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1	A NEW HIGH EFFICIENCY, AGILE BEAM SCANNING, BROADBAND TRACKING ANTENNA FEED Richard, Gaetan C. 10 1900 (has links) International Telemetering Conference Proceedings / October 25-28, 1993 / Riviera Hotel and Convention Center, Las Vegas, Nevada / Two different types of tracking feeds are currently used in the majority of telemetry tracking antenna systems when autotrack operation is required. They are of the conical scanner or of the single channel monopulse family and they employ well known technologies. In broadband applications, these feeds all suffer from the same inherent degradation in efficiency caused by their inability to maintain a constant crossover loss value and by their failure to properly illuminate the reflector. In high dynamics situations they can also generate unwanted and sometimes detrimental modulation whenever on-axis tracking is not maintained. In addition, currently available versions of the conical scanner are not capable of high scan rates or of scan rate agility and they are ill-suited for use in tracking systems based on non-orthogonal axes positioners. This paper describes a new high efficiency tracking feed system based on proven conical scanner technology. Its design incorporates features such as variable crossover, steerable beam, high scan rates, scan rate agility as well as stable reference coordinate system. In addition to these features, this new feed is also capable of delivering, in all but one operational category, levels of performance superior to that achievable to date by any other implementation of the conical scanner or of the single channel monopulse technology. Broadband Tracking Antenna Feed Efficiency Beam Steering Scan Rate Overhead Pass Non Orthogonal Axes Positioners
2	The Electroanalytical Performance of Sonogel Carbon Titanium (IV) Oxide Electrodes versus Conducting Polymer Electrodes in the Electrochemical Detection of Biological Molecules Stinson, Jelynn A. 22 June 2007 (has links) No description available. Chemistry, Analytical SGC/TiO2 Electrodes GCE NADH PBTP P3MT Scan Rate
3	Leaky Wave Antenna Aditya, Pradyumna 14 September 2016 (has links) No description available. Electrical Engineering Electromagnetics
4	Analysis of Covariance with Linear Regression Error Model on Antenna Control Unit Tracking Laird, Daniel T. 10 1900 (has links) ITC/USA 2015 Conference Proceedings / The Fifty-First Annual International Telemetering Conference and Technical Exhibition / October 26-29, 2015 / Bally's Hotel & Convention Center, Las Vegas, NV / Over the past several years DoD imposed constraints on test deliverables, requiring objective measures of test results, i.e., statistically defensible test and evaluation (SDT&E) methods and results. These constraints force the tester to employ statistical hypotheses, analyses and perhaps modeling to assess test results objectively, i.e., based on statistical metrics, probability of confidence and logical inference to supplement rather than rely solely on expertise, which is too subjective. Experts often disagree on interpretation. Numbers, although interpretable, are less variable than opinion. Logic, statistical inference and belief are the bases of testable, repeatable and refutable hypothesis and analyses. In this paper we apply linear regression modeling and analysis of variance (ANOVA) to time-space position information (TSPI) to determine if a telemetry (TM) antenna control unit (ACU) under test (AUT) tracks statistically, thus as efficiently, in C-band while receiving both C- and S-band signals. Together, regression and ANOVA compose a method known as analysis of covariance (ANCOVA). In this, the second of three papers, we use data from a range test, but make no reference to the systems under test, nor to causes of error. The intent is to present examples of tools and techniques useful for SDT&E methodologies in testing. Null- and alternative-hypotheses tracking mode TM AGC ACU Scan rate Slew rate TSPI samples GPS INS observables calculated dataframe R inner-product modeling ANOVA ANCOVA F-test and t-test PDF CDF
5	Nanolithography on thin films using heated atomic force microscope cantilevers Saxena, Shubham 01 November 2006 (has links) Nanotechnology is expected to play a major role in many technology areas including electronics, materials, and defense. One of the most popular tools for nanoscale surface analysis is the atomic force microscope (AFM). AFM can be used for surface manipulation along with surface imaging. The primary motivation for this research is to demonstrate AFM-based lithography on thin films using cantilevers with integrated heaters. These thermal cantilevers can control the temperature at the end of the tip, and hence they can be used for local in-situ thermal analysis. This research directly addresses applications like nanoscale electrical circuit fabrication/repair and thermal analysis of thin-films. In this study, an investigation was performed on two thin-film materials. One of them is co-polycarbonate, a variant of a polymer named polycarbonate, and the other is an energetic material called pentaerythritol tetranitrate (PETN). Experimental methods involved in the lithography process are discussed, and the results of lithographic experiments performed on co-polycarbonate and PETN are reported. Effects of dominant parameters during lithography experiments like time, temperature, and force are investigated. Results of simulation of the interface temperature between thermal cantilever tip and thin film surface, at the beginning of the lithography process, are also reported. Characterization Deflection Setpoint Grain rearrangement Array Precise positioning Metrology Explosion Explosives Data storage Material Image processing Slow scan disabled Temperature Tip Local In-situ Nanoscale Electrical circuit fabrication Repair Co-polycarbonate Polymers Polycarbonates Energetic materials PETN Simulation Interface Nano-manufacturing Experiment Calibration Raman Frequency Deflagration Decomposition Detonation Build up Pile-up End capped End capping Cross linked Cross-linked Conductivity Microscale MEMS Microcantilever NEMS DPN tDPN Silicon Glass Peak InVOLS Manipulation AFM Atomic force microscope Defense Nanoscale Surface Stiffness Force Scan size Thermal cantilevers Imaging Lithography Nanolithography Thin films Cantilevers Heaters Technology Nanotechnology Scan velocity Scan rate Bake Anneal Pentaerythritol tetranitrate Thin films Thermal properties Atomic force microscopy Microlithography Nanotechnology Surfaces (Technology) Analysis

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