The technology today makes it possible to integrate a complete system on a single chip, called "System-on-Chip'' (SOC). Nowadays SOC designers use previously designed hardware modules, called cores, together with their user defined logic (UDL), to form a complete system on a single chip. The manufacturing process may result in defect chips, for instance due to the base material, and therefore testing chips after production is important in order to ensure fault-free chips. The testing time for a chip will affect its final cost. Thus it is important to minimize the testing time for each chip. For core-based SOCs this can be done by testing several cores at the same time, instead of testing the cores sequentially. However, this will result in a higher activity in the chip, hence higher power consumption. Due to several factors in the manufacturing process there are limitations of the power consumption for a chip. Therefore, the power limitations should be carefully considered when planning the testing of a chip. Otherwise it can be damaged during test, due to overheating. This leads to the problem of minimizing testing time under such power constraints. In this thesis we discuss test power modeling and its application to SOC testing. We present previous work in this area and conclude that current power modeling techniques in SOC testing are rather pessimistic. We therefore propose a more accurate power model that is based on the analysis of the test data. Furthermore, we present techniques for test pattern reordering, with the objective of partitioning the test power consumption into low parts and high parts. The power model is included in a tool for SOC test architecture design and test scheduling, where the scheduling heuristic is designed for SOCs with fixed- width test bus architectures. Several experiments have been conducted in order to evaluate the proposed approaches. The results show that, by using the presented power modeling techniques in test scheduling algorithms, we will get lower testing times and thus lower test cost.

An algorithm of incremental mining implicative logical rules is pro-posed. This algorithm is based on constructing good classification tests. The in-cremental approach to constructing these rules allows revealing the interde-pendence between two fundamental components of human thinking: pattern recognition and knowledge acquisition.

Manufacture testing of digital integrated circuits is essential for high quality. However, exhaustive testing is impractical, and only a small subset of all possible test patterns (or test pattern pairs) may be applied. Thus, it is crucial to choose a subset that detects a high percentage of the defective parts and produces a low defective part level. Historically, test pattern generation has often been seen as a deterministic endeavor. Test sets are generated to deterministically ensure that a large percentage of the targeted faults are detected. However, many real defects do not behave like these faults, and a test set that detects them all may still miss many defects. Unfortunately, modeling all possible defects as faults is impractical. Thus, it is important to fortuitously detect unmodeled defects using high quality test sets. To maximize fortuitous detection, we do not assume a high correlation between faults and actual defects. Instead, we look at the common requirements for all defect detection. We deterministically maximize the observations of the leastobserved sites while randomly exciting the defects that may be present. The resulting decrease in defective part level is estimated using the MPGD model. This dissertation describes the MPGD defective part level model and shows how it can be used to predict defective part levels resulting from static defect detection. Unlike many other predictors, its predictions are a function of site observations, not fault coverage, and thus it is generally more accurate at high fault coverages. Furthermore, its components model the physical realities of site observation and defect excitation, and thus it can be used to give insight into better test generation strategies. Next, we investigate the effect of additional constraints on the fortuitous detection of defects-specifically, as we focus on detecting dynamic defects instead of static ones. We show that the quality of the randomness of excitation becomes increasingly important as defect complexity increases. We introduce a new metric, called excitation balance, to estimate the quality of the excitation, and we show how excitation balance relates to the constant τ in the MPGD model.

Manufacture testing of digital integrated circuits is essential for high quality. However, exhaustive testing is impractical, and only a small subset of all possible test patterns (or test pattern pairs) may be applied. Thus, it is crucial to choose a subset that detects a high percentage of the defective parts and produces a low defective part level. Historically, test pattern generation has often been seen as a deterministic endeavor. Test sets are generated to deterministically ensure that a large percentage of the targeted faults are detected. However, many real defects do not behave like these faults, and a test set that detects them all may still miss many defects. Unfortunately, modeling all possible defects as faults is impractical. Thus, it is important to fortuitously detect unmodeled defects using high quality test sets. To maximize fortuitous detection, we do not assume a high correlation between faults and actual defects. Instead, we look at the common requirements for all defect detection. We deterministically maximize the observations of the leastobserved sites while randomly exciting the defects that may be present. The resulting decrease in defective part level is estimated using the MPGD model. This dissertation describes the MPGD defective part level model and shows how it can be used to predict defective part levels resulting from static defect detection. Unlike many other predictors, its predictions are a function of site observations, not fault coverage, and thus it is generally more accurate at high fault coverages. Furthermore, its components model the physical realities of site observation and defect excitation, and thus it can be used to give insight into better test generation strategies. Next, we investigate the effect of additional constraints on the fortuitous detection of defects-specifically, as we focus on detecting dynamic defects instead of static ones. We show that the quality of the randomness of excitation becomes increasingly important as defect complexity increases. We introduce a new metric, called excitation balance, to estimate the quality of the excitation, and we show how excitation balance relates to the constant τ in the MPGD model.

