be increased by redundancy removal. The final area may be increased, reduced or even remain the same, considering the number of logic gates. The results obtained in this work indicate that the algorithm is able to perform redundancy removal without increasing the circuit delay. Besides, all the redundant paths in the circuit have their delay reduced, as the number of logic gates in series will be reduced by the redundancy removal process. The application of this algorithm gives good results for arithmetic circuits. This is mainly due to the fact that the carry chain is composed of unate functions, this way redundancies are introduced in the circuit if this property is not adequately treated. The proposed algorithm allows for the creation of other CAD tools, as for instance: a timing analysis tool, a generator of irredundant arithmetic circuits, or even a test generation tool, including list of faults, test vectors as well as fault coverage.

The high cost of chip testing makes testability an important aspect of any chip design. Two important testability considerations are addressed namely, the power consumption and test quality. The power consumption during shift is reduced by efficiently adding control logic to the design. Test quality is studied by determining the sensitization characteristics of a path to be tested. The path delay fault models have been used for the purpose of studying this problem. Another important aspect in chip design is performance validation, which is increasingly perceived as the major bottleneck in integrated circuit design. Given the synthesizable HDL code, the proposed technique will efficiently identify infeasible paths, subsequently, it determines the worst case execution time (WCET) in the HDL code.

Os algoritmos para síntese de circuitos digitais em geral visam a melhoria de uma função de custo composta de quatro critérios: área, desempenho, potência e testabilidade. Normalmente estes algoritmos conseguem uma relação de compromisso para a otimização de dois critérios. Efeitos indesejáveis também podem surgir com a otimização de um destes critérios. Por exemplo, as otimizações de desempenho podem introduzir falhas de colagem não testáveis (redundâncias) em um circuito, reduzindo a sua testabilidade. Muitos algoritmos de síntese lógica exploram propriedades específicas de determinadas funções a serem sintetizadas. Um exemplo de função com propriedades específicas são as funções ditas unate. Um exemplo deste tipo de função é o sinal de carry de um somador completo. Este tipo de função exige cuidados especiais para evitar a introdução de redundâncias. Muitos dos algoritmos para síntese lógica empregam a decomposição de Shannon para melhorar o desempenho de um circuito. A equação geral da decomposição de Shannon é expressa através de uma função binate. As redundâncias sempre serão introduzidas nos circuitos quando uma equação binate é utilizada para representar uma função unate. Diagramas de Decisão Binária (BDDs) são um tipo estruturas de dados muito utilizadas em algoritmos para síntese lógica. A decomposição de Shannon também é utilizada para derivar circuitos a partir de BDDs. Este tipo de estrutura representa uma função lógica, mas não mantém uma representação sem redundâncias da mesma. Infelizmente, os circuitos derivados a partir desta estrutura poderão ser redundantes, principalmente quando a decomposição de Shannon for utilizada. Existem estruturas de dados capazes de representar uma função sem redundâncias. Este é o caso dos VPBDDs , que possuem propriedades especiais que preservam características de testabilidade da função representada. Baseando-se nas propriedades dos VPBDDs, um novo algoritmo para remoção de redundâncias foi proposto. Este algoritmo é capaz de gerar circuitos sem redundâncias, mesmo quando a função, que é representada pelo VPBDD, é unate. Além da geração de circuitos sem redundâncias, o algoritmo garante que o atraso do circuito não aumenta após a remoção de redundâncias. A área dos circuitos resultantes pode aumentar, diminuir ou permanecer a mesma, considerando o número de portas lógicas utilizadas. Todos os resultados obtidos neste trabalho mostram que o algoritmo consegue realizar a remoção de redundâncias, sem prejudicar o atraso do circuito. Além disso, todos os caminhos redundantes do circuito têm seu atraso reduzido, pois com a remoção de redundâncias o número de portas lógicas em série é reduzido. A aplicação deste algoritmo apresenta bons resultados para circuitos aritméticos. Isto se deve principalmente ao fato do carry ser uma função unate, o que pode introduzir redundâncias no circuito se esta propriedade (de ser unate) não for tratada adequadamente. O algoritmo proposto também abre possibilidades para a criação de outras ferramentas de CAD, como por