Os recentes avanços experimentados pela tecnologia CMOS tem permitido a fabricação de transistores em dimensões submicrônicas, possibilitando a integração de dezenas de milhões de dispositivos numa única pastilha de silício, os quais podem ser usados na implementação de sistemas eletrônicos muito complexos. Este grande aumento na complexidade dos projetos fez surgir uma demanda por ferramentas de verificação eficientes e sobretudo que incorporassem modelos físicos e computacionais mais adequados. A verificação de timing objetiva determinar se as restrições temporais impostas ao projeto podem ou não ser satisfeitas quando de sua fabricação. Ela pode ser levada a cabo por meio de simulação ou por análise de timing. Apesar da simulação oferecer estimativas mais precisas, ela apresenta a desvantagem de ser dependente de estímulos. Assim, para se assegurar que a situação crítica é considerada, é necessário simularem-se todas as possibilidades de padrões de entrada. Obviamente, isto não é factível para os projetos atuais, dada a alta complexidade que os mesmos apresentam. Para contornar este problema, os projetistas devem lançar mão da análise de timing. A análise de timing é uma abordagem independente de vetor de entrada que modela cada bloco combinacional do circuito como um grafo acíclico direto, o qual é utilizado para estimar o atraso do circuito. As primeiras ferramentas de análise de timing utilizavam apenas a topologia do circuito para estimar o atraso, sendo assim referenciadas como analisadores de timing topológicos. Entretanto, tal aproximação pode resultar em estimativas demasiadamente pessimistas, uma vez que os caminhos mais longos do grafo podem não ser capazes de propagar transições, i.e., podem ser falsos. A análise de timing funcional, por sua vez, considera não apenas a topologia do circuito, mas também as relações temporais e funcionais entre seus elementos. As ferramentas de análise de timing funcional podem diferir por três aspectos: o conjunto de condições necessárias para se declarar um caminho como sensibilizável (i.e., o chamado critério de sensibilização), o número de caminhos simultaneamente tratados e o método usado para determinar se as condições de sensibilização são solúveis ou não. Atualmente, as duas classes de soluções mais eficientes testam simultaneamente a sensibilização de conjuntos inteiros de caminhos: uma baseia-se em técnicas de geração automática de padrões de teste (ATPG) enquanto que a outra transforma o problema de análise de timing em um problema de solvabilidade (SAT). Apesar da análise de timing ter sido exaustivamente estudada nos últimos quinze anos, alguns tópicos específicos não têm recebido a devida atenção. Um tal tópico é a aplicabilidade dos algoritmos de análise de timing funcional para circuitos contendo portas complexas. Este constitui o objeto básico desta tese de doutorado. Além deste objetivo, e como condição sine qua non para o desenvolvimento do trabalho, é apresentado um estudo sistemático e detalhado sobre análise de timing funcional. / The recent advances in CMOS technology have allowed for the fabrication of transistors with submicronic dimensions, making possible the integration of tens of millions devices in a single chip that can be used to build very complex electronic systems. Such increase in complexity of designs has originated a need for more efficient verification tools that could incorporate more appropriate physical and computational models. Timing verification targets at determining whether the timing constraints imposed to the design may be satisfied or not. It can be performed by using circuit simulation or by timing analysis. Although simulation tends to furnish the most accurate estimates, it presents the drawback of being stimuli dependent. Hence, in order to ensure that the critical situation is taken into account, one must exercise all possible input patterns. Obviously, this is not possible to accomplish due to the high complexity of current designs. To circumvent this problem, designers must rely on timing analysis. Timing analysis is an input-independent verification approach that models each combinational block of a circuit as a direct acyclic graph, which is used to estimate the critical delay. First timing analysis tools used only the circuit topology information to estimate circuit delay, thus being referred to as topological timing analyzers. However, such method may result in too pessimistic delay estimates, since the longest paths in the graph may not be able to propagate a transition, that is, may be false. Functional timing analysis, in turn, considers not only circuit topology, but also the temporal and functional relations between circuit elements. Functional timing analysis tools may differ by three aspects: the set of sensitization conditions necessary to declare a path as sensitizable (i.e., the so-called path sensitization criterion), the number of paths simultaneously handled and the method used to determine whether sensitization conditions are satisfiable or not. Currently, the two most efficient approaches test the sensitizability of entire sets of paths at a time: one is based on automatic test pattern generation (ATPG) techniques and the other translates the timing analysis problem into a satisfiability (SAT) problem. Although timing analysis has been exhaustively studied in the last fifteen years, some specific topics have not received the required attention yet. One such topic is the applicability of functional timing analysis to circuits containing complex gates. This is the basic concern of this thesis. In addition, and as a necessary step to settle the scenario, a detailed and systematic study on functional timing analysis is also presented.

Os recentes avanços experimentados pela tecnologia CMOS tem permitido a fabricação de transistores em dimensões submicrônicas, possibilitando a integração de dezenas de milhões de dispositivos numa única pastilha de silício, os quais podem ser usados na implementação de sistemas eletrônicos muito complexos. Este grande aumento na complexidade dos projetos fez surgir uma demanda por ferramentas de verificação eficientes e sobretudo que incorporassem modelos físicos e computacionais mais adequados. A verificação de timing objetiva determinar se as restrições temporais impostas ao projeto podem ou não ser satisfeitas quando de sua fabricação. Ela pode ser levada a cabo por meio de simulação ou por análise de timing. Apesar da simulação oferecer estimativas mais precisas, ela apresenta a desvantagem de ser dependente de estímulos. Assim, para se assegurar que a situação crítica é considerada, é necessário simularem-se todas as possibilidades de padrões de entrada. Obviamente, isto não é factível para os projetos atuais, dada a alta complexidade que os mesmos apresentam. Para contornar este problema, os projetistas devem lançar mão da análise de timing. A análise de timing é uma abordagem independente de vetor de entrada que modela cada bloco combinacional do circuito como um grafo acíclico direto, o qual é utilizado para estimar o atraso do circuito. As primeiras ferramentas de análise de timing utilizavam apenas a topologia do circuito para estimar o atraso, sendo assim referenciadas como analisadores de timing topológicos. Entretanto, tal aproximação pode resultar em estimativas demasiadamente pessimistas, uma vez que os caminhos mais longos do grafo podem não ser capazes de propagar transições, i.e., podem ser falsos. A análise de timing funcional, por sua vez, considera não apenas a topologia do circuito, mas também as relações temporais e funcionais entre seus elementos. As ferramentas de análise de timing funcional podem diferir por três aspectos: o conjunto de condições necessárias para se declarar um caminho como sensibilizável (i.e., o chamado critério de sensibilização), o número de caminhos simultaneamente tratados e o método usado para determinar se as condições de sensibilização são solúveis ou não. Atualmente, as duas classes de soluções mais eficientes testam simultaneamente a sensibilização de conjuntos inteiros de caminhos: uma baseia-se em técnicas de geração automática de padrões de teste (ATPG) enquanto que a outra transforma o problema de análise de timing em um problema de solvabilidade (SAT). Apesar da análise de timing ter sido exaustivamente estudada nos últimos quinze anos, alguns tópicos específicos não têm recebido a devida atenção. Um tal tópico é a aplicabilidade dos algoritmos de análise de timing funcional para circuitos contendo portas complexas. Este constitui o objeto básico desta tese de doutorado. Além deste objetivo, e como condição sine qua non para o desenvolvimento do trabalho, é apresentado um estudo sistemático e detalhado sobre análise de timing funcional. / The recent advances in CMOS technology have allowed for the fabrication of transistors with submicronic dimensions, making possible the integration of tens of millions devices in a single chip that can be used to build very complex electronic systems. Such increase in complexity of designs has originated a need for more efficient verification tools that could incorporate more appropriate physical and computational models. Timing verification targets at determining whether the timing constraints imposed to the design may be satisfied or not. It can be performed by using circuit simulation or by timing analysis. Although simulation tends to furnish the most accurate estimates, it presents the drawback of being stimuli dependent. Hence, in order to ensure that the critical situation is taken into account, one must exercise all possible input patterns. Obviously, this is not possible to accomplish due to the high complexity of current designs. To circumvent this problem, designers must rely on timing analysis. Timing analysis is an input-independent verification approach that models each combinational block of a circuit as a direct acyclic graph, which is used to estimate the critical delay. First timing analysis tools used only the circuit topology information to estimate circuit delay, thus being referred to as topological timing analyzers. However, such method may result in too pessimistic delay estimates, since the longest paths in the graph may not be able to propagate a transition, that is, may be false. Functional timing analysis, in turn, considers not only circuit topology, but also the temporal and functional relations between circuit elements. Functional timing analysis tools may differ by three aspects: the set of sensitization conditions necessary to declare a path as sensitizable (i.e., the so-called path sensitization criterion), the number of paths simultaneously handled and the method used to determine whether sensitization conditions are satisfiable or not. Currently, the two most efficient approaches test the sensitizability of entire sets of paths at a time: one is based on automatic test pattern generation (ATPG) techniques and the other translates the timing analysis problem into a satisfiability (SAT) problem. Although timing analysis has been exhaustively studied in the last fifteen years, some specific topics have not received the required attention yet. One such topic is the applicability of functional timing analysis to circuits containing complex gates. This is the basic concern of this thesis. In addition, and as a necessary step to settle the scenario, a detailed and systematic study on functional timing analysis is also presented.

Os recentes avanços experimentados pela tecnologia CMOS tem permitido a fabricação de transistores em dimensões submicrônicas, possibilitando a integração de dezenas de milhões de dispositivos numa única pastilha de silício, os quais podem ser usados na implementação de sistemas eletrônicos muito complexos. Este grande aumento na complexidade dos projetos fez surgir uma demanda por ferramentas de verificação eficientes e sobretudo que incorporassem modelos físicos e computacionais mais adequados. A verificação de timing objetiva determinar se as restrições temporais impostas ao projeto podem ou não ser satisfeitas quando de sua fabricação. Ela pode ser levada a cabo por meio de simulação ou por análise de timing. Apesar da simulação oferecer estimativas mais precisas, ela apresenta a desvantagem de ser dependente de estímulos. Assim, para se assegurar que a situação crítica é considerada, é necessário simularem-se todas as possibilidades de padrões de entrada. Obviamente, isto não é factível para os projetos atuais, dada a alta complexidade que os mesmos apresentam. Para contornar este problema, os projetistas devem lançar mão da análise de timing. A análise de timing é uma abordagem independente de vetor de entrada que modela cada bloco combinacional do circuito como um grafo acíclico direto, o qual é utilizado para estimar o atraso do circuito. As primeiras ferramentas de análise de timing utilizavam apenas a topologia do circuito para estimar o atraso, sendo assim referenciadas como analisadores de timing topológicos. Entretanto, tal aproximação pode resultar em estimativas demasiadamente pessimistas, uma vez que os caminhos mais longos do grafo podem não ser capazes de propagar transições, i.e., podem ser falsos. A análise de timing funcional, por sua vez, considera não apenas a topologia do circuito, mas também as relações temporais e funcionais entre seus elementos. As ferramentas de análise de timing funcional podem diferir por três aspectos: o conjunto de condições necessárias para se declarar um caminho como sensibilizável (i.e., o chamado critério de sensibilização), o número de caminhos simultaneamente tratados e o método usado para determinar se as condições de sensibilização são solúveis ou não. Atualmente, as duas classes de soluções mais eficientes testam simultaneamente a sensibilização de conjuntos inteiros de caminhos: uma baseia-se em técnicas de geração automática de padrões de teste (ATPG) enquanto que a outra transforma o problema de análise de timing em um problema de solvabilidade (SAT). Apesar da análise de timing ter sido exaustivamente estudada nos últimos quinze anos, alguns tópicos específicos não têm recebido a devida atenção. Um tal tópico é a aplicabilidade dos algoritmos de análise de timing funcional para circuitos contendo portas complexas. Este constitui o objeto básico desta tese de doutorado. Além deste objetivo, e como condição sine qua non para o desenvolvimento do trabalho, é apresentado um estudo sistemático e detalhado sobre análise de timing funcional. / The recent advances in CMOS technology have allowed for the fabrication of transistors with submicronic dimensions, making possible the integration of tens of millions devices in a single chip that can be used to build very complex electronic systems. Such increase in complexity of designs has originated a need for more efficient verification tools that could incorporate more appropriate physical and computational models. Timing verification targets at determining whether the timing constraints imposed to the design may be satisfied or not. It can be performed by using circuit simulation or by timing analysis. Although simulation tends to furnish the most accurate estimates, it presents the drawback of being stimuli dependent. Hence, in order to ensure that the critical situation is taken into account, one must exercise all possible input patterns. Obviously, this is not possible to accomplish due to the high complexity of current designs. To circumvent this problem, designers must rely on timing analysis. Timing analysis is an input-independent verification approach that models each combinational block of a circuit as a direct acyclic graph, which is used to estimate the critical delay. First timing analysis tools used only the circuit topology information to estimate circuit delay, thus being referred to as topological timing analyzers. However, such method may result in too pessimistic delay estimates, since the longest paths in the graph may not be able to propagate a transition, that is, may be false. Functional timing analysis, in turn, considers not only circuit