exemplo: uma ferramenta para análise de timing, um gerador de circuitos aritméticos sem redundâncias, ou ainda uma ferramenta para geração de teste, incluindo lista de falhas, vetores de teste e cobertura de falhas. / Algorithms for digital circuit design aim the reduction of a cost function composed of four criteria: area, delay, power and testability. Usually these algorithms are able to obtain a trade-off for the optimization of two of these criteria. Undesired effects may occur due to the optimization of one of the criteria. For instance, delay optimizations may introduce non testable stuck-at faults (redundancies) in a circuit, this way reducing its testability. Several logic synthesis algorithms exploit specific properties of the logic functions to be synthesized. One example of function with specific properties are the socalled unate functions. An example of this kind of function is the carry-out sign in a full adder circuit. This kind of function require special care in order to avoid redundancy introduction. Shannon decomposition [SHA 38] is used in many logic synthesis algorithms for improving circuit performance. The general case of the Shannon decomposition is represented by a binate (not unate) equation. Redundancies are introduced in a circuit when a binate equation is used to express a unate function. Binary Decision Diagrams (BDDs) are a kind of data structures widely used in the field of logic synthesis. Shannon decomposition is also used to derive circuits from BDDs. This data structure is used to represent logic functions, but it is not able to maintain an irredundant representation of any logic function. Unfortunately, circuits derived from BDDs will possibly have redundancies, specially when Shannon decomposition is used. Some data structures are able to represent any logic function in a irredundant form. This is the case of the VPBDDs [REI 95a] [REI 2000], which have special properties that preserve the testability properties of the functions being represented. Based on VPBDD properties, a novel algorithm for redundancy removal was proposed [MAR 2002]. This algorithm is able to generate irredundant circuits even when the function represented by the VPBDD is unate. In addition to the generation of irredundant circuits, the algorithm guarantees that the circuit delay will not be increased by redundancy removal. The final area may be increased, reduced or even remain the same, considering the number of logic gates. The results obtained in this work indicate that the algorithm is able to perform redundancy removal without increasing the circuit delay. Besides, all the redundant paths in the circuit have their delay reduced, as the number of logic gates in series will be reduced by the redundancy removal process. The application of this algorithm gives good results for arithmetic circuits. This is mainly due to the fact that the carry chain is composed of unate functions, this way redundancies are introduced in the circuit if this property is not adequately treated. The proposed algorithm allows for the creation of other CAD tools, as for instance: a timing analysis tool, a generator of irredundant arithmetic circuits, or even a test generation tool, including list of faults, test vectors as well as fault coverage.

Os algoritmos para síntese de circuitos digitais em geral visam a melhoria de uma função de custo composta de quatro critérios: área, desempenho, potência e testabilidade. Normalmente estes algoritmos conseguem uma relação de compromisso para a otimização de dois critérios. Efeitos indesejáveis também podem surgir com a otimização de um destes critérios. Por exemplo, as otimizações de desempenho podem introduzir falhas de colagem não testáveis (redundâncias) em um circuito, reduzindo a sua testabilidade. Muitos algoritmos de síntese lógica exploram propriedades específicas de determinadas funções a serem sintetizadas. Um exemplo de função com propriedades específicas são as funções ditas unate. Um exemplo deste tipo de função é o sinal de carry de um somador completo. Este tipo de função exige cuidados especiais para evitar a introdução de redundâncias. Muitos dos algoritmos para síntese lógica empregam a decomposição de Shannon para melhorar o desempenho de um circuito. A equação geral da decomposição de Shannon é expressa através de uma função binate. As redundâncias sempre serão introduzidas nos circuitos quando uma equação binate é utilizada para representar uma função unate. Diagramas de Decisão Binária (BDDs) são um tipo estruturas de dados muito utilizadas em algoritmos para síntese lógica. A decomposição de Shannon também é utilizada para derivar circuitos a partir de BDDs. Este tipo de estrutura representa uma função lógica, mas não mantém uma representação sem redundâncias da mesma. Infelizmente, os circuitos derivados a partir desta estrutura poderão ser redundantes, principalmente quando a decomposição de Shannon for utilizada. Existem estruturas de dados capazes de representar uma função sem redundâncias. Este é o caso dos VPBDDs , que possuem propriedades especiais que preservam características de testabilidade da função representada. Baseando-se nas propriedades dos VPBDDs, um novo algoritmo para remoção de redundâncias foi proposto. Este algoritmo é capaz de gerar circuitos sem redundâncias, mesmo quando a função, que é representada pelo VPBDD, é unate. Além da geração de circuitos sem redundâncias, o algoritmo garante que o atraso do circuito não aumenta após a remoção de redundâncias. A área dos circuitos resultantes pode aumentar, diminuir ou permanecer a mesma, considerando o número de portas lógicas utilizadas. Todos os resultados obtidos neste trabalho mostram que o algoritmo consegue realizar a remoção de redundâncias, sem prejudicar o atraso do circuito. Além disso, todos os caminhos redundantes do circuito têm seu atraso reduzido, pois com a remoção de redundâncias o número de portas lógicas em série é reduzido. A aplicação deste algoritmo apresenta bons resultados para circuitos aritméticos. Isto se deve principalmente ao fato do carry ser uma função unate, o que pode introduzir redundâncias no circuito se esta propriedade (de ser unate) não for tratada adequadamente. O algoritmo proposto também abre possibilidades para a criação de outras ferramentas de CAD, como por exemplo: uma ferramenta para análise de timing, um gerador de circuitos aritméticos sem redundâncias, ou ainda uma ferramenta para geração de teste, incluindo lista de falhas, vetores de teste e cobertura de falhas. / Algorithms for digital circuit design aim the reduction of a cost function composed of four criteria: area, delay, power and testability. Usually these algorithms are able to obtain a trade-off for the optimization of two of these criteria. Undesired effects may occur due to the optimization of one of the criteria. For instance, delay optimizations may introduce non testable stuck-at faults (redundancies) in a circuit, this way reducing its testability. Several logic synthesis algorithms exploit specific properties of the logic functions to be synthesized. One example of function with specific properties are the socalled unate functions. An example of this kind of function is the carry-out sign in a full adder circuit. This kind of function require special care in order to avoid redundancy introduction. Shannon decomposition [SHA 38] is used in many logic synthesis algorithms for improving circuit performance. The general case of the Shannon decomposition is represented by a binate (not unate) equation. Redundancies are introduced in a circuit when a binate equation is used to express a unate function. Binary Decision Diagrams (BDDs) are a kind of data structures widely used in the field of logic synthesis. Shannon decomposition is also used to derive circuits from BDDs. This data structure is used to represent logic functions, but it is not able to maintain an irredundant representation of any logic function. Unfortunately, circuits derived from BDDs will possibly have redundancies, specially when Shannon decomposition is used. Some data structures are able to represent any logic function in a irredundant form. This is the case of the VPBDDs [REI 95a] [REI 2000], which have special properties that preserve the testability properties of the functions being represented. Based on VPBDD properties, a novel algorithm for redundancy removal was proposed [MAR 2002]. This algorithm is able to generate irredundant circuits even when the function represented by the VPBDD is unate. In addition to the generation of irredundant circuits, the algorithm guarantees that the circuit delay will not be increased by redundancy removal. The final area may be increased, reduced or even remain the same, considering the number of logic gates. The results obtained in this work indicate that the algorithm is able to perform redundancy removal without increasing the circuit delay. Besides, all the redundant paths in the circuit have their delay reduced, as the number of logic gates in series will be reduced by the redundancy removal process. The application of this algorithm gives good results for arithmetic circuits. This is mainly due to the fact that the carry chain is composed of unate functions, this way redundancies are introduced in the circuit if this property is not adequately treated. The proposed algorithm allows for the creation of other CAD tools, as for instance: a timing analysis tool, a generator of irredundant arithmetic circuits, or even a test generation tool, including list of faults, test vectors as well as fault coverage.