topology, but also the temporal and functional relations between circuit elements. Functional timing analysis tools may differ by three aspects: the set of sensitization conditions necessary to declare a path as sensitizable (i.e., the so-called path sensitization criterion), the number of paths simultaneously handled and the method used to determine whether sensitization conditions are satisfiable or not. Currently, the two most efficient approaches test the sensitizability of entire sets of paths at a time: one is based on automatic test pattern generation (ATPG) techniques and the other translates the timing analysis problem into a satisfiability (SAT) problem. Although timing analysis has been exhaustively studied in the last fifteen years, some specific topics have not received the required attention yet. One such topic is the applicability of functional timing analysis to circuits containing complex gates. This is the basic concern of this thesis. In addition, and as a necessary step to settle the scenario, a detailed and systematic study on functional timing analysis is also presented.

Práce se zabývá metodami pro testování lineárních analogových obvodů v kmitočtové oblasti. Cílem je navrhnout efektivní metody pro automatické generování testovacího plánu. Snížením počtu měření a výpočetní náročnosti lze výrazně snížit náklady za testování. Práce se zabývá multifrekveční parametrickou poruchovou analýzou, která byla plně implementována do programu Matlab. Vhodnou volbou testovacích kmitočtů lze potlačit chyby měření a chyby způsobené výrobními tolerancemi obvodových prvků. Navržené metody pro optimální volbu kmitočtů byly statisticky ověřeny metodou MonteCarlo. Pro zvýšení přesnosti a snížení výpočetní náročnosti poruchové analýzy byly vyvinuty postupy založené na metodě nejmenších čtverců a přibližné symbolické analýze.

Testing, verification and validation of sensors, components and systems is vital in the early-stage development of new cars with computer-in-the-car architecture. This can be done with the help of the existing technique, hardware-in-the-loop (HIL) testing which, in the close loop testing case, consists of four main parts: Real-Time Simulation Platform, Sensor Simulation PC, Interface Unit (IU), and unit under test which is, for instance, a Vehicle Computing Unit (VCU). The purpose of this degree project is to research and develop a proof of concept for in-house development of an image injection solution (IIS) on the IU in the HIL testing environment. A proof of concept could confirm that editing, customizing, and having full control of the IU is a possibility. This project was initiated by Volvo Cars to optimize the use of the HIL testing environment currently available, making the environment more changeable and controllable while the IIS remains a static system. The IU is an MPSoC/FPGA based design that uses primarily Xilinx hardware and software (Vivado/Vitis) to achieve the necessary requirements for image injection in the HIL testing environment. It consists of three stages in series: input, image processing, and output. The whole project was divided in three parts based on the three stages and carried out at Volvo Cars in cooperation by three students, respectively. The author of this thesis was responsible for the output stage, where the main goal was to find a solution for converting, preferably, AXI4 RAW12 image data into data on CSI2 format. This CSI2 data can then be used as input to serializers, which in turn transmit the data via fiber-optic cable on GMSL2 format to the VCU. Associated with the output stage, extensive simulations and hardware tests have been done on a preliminary solution that partially worked on the hardware, producing signals in parts of the design that could be read and analyzed. However, a final definite solution that fully functions on the hardware has not been found, because the work is at the initial phase of an advanced and very complex project. Presented in this thesis is: important theory regarding, for example, protocols CSI2, AXI4, GMSL2, etc., appropriate hardware selection for an IIS in HIL (FPGA, MPSoC, FMC, etc.), simulations of AXI4 and CSI2 signals, comparisons of those simulations with the hardware signals of an implemented design, and more. The outcome was heavily dependent on getting a certain hardware (TEF0010) to transmit the GMSL2 data. Since the wrong card was provided, this was the main problem that hindered the thesis from reaching a fully functioning implementation. However, these results provide a solid foundation for future work related to image injection in a HIL